1 platform, 3 options, 5 sensors<\/p>,
Wide panel of resolutions: from 0.5 to 24.5 MP<\/p>,
Broad spectrum from UV to visible<\/p>,
High speed up to 1594 fps<\/p>,
Low noise and low dark current<\/p>,
Global shutter<\/p>", "overview" : "Andor CB2 sCMOS Series by First Light Imaging\r\nThe Andor CB2 Series is a family of ultra-high performance scientific CMOS cameras offering a broad range of resolutions from 0.5 MP up to 24.5 MP, designed to deliver exceptional speed with global shutter, high detail fidelity while preserving low noise.\r\n The CB2 Series is flexible: it comes in three versions, five models, to cover the largest scope of applications in research and industry:\r\n\r\n Andor CB2 High Resolution - Featuring a 24.5 MP back-illuminated sensor for exceptional detail and long-exposure performance with 2x2 on-chip binning for even faster acquisition.\r\n\r\n Andor CB2 High Speed - Optimised for rapid frame rates up to 1594 fps with resolutions from 0.5 to 7.1 MP, perfect for speed-critical experiments.\r\n\r\n Andor CB2 UV - Specially optimised for ultraviolet imaging (200–400 nm), with quantum efficiency above 50% at 300 nm and high frame rates up to 194 fps.\r\n\r\n Discover Andor CB2 series at a glance:\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n \r\n \r\n \r\n Andor CB2 High res\r\n Andor CB2 High speed\r\n Andor CB2 UV\r\n \r\n \r\n 400 - 1000 nm\r\n 400 - 1000 nm\r\n 200 - 1000 nm\r\n \r\n \r\n 24.5 MP\r\n 7.1 \/ 1.7 \/ 0.5 MP\r\n 8.1 MP\r\n \r\n \r\n Back illuminated\r\n Front illuminated\r\n Back illuminated & UV optimised\r\n \r\n \r\n 2.74 µm5.8 µm with 2x2 on-chip binningup to 106 FPS\r\n 9 µm (CB2 0.5F & CB2 1.7F)4.5 µm (CB2 7.1F)up to 1594 FPS\r\n 2.74 µm5.48 µm with 2x2 on-chip binningup to 194 FPS\r\n \r\n \r\n Global shutter\r\n Global shutter\r\n Global shutter\r\n \r\n \r\n 1.40 e- RON\r\n 1.40 e- \/ 2.60 e- \/ 2.60 e- RON\r\n 1.60 e- RON (median)\r\n \r\n \r\n Ultra low dark current sCMOS\r\n Low dark current sCMOS\r\n Ultra low dark current sCMOS\r\n \r\n \r\n -40°C cooling\r\n -40°C cooling\r\n -40°C cooling\r\n \r\n \r\n \r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n", "features" : "\r\n .striped-table tr:first-child td {\r\n color: #000;\r\n }\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n \r\n \r\n\r\n \r\n Andor CB2 High res\r\n High resolution sensor format\r\n CB2 offers a 24.5 Megapixel array and small 2.74 µm pixel size, to image much wider areas at lower magnifications with full resolution.\r\n Lens mounting\r\n The large 19.7 mm diagonal sensor of the CB2 24B comes with a native C-mount for broad compatibility and wide field of view across most modern microscopes, and optics. Eventhough C-mount is very popular across a variety of applications. a TFL-mount is available to widen its range of applications.\r\n \r\n \r\n \r\n \r\n Andor CB2 High Speed\r\n Flexible resolution sensor format\r\n CB2 High speed offers 0.5, 1.7 and 7.1 Megapixels array. The CB2 0.5F and CB2 1.7F have a pixel size of 9 µm to record over a chosen area and resolution and the CB2 7.1F offers a 4.5 µm that can be binned on-chip to 9 µm to allow higher speed to enhance SNR (Signal to Noise ratio).\r\n High speed\r\n CB2 0.5F: 1594 fpsCB2 1.7F: 662 fpsCB2 7.1F: 207 fps\r\n \r\n \r\n \r\n \r\n Andor CB2 UV\r\n Enhanced Quantum Efficiency in the UV\r\n Thanks to its back-illuminated structure and UV-optimized optical components to ensure high transmission of UV light, CB2 UV delivers exceptional spectral sensitivity in the 200-400 nm range.\r\n Parasitic Light Sensitivity (PLS) corrections\r\n Global shutter is a useful feature for applications requiring fast imaging but the sensor is prone to parasitic light sensitivity that appears as an intensity gradient on the image. CB2 UV handles this effect thanks to its bias and flat-field corrections.\r\n Flexible resolution sensor format\r\n CB2 UV offers a 8.1 Megapixels array and small 2.74 µm pixel size, to image much wider areas at lower magnifications with full resolution.\r\n\r\n\r\n \r\n \r\n \r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n\r\n \r\n \r\n \r\n Andor CB2 Series Common Features\r\n \r\n \r\n \r\n\r\n\r\n\r\n\r\n\r\n\r\n", "features_benefits" : "Low dark current sCMOS - CB2 uses sensor cooling down to -20°C for minimization of darkcurrent. Combined with low amplifier glow from stacked chip design this allows access to longer exposures, up to several minutes. This broadens the application flexibility of this model, making it ideal for long exposure luminescence measurements and astro-photometry. ,Selectable readout speeds - 8-bits, 10-bits, 12-bits and 14-bits (HDR) or 16-bits (HDR) modes: Trade-off between frame rate and dynamic range. HDR mode is available to capture the full image information across a very wide pixel depth.,Temperature management - Air cooling provides effective cooling to -5°C for most applications. Liquid cooling boosts cooling down to -40°C providing the lowest possible dark current at long exposures. The fan can be entirely disabled for vibration sensitive applications such as electrophysiology.,Low temperature qualified - CB2 series has been qualified for operation down to -40 °C ambient, ideal for observing in high altitude harsh environments.,Adjustable gain - Default options for selection of High or Low sensitivity allows easy adjustment for sensitivity, or extended dynamic range. In addition, advanced users can fine-tune sensitivity and dynamic range to suit their specific requirements using 24dB analog amplification gain and up to 48 dB of digital amplification gain.,Global Shutter architecture - By incorporating a global shutter architecture, a “snapshot” image can be taken which provides true temporal accuracy across the field of view. This avoids the temporal distortions that can be found when imaging dynamic processes using the more common rolling shutter sCMOS designs.,Multi-windowing and Region of Interest (ROI) - User-selectable regions of interest allow cropped sensor operation to boost frame rates, while multiple regions of interest can also be set enhancing application possibilities.,Compact design - CB2 Series packages a large area sensor, thermoelectric and liquid cooling and multiple connectivity options within a space efficient design, keeping the overall size of the camera to a minimum. The dimensions of the CB2 Series are 183.7 (CXP) - 180.4 (GigE) x 93 x 77.5 mm (LxWxH), while weight is 1.3kg. This allows for ease of integration in most imaging and detection systems.,High speed data interface options - CB2 supports the high data output with high-speed data interface options. CoaXPress provides stable, low latency performance and GigE offers a user-friendly interface over longer distances. CB2 supports GigE Vision and compliant with GenICam standards. ,On-chip 2x2 Binning - CB2 uniquely offers on-chip 2x2 binning of sCMOS pixels, allowing the native 2.74µm pixel to be converted to a 5.48µm pixel without doubling of read noise (which would otherwise be expected for sCMOS technology). This inherent optical flexibility significantly expands the application adaptability of the camera. (only available on CB2 High Resolution and CB2 UV)", "extended_tabs" : "\n \n \n Sensor Specifications\n Andor CB2 High res\n Andor CB2 High speed\n Andor CB2 UV\n \n \n Sensor Type\n Back illuminated stacked sensor\n Front illuminated sensor\n Back illuminated sensor\n \n \n Active Pixels (W x H)\n 5328 x 4608 CMOS (24.5 Megapixel)\n 3216 x 2232 | 1608 x 1104 | 816 x 624 CMOS (7.1 | 1.7 | 0.5 Megapixel)\n 2848 x 2848 (8.1 Megapixel)\n \n \n Pixel Size\n 2.74 µm5.48 µm with 2x2 on-chip binning\n 9µm for CB2 0.5F and CB2 1.7F4.5 µm (9µm with 2x2 binning) for CB2 7.1F\n 2.74\n5.48 µm with 2x2 on-chip binning\n \n \n Sensor Size\n 19.3 mm diagonal\n 17.6 | 17.6 | 9.2 mm diagonal\n 11.2 mm diagonal\n \n \n Shutter Architecture\n Global shutter\n Global shutter\n Global shutter\n \n \n Maximum Quantum Efficiency\n 74 %\n 74 %\n >50% at 300 nm (UV) & >70% at 500 nm (visible)\n \n \n Readout Noise (in 12 bits, 24 dB analogic gain at 50 µs)\n 1.40 e-\n 1.40 e- | 2.60 e- | 2.60 e-\n 1.60 e- (median)\n \n \n Air Cooling\n -5°C (@ +25°C ambient)\n -5°C (@ +25°C ambient)\n -5°C (@ +25°C ambient)\n \n \n Liquid Cooling\n -20°C (@ +25°C liquid)-40°C (@ +5°C liquid)\n -20°C (@ +25°C liquid)-40°C (@ +5°C liquid)\n -20°C (@ +25°C liquid)-40°C (@ +5°C liquid)\n \n \n Dark Current (@ 20°C) (e-\/p\/s)\n 0.043\n 0.26 | 1.14 | 1.54\n 0.014\n \n \n Image Full well capacity (0 dB analogic gain)\n 9.5 ke-\n 23 ke- | 94 ke- | 94 ke-\n 9.2 ke-\n \n \n \n\n \n \n Additional Features\n Andor CB2 High res\n Andor CB2 High speed\n Andor CB2 UV\n \n \n Synchronization\n Internal & External\n Internal & External\n Internal & External\n \n \n Analog gain Quantization A\/D\n 0 to 24 dB8, 10, 12 bits\n 0 to 24 dB8, 10, 12 bits\n 0 to 24 dB8, 10, 12 bits\n \n \n Data range with HDR (High dynamic range)\n 16 bits\n 14 bits\n 16 bits\n \n \n Binning\n 2x2 on-chip\n 2x2 on-chip (CB2 7.1F model only)\n 2x2 on-chip\n \n \n Region of interest\n Multi-ROI supported\n Multi-ROI supported\n Multi-ROI supported\n \n \n Interface options\n CoaXPress 2.0 \/ High speed SFP+ 10 GigE interface with Ethernet or Fiber\n CoaXPress 2.0 \/ High speed SFP+ 10 GigE interface with Ethernet or Fiber\n CoaXPress 2.0 \/ High speed SFP+ 10 GigE interface with Ethernet or Fiber\n \n \n Optical interface\n C-Mount + TFL Mount optional\n C-Mount\n C-Mount\n \n \n ", "options" : "", "accessories" : "", "tags" : "", "businesses" : "andor", "businesses_frontend" : "Andor", "applications" : [ "" ], "applications_frontend" : "", "product_family" : "scmos-camera-series", "product_family_frontend" : "sCMOS Camera Series", "sorting_product_family" : "100", "idx": 13, "page_id": 29280, "page_link" : "https://andor.oxinst.com/products/scmos-camera-series/cb2-scmos-series", "weight" : 0, }, { "name":"Apogee 5500 Series Radiation Shielded X-ray Tube", "sorting_name":"apogee 5500 series radiation shielded x-ray tube", "image":"/assets/components/phpthumbof/cache/x-ray-tube-radiation-shielded-apogee-5500-series.1c468b924ea55240f8ac9476a4d59886.png", "content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nHow to Request Product Quotes\n1. In the table below, please click the “Add to quote list” button for all products that you would like quoted.\n2. Scroll to the bottom of the table and click the green “My Quote List” button to visit the submission form page.", "outline" : "The Apogee 5500 Series is a 50kV, 50W packaged X-ray tube designed for applications where high flux density and continuous operation are important.\r\nUtilizing our high stability, high intensity X-ray tube technology coupled with grid-controlled variable focus enables our Apogee design to produce very small focal spots; this makes the Apogee 5500 Series ideal for most industrial inspection and non-destructive testing applications that require high resolution, including PCB assembly, battery, plastic, metal and mechanical parts inspection. Flexible and reliable, this unit is also well suited for use with X-ray optics.\r\nThe Apogee 5500 Series is configured in a compact stainless steel, lead-lined package filled with dielectric oil, which enables the unit to provide maximum X-ray shielding and heat dissipation. The design includes high voltage and filament connectors, making it ideal for plug and play operation.", "outline_limited" : "The Apogee 5500 Series is a 50kV, 50W packaged X-ray tube designed for applications where high flux density and continuous operation are important.\r...", "highlights" : "", "overview" : "", "features" : "", "features_benefits" : "Wide operating range - enables optimal image contrast,Stable X-ray output - delivers high-precision measurements,Low attenuation beryllium window - ensures high transmission of low energy X-rays,Fully shielded compact package - eliminates X-ray leakage and easily integrates into your system", "extended_tabs" : "\nAnalytical XRFCoating thickness gaugingElectronics inspectionPhase-contrast imagingSolder joint inspection\n", "options" : "", "accessories" : "Shasta Series X-ray Tube Power Supply ", "tags" : "Radiation Shielded Packaged X-ray Source", "businesses" : "x-ray-technology", "businesses_frontend" : "X-Ray Technology", "applications" : [ "analysis-of-environmental-contaminants","inspection-and-process-control","material-composition-and-structure","materials-for-the-power-generation-industry","process-mineralogy-and-chemical-analysis","solar-and-pv-technology","structural-materials-and-components","x-ray-fluoroscopy-tomography-and-micro-ct" ], "applications_frontend" : "Analysis of Environmental Contaminants, Inspection and Process Control, Material Composition and Structure, Materials for the Power Generation Industry, Process Mineralogy and Chemical Analysis, Solar and PV Technology, Structural Materials and Components, X-ray Fluoroscopy, Radiography and CT", "product_family" : "x-ray-tube-assembly-radiation-shielded", "product_family_frontend" : "X-ray Tube Assembly Radiation Shielded", "sorting_product_family" : "100", "idx": 14, "page_id": 470, "page_link" : "https://xray.oxinst.com/x-ray-tube-products/x-ray-tube-assembly-radiation-shielded/apogee-5500-series", "weight" : 0, }, { "name":"AR Maps Software", "sorting_name":"ar maps software", "image":"/assets/components/phpthumbof/cache/AR%20Maps%20Particle%20Analysis.3955484f5a54819e88c155ba107ad794.png", "content" : "", "outline" : "Streamline your workflow with AR Maps, a comprehensive analysis package designed for AFM data. \r\nFeatures include:\r\n\r\n Extensive tools to correct, normalize, and denoise measured data\r\n Characterize surface and section data including \r\n ISO standard roughness\r\n Step height\/measure distance\r\n Histograms \r\n \r\n \r\n Develop powerful recipes to customize your data process and analysis\r\n\r\n\r\nAdvanced features include:\r\n\r\n Batch process and automate your data analysis\r\n Generate statistics reports on data sets\r\n Critical dimensions and trench analysis package with cantilever tip deconvolution\r\n Image stitching\r\n Particle analysis\r\n\r\n\r\nSupports both Ergo and Igor files.", "outline_limited" : "Streamline your workflow with AR Maps, a comprehensive analysis package designed for AFM data. \r...", "highlights" : "", "overview" : "", "features" : "", "features_benefits" : "", "extended_tabs" : "", "options" : "", "accessories" : "", "tags" : "Atomic Force Microscopy,AFM,Nanotechnology,thin film,Semiconductors", "businesses" : "asylum", "businesses_frontend" : "Asylum Research", "applications" : [ "" ], "applications_frontend" : "", "product_family" : "jupiter-afm-accessories", "product_family_frontend" : "Jupiter AFM Accessories", "sorting_product_family" : "100", "idx": 15, "page_id": 25879, "page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/ar-maps", "weight" : 0, }, { "name":"AZtec LayerProbe", "sorting_name":"aztec layerprobe", "image":"/assets/components/phpthumbof/cache/Webinar_Layerprobe_webinar_page.2d676a238a609aaa0be50e76345cb8a6.png", "content" : "Download Centre !If? &subject=`` &operator=`notempty` &then=`` &else=`` LayerProbe Brochure\nThis 8 page brochure shows the features, benefits and operating principles of LayerProbe - and the many applications it is applied to. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`9405`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` High quality TEM lamella preparation and on-tip analysis using LayerProbe\nHere we present a new technique that enables measurement of the local thickness and composition of TEM lamellae and discuss its application to the failure analysis of semiconductor devices. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`15428`\n` !If? &subject=`https:\/\/register.gotowebinar.com\/rt\/7477607472396700430?source=Website` &operator=`notempty` &then=`` &else=`` Utilising SEM-EDS to measure the thickness and composition of thin layers and TEM lamella\nIn this webinar, we discuss how the software solution AZtec LayerProbe uses EDS to measure the compositions and thickness of thin layers and how you can achieve successful results, including for TEM lamella. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`https:\/\/register.gotowebinar.com\/rt\/7477607472396700430?source=Website` &operator=`notempty` &then=`` &else=``\nWatch now !If? &subject=`` &operator=`notempty` &then=`` &else=`` Characterisation of all-oxide solar cells using AZtec LayerProbe\nPhotovoltaic (PV) cells are an attractive option for generating low carbon renewable energy but traditional designs often include undesirable toxic compounds and must be manufactured under special conditions. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`513`\n` !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"LayerProbe Applications\",\"content\": !jsonEncode? &input=` LayerProbe is ideal for a wide range of applications, including back- and front-end chip manufacturing, semiconductor R&D, optical and industrial coatings, nanoelectronic devices...\nSemiconductor R&D\nMeasure thickness and composition of metallisation and dielectric layers\nAccurately characterise oxide formation on bond pads (e.g. Cu oxide on Cu)\nOptimise thin film deposition processes (CVD, ALD, sputtering, evaporation)\nSolar cells\nCharacterise active layers in thin film solar cells (CIGS, CdTe)\nOptimise TCO layer thickness and uniformity\nCharacterise anti-reflection coating thickness and composition\nOptical Coatings\nOptimise the colour and transparency of optical coatings by accurately determining the film thickness and composition\nCompositional measurement uncovers non-uniformities not seen in conventional thickness measurements\nIndustrial Coatings\nSuitable for decorative and structural coatings\nUncover and accurately characterise sub-surface defects with minimal sample preparation\nNanoscience\nMeasure uniformity of nanoparticle coatings\nCharacterise contacts to nano-devices\nRelate device performance and structure using nondestructive layer measurements\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"LayerProbe and the FIB\",\"content\": !jsonEncode? &input=` LayerProbe provides a new way to quantify TEM lamella thickness and quality in situ - as well as a complimentary technique to the cross-sectional analysis of layered specimens on FIB-SEMs.\nLayerProbe takes only seconds to characterise the lamella thickness and to detect and measure any implanted Gallium\nIts precise thickness measurement enables faster preparation of high-quality, ultra-thin lamellae\nSub-surface defects are pinpointed to identify locations where to cut with the FIB-SEM\nLayerProbe can also characterise and optimise the quality of layers deposited or processed in the FIB using gas assisted deposition and etching\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"A comparison with established methods\",\"content\": !jsonEncode? &input=` LayerProbe is based on proven technology and has significant benefits compared to alternative techniques\nA comparison of LayerProbe with other techniques +cellLayerProbeEllipsometryFIB\/TEMRBSNon-destructiveYesYesNoYesHigh spatial resolutionYesNo (>>1 micron)YesYesRapid analysisYes (each point takes seconds)YesNo (several hours)NoCostRelatively inexpensiveExpensiveVery expensiveExtremely expensive\n.striped-table.first-col-highlight td:first-child {\ncolor: #1c2674 !important\n}\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nHow accurate is LayerProbe?\nComparison of ALD layers on silicon substrate +cellLayerProbe Thickness (nm)Density (gcm-3)Ellipsometry Thickness (nm)Refractive IndexHfO228.1 ± 0.19.433.6 ± 52.04Al2O357.0 ± 0.23.052.8 ± 51.64\n.striped-table.first-col-highlight td:first-child {\ncolor: #1c2674 !important\n}\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nLayerProbe EDS and RBSD composition measurement +cellLayerProbe - Stoichiometric RatioRBS - Stoichiometric RatioHf \/O2.132.07Al \/O1.561.60\n.striped-table.first-col-highlight td:first-child {\ncolor: #1c2674 !important\n}\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nExample: PCB Application - Au on Ni on Si substrate\nLayerProbe and XRF thickness measurement +cellLayerProbe Thickness (nm)Density (gcm-3)XRF Thickness (nm)AU60.1 ± 0.719.361 ± 25Ni123.5 ± 0.78.9141 ± 24\n.striped-table.first-col-highlight td:first-child {\ncolor: #1c2674 !important\n}\nSEM cross section measurement confirms the result...\n`}}`", "outline" : "LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher resolution than dedicated thin film measurement tools.", "outline_limited" : "LayerProbe is an exciting software tool for thin film analysis in the SEM. An option for the AZtec EDS microanalysis system, LayerProbe is faster, more cost-effective and higher...", "highlights" : "
Thin film analysis in the SEM<\/p>,
Characterises multiple layers beneath surface of the specimen<\/p>,
Non-destructive analysis<\/p>,
Thickness and composition of multiple layers from 2 nm to 2000 nm<\/p>,
Lateral resolution down to 200 nm<\/p>,
Easy to set-up for routine user, and a cost effective extension of your SEM or FIB-SEM<\/p>,
An extension to AZtecLive: seamlessly integrated and easily retrofittable to existing installations<\/p>", "overview" : "LayerProbe analyses the composition and thickness of the surface and sub-surface layers of a specimen. A non-destructive tool based on established microanalysis technology, it is more cost-effective, higher resolution, and more accurate than dedicated film measurement tools.\r\nLayerProbe complements the elemental and phase information gained from conventional EDS analysis by also calculating the composition and thickness of the individual layers beneath the surface.", "features" : "", "features_benefits" : "", "extended_tabs" : "", "options" : "", "accessories" : "", "tags" : "thin film", "businesses" : "nanoanalysis", "businesses_frontend" : "NanoAnalysis", "applications" : [ "" ], "applications_frontend" : "", "product_family" : "aztec", "product_family_frontend" : "AZtec", "sorting_product_family" : "100", "idx": 16, "page_id": 402, "page_link" : "https://nano.oxinst.com/products/aztec/layerprobe", "weight" : 0, }, { "name":"AZtec3D", "sorting_name":"aztec3d", "image":"/assets/components/phpthumbof/cache/AZtec3D%20%28393x341%29.e43f0875c7895bf05ec4bf0fcd9f7371.jpg", "content" : "", "outline" : "\r\n\r\nAZtec3D provides an interface which allows simultaneous EDS and EBSD data acquisition & analysis to be initiated from outside of AZtec. This allows the analysis to be combined with automated processes, such as the milling capabilities of a FIB-SEM via the FIB-SEM 3D software module.\r\n", "outline_limited" : "\r...", "highlights" : "
\n<\/p>\n
Superior data quality, combining Tru-I®<\/sup> and Tru-Q®<\/sup> in 3D<\/p>\n <\/p>, \n<\/p>\n Optimised data acquisition using superfast EBSD detectors and large area SDD EDS detectors<\/p>\n <\/p>, \n<\/p>\n AZtec AutoLock Drift Correction to correct for sample drift<\/p>\n <\/p>, \n<\/p>\n Simple setup for simultaneous EDS & EBSD data acquisition <\/p>\n <\/p>, <\/p>\n Observe the EDS & EBSD map data slice by slice as it is collected<\/p>\n <\/p>",
"overview" : "\r\n\r\nAZtec3D provides an interface which allows simultaneous EDS and EBSD data acquisition & analysis to be initiated from outside of AZtec. This allows the analysis to be combined with automated processes, such as the milling capabilities of a FIB-SEM via the FIB-SEM 3D software module.\r\n",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "nanoanalysis",
"businesses_frontend" : "NanoAnalysis",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "aztec",
"product_family_frontend" : "AZtec",
"sorting_product_family" : "100",
"idx": 17,
"page_id": 405,
"page_link" : "https://nano.oxinst.com/aztec3d",
"weight" : 0,
},
{
"name":"AZtecAM",
"sorting_name":"aztecam",
"image":"/assets/components/phpthumbof/cache/AZtecAM-software.e1c8925353bd0ac28f386bd8a2fce334.png",
"content" : "Flyers Flyer: AZtecAM\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`2584`\n`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nApplications !If? &subject=`` &operator=`notempty` &then=`` &else=`` Morphology Characterisation and Contamination Detection in Additive Manufacturing Powders with AZtecAM\nThis application note considers the use of AZtecAM, an automated system developed specifically for the rapid analysis and classification of AM powders, using an energy dispersive X-ray spectrometry (EDS) system in the scanning electron microscope (SEM). for the routine characterisation of gas atomised high-purity copper powders. It demonstrates how particles across the population can be assessed and how contamination can be easily detected and classified. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` The Complete Characterisation of Additive Manufacturing Powders with AZtecAM\nInvestigate the streamlined process through the dedicated AZtecAM software recipe, for complete characterisation of all aspects of metal powders used in additive manufacturing. Ensure the characterisation, particle morphology and individual particle characterisation. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload",
"outline" : "AZtecAM is a powerful, automated, solution for the analysis of metal powders used in additive manufacturing. Based on AZtecFeature, AZtecAM optimises the particle analysis workflow to enable the rapid and accurate characterisation of metal powders.\r\nAZtecAM is ideal for the detection and identification of contaminants in powders, the characterisation of powder grain morphology and the in-depth investigation of individual grains – providing all the necessary information to ensure that your additive manufacturing process and products are of the highest quality.",
"outline_limited" : "AZtecAM is a powerful, automated, solution for the analysis of metal powders used in additive manufacturing. Based on AZtecFeature, AZtecAM optimises the particle analysis workflow...",
"highlights" : "",
"overview" : "AZtecAM is a powerful, automated, solution for the analysis of metal powders used in additive manufacturing. Based on AZtecFeature, AZtecAM optimises the particle analysis workflow to enable the rapid and accurate characterisation of metal powders.\r\nAZtecAM is ideal for the detection and identification of contaminants in powders, the characterisation of powder grain morphology and the in-depth investigation of individual grains – providing all the necessary information to ensure that your additive manufacturing process and products are of the highest quality.\r\nCombined with the complete AZtecLive NanoAnalysis suite,\r\nComplete AM Powder Characterisation\r\n\r\nDetect and Identify Contaminants\r\nCharacterise Powder Morphology\r\nIn depth reviews of individual particles of interest\r\n\r\nApplications\r\n\r\nInvestigating powders during production\r\nDetermining if powders can be recycled\/re-used (powder grain morphology)\r\nDetecting contaminants and understanding their composition for source identification\r\n\r\nPerformance\r\n\r\nHigh speed acquisition using SDD technology\r\nAutomated analysis over wide areas, resolution at the nanoscale\r\nBased on proven Oxford Instruments algorithms\r\n\r\nFlexibility\r\n\r\nCustom AM powder analysis on a multi-capable system\r\nWorks with most SEMs\r\nCan be retrofitted to existing systems\r\nParticle relocation for more further analysis using WDS, EBSD and complementary EDS techniques\r\nUpgrade paths include large area mapping, quantitative EDS mapping and more\r\n",
"features" : "AZtecAM automatically analyses powders over large area sample stubs – up to 200,000 particles per sample.\r\nBecause of the resolution achieved, information on individual particles is available from the same acquisition.\r\n\r\n Particles, and the grains within them, are detected using the atomic number contrast derived from a backscattered electron image.\r\n A combination of X-ray data and morphological data from the BSE image is used to identify the particles.\r\n Both morphological and compositional information from each particle is stored in a database from which it can be retrieved and re analysed in greater detail at any time.\r\n Quantification of composition is performed by real-time full quantitative analysis during the acquisition (including AZtec’s Tru-Q® processing).\r\n Information is provided for individual particles as well as statistical information over the whole sample: particle size distributions, morphology measurements, number of particles in each class, physical distribution on sample stub and histograms and scatterplots of any measured parameter\r\n",
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"content" : "$floating-bar? &rows=`[{ \"title\": \"Overview\", \"scroll_section\": \"overview\"\n},{ \"title\": \"Features\", \"scroll_section\": \"features\"\n},{ \"title\": \"Library\", \"scroll_section\": \"library\"\n}]` &rows=`[{ \"title\": \"Overview\", \"scroll_section\": \"overview\"\n},{ \"title\": \"Features\", \"scroll_section\": \"features\"\n},{ \"title\": \"Library\", \"scroll_section\": \"library\"\n}]` &contact_id=`65` &pricing_id=`75` &ids=`` &value=`` &button1Title=`` &button2Title=`` &bar_title=`` !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=` Identify Contamination Faster and with Complete Confidence\nWhen contamination threatens battery performance, yield and safety, you need answers you can trust. AZtecBattery helps you rapidly identify contaminant particles and understand their source, enabling faster corrective action and greater confidence in your manufacturing and R&D decisions. Accurately identify the elemental composition of contaminants, making it easier to determine their origin and eliminate recurring issues. Analyse more than 120,000 particles per hour (hardware dependent) without compromising confidence in results. Avoid misidentifying contaminants thanks to stable spectral resolution at high throughput and outstanding low-energy performance, helping you accurately detect and distinguish light elements that are often critical in battery materials and contamination investigations\nAdapt Quickly to New Contamination Challenges\nContamination problems are rarely predictable. As processes evolve, materials change and new contaminant types emerge, your analysis workflow needs to keep pace.\nAZtecBattery provides the flexibility to handle changing requirements without lengthy method development, helping you save time and reduce operational costs. Detect contaminants regardless of whether they appear brighter or darker than the surrounding powder. Quickly update classification schemes to accommodate newly discovered contamination sources. Reconstruct large particles across multiple fields of view to ensure accurate size, morphology and compositional measurements. Target particles within critical size ranges using advanced morphological filtering, reducing the time spent analysing irrelevant material. Use intelligent filtering and classification tools to focus data collection where it delivers the greatest value. Automatically assess contamination levels through survey scans and optimise acquisition strategies without operator intervention. Maintain sharp focus across large sample areas with automated Z-focus capability.\nIncrease Throughput Without Missing Critical Contaminants\nWhen analysing large volumes of samples, the pressure is on to deliver rapid results while still detecting the smallest and most significant contamination events.\nAZtecBattery combines powerful software with industry-leading detector technology to maximise throughput without sacrificing accuracy. Detect even the smallest contaminant particles with greater statistical confidence using Ultim® Max Infinity or Xplore\/XploreCompact detectors with sensor areas up to 170 mm². Scale throughput further with optional multi-detector configurations. Reveal small particles that might otherwise be missed using advanced scan strategies and dedicated electronics.\nStandardise Contamination Analysis Across Sites and Suppliers\nInconsistent analysis methods can lead to conflicting results, delayed investigations and uncertainty when working with suppliers.\nAZtecBattery helps establish a consistent, repeatable workflow so that every operator, laboratory and supplier follows the same process and produces comparable results. Guide users through every stage of the workflow with configurable instructions. Reduce training requirements with intuitive software designed around a clear, guided workflow. Improve reproducibility by using pre-defined analysis settings and standardised operating procedures embedded directly within the software.\nGet More Value from Every Battery Investigation\nWhen contamination is discovered, identifying it is often only the first step. Understanding its impact and investigating related material characteristics are critical to solving the problem.\nAZtecBattery enables deeper investigation without moving between multiple software platforms or instruments. Transition seamlessly from automated particle analysis to detailed X-ray mapping and AutoPhaseMap (FeaturePhase) investigations of identified contaminants. Extend your battery materials research using integrated EDS and EBSD analysis within the same software environment. Add Ultim® Extreme Infinity for low-energy analysis of beam-sensitive materials, unlocking valuable information that might otherwise be inaccessible.\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Features\",\"content\": !jsonEncode? &input=` AZtecBattery automatically analyses powders over large area sample stubs – up to 200,000 particles and 10,000 fields per sample. Because of the achieved spatial resolution, it is possible to extract a wealth of information even from individual particles.\n AZtecBattery Software\nIdentify common contaminants with dedicated classification\n ✔\nAcquisition settings optimised for finding contaminants\n ✔\nCustom step notes to guide users through the analysis process\n ✔\nReconstruction of particles to ensure true morphology measurements\n ✔\nMorphology filtering of particles to save time by only acquiring those of interest\n ✔\nTru-Q IQ for accuracy and reliability in element identification and quantification\n ✔\nLive chemical imaging\n ✔\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"Library\",\"content\": !jsonEncode? &input=` Flyer: AZtecBattery\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`437`\n` Brochure: AZtecFeature\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`3154`\n` App Note: Monitoring the Composition of NCM cathodes in Li-ion Batteries Video: Introduction to AZtecBattery Blog: From Mine to Manufacture Blog: Powering the future with Li-ion batteries\n`}}` !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtecBattery\nDownload this brochure to discover how AZtecBattery can help you ensure quality in your battery products by identifying contaminants quickly, reliably, and accurately in the SEM. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload Brochure\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`7752`\n`",
"outline" : "AZtecBattery is a powerful, automated, solution for the analysis of powders used in the manufacturing of battery materials and batteries. AZtecBattery is ideal for the detection and identification of contaminants in powders all the way from the mining facility to the battery manufacturing plant.",
"outline_limited" : "AZtecBattery is a powerful, automated, solution for the analysis of powders used in the manufacturing of battery materials and batteries. AZtecBattery is ideal for the detection...",
"highlights" : " Identification of contaminants so sources can be found<\/p>, Complete characterisation of powders<\/p>, Automated high throughput analysis<\/p>, Easily Deployable across multiple systems and sites<\/p>, Analysis and Reporting made easy<\/p>",
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"content" : "$floating-bar? &rows=`[{ \"title\": \"Overview\", \"scroll_section\": \"overview\"\n},{ \"title\": \"Features\", \"scroll_section\": \"features\"\n},{ \"title\": \"Library\", \"scroll_section\": \"library\"\n},{ \"title\": \"Contact us\", \"scroll_section\": \"contact\"\n}]` &rows=`[{ \"title\": \"Overview\", \"scroll_section\": \"overview\"\n},{ \"title\": \"Features\", \"scroll_section\": \"features\"\n},{ \"title\": \"Library\", \"scroll_section\": \"library\"\n},{ \"title\": \"Contact us\", \"scroll_section\": \"contact\"\n}]` &contact_id=`+contact_id` &pricing_id=`+pricing_id` &ids=`+ids` &value=`+value` &button1Title=`+button1Title` &button2Title=`+button2Title` &bar_title=`+bar_title` !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=` AZtecClean is a tailored version of the AZtecFeature particle analysis platform that is fully optimised for technical cleanliness analysis. The automated SEM based analysis finds, identifies and reports on particles to international standards, such as ISO 16232 and VDA 19.\nAZtecClean is specifically designed to meet the analytical requirements of the automotive and aerospace industries and includes dedicated functionalities to ensure that all particles are analysed quickly, easily, and accurately to aid in the process of identifying the sources of contaminants and creating appropriate remedial actions.\nAZtecClean uses Oxford Instruments’ Ultim Max or Xplore EDS with the AZtecLive Tru-Q algorithms to ensure accurate element identification and quantification, even at the highest levels of throughput.\nMontaged image of an entire filter holding detected partcles\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Features\",\"content\": !jsonEncode? &input=` Dedicated\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Optimised analytical recipe for technical cleanliness`&else=`Optimised analytical recipe for technical cleanliness` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Automatically acquires particle data and reports in accordance with ISO 16232 and VDA 19 including the generation of component cleanliness codes`&else=`Automatically acquires particle data and reports in accordance with ISO 16232 and VDA 19 including the generation of component cleanliness codes` LabelABCDEFGHIJKClass\/Length (μm)1000All Features1861208529249579511161896130300Ferrous Metals148224116281896343581710100Steel - Low alloy136206315151781326531610100Steel - Cr111431009612410000Steel - High alloy13513195100000Non-Ferrous Metals1613255262000000Copper04430000000Brass17441000000W12130000000Ti1210734151000000\n.striped-table.first-col-highlight td:first-child {\ncolor: #1c2674 !important\n}\nCCC=V (B15\/C14\/D13\/E11\/F8\/G6\/H5\/I2\/JK00)\nAZtecClean Classification Table\nIncludes a dedicated and fully customisable technicl cleanliness classification scheme for the identification of common particles\nFlexible\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Easily add\/edit classifications for new particle types`&else=`Easily add\/edit classifications for new particle types` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Automatically acquire additional data from key particles`&else=`Automatically acquire additional data from key particles` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Terminate analyses automatically when certain criteria are met – e.g. identification of a particular contaminant`&else=`Terminate analyses automatically when certain criteria are met – e.g. identification of a particular contaminant` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Perform in depth follow-up investigations of particles within the same software suite`&else=`Perform in depth follow-up investigations of particles within the same software suite` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Works with a wide range of SEMs `&else=`Works with a wide range of SEMs ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Work with additional analytical techniques in the same software platform (e.g., WDS, EBSD)`&else=`Work with additional analytical techniques in the same software platform (e.g., WDS, EBSD)`\nFast\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Maximum particle analysis rates > 120,000 particles per hour (dependent on hardware configuration)`&else=`Maximum particle analysis rates > 120,000 particles per hour (dependent on hardware configuration)` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Combine up to 4 Ultim Max detectors for the ultimate in throughput`&else=`Combine up to 4 Ultim Max detectors for the ultimate in throughput`\nAccurate\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Automatically reconstruct large particles broken by field boundaries to ensure correct morphology measurements – essential for the correct calculation of component cleanliness codes`&else=`Automatically reconstruct large particles broken by field boundaries to ensure correct morphology measurements – essential for the correct calculation of component cleanliness codes`\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"Library\",\"content\": !jsonEncode? &input=` Flyers Flyer: AZtecClean\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`6061`\n`\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Video\nAZtecClean: Setup and Acquisition\nThis video demonstrates how quick and easy it is to setup and acquire EDS data for technique cleanliness analysis using AZtecClean. !If? &subject=`` &operator=`notempty` &then=`` &else=``\nBlog !If? &subject=`https:\/\/nano.oxinst.com\/library\/past-blogss\/cleanliness-of-ball-bearings` &operator=`notempty` &then=`` &else =`` Aug 3 !If? &subject=`Ensuring technical cleanliness in the manufacture of ball bearings` &operator=`notempty` &then=`Ensuring technical cleanliness in the manufacture of ball bearings` !If? &subject=`\/assets\/uploads\/products\/nanoanalysis\/images\/Blog\/blog_cleanliness_in_manufacture_ball_bearings.jpg` &operator=`notempty` &then=`` !If? &subject=`!If? &subject=`0` &operator=`eq` &operand=`0` &then=`` &else=`\n`` &operator=`notempty` &then=` !If? &subject=`0` &operator=`eq` &operand=`0` &then=`` &else=`\n` !If? &subject=`https:\/\/nano.oxinst.com\/library\/past-blogss\/cleanliness-of-ball-bearings` &operator=`notempty` &then=` >`\n`\n!If? &subject=`https:\/\/nano.oxinst.com\/library\/past-blogss\/cleanliness-of-ball-bearings` &operator=`notempty` &then=`` &else =``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Gallery !If? &subject=`` &operator=`notempty` &then=`` &else=`` By utilising FeaturePhase to analyse the saturated particle in the centre of A, it is possible to determine that two phases (steel & Silicate) within the particle, in B. !If? &subject=`(A) Separation of Features that can't be Separated with Backscatter Electron Image (BSE)` &operator=`notempty` &then=`(A) Separation of Features that can't be Separated with Backscatter Electron Image (BSE)` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` By utilising FeaturePhase to analyse the saturated particle in the centre of A, it is possible to determine that two phases (steel & Silicate) within the particle, in B. !If? &subject=`(B) Separation of Features that can't be Separated with Backscatter Electron Image (BSE)` &operator=`notempty` &then=`(B) Separation of Features that can't be Separated with Backscatter Electron Image (BSE)` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=``\nBy utilising FeaturePhase to analyse the saturated particle (A), it is possible to determine that two phases (steel & silicate) are present within the particle (B).\n`}}` Got a question? Get in touch\n!If? &subject=`Yes` &operator=`notempty` &then=``\n!renderForm? &form=`75`&formTpl=`standard-form-wrapper` &unique_id=`46725`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`Yes` &operator=`notempty` &then=``",
"outline" : "AZtecClean is the leading global solution for the detection and analysis of particles as part of the technical cleanliness monitoring and investigations commonly performed in the automotive and aerospace industries. \r\nAZtecClean provides analysts with:",
"outline_limited" : "AZtecClean is the leading global solution for the detection and analysis of particles as part of the technical cleanliness monitoring and investigations commonly performed in the...",
"highlights" : " Particle analysis fully optimised for technical cleanliness analysis<\/p>, Accurate element identification with AZtec’s Tru-Q®<\/sup> algorithms<\/p>, Automatic SEM-based data collection, particle classification and reporting to international standards including ISO 16232 and VDA 19 and calculation of component cleanliness codes<\/p>",
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"content" : "Overview\nFast, Accurate & Smart\nApplications\nIndustry Specific Modules\nHardware\nLibrary\nPublications\nContact us !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=` Fast and Powerful\nUnleashes the potential of the latest generation of large area Ultim Max SDDs - delivering sensitivity when count rates are low and high capacity when count rates are high\nOur recent FeatureExpress upgrade – available to all users in AZtecLive 5.1 improves maximum particle analysis speeds from 30,000 particles per hour (pph) to in excess of 120,000 pph\n \nChoice of detectors to suit budget and needs\nUp to four detectors can be combined to deliver maximum throughput and sensitivity and eliminate shadowing of particles on rough samples\nCompatible with Ultim Max and Xplore detectors and certain legacy Oxford Instruments EDS detectors\nAZtec has 64-bit performance and is truly multi-tasking\nUp to 200,000 particles characterised on one sample\nReal-time detection, morphology and chemistry analysis\nOn-line or post acquisition elemental and phase analysis of particles\nParallel analysis and reporting during acquisition\n \nAccurate\nAZtecFeature incorporates Tru-Q technology to provide unparalleled elemental identification and quantitative analysis without requiring user intervention, making it the ideal system for unattended data collection\nUnique pulse pile-up correction ensures accurate quantitative analysis even at the highest count rates\n \nEasy to Use\nEven for new samples, results are obtained in seconds - there’s no need for laborious setup procedures\nMorphological and chemical measurements are acquired automatically and are easily incorporated into particle classification schemes\nThe complete system setup can be stored as a recipe and recalled at a later date\t++trans_enable_javascript\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Fast, Accurate & Smart\",\"content\": !jsonEncode? &input=` Fast, Accurate & Smart Particle Analysis: AZtecFeature is as automated as possible...as flexible as needed Data in seconds\nAutomated feature and particle analysis has never been so easy! Basic particle sizing is available immediately: click on one particle and others in a similar grey level will be automatically detected and their morphology displayed.\nReal-time calculation of morphological parameters\nParticle size, shape, aspect ratio... are shown instantly\nManually fine-tune particle detection by adjusting thresholds and adding image filters for noise reduction, particle separation etc.\t++trans_enable_javascript\n \nFully Integrated\nAs AZtecFeature is fully integrated with the rest of the AZtec Suite; adding chemical data could not be easier...\nAcquire an EDS spectrum for each particle automatically\nUse existing settings in the AZtec user profile for spectrum processing\nGenerate the right result using Tru-Q® algorithms\nStart building a classification scheme at the click of a button\n \nEasily move from single field to large area analysis \nGoing from single field analysis to acquiring data over a large area of a specimen or even several specimens is easy:\nA wizard guides users through the setting up of areas and samples\nAreas can be stored and recalled for later use\nFor each sample, up to 200,000 particles over thousands of fields of view can be analysed automatically\nThe system fully automates the stage movement, image acquisition and EDS acquisition and stitches the acquired data together into a single large area. Individual fields are automatically shown in a montaged view during acquisition\nSee the ‘big picture’ and zoom into details during acquisition\nRelocate to any field and acquire data for further analysis\nAutomatic system pause when a blown filament is detected (microscope dependent)\n \nReporting\nAs soon as data from a particle is acquired, it is added to a customisable list displaying morphological and compositional measurements and particle classifications.\nInteract with and interrogate the tabulated results while data acquisition is still in progress\nVisualise data in the form of histograms and summary reports can be generated directly into Microsoft Word\nFor further, more detailed analysis and plotting options, comprehensive data export into Microsoft Excel is available\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"Applications\",\"content\": !jsonEncode? &input=`\nParticle Analysis Applications: Informed decisions based on morphology and chemistry\n \nUnlike light-optical methods, AZtecFeature classifies particles and features not only by size and shape but also by their chemical composition, including any combination of these parameters.\nThe extra dimension provided by compositional analysis creates certainty as to the origin and impact of identified particles on materials properties or an industrial process. It opens up applications in R&D and industrial process control such as:\nTechnical cleanliness – identify of the source of contaminants in precision manufacturing processes in the electronics, semiconductor and automotive industries\nEngine wear analysis – monitor combustion engine health by analysing particles found in engine oil filters\nSteel cleanliness – analyse the nature and origin of non-metallic inclusions in metals and steels\nForensic analysis – detect and analyse trace evidence material in crime science and industrial forensics\nGeology and mineralogy – identify and measure phase compositions and textures in geological samples\nAir filter analysis – monitor air quality and pollution by analysing particles in air filters\nAsbestos - identify fibres in a sample by morphological analysis and confirm the type of asbestos present by chemistry\n... & many more...\n \nRare particle detection\nAZtecFeature is ideally suited to rapidly find rare features or particles of interest, solving so-called ‘needle in a haystack’ problems.\nBy processing the electron image, candidate features can be identified rapidly and their chemistry confirmed by EDS. This technique is widely used in crime forensics to identify gunshot residue and for identifying precious metals in ore samples. It can cut the analysis time from hours to minutes and free up the operator’s time.\nBig Data - Extract Feature Data from Existing Datasets\nAZtec offers the automated acquisition of large area X-ray maps which are used to reveal nanoscale features distributed over large areas. AZtecFeature is used to extract X-ray data from large area maps comprising tens of gigabytes of data. By intelligently combining the information from electron images and X-ray mapping data, AZtecFeature is an effective data mining tool to analyse large sets of analytical data.\nSearch large area mapping data for particular phases or inclusions\nPerform morphological measurements and classify the features found in these datasets\nQuantify grain sizes and shapes for compositionally inhomogeneous phases\nWork on previously acquired mapping data\n`},\"tab4\":{\"index\":\"4\",\"tabID\": \"4\",\"tabTitle\": \"Industry Specific Modules\",\"content\": !jsonEncode? &input=`\nApplication Specific Modules\n \nAutomated mineralogy - AZtecMineral\nThe most advanced and cost-effective automated mineralogy system on the market.\nAutomatically analyse grain mounts and polished rock sections\nCalculate mineral liberation, modal mineralogy and phase associations\nDirectly report phase compositions and compare to assay results\nUse dedicated setups for a range of different ore types\nFind out more here: AZtecMineral\nGunshot residue analysis - AZtecGSR\nThe GSR module adds dedicated setups for crime forensics and gunshot residue analysis. It enables particle classification and reporting according to ASTM 1588-20.\nClassification for all ammunition types\nReliable identification of gunshot residue particles\nStandard samples for system calibration and optimum repeatability\nFind out more here: AZtecGSR\n \nNon-Metallic Inclusions in Steel - AZtecSteel\nAnalyse inclusions in steels, tyre cords and powder metallurgy...\nDetermination of steel cleanliness according to a range of international standards\nIdentification and classification of complex inclusions, stringers and clusters\nComprehensive, automated report generation including statistical data on inclusion types, ternary phase diagrams and plots etc.\nFind out more here: AZtecSteel \n \nCleanliness in Battery Manufacture - AztecBattery \nAnalyse the powders used in the manufacture of Li-ion batteries for the presence of contaminants\nIdentify the contaminants by composition and morphology to aid in the process of determining sources and remedial actions\nEasily deployable across multiple sites – ensure consistent cleanliness standards throughout supply chains\nComprehensive, automated report generation including statistical data on inclusion types, ternary phase diagrams and plots etc.\nFind out more here: AZtecBattery \n \nTechnical Cleanliness in Automotive Manufacture - AZtecClean\nAnalyse technical cleanliness samples in automotive manufacture and report results to ISO16232 or VDA 19.\nIdentify particles by composition and morphology to aid in the process of determining sources and remedial actions\nEasily deployable across multiple sites – ensure consistent cleanliness standards throughout supply chains\nReport to industry relevant standards including ISO16232 and VDA19 and calculate component cleanliness codes in the software\nFind out more here: AZtecClean\n \nQuality Control for Additive Manufacturing Powders - AZtecAM\nAnalyse metal powders before and after use to maintain quality in your additive manufacturing.\nIdentify contaminants so that sources can be identified and fixed\nMonitor previously used powders to determine if they can be recycled again\nCombine with EBSD with Symmetry S2 to check the quality of finished components\nFind out more here: AZtecAM\n \nAdvanced characterisation\nThe integration of AZtecFeature with the other modules in the AZtec nanoanalysis suite enables seamless transitions between different techniques and sensors.\nFor example, if a particle or grain of specific interest is identified during an automated run, it can be relocated and an X-ray or EBSD map acquired in seconds. The advanced AZtec TruMap and TruPhase functionality correct for overlaps and background variations in EDS data and identify phases unambiguously by combining EBSD and EDS data. Alternatively, WDS can be used to determine trace element concentrations or to resolve complex overlaps. \nIntegration enables:\nAutomated pre-screening of samples with AZtecFeature\nSubsequent re-analysis of specific features using alternative techniques\nCombination of Feature analysis with:\nX-ray mapping\nTruMap - removes background and peak overlaps on the fly\nTruMap - removes background and peak overlaps on the fly\nDetailed spectrum analysis with interactive overlaps and element profiles\nFilm thickness (LayerProbe)\nEBSD analysis\nTruPhase - combines X-ray and EBSD for unambiguous phase identification\nWDS quantitative analysis\n`},\"tab5\":{\"index\":\"5\",\"tabID\": \"5\",\"tabTitle\": \"Hardware\",\"content\": !jsonEncode? &input=` A range of Silicon Drift Detectors (SDD) for particle analysis applications\nAZtecFeature works best with Oxford Instruments’ Ultim Max SDDs which come in a range of sizes to suit budget and application – 40 mm2 for basic microanalysis up to an astounding 170 mm2 for advanced nanoanalysis. \nA range of silicon drift detector sizes\nFrom 40 mm2 to 170 mm2\nThe same geometry inside the SEM means count rate increases in proportion to sensor size\n \nAll Ultim Max detectors provide:\nThe best low energy performance – all detectors clearly resolve Be\nThe same excellent resolution, guaranteed on your microscope\nThe same physical geometry, so existing systems can be easily upgraded\n \nUsing a larger sensor means:\nUsable count rates at lower currents\nMaximising imaging performance and accuracy enabling the detection of sub-micron particles and nanoparticles\nSignificantly higher count rates at the same beam current\nShorter acquisition times and better statistical confidence\nPractical analysis with small beam diameters, maximising spatial resolution\nFor applications that do not demand the full Ultim Max performance, Xplore is available. It is a fully quantitative 10 mm2 SDD with excellent performance at low and high count rates.\nMultiple detector systems\nWhen used in automated process control, adding one or more extra detectors can significantly enhance the sample throughput.\nFor challenging applications, where very small particles or particles on beam sensitive substrates are being analysed, traditional, high energy (e.g. 20kV) analysis may not be an option. In such cases multiple detectors can provide an effective solution to enhance the collection efficiency so that particle detection can progress rapidly. For samples where particle size varies significantly, shadowing of smaller particles by larger particles can be a significant issue when only one detector is used. Having at least two detectors mounted on opposing ports can overcome these shadowing effects.\nUp to four Ultim Max can run in parallel on one microscope to create a system with a total active area of 680 mm2\nMultiple detectors enable the analysis of:\nNanoscale particles at low kV where the highest solid angle is required\nParticles on beam sensitive substrates (e.g. filters, resins etc)\nSamples of particles with varying size where shadowing of smaller particles is an issue (see the image at the top of this page).\n \nA multiple detector system not only achieves faster sample throughput, it also reduces the effect of shadowing.\n`},\"tab6\":{\"index\":\"6\",\"tabID\": \"6\",\"tabTitle\": \"Library\",\"content\": !jsonEncode? &input=` Brochure: AZtecFeature\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`16587`\n` Flyer: AZtecAM\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`4655`\n` Flyer: AZtecBattery\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`6422`\n` Flyer: AZtecClean\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`3002`\n` Flyer: AZtecGSR\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`7733`\n` Flyer: AZtecMineral\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`5206`\n` Flyer: AZtecSteel\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`3743`\n`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nVideo AZtecFeature: Feature Express\nAZtecFeature automates investigations of particle samples. In this short video, we demonstrate how recent innovations have greatly increased the speed of analysis and how, by using smart functionalities and algorithms, AZtecFeature is the fastest, smartest and most accurate particle analysis platform for SEM. \nApprox View time: 5 minutes\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nApplication notes !If? &subject=`` &operator=`notempty` &then=`` &else=`` Taking Advantage of the H5OINA file format Using Python\nThis application note explains to new users how to set up their tools to extract data from the H5OINA file using one of the more popular programming languages among scientists, Python. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Morphology Characterisation and Contamination Detection in Additive Manufacturing Powders with AZtecAM\nThis application note considers the use of AZtecAM, an automated system developed specifically for the rapid analysis and classification of AM powders, using an energy dispersive X-ray spectrometry (EDS) system in the scanning electron microscope (SEM). for the routine characterisation of gas atomised high-purity copper powders. It demonstrates how particles across the population can be assessed and how contamination can be easily detected and classified. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Contamination Investigation on PCBs\nThis application note demonstrates a SEM based solution combined with EDS for the detection and characterisation of contamination on two PCB samples in the analysis of the failures of PCBs. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Monitoring the Composition of NCM cathodes in Li-ion Batteries\nOptimising and controlling the cathode material is one of the important areas for current Li-ion battery technology. This application note demonstrates a simple and automated method which does not rely on operator expertise - using a Scanning Electron Microscope (SEM) equipped with Energy Dispersive X-ray Spectroscopy (EDS) to determine the composition of powder particles used for Li-ion battery cathodes. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Automated Analysis of Sections of Geological Materials\nThe manual characterisation of cut sections of geological materials can be a laborious, time consuming process which can be very subjective. AZtecFeature, used in conjunction with large area X MaxN SDDs can automate this process enabling complex mineralogies to be characterised quickly and accurately. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtec Gunshot Residue Analysis\nGunshot residue (GSR) is produced from the condensation of the vapour cloud which is generated from the primer and propellant when a bullet is fired from a gun. The condensing vapour from the primer will form particles which are typically spherical and range from potentially less than 0.5 μm up to significantly larger sizes... !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Particle & Feature Analysis with AZtecFeature\nHere we consider AZtecFeature in the context of engine wear monitoring, geology and air cleanliness and pollution. We discuss how key improvements in AZtecFeature in combination with recent advances in EDS detector hardware make it a compelling proposition for a much wider group of researchers and practitioners in industry and academia.\n \n !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Steel Cleanliness Analysis to International Standards with AZtecSteel\nThis application note demonstrates how AZtecSteel, an industry-leading, dedicated particle analysis solution for the analysis of non-metallic inclusions can characterise inclusions in different types of steels to the requirements of multiple international standards.\n !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`12901`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` The Analysis and Classification of non-metallic inclusions in Steels with AZtecSteel\nHere we consider the use of SEM equipped with EDS and dedicated particle analysis software AZtecSteel for the complete characterisation of 5 steels. We demonstrate how inclusions across the population can be assessed and how they can be classified across the sample.\n !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`6365`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Particle Analysis on Table Top Scanning Electron Microscopes\nParticles in powder samples come in all shapes, sizes and compositions, and the requirements for their analysis and characterisation can be just as varied. Particle analysis tasks may require only morphological measurements from a single field of view or could require the combination of morphological and chemical data from many thousands of particles from a large sample area. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`11495`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtecFeature\nAZtecFeature is an innovative system for particle analysis in the SEM. It is specifically optimised for usability and high-speed throughput. This 12 page brochure gives an overview of the system. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`2147`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Identifying contaminants in Li-Ion battery production using AZtecFeature\nLithium Ion batteries are found in most mobile electronic devices (e.g. laptop computers, phones etc). They are the dominant battery technology due to their superior energy to weight ratio and lack of memory effect. They are also the primary battery type used in the latest generation of electric and hybrid cars. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`12198`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` SEM based analysis of Lithium ion battery materials\nNew and existing materials for lithium ion batteries are being studied extensively with the aim of increasing their storage capacity and lifetime. While the SEM is an important tool in the study of these materials, characterising the distribution of Li still remains one of the main challenges. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`13091`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Technical Cleanliness in the Manufacture of Ball Bearings\nThe technical cleanliness of components is crucial to their performance in finished products. As such, the assessment of the level of cleanliness of components is applicable in a wide range of industries, e.g. any involving the manufacture of mechanical devices such as the automotive industry. A typical example of such a component is ball bearings which are at the heart of almost every product with a rotating shaft. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Fast Characterisation of Minerals with Similar Crystal Structures\nCombining electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) techniques for geological sample characterisation, helps to unlock even more information on the likely formation and history of the sample. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` From Mine to Manufacture\nLi-ion batteries have been a key enabling technology over the last decade and are vital to further developments of EVs (Electrical Vehicles). Controlling the cleanliness of the raw materials is critical for ensuring the safety of the batteries. Automated analysis makes it fast and easy to identify contaminants and where the contaminants are being introduced. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` The Application of Recent Developments in EDS Hardware and Software to Process Mineralogy\nImprovements in Energy Dispersive X-ray Spectroscopy (EDS) hardware (detector and pulse processing electronics) and software over the last decade have delivered many advances in terms of data quality, acquisition speed and ease of use. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`8151`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` The Complete Characterisation of Additive Manufacturing Powders with AZtecAM\nInvestigate the streamlined process through the dedicated AZtecAM software recipe, for complete characterisation of all aspects of metal powders used in additive manufacturing. Ensure the characterisation, particle morphology and individual particle characterisation. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Automoted Analysis of Suspected Asbestos Fibres\nThe automated analysis of asbestos by scanning electron microscope (SEM) and energy dispersive X-ray spectrometry (EDS) is a powerful technique that enables the quantity, composition, and morphology of suspected asbestos fibres to be quickly measured. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Quantifying Metal Cleanliness - boride and nitride non-metallic inclusions\nIn the past, characterising non-metallic inclusions and precipitates in steels and other alloys, especially for light elements such as boron, has presented a challenge. However, AZtecFeature, in combination with a high solid angle windowless EDS detector such as X-Max Extreme and a conventional large area detector provides exciting, novel capabilities. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`4446`\n`\n`}}` Customer Publications Powered by Bioz See more details on Bioz Get in touch!\n!If? &subject=`Yes` &operator=`notempty` &then=``\n!renderForm? &form=`75`&formTpl=`standard-form-wrapper` &unique_id=`9600`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`Yes` &operator=`notempty` &then=``",
"outline" : "AZtecFeature is the world-leading particle analysis solution for SEM. Using a combination of smart approaches, our latest release includes our FeatureExpress upgrade to combine the highest levels of throughput with accuracy; giving the high-quality results that analysts need in a wide range of particle analysis applications.",
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"image":"/assets/components/phpthumbof/cache/AZtecFlex_profile.c437ecf07b2b3c998e509ab5968f50ef.jpg",
"content" : "Overview\nWhat's Included\nLicence Info\nStudent Discount\nHow to Buy\nFAQs\nApplications\nContact !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=` Flexibility for you. Productivity for your facility.\nAZtecFlex is a 12-month personal subscription licence for installation on your desktop or laptop, designed to let you use AZtec anywhere and without needing to access shared facilities. \nAZtecFlex includes advanced data processing features, for example, particle analysis and EBSD data processing, allowing you to access them even if they aren’t enabled on the system used to acquire the data. Your licence will also provide access to the latest AZtec release as soon as it is available.\n \nAnalyse data away from the lab\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Process data when you want, where you want, and without time pressures, ensuring that you get the best results out of every dataset`&else=`Process data when you want, where you want, and without time pressures, ensuring that you get the best results out of every dataset` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Spend less time at the microscope. This will help to optimise microscope usage and allows other users to start acquiring new data sooner`&else=`Spend less time at the microscope. This will help to optimise microscope usage and allows other users to start acquiring new data sooner` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Maximise collaborations by being able to open, analyse and process data that has been collected at a distant facility`&else=`Maximise collaborations by being able to open, analyse and process data that has been collected at a distant facility`\nGet the latest functionality for your needs\nEDS & WDS\n!If?&subject=`1`&operator=`eq`&operand=`1`&then=`This package offers you the latest AZtec versions as soon as they are released for the duration of your subscription`&else=`This package offers you the latest AZtec versions as soon as they are released for the duration of your subscription` !If?&subject=`1`&operator=`eq`&operand=`1`&then=`Test out advanced functions on your data, including AZtecFeature and AZtecLayerProbe `&else=`Test out advanced functions on your data, including AZtecFeature and AZtecLayerProbe ` !If?&subject=`1`&operator=`eq`&operand=`1`&then=`Analyse and process your data away from the lab`&else=`Analyse and process your data away from the lab`\nEDS, WDS & EBSD\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`This package offers you the compete solution for EBSD data analysis and processing with AZtec HKL, AZtecCrystal and AZtecCrystalAdvanced included`&else=`This package offers you the compete solution for EBSD data analysis and processing with AZtec HKL, AZtecCrystal and AZtecCrystalAdvanced included` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Also included are the full range of options available in the EDS & WDS option`&else=`Also included are the full range of options available in the EDS & WDS option`\nOptimise your time\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Plan experiments before you get to the microscope`&else=`Plan experiments before you get to the microscope` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Familiarise yourself with acquisition workflows`&else=`Familiarise yourself with acquisition workflows` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Use spectrum simulator to optimise conditions for sample analysis`&else=`Use spectrum simulator to optimise conditions for sample analysis`\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"What's Included\",\"content\": !jsonEncode? &input=` Two version of AZtecFlex are available; the first package is designed for users of our EDS and WDS detectors, the second package is intended for user who also have an EBSD detector. We also offer a discounted version for students, which has the full functionality (EDS, WDS & EBSD analysis).\n +cellEDS & WDSEDS, WDS & EBSDView and process previously acquired SEM and TEM EDS data:\n•\tPoint Analysis\n•\tLine scans\n•\tMaps\n•\tTruMap\n•\tQuant maps✔✔Generate reports and export data✔✔Create and export layered images and maps✔✔Batch Processing, process multiple sites using the same settings✔✔Batch export, export data from multiple sites in a single process✔✔Large Area Maps (LAM):\n•\tOpen LAM files\n•\tPerform alignments and image stitching of acquired LAM files✔✔View and process data acquired by AZtecWave (WDS datasets)✔✔AZtec Feature:\n•\tOpen full data sets acquired with feature\n•\tProcess individual images using feature✔✔AZtecFeature Application specific addon packages:\n•\tAZtecAM\n•\tAZtecBattery\n•\tAZtecClean\n•\tAZtecGSR AZtecMineral\n•\tAZtecPharma\n•\tAZtecSteel✘✘AZtec LayerProbe & spectrum simulator✔✔AZtecHKL:\n•\tOpen EBSD data AZtec\n•\tExport data to AZtec Crystal\n•\tReprocess data with stored patterns*✘✔AZtecCrystal:\n•\tFlexible EBSD map creation\n•\tGrain size measurement\n•\tTexture analyses using pole figures\n•\tComprehensive boundary analysis\n•\tSEM image – EBSD map correlation✘✔AZtecCrystal advanced:\n•\tAdvanced texture analysis using ODFs\n•\tParent Grain Reconstruction\n•\tAdvanced phase classification tool\n•\tElastic properties calculation and display✘✔\n*only libraries not dependant on third party licenced data bases are included.\n \n \n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"Licence Info\",\"content\": !jsonEncode? &input=` Terms, Condtions & System Requirements\nLicence Information\nAZtecFlex is an individual time limited licence that is locked to a single PC, it is not provided for shared\/facility computers. The licence is activated online and by default is locked to the computer used for activation. Where the target computer does not have an internet connection there is an alternative activation process available. The licence is non-transferable. In the event of a computer failure please contact technical support to move\/recover the licence to a new computer.\nAZtecFlex licences are specifically designed to process data acquired previously or to plan experiments. AZtecFlex will not work when connected to a microscope and cannot be used to acquire new data with our detectors.\nA valid licence entitles the user to download the current version of AZtecFlex, which includes any new versions released during the subscription period. The updated versions will include improvements to existing functionality but will not include any new functions that were not in the original release.\nIf you instead require a perpetual licence for working away from the microscope, for a shared facility, or you are looking to purchase a software upgrade for your acquisition system then please contact our sales team (request a quote here). The functionality of these perpetual licences will be linked to a microscope system.\n \nDownload full instructions here\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`663` &formTpl=`protected-form-wrapper` &unique_id=`546312`\n`\nSystem Requirements\nAZtec is designed to run on relatively low specification computers, however, the PC requirements will vary depending on the AZtec processes being utilised. The minimum specification will perform all but the most demanding tasks. The recommended specification below will handle all applications available in the software.\nMinimum specification:\n \n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`CPU: 4 threads running at 2.2Ghz`&else=`CPU: 4 threads running at 2.2Ghz` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`RAM: 8Gb*`&else=`RAM: 8Gb*` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Diskspace: Install requires 8 Gb of free disk space`&else=`Diskspace: Install requires 8 Gb of free disk space` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Operating System: Windows 10 64-bit`&else=`Operating System: Windows 10 64-bit` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Internet connection for activation (licence can be activated on a separate PC)`&else=`Internet connection for activation (licence can be activated on a separate PC)`\n*16Gb is required for large projects or computationally intense processes such as AZtecCrystal, large area mapping or Feature, below this will cause these operations to run slowly or fail.\n \nRecommended:\n \n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`CPU: 8 Cores running at 3.0 Ghz`&else=`CPU: 8 Cores running at 3.0 Ghz` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`RAM: 32Gb`&else=`RAM: 32Gb` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Diskspace: 8 Gb of free disk space with project data and AZtec installed on a high speed (NVME SSD) drive`&else=`Diskspace: 8 Gb of free disk space with project data and AZtec installed on a high speed (NVME SSD) drive` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Operating System: Windows 10 Pro 64-bit`&else=`Operating System: Windows 10 Pro 64-bit` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Internet connection for activation (licence can be activated on a separate PC)`&else=`Internet connection for activation (licence can be activated on a separate PC)`\nAZtec projects have significant variability and requirements change dramatically with the application. While AZtec will run on the minimum spec and below, the usability will decrease accordingly. General advice on PC specification is:\n \n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`CPU: AZtec is optimised for multi core processors and will use the cores available, increased core count will improve performance`&else=`CPU: AZtec is optimised for multi core processors and will use the cores available, increased core count will improve performance` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`RAM: AZtec will utilise all the avaiable RAM, if required for the project. For most projects 16Gb is sufficient, unless looking at exceptionally large datasets`&else=`RAM: AZtec will utilise all the avaiable RAM, if required for the project. For most projects 16Gb is sufficient, unless looking at exceptionally large datasets` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Disk space: while most of the processing is performed with the data stored in RAM, the reading\/writing of data to RAM is limited by the disk speed, fast storage will improve performance, more significant for larger datasets`&else=`Disk space: while most of the processing is performed with the data stored in RAM, the reading\/writing of data to RAM is limited by the disk speed, fast storage will improve performance, more significant for larger datasets` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Operating system: Current releases of AZtec are tested with Windows 10 Pro 64-bit PC’s. AZtec will only work on a 64-bit OS and is not tested on historic versions of Windows. AZtec is not designed to work on other operating systems`&else=`Operating system: Current releases of AZtec are tested with Windows 10 Pro 64-bit PC’s. AZtec will only work on a 64-bit OS and is not tested on historic versions of Windows. AZtec is not designed to work on other operating systems`\n`},\"tab4\":{\"index\":\"4\",\"tabID\": \"4\",\"tabTitle\": \"Student Discount\",\"content\": !jsonEncode? &input=` Students are the researchers and industry leaders of the future, and we believe they should have access to our software. To support this, we offer a discounted version of AZtecFlex for verified students. The student version includes the full functionality of the elemental and crystallographic package.\nTo recieve your student discount, follow the steps below:\nSend verification of student status to ecommerceteam@estore.oxinst.com\nYou will receive a promotional code via email (ID is manually checked and replies may not be immediate)\n Add the AZtecFlex student licence to your cart by clicking “Add to cart”\nYou will automatically be taken to your shopping cart\nClick on “Enter a Promotion Code” in your order summary\nAdd the promotional code and click APPLY\n Your product should now be showing the correct student price\nYou can checkout as a guest if you do not know your institutions TAX number\nShipping cost is removed further along in the checkout process\n \nStudents can be verified by providing proof of eligibility by email at the point of purchase (such as a letter of enrolment, student i.d. card, signed letter from an academic supervisor or other official documentation). This is intended for students in full or part-time education and should not be used for commercial use (students funded by industry are eligible).\nIn exchange for the discount, we ask that students:\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Acknowledge the use of AZtecFlex when presenting\/publishing results`&else=`Acknowledge the use of AZtecFlex when presenting\/publishing results` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Provide usage statistics to help us understand our customer needs`&else=`Provide usage statistics to help us understand our customer needs`\nUsage statistics do not include end user details or personal information\nUsage statistics do not include details of the data been processed\nUsage statistics do not include end user details or personal information\n \n`},\"tab5\":{\"index\":\"5\",\"tabID\": \"5\",\"tabTitle\": \"How to Buy\",\"content\": !jsonEncode? &input=` AZtecFlex can be purchased from our e-stores by following the links below. If the e-store is not available in your region, please get in touch with us here. For online purchasing, delivery time will vary depending on local rules and required export checks applicable to your region.\nUS & Canada\nAsia Pacific\nUnited Kingdom\nJapan\nEurope\nChina Mainland Can't find your region? Get in touch with us here.\nGet in touch\n`},\"tab6\":{\"index\":\"6\",\"tabID\": \"6\",\"tabTitle\": \"FAQs\",\"content\": !jsonEncode? &input=` Q: How many PC’s Can I install on? A: 1 per licence. The licence of AZtecFlex is locked to the PC it was activated on.\n Q: What is the PC requirement for AZtec? A: Find out here.\n Q: How long does student verification take A: Up to 5 working days\n Q: How long does delivery take? A: AZtecFlex is delivered digitally, in regions with access to an e-store this process is automated. Regional differences mean that some of the control checks may take a few hours. You should receive your digital software activation key within 24 hours (please leave at least this long before contacting support). Orders process via the sales team can take up to 5 working days to be processed, but usually less. Q: How is AZtecFlex different to AZtec? A: AZtecFlex licences are specifically designed to process data acquired previously and will not work when connected to a microscope.\n Q: What languages does AZtec support? A: The current languages in the AZtec user interface are:\nEnglish\nFrench\nGerman\nRussian\nChinese Simplified\nChinese Traditional\nJapenese\nKorean\nBrazilian\nSpanish\nItalian\n Q: The computer I want to install on is not connected to the internet, can I still use AZtecFlex? A: Yes, you can activate the licence on a different PC connected to the internet. The activation process will require you to enter hardware information of the PC you intended use AZtecFlex on, this will lock the licence to that PC.\n Q: Will AZtecFlex work on a Mac? A: No AZtecFlex will only work with Windows 10 operating systems.\n Q: I don’t see the answer I am looking for? A: Please leave a message in the webchat with your contact details or fill out the contact form here and we will get in touch with you.\n Q: Why is tax excluded from the product price A: Our e-stores cover multiple regions with variable tax rates and rules, the correct sales tax will be calculated at checkout based on your location.\n Q: Why is a shipping fee showing? A: No shipping is charged for AZtecFlex, a shipping fee may show with the product in the basket, but the correct amount (0) is calculated at the checkout page, along with local sales taxes. \n Q: What if I don’t know my TAX code or EORI number? A: If you are purchasing as an individual, you can checkout as a guest where these numbers are not required to proceed. If you are purchasing as a business or procurement team, or you need to adjust your tax rating, you will need these numbers in order to issue a correct invoice. We are not able to correct the invoices after order completion. Q: How do I receive my licence? A: Your order confirmation, invoice and product licence key will be sent to the email address you provide during the order process. The email containing your product licence key will also contain a download link for AZtec and a link to details of how to activate your licence. Q: Can I order multiple licences? A: You can currently only order one licence per transaction. There is no restriction on how many transactions you make. Student discount codes will only work for one transaction. Q: Is MapSweeper available with AZtecFlex? MapSweeper is not available with AZtecFlex and cannot be added to an AZtecFlex licence. You will need to speak to our sales team to get a quote for MapSweeper.\n`}}` Applications\nTruMap\nTruMap deconvolutes overlapping peaks and removes background accounting for the elements present, to produce true elemental maps. This becomes even more important when mapping at low KeV, where the number of available peaks is limited. \nThis map is acquired at 3 keV and resolves sub 20 nm features. The tungsten (W) Ma peak at 1.774 keV overlaps with a silicon (Si) ka peak at 1.740 keV. Maps with a standard energy window show a W distribution which is a combination of both W and Si signals. TruMap deconvolutes the peaks to give an accurate W map. The presence of the heavy element (W) increases the background signal, even without an overlap. This can create a shadow map, as seen in the copper signal. TruMap accounts for the change in background and adjusts the map display accordingly.\n \n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nAZtecCrystal\nAZtecCrystal is a modern, comprehensive EBSD data analysis software package designed to blend ease of use for relative newcomers to EBSD with an array of advanced tools for expert users. The software has been designed to handle the exceptionally large EBSD datasets that are now commonplace with our latest, high-speed CMOS-based EBSD detectors.\nAZtecCrystal will allow you to perform all of the routine analyses that are necessary when processing EBSD datasets, including the creation of maps, analyses of crystallographic texture, examination of grain boundary properties and a comprehensive range of grain measurement tools. In addition, advanced functionality includes the calculation of elastic properties from grain orientation data, advanced phase classification \/ discrimination and the rapid reconstruction of parent grain microstructures in systems that have undergone displacive phase transformations.\nAZtecCrystal is the ideal software for any user wishing to rapidly and effectively process and interrogate their EBSD data.\n \n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nAZtecFeature\nAZtecFeature is a particle analysis platform that automates the detection, morphological measurement, compositional analysis and classification of particle\/granular\/inclusion samples. By measuring both composition and morphological information on a particle by particle basis, AZtecFeature allows you to interpret your data in real time with powerful and easy to create classification schemes and data review plots.\nAll of the automatically acquired data in AZtecFeature is processed with AZtec’s Tru-Q® algorithms to ensure reliability and accuracy in the identification and quantification of elements in your samples – ensuring you get the right results each time.\n \n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nAZtecLayerProbe\nAztecLayerProbe is a tool for the characterisation of layered thin film structures in the SEM. Working with layer stacks up to 2μm thick, LayerProbe is able to calculate, from an EDS analysis, layer thickness and composition. With proven accuracy across multiple critical applications including electronic devices, material coatings, energy devices and many more, LayerProbe is the ideal tool for both research and routine non-destructive analysis of layered samples – down to a nanometer scale.\n Get in Touch\n!If? &subject=`Yes` &operator=`notempty` &then=``\n!renderForm? &form=`75`&formTpl=`standard-form-wrapper` &unique_id=`71700`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`Yes` &operator=`notempty` &then=``",
"outline" : "The full power of AZtec as a personal copy giving you a comprehensive suite of features. For Anyone, Anywhere at Anytime.\r\n ",
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"highlights" : " Flexibility to open and process your data whenever and wherever you want<\/p>, Data processing for EDS, WDS and EBSD<\/p>, Try out advanced software features<\/p>, Stay up to date with the latest version of AZtec<\/p>",
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"content" : "!generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"overview\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=`\nAZtecGSR is a dedicated tool for the detection and analysis of gunshot residue (GSR) particles in the SEM. AZtecGSR is a tailored version of the AZtecFeature particle analysis platform, sitting within the AZtecLive NanoAnalysis suite, and which is fully optimised for GSR analysis including classification and reporting to the 2016, 2017, 2020 and 2025 versions of ASTM-E1588 standard.\nDesigned for analysis according to industry best practice guidelines, AZtecGSR uses a workflow-based approach to guide both expert and novice users through GSR analysis, with in-interface instructions to provide additional guidance. It also includes a series of advanced functionalities designed to assist in dealing with the very small particles that are often found in GSR analysis, as well as approaches for improving throughput and efficiently running a large number of samples.\nAZtecGSR uses Oxford Instruments’ Ultim Max Infinity or Xplore EDS detectors in combination with AZtecLive’s TruQ-IQ algorithms to ensure accurate element identification and quantification, even at the highest levels of throughput.\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"Features\",\"tabTitle\": \"Features\",\"content\": !jsonEncode? &input=` Customised for GSR\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Optimised analytical recipe for GSR analysis`&else=`Optimised analytical recipe for GSR analysis` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Classify to ASTM-E1588 16, 17, 20 & 25`&else=`Classify to ASTM-E1588 16, 17, 20 & 25` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Includes a classification scheme that indicates which brand of ammunition may have been used`&else=`Includes a classification scheme that indicates which brand of ammunition may have been used` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Manual and automatic reacquisition modes`&else=`Manual and automatic reacquisition modes` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Confirmation routine for reacquired particles`&else=`Confirmation routine for reacquired particles` Flexible\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Add new classifications for new ammunitions`&else=`Add new classifications for new ammunitions` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Option to automatically acquire additional data from particles containing key elements`&else=`Option to automatically acquire additional data from particles containing key elements` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Terminate analyses automatically when sufficient evidence has been acquired`&else=`Terminate analyses automatically when sufficient evidence has been acquired` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Works with a wide range of SEMs`&else=`Works with a wide range of SEMs` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Use the same software platform to analyse with other techniques (e.g. EBSD).`&else=`Use the same software platform to analyse with other techniques (e.g. EBSD).`\nFast\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Analysis rates > 120,000 particles per hour (dependent on hardware configuration)`&else=`Analysis rates > 120,000 particles per hour (dependent on hardware configuration)` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Combine up to 4 Ultim Max Infinity detectors for the ultimate in throughput`&else=`Combine up to 4 Ultim Max Infinity detectors for the ultimate in throughput` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Simultaneously manage multiple analysis runs`&else=`Simultaneously manage multiple analysis runs`\nCertainty\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`2-pass imaging for small particle accuracy without compromising speed`&else=`2-pass imaging for small particle accuracy without compromising speed` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Routinely used globally to detect 100% of particles on PLANO and ENFSI test samples`&else=`Routinely used globally to detect 100% of particles on PLANO and ENFSI test samples` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Image calibration sample and software ensure particles are detected the same way every run`&else=`Image calibration sample and software ensure particles are detected the same way every run` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Automatically compensate for changes to image contrast\/brightness in-run`&else=`Automatically compensate for changes to image contrast\/brightness in-run`\n*Run progress over multiple fields in an automated GSR analysis (video speed increased).\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"Library\",\"tabTitle\": \"Library\",\"content\": !jsonEncode? &input=` Applications !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtecGSR\nAZtecGSR automates the analysis of Gunshot Residue Analysis in the SEM to provide fast, accurate and reproducible results to ASTM E1588 - 16 & 17. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`3306`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtec Gunshot Residue Analysis\nThis four page application note illustrates how Gunshot Residue Analysis is performed in AZtec. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Light Element Particle Analysis - GSR from heavy metal free primers\nThe combination of Ultim® Extreme and AZtecGSR enables the automated detection of particles containing light elements such as boron at very short acquisition times. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`5947`\n` Discover more Applications here\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Blog !If? &subject=`https:\/\/nano.oxinst.com\/library\/past-blogss\/manual-particle-reacquisition-gsr` &operator=`notempty` &then=`` &else =`` Dec 18 !If? &subject=`Manual Particle Reacquisition: an application example for Gunshot Residue` &operator=`notempty` &then=`Manual Particle Reacquisition: an application example for Gunshot Residue` !If? &subject=`\/assets\/uploads\/products\/nanoanalysis\/images\/Blog\/gsr_1.jpg` &operator=`notempty` &then=`` !If? &subject=`!If? &subject=`0` &operator=`eq` &operand=`0` &then=`` &else=`\n`` &operator=`notempty` &then=` !If? &subject=`0` &operator=`eq` &operand=`0` &then=`` &else=`\n` !If? &subject=`https:\/\/nano.oxinst.com\/library\/past-blogss\/manual-particle-reacquisition-gsr` &operator=`notempty` &then=` >`\n`\n!If? &subject=`https:\/\/nano.oxinst.com\/library\/past-blogss\/manual-particle-reacquisition-gsr` &operator=`notempty` &then=`` &else =``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\n`},\"tab4\":{\"index\":\"4\",\"tabID\": \"Videos\",\"tabTitle\": \"Videos\",\"content\": !jsonEncode? &input=` AZtecGSR Training Video This video shows the ease of use of AZtecGSR, explaining the workflow that is followed from initial setup to a complete large area analysis\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Webinar\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` SEM-based Analysis in Forensics - GSR and Beyond\nIn this webinar we will discuss how a broad range of forensic trace evidence analyses can be performed in a scanning electron microscope (SEM) equipped with analytical systems. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nWatch on demand\n`}}`",
"outline" : "Gunshot Residue (GSR) is a key piece of forensic evidence that is often critical to ensuring justice in some of the most serious crimes. AZtecGSR provides fast, accurate, and easy to use SEM-based GSR analysis for the forensic analyst.\r\nAZtecGSR provides analysts with:\r\n\r\n Particle analysis optimised for GSR\r\n Accurate element identification with AZtec’s TruQ-IQ® algorithms\r\n Automatic data collection and particle classification according to ASTM-E1588 16, 17, 20 & 25\r\n Manual and automated particle reacquisition workflows\r\n",
"outline_limited" : "Gunshot Residue (GSR) is a key piece of forensic evidence that is often critical to ensuring justice in some of the most serious crimes. AZtecGSR provides fast, accurate, and easy...",
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"content" : "Usability Features\nLibrary\nContact us !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Usability Features\",\"content\": !jsonEncode? &input=` Whether you are a newcomer or an expert user, setting up for a stable, drift-free acquisition, to re-locating points of interest in a previously analysed sample - to getting your report out to those waiting for it is made as quick and as easy as possible...\nSome of the advanced AZtec features in this section: Autolock - automatic drift correction Image registration using AZtec acquired images for specimen navigation and relocation Guided and custom operating modes Step notes and Standard Operating Procedures Reporting\nAutolock provides a seamlessly integrated and powerful solution for drift correction. Works in extreme situations, even on the nanoscale Keeps you informed about specimen drift Provides live updates of corrective action taken A unique blend of predictive and reactive drift correction routines cope with different types of specimen drift\nGuided and Custom operation modes to suit newcomers and experts\nGuided ModeIdeal for those who prefer a ‘step by step’ approach to analysisEach step of the Navigator has a clear purposeYou can always see what is happening and what to do nextCustom ModeIdeal for those who prefer the freedom and flexibility to do what they want, when they wantYou decide what functionality you want to see and where you want to see itChoose the visualisations that suit your task and expand them over as many monitors as you need\nStep Notes are available on every Navigator step to help you get the most from AZtec in the quickest time possibleHelp precisely where you need itEasy to follow text and images ensure that you know exactly what to do nextStep Notes can be easily turned into Standard Operating Procedures (SOPs)Define on-screen SOPs using text and imagesBy following an SOP, novice staff can be productive from the start, and achieve repeatable and reliable results every time\nIntegrated Reporting - flexible or structured, always fast\nFastReporting direct from the interfaceA simple right click and data can be e-mailed directly to your customer\nFlexibleDedicated export applicationExport your data in the format and resolution you want\nStructuredPrint a professional report with a single button pressComprehensive list of report templates tailored to each applicationA dedicated ‘Site Report’ will print out all data acquired during a specimen investigationCustomise reports to incorporate your company logo\nWant to create your own templates? AZtec’s new integrated report template generator allows you to do just that! Simple easy to use interface Create templates for use across multiple techniques Create multiple page templates Create templates for single or multiple users\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Library\",\"content\": !jsonEncode? &input=` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Brochure: AZtecLive & Ultim Max\nAZtecLive takes the EDS technique from the static to the dynamic with real-time chemical imaging. AZtecLive is powered by Ultim Max, the next generation SDD detectors combining the largest sensor sizes with Extreme electronics to deliver unparalleled speed and sensitivity. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`3857`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` App Note: AZtecLive In Depth: Tru-Q\nThis application note describes the unique approach and technology used in AZtecLive EDS systems to provide automatic real-time element identification and composition determination !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`5301`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` App Note: AZtecLive In Depth: TruMap\nThis application note shows how TruMap displays in real-time the real variations of elements in a sample. It describes how minor element variations in a refractory oxide containing slag sample created during clean steel manufacture can be studied. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`13623`\n`\n`}}` Get in touch\n!If? &subject=`Yes` &operator=`notempty` &then=``\n!renderForm? &form=`75`&formTpl=`standard-form-wrapper` &unique_id=`24900`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`Yes` &operator=`notempty` &then=``",
"outline" : "The combination of Guided mode navigators and editable step notes aids the inexperienced or process driven user to get the correct results quickly. And for those users who prefer to work their own way, there is custom mode with its modular approach to analysis.",
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"sorting_name":"aztecliveone",
"image":"/assets/components/phpthumbof/cache/500x500%20xplore%20product%20image.594126b49c4b6752d7ded60afc11ff15.png",
"content" : "Download Centre !If? &subject=`` &operator=`notempty` &then=`` &else=`` Xplore & AZtecLiveOne\nBringing you power with simplicity. The combination of the market-leading AZtecLive EDS software with the compact Xplore 30 EDS detector delivers a system solution for your entry-level SEM requirements. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`1710`\n`",
"outline" : "AZtecLiveOne software platform is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible. No need for substantial training or advanced knowledge of the EDS technique. Users can be trained in a matter of minutes and will have complete confidence in their results.",
"outline_limited" : "AZtecLiveOne software platform is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible. No need for substantial training or advanced...",
"highlights" : "Easy and intuitive,Accurate and dependable,Fast and productive,Ideal for multi-user labs",
"overview" : "AZtecLiveOne includes all the tools required to help you quickly analyse and characterise your sample with confidence and ease. Tools such as ’AZtecLive chemical imaging’, ‘Spectrum Acquisition’, ‘X-Ray Mapping’ and ‘LineScanning’ ensure you can determine what elements are present in your sample and how they are distributed. Unique tools such as Tru-QTM ensure that elements are automatically identified and quantified to new levels of accuracy\r\nWhen combined with Xplore 30 becomes a system solution ideal for general analysis in the SEM.",
"features" : "Easy and intuitive\r\n\r\nWith AZtecLiveOne users have all the necessary tools at hand to complete the task quickly and with ease.\r\nStreamlined interface minimises the number of steps to get a result\r\nNew users can be productive in a matter of minutes\r\nNo need for the infrequent user to be retrained every time they need to perform an analysis\r\n\r\n \r\nAccurate and dependable\r\n\r\nAZtecLiveOne works hard behind the scenes so users don’t have to worry about pulse pile-ups, overlapping peaks and other potential artefacts.\r\nTru-QTM technology ensures that users can depend on the elements being automatically detected and that the correct results are being reported\r\nTruMap (option) ensures that the real data distribution is shown on X-ray maps and LineScans\r\n\r\n \r\nFast and productive\r\n\r\nAZtecLiveOne focuses on getting results out as quickly as possible: rapid set-up, real-time results display, reports just a click of a button away\r\nAZtecLive Chemical imaging enables you to quickly roam around your sample while getting instant feedback in the form of live electron image, live X-Ray maps and Live automatically labelled spectrum\r\nFrom image to report in seconds\r\nFully interactive during acquisition\r\nDuring acquisition, users can interact with data in the current or stored projects\r\nQuick and straightforward report generation\r\nChoose components (maps, spectra, linescans) required in the report and AZtecLiveOne does the rest\r\n",
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"name":"AZtecMineral",
"sorting_name":"aztecmineral",
"image":"/assets/components/phpthumbof/cache/Product_AZtecMineral.247cb2f22ddacd6aa50f363918c4960a.png",
"content" : "Flyers Flyer: AZtecMineral\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`9272`\n`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nApplication Notes using AZtecMineral !If? &subject=`` &operator=`notempty` &then=`` &else=`` Fast Characterisation of Minerals with Similar Crystal Structures\nCombining electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDS) techniques for geological sample characterisation, helps to unlock even more information on the likely formation and history of the sample. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload",
"outline" : "Dedicated mineralogy on multi-purpose SEM.",
"outline_limited" : "Dedicated mineralogy on multi-purpose SEM.",
"highlights" : "",
"overview" : "AZtecMineral is a powerful, automated, Mineral Liberation Analysis solution. It enables ore characterisation, provides vital data on metal recovery and enables process yield characterisation using multipurpose SEMs.\r\nExploiting the performance of Oxford Instruments’ large area SDDs (Ultim Max), it provides accurate classification of minerals at speeds comparable to dedicated systems – but with the flexibility to perform other investigations as required.\r\nAutomated mineral characterisation\r\n\r\n Reporting modal mineralogy\r\n Liberation yields\r\n Mineral associations\r\n Particle and grain size distribution\r\n Classification against a database of over 5000 minerals\r\n\r\nApplications\r\n\r\n Precious metal recovery (PGM)\r\n Base metal recovery\r\n Iron ore characterisation\r\n Coal (mineral impurity analysis)\r\n Thin section characterisation\r\n Modal mineralogy\r\n\r\nPerformance\r\n\r\n High speed acquisition using Ultim® Max technology\r\n Automated analysis over wide area, resolution at the nanoscale\r\n Take advantage of AZtec's Tru-Q® quantification algorithms\r\n\r\nFlexibility\r\n\r\n Works with most SEMs\r\n Can be retrofitted to existing systems\r\n Grain relocation for more detailed analysis using WDS, EBSD and complementary EDS techniques\r\n Upgrade paths include large area mapping, quantitative EDS mapping and more\r\n",
"features" : "AZtecMineral automatically analyses grains over a large area of the sample, typically several square centimetres.\r\nBecause of the resolution achieved, information on individual grains is available from the same acquisition.\r\n\r\n Samples can be either grain mounts, polished specimens or thin sections\r\n Particles, and the grains within them, are detected using the atomic number contrast derived from a backscattered electron image\r\n A combination of X-ray data and morphological data from the BSE image is used to identify the minerals\r\n Both morphological and phase information from each grain is stored in a database from which it can be retrieved and re analysed in greater detail at any time\r\n Stores all map, pole figure, measurement, subset and material settings within each dataset\r\n Phase identification is performed by real-time full quantitative analysis during the acquisition (including AZtec’s Tru-Q processing). This delivers the accuracy needed to distinguish chemically similar phases\r\n The relationship between the individual grains and the parent particles is maintained for further post-processing.\r\n The post-processing module provides direct and convenient access to the data via a graphical user interface\r\n Information is provided for individual grains as well as statistical information over the whole sample: mineral abundance, mineral associations, liberation, grain size distributions, common perimeter associations and particle associations as well as cumulative liberation yield graphs (depending on sample type).\r\n Mineral grains can be classified against a database containing in excess of 5,000 reference minerals. An automated approach identifies groups of grains with similar compositions for comparison against the database.\r\n",
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"sorting_name":"aztecone",
"image":"/assets/components/phpthumbof/cache/AZtecLiveOne_Software_Product_Page.98c4fe93f947826d6f2540b5d307f200.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "The AZtecOne system combines the simple-to-use yet powerful AZtecOne software and the proven stability and accuracy of Xplore Detector. The AZtecOne system is the ideal solution for carrying out a complex task like EDS as quickly and as easily as possible.\r\nThere is no need for substantial training or advanced knowledge of the EDS technique. Users can be trained in a matter of minutes and will have complete confidence in their results.",
"outline_limited" : "The AZtecOne system combines the simple-to-use yet powerful AZtecOne software and the proven stability and accuracy of Xplore Detector. The AZtecOne system is the...",
"highlights" : "Easy and intuitive,Accurate and dependable,Fast and productive,Ideal for multi-user labs",
"overview" : "Easy and intuitive\r\n\r\nWith AZtecOne users have all the necessary tools at hand to complete the task quickly and with ease.\r\nStreamlined interface minimises the number of steps to get a result\r\nNew users can be productive in a matter of minutes\r\nNo need for the infrequent user to be retrained every time they need to perform an analysis\r\n\r\nAccurate and dependable\r\n\r\nAZtecOne works hard behind the scenes so users don’t have to worry about pulse pile-ups, overlapping peaks and other potential artifacts.\r\nTru-Q® technology ensures that users can depend on the elements being automatically detected and that the correct results are being reported\r\nTruMap (option) ensures that the real data distribution is shown on X-ray maps and LineScans\r\n\r\nFast and productive\r\n\r\nAZtecOne focuses on getting results out as quickly as possible: rapid set-up, real-time results display, reports just a click of a button away\r\nFrom image to report in seconds\r\nFully interactive during acquisition\r\nDuring acquisition users can interact with data in the current or stored projects\r\nQuick and straightforward report generation\r\nChoose components (maps, spectra, linescans) required in the report and AZtecOne does the rest\r\n",
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"applications_frontend" : "Counterfeit Pharmaceuticals, Failure Analysis , Inspection and Process Control, Quality Control and Chemical Identification, Rock Core Analysis, Structural Materials and Components",
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"name":"AZtecPharma",
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"image":"/assets/components/phpthumbof/cache/AZtecPharma_Product_image.4ddf039adae59605075664a2bee2970b.png",
"content" : "$floating-bar? &rows=`[{ \"title\": \"Overview\", \"scroll_section\": \"overview\"\n},{ \"title\": \"Features\", \"scroll_section\": \"features\"\n},{ \"title\": \"Gallery\", \"scroll_section\": \"gallery\"\n},{ \"title\": \"Applications\", \"scroll_section\": \"applications\"\n}]` &rows=`[{ \"title\": \"Overview\", \"scroll_section\": \"overview\"\n},{ \"title\": \"Features\", \"scroll_section\": \"features\"\n},{ \"title\": \"Gallery\", \"scroll_section\": \"gallery\"\n},{ \"title\": \"Applications\", \"scroll_section\": \"applications\"\n}]` &contact_id=`+contact_id` &pricing_id=`+pricing_id` &ids=`+ids` &value=`+value` &button1Title=`+button1Title` &button2Title=`+button2Title` &bar_title=`+bar_title` !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=` AZtecPharma is a dedicated version of the market-leading AZtecLive software platform with increased data security and integrity. It enables EDS analysis to be incorporated into laboratory Standard Operating Procedures to support good practice quality guidelines like ‘GxP’ and regulations such as 21 CFR part 11 and Annex 11\nSecure\nIndividual user logins, making use of existing company login credentials\nLocal IT can continue to set user privileges\nAccurate\nAdvanced Tru-Q® spectrum processing technology ensures that peaks are automatically identified and labelled, enabling even inexperienced users to achieve reliable sample and feature determination\nEven a novice user can achieve expert results consistently\nTraceable\nData interactions are stamped with digital signature\nDedicated ‘Inspector’ program used to view ‘Audit-Trail’\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Features\",\"content\": !jsonEncode? &input=` Individual User Login\nUsers must login to use AZtecPharma\nAZtecPharma uses existing company login credentials\nLocal IT can set user privileges and password change interval\nDigital Signature\nData interactions are stamped with ‘user name’, ‘action’ and ’date\/time’\nDigital signature cannot be modified or removed\nAudit Trail and Inspector\nDedicated ‘Inspector’ program used to view ‘Audit-Trail’\nFilter records on individual user, project or date\/time\nAudit trail cannot be modified\nLive Chemical Imaging\nIncreased Productivity \nIncreased Confidence\nSOPs and Profiles\nImport existing SOPs into the AZtecPharma profile\nEach profile saves all acquisition conditions \n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"Gallery\",\"content\": !jsonEncode? &input=` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Cross-section of a pain relief tablet !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Cross-section of a drug packaging !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Analysis of contamination from an actuator !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=``\n`}}` Applications\n \nMain applications carried out in Pharmaceutical production facilities are Quality Control and Failure Analysis\nQuality Control is often a simple check on the structure and chemical composition of the product. Using AZtec’s live spectrum compare is an ideal way of comparing a sample's composition with control. Any sample that deviates from the control will be submitted for more detailed Failure Analysis.\n \n \n*Example of live spectrum compare - In yellow is the currently acquiring spectrum from a sample being analysed and in red is the spectrum from the control sample. This view immediately tells the analyst if there is an issue \nCommon areas of analysis\nProduct\n• Material from 3rd party supplier may contain contamination from numerous sources (Metals, plastics, glass, ceramics, fibres)\n• Production process\n• Cross-contamination from other products using same facility\n• Contamination from equipment (metals, plastics, paint, oils etc…)\n• Human contamination\n \nPackaging\n• Contaminated blister packs, tubes, jars and boxes\n \nDrug Delivery Equipment\n• Defective Actuators and syringes\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nProduct\nForeign body identification in products is the most common application. Whether it’s from the raw materials or the production process; Tracing the contamination back to source is key to preventing future occurrences. This contamination can cause the product to fail or in the worst case, cause harm to the consumer. In the example below, an initial investigation was carried out using AZtecLive Chemical Imaging to get a quick overview of the tablet structure and composition. Then a more detailed analysis was carried out using spectrum compare and then X-Ray mapping.\nMovie showing the initial investigation using AZtecLive Chemical Imaging\nLayered image showing the chemical distribution over the cross section of a pain relief tablet \nPackaging\nPackaging can be a source of contamination or be defective in a way that it allows external contamination of the product it encloses\nMovie showing an initial investigation can be carried out using AZtecLive Chemical Imaging\nLayered image showing the chemical distribution over the cross section of cellulose packaging\n \nDrug Delivery Equipment\nThe drug delivery mechanism can also be a potential source of contamination, for example:\n· Failure of Asthma Cannister causing contamination fragments to contaminate the drug actuations \n· Failure of vials and syringes resulting in glass contamination\nDetection of Al contamination particles from a defective inhaler\nActuation from an Asthma inhaler",
"outline" : "The Pharmaceutical and Biomedical industries require EDS systems to show that their electronic records are trustworthy, reliable, and equivalent to paper records. AZtecPharma is designed to meet the growing requirements of the Pharmaceutical and Biomedical industries with:",
"outline_limited" : "The Pharmaceutical and Biomedical industries require EDS systems to show that their electronic records are trustworthy, reliable, and equivalent to paper records. AZtecPharma is...",
"highlights" : " Individual user login<\/p>, Digital signatures<\/p>, Data Audit Trail with viewer<\/p>, Data tree deletion forbidden<\/p>",
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"name":"AZtecSteel",
"sorting_name":"aztecsteel",
"image":"/assets/components/phpthumbof/cache/AZtecSteel-software.8768f810245e2209effe0497bcd9b492.png",
"content" : "Download Centre !If? &subject=`` &operator=`notempty` &then=`` &else=`` Inclusion characterisation of rod wire by SEM according to Pirelli Method\nDiscover the detection and analysis of oxide in steel wire for use in cords best addressed with a scanning electron microscope (SEM) equipped with Energy Dispersive X-ray Spectrometry (EDS). !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Steel Cleanliness Analysis to International Standards with AZtecSteel\nThis application note demonstrates how AZtecSteel, an industry leading, dedicated particle analysis solution for the analysis of non-metallic inclusions can characterise inclusions in different types of steels to the requirements of multiple international standards. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`14231`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtecSteel Flyer\nAZtecSteel is the leading global solution for the detection and analysis of non-metallic inclusions in steel using SEM+EDS. It is a tailored version of the AZtecFeature particle analysis platform that is fully optimised for non-metallic inclusion analysis and includes Inclusion Classifier. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`9063`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Quantifying Metal Cleanliness - boride and nitride non-metallic inclusions\nIn the past, characterising non-metallic inclusions and precipitates in steels and other alloys, especially for light elements such as boron, has presented a challenge. However, AZtecFeature, in combination with a high solid angle windowless EDS detector such as X-Max Extreme and a conventional large area detector provides exciting, novel capabilities. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`9234`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` The Analysis and Classification of non-metallic inclusions in Steels with AZtecSteel\nHere we consider the use of SEM equipped with EDS and dedicated particle analysis software AZtecSteel for the complete characterisation of 5 steels. We demonstrate how inclusions across the population can be assessed and how they can be classified across the sample. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nFind out more\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`12084`\n`",
"outline" : "Steel inclusion analysis in the SEM is made more efficient and accurate by AZtecSteel.\r\nAZtecSteel is an automated steel inclusion analysis package developed specifically for the analysis and classification of steel inclusions using Energy Dispersive X-ray microanalysis (EDS) in a scanning electron microscope (SEM). It detects, measures and analyses the inclusions, processes the resulting data set to published standard methods, and includes functionality to plot complex ternary diagrams.",
"outline_limited" : "Steel inclusion analysis in the SEM is made more efficient and accurate by AZtecSteel.\r...",
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"overview" : "Steel inclusion analysis in the SEM is made more efficient and accurate by AZtecSteel.\r\nAZtecSteel is an automated steel inclusion analysis package developed specifically for the analysis and classification of steel inclusions using Energy Dispersive X-ray microanalysis (EDS) in a scanning electron microscope (SEM). It detects, measures and analyses the inclusions, processes the resulting data set to published standard methods, and includes functionality to plot complex ternary diagrams.\r\nInclusion Classifier will determine steel cleanliness using the following published methods:\r\n\r\nASTM E2142 (E45), E2283 and E796-7\r\nSIS 111116\r\nDIN 50602\r\nISO 4967\r\nEN 10247\r\nJIS G0555\r\nNFA 04-106\r\nGBT 30834\r\n",
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"name":"AZtecSynergy",
"sorting_name":"aztecsynergy",
"image":"/assets/components/phpthumbof/cache/AZtecSynergy-software-oxford-instruments.ea81ccc8058a24ec65ecd59fbdcd421e.png",
"content" : "Phase ID\nSimultaneously collect the EDS spectrum and EBSD pattern from a single point on the sample, for accurate phase identification.\nPowerful and fast phase search to identify candidate phases based on chemical information\nAccurately determine the phase from a list of candidate phases, using Tru-I® algorithms\nSave spectra and EBSD patterns with reference image\nIntegrated EBSD and EDS mapping\nAZtecSynergy provides a true and complete characterisation of the sample in real-time. Easy to use, with no complex switching between techniques A single interface is used for data collection Use EBSD map as a reference image for EDS collection Stored data can be interrogated offline\nAZtecSynergy is optimised so there’s no loss in performance when the EBSD and EDS data are collected simultaneously. Unleash the power of the Ultim Max SDD and Symmetry S3 EBSD detector View ALL of the data in real-time EBSD patterns are indexed as acquired to create orientation and phase maps together with element maps Change EDS parameters or EBSD parameters and see the impact on the results immediately View and report EDS and EBSD maps simultaneously\nEDS and EBSD maps from a Tungsten Alloy. Data were collected simultaneously at 670 Hz and 99% hit rate. The EBSD and X-ray maps were displayed in real-time. ",
"outline" : "AZtecSynergy provides a powerful solution for the simultaneous collection of EDS and EBSD data. All of the tools to collect excellent integrated data are included in one place with no complicated switching from one navigator to another.",
"outline_limited" : "AZtecSynergy provides a powerful solution for the simultaneous collection of EDS and EBSD data. All of the tools to collect excellent integrated data are included in one place with...",
"highlights" : " Several navigators<\/p>, Phase selection<\/p>, Dual image capture<\/p>, AutoCalibration<\/p>",
"overview" : "AZtecSynergy combines the innovation and power in AZtecEnergy and AZtecHKL to create the ultimate materials characterisation system with simultaneous EBSD and EDS analyses...\r\nEDS and EBSD are integrated in a single interface with no compromise on functionality or productivity\r\n\r\nView EDS and EBSD data simultaneously at speeds in excess of 4500 points per second\r\nView and optimise the acquisition parameters for both detectors from a single window\r\nUnknown phases can be identified from the stored patterns and spectra once an EDS \/ EBSD data set is collected\r\n",
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"name":"AZtecTEM",
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"content" : "View Showcase Page Download Centre !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtecTEM\nA 16 page brochure showing why AZtecTEM is the most powerful solution for EDS on the TEM. It comprises software and hardware sections (inc X-Max 100TLE and X-Max TSR). !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`3325`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` EDS in the TEM Explained\nThis 12 page document gives an introduction to EDS applications in the Transmission Electron Microscope (TEM). It covers the theory of the SDD operation and X-ray analysis. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`17081`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Simultaneous EDS & EELS\nSimultaneous acquisition of EDS and EELS is a powerful tool for materials analysis !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`17708`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Semiconductor Mapping in the TEM - Solving peak overlaps in real-time\nThis document shows how AZtecTEM solves peak overlaps in real-time. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`16891`\n` !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Qualitative and Quantitative Analysis\",\"content\": !jsonEncode? &input=`\nQualitative Analysis in the TEM: Real-time analysis and reporting\nPoint & ID\nOften the first step in analysing the sample. With AZtec this is fast, accurate and reproducible - you simply select the areas to analyse then, in the short time it takes to collect a spectrum:\nAll elements are automatically identified\nThe composition is displayed in the unique miniQuant window\nYou can quickly annotate points of interest for others to note ...and send your mini-report to others with a single click\nAutoID\nAccurate and reliable, AutoID allows users to identify peaks in real-time as spectra are being collected during the scan.\nNo need to know which elements are present beforehand\nExclude elements from the analysis, if required\nUses Tru-Q technology to correctly identify elements at all count rates - even where peaks overlap\nAutoLock\nAutomatically keep the field of view locked to the same area. This is of special relevance to STEM when collecting high-resolution images and maps.\nEnables analysis at resolutions that are normally difficult to achieve because of drift\nProvides live updates of corrective actions being taken\nA unique blend of predictive and reactive correction routines cope with different types of drift\nQuantitative Analysis in the TEM: Providing the accuracy for real-time quant analysis\nTru-Q®\nTru-Q is a unique Oxford Instruments’ technology that provides high accuracy AutoID and quantitative analysis. It uses a combination of technologies:\nComplete detector and hardware characterisation for a true standardless analysis\nRobust FLS spectrum processing that works in all situations. For example, there is no need for any background fitting adjustment\nModified Cliff-Lorimer – TEM quant that allows sample thickness and density to be taken into consideration\nTheoretical or user-defined k-factors can be applied\nK, L or M lines can be chosen for quantitative analysis\nPPC - Automatic correction for pulse pile-up at high count making accurate quant at 200,000 cps a reality\nRemoval of unwanted non-sample peaks (e.g. Cu from grid)\nNow everyone can achieve reliable results\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"EDS Mapping for TEM\",\"content\": !jsonEncode? &input=`\nSpectral mapping should be a central tool of every EDS system - it is with AZtec\nSmart Mapping\nSmartMap spectral mapping brings the benefits of automatic qualitative analysis into two dimensions to identify elements and visualise their distributions.\nThe traditional ‘Windows Integral’ mapping method\nMaps are automatically generated\nElements may also be manually defined\nMapping resolution up to 4k pixels\nAll the information is saved at every pixel for post-processing\nAutoLayer\nAt the click of a button, AutoLayer takes the often complex information contained in a set of X-ray maps and turns it into a single image that helps visualise both phase and element distribution in the specimen.\nInstantly and automatically interprets your specimen\nColours automatically selected to highlights what’s important in a single image\nUnravels the complexity of real specimens\nEELS Integration\nSuperfast EELS integration delivers accurate simultaneous data acquisition. AZtec is capable of working at speeds well in excess of 1000 spectra per second.\nSeamless integration with Digital Micrograph™\nFastest acquisition possible\nEasy switching between integrated and stand-alone modes.\nHighest EDS collection efficiency\nTruMap\nTruMap is a unique real-time mapping solution that removes background and peak overlaps on the fly.\nEliminates erroneous data automatically\nCorrects overlaps such as:\nSi K and W M lines - vital to the semiconductor industry\nPb M, Mo L and S K for minerals analysis\nCan be applied to legacy data\nQuantMap\nQuantMap displays real quantitative chemical X-ray maps by recalculating SmartMap data to correct for X-ray background, peak overlaps, sample matrix effects and pile up artefacts. QuantMaps can be calculated and displayed on-line - eliminating the need to reprocess SmartMap data off-line.\nDisplay results in atomic%, weight%, oxide% or atomic concentration\nExport data to a spreadsheet\nAutoPhaseMap\nAutoPhaseMap creates a phase map of the specimen using statistical measures to optimise phase groupings rather than clustering or principle components. It provides an unrivalled qualitative and quantitative analysis of automatically identified phases.\nDistribution of each phase\nSpectrum, composition and area fraction for each phase\nFinds phases for all size ranges, including nanomaterials\nFinds elements which are present in trace amounts\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"Linescan for TEM\",\"content\": !jsonEncode? &input=`\nLineScan brings the concepts of AZtec real-time acquisition and reporting to the study of linear variations\nAll the data is always collected and saved at every pixel\nEasy and flexible interpretation\nAutomatically acquire multiple horizontal or vertical LineScans\nAlign image and LineScan for clear visual comparison\nNormalised intensity scales make a comparison of major and minor elements simple\nTruLine\nTruLine Incorporates Tru-Q technology to calculate true elemental peak variation from a line scan.\nCorrects for peak overlaps automatically\nEnhances real elemental differences by removing X-ray background variation\nReal-time calculation and display\nQuantLine\nQuantLine displays real quantitative chemical linescans by recalculating SmartMap data to correct for the X-ray background, peak overlaps, sample matrix effects and pile up artefacts.\nNo need to wait for lengthy data processing...see quantitative linescans live!\nDisplay results in atomic%, weight%, oxide% or atomic concentration\nExport data to a spreadsheet\nCan work on legacy datasets\n`},\"tab4\":{\"index\":\"4\",\"tabID\": \"4\",\"tabTitle\": \"Data processing and export\",\"content\": !jsonEncode? &input=`\nFlexible off-line data processing and data export\nReconstruction\nMaps, linescans and spectra may be reconstructed from previously collected SmartMap or Linescan data. This enables users to:\nReconstruct TruMaps from previously collected SmartMaps\nReconstruct QuantMaps from previously collected SmartMaps\nReconstruct TruLines and QuantLines from previously collected Linescans\nReconstruct spectra from areas and points on maps or linescans\nVariable thickness linescans can be extracted from stored map data for detailed analysis of grain boundaries\nData Transfer\nIn (S)TEM it is often desirable to transfer data collected in AZtec to other programmes for further investigation. AZtec gives the capability to transfer data as:\nDatacubes in the form of raw files to programmes such as Lispix and multivariate statistical analysis packages for evaluation of data such as atomic column mapping\nExcel for further processing of spectra (EMSA format), maps and linescans\n`},\"tab5\":{\"index\":\"5\",\"tabID\": \"5\",\"tabTitle\": \"Usability and Reporting\",\"content\": !jsonEncode? &input=`\nUsability: powerful for the expert - yet scalable to any user\nMulti-Tasking\nAZtec has true multi-tasking capability, meaning that every second of data acquisition can also be used for processing and reporting.\nData interaction in real-time\nMany tasks that used to take minutes now take seconds\nInterrogate data from one project while acquiring data for a new project\nEnable new ways of working to give a large increase in productivity\nMulti-user environments\nProfiles contain all the settings required to repeat an analysis and obtain the same results no matter who the user is\nStep Notes and Standard Operating Procedures (SOP) help at every step of your analysis and can be easily modified for personalised SOPs\nOperating Modes\nGuided Mode: Ideal for those who prefer a ‘step by step’ approach to analysis. Each step of the Navigator has a clear purpose. You can always see what is happening and what to do next\nCustom Mode: Ideal for those who prefer the freedom and flexibility to decide what functionality they want to see and where they want to see it\nReporting\nNo matter what your requirements, AZtec will help you present the reports you need in the format you want them.Fast: reporting direct from the interface - a simple right click and data can be e-mailed directly to your customer\nFlexible: a dedicated application enables you to export your data in the format and resolution you want\nStructured: a comprehensive list of report templates tailored to each application enables you to print a professional report with a single button press\nCreate your own templates\nSimple easy to use interface\nCreate templates for use across multiple techniques\nCreate multi-page templates\nCreate templates for single or multiple users\n`}}`",
"outline" : "AZtecTEM is an innovative EDS software specifically optimised for advanced TEM applications.\r\nAZtecTEM is a unique system approach to the characterisation of materials at the nanoscale. Building on over 30 years Oxford Instruments’ experience in TEM technologies, AZtec is everything you should expect of a next-generation EDS system for TEM.",
"outline_limited" : "AZtecTEM is an innovative EDS software specifically optimised for advanced TEM applications.\r...",
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"overview" : "\r\nPowerful\r\n\r\nUnleashes the potential of the latest generation of large area Ultim Max TEM SDDs - delivering sensitivity when count rates are low and a high capacity when count rates are high.\r\nChoice of detectors, including 100 mm2 active area with a special design that maximises solid angle Multiple detector systems enables over 2 sr solid angle (TEM and configuration dependent)\r\nWindowless options for outstanding low energy performance\r\nAZtec has a 64-bit performance and a true multi-tasking capability so you work at the maximum detector speed, visualise final results in real-time, report in parallel and get the job done faster than ever\r\n\r\nFlexible\r\n\r\nAZtecTEM provides the tools to explore data in your own way with a variety of options for data collection, processing and export\r\n\r\n\r\n\r\nAccurate\r\n\r\nIncorporates Tru-Q® technology to provide high accuracy AutoID and quantitative analysis - so you get the right results in real-time, time after time\r\nAutoLock™ provides a unique blend of predictive and reactive drift correction routines - vital when working at the nano and atomic scales\r\nTruMap® and TruLine™ correct for overlaps and other artefacts in real-time, then automatically visualise the data in the best way possible\r\n\r\nStructured\r\n\r\nGuided or custom operating modes\r\nAZtecTEM can assist any level of user from start to finish with Step Notes and editable Standard Operating Procedures\r\n\r\nFast\r\n\r\nAcquire at the maximum detector speed, visualise final results in real-time, report in parallel\r\n\r\n",
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"name":"BC43 CF",
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"image":"/assets/components/phpthumbof/cache/bc43-cf.e0c090d652bdf9b894460c535a7c9204.png",
"content" : "13163",
"outline" : "Andor's NEW BC43 Benchtop Confocal is a push-button imaging solution designed with cost, performance and accessibility in mind. Make stunning 2D and 3D images part of your routine benchtop workflow.",
"outline_limited" : "Andor's NEW BC43 Benchtop Confocal is a push-button imaging solution designed with cost, performance and accessibility in mind. Make stunning 2D and 3D images part of your routine...",
"highlights" : " Fast and easy to learn: take great images sooner with less need for support<\/p>, Compact, yet rich in features: offers multidimensional imaging in confocal, widefield and transmitted light modes<\/p>, Light-tight: no need for a dark room<\/p>",
"overview" : "",
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"features_benefits" : "Benchtop multimodal imaging system - ,Instant confocal: Blur-free imaging - ,Widefield imaging - ,Differential phase contrast & brightfield - ,Borealis uniform illumination - ,GPU-powered deconvolution - ",
"extended_tabs" : "\n\n\n\nMicroscope Unit\nBC43\n\n\nImaging Modes\nHigh-speed confocal, Widefield epifluorescence, Transmitted light - brightfield and Differential Phase Contrast\n\n\nImaging Methods\nSingle color, multicolor, z-stacking (volume), time-lapse, Optional modules: multi-field\/multi-well, area scan (montage) with tile stitching.\n\n\nClearView™ GPU\nClears image of non-specific sample background signal and improves resolution beyond the normal optical limits.\n\n\nCamera\n \n\n\nResolution\n6.5 µm pixel; 2048x2000 pixels (4.1 MP)\n\n\nQE\nUp to 82%\n\n\nField of view (mm)\n18.4 mm (diagonal)\n\n\nCooling\n0°C\n\n\nImages\n16-bit, monochrome\n\n\nIllumination\n \n\n\nFluorescence\n4 fixed wavelengths of 405 nm, 488 nm, 561 nm, 638 nm\n\n\nTransmitted light\nBroad spectrum visible light LED\n\n\nOptics (Objectives)\n \n\n\nObjective Lens Nosepiece\nMotorised 5 position turret\n\n\nObjective Magnifications\nBC43 is supplied with 2x objective for sample overview. Select additional objectives from 10x to 60x magnification\n\n\nPrecision motorised x,y stage\nTravel Range = 110 mm x 80 mm Resolution = 100 nm\n\n\nZ-Control & Focus\nRange = 14.5 mm\n\n\nAutofocus \"Seek & Lock\" Technology\nSample \"Seek & Lock\". Finds focal plane for new sample and maintains focus stability during time-lapse experiments\n\n\nSample Vessels Supported\nGlass slides (25 by 75 mm); culture dish (35 mm diameter); Multiwell plates (6, 12, 24 & 96); Multiwell chamber coverslip (2, 4, 8)\n\n\nIncubation (option)\nStage-top incubator. Sliding lid for easy sample access and exchange. Objective heater for oil-immersion objectives\n\n\nWorkstation\n \n\n\nPC\nWindows™ 10 software 64 GB DDR4 RAM, 512 GB PCIe SSD Boot drive, 4 GB Graphics Card, 2 TB Image Data storage (option to add more)\n\n\nMonitor\n24 inch\n\n\n\n",
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"name":"BC43 SR",
"sorting_name":"bc43 sr",
"image":"/assets/components/phpthumbof/cache/bc43-sr.065287a41b8271f9cbee88e2158077e4.png",
"content" : "25826",
"outline" : "Andor’s BC43 SR is super-compact, yet rich in features and benefits, making it the ideal microscope for early-stage researchers and experienced microscopists alike.",
"outline_limited" : "Andor’s BC43 SR is super-compact, yet rich in features and benefits, making it the ideal microscope for early-stage researchers and experienced microscopists alike.",
"highlights" : " Fast and easy to learn: take great images sooner with less need for support<\/p>, Compact, yet rich in features: offers multidimensional imaging in confocal, widefield and transmitted light modes<\/p>, Light-tight: no need for a dark room<\/p>",
"overview" : "",
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"features_benefits" : "Benchtop multimodal imaging system - ,Instant confocal: Blur-free imaging - ,Widefield imaging - ,Differential phase contrast & brightfield - ,Borealis uniform illumination - ,GPU-powered deconvolution - ",
"extended_tabs" : "\n\n\n\nMicroscope Unit\nBC43\n\n\nImaging Modes\nHigh-speed confocal, Widefield epifluorescence, Transmitted light - brightfield and Differential Phase Contrast\n\n\nImaging Methods\nSingle color, multicolor, z-stacking (volume), time-lapse, Optional modules: multi-field\/multi-well, area scan (montage) with tile stitching.\n\n\nClearView™ GPU\nClears image of non-specific sample background signal and improves resolution beyond the normal optical limits.\n\n\nCamera\n \n\n\nResolution\n6.5 µm pixel; 2048x2000 pixels (4.1 MP)\n\n\nQE\nUp to 82%\n\n\nField of view (mm)\n18.4 mm (diagonal)\n\n\nCooling\n0°C\n\n\nImages\n16-bit, monochrome\n\n\nIllumination\n \n\n\nFluorescence\n4 fixed wavelengths of 405 nm, 488 nm, 561 nm, 638 nm\n\n\nTransmitted light\nBroad spectrum visible light LED\n\n\nOptics (Objectives)\n \n\n\nObjective Lens Nosepiece\nMotorised 5 position turret\n\n\nObjective Magnifications\nBC43 is supplied with 2x objective for sample overview. Select additional objectives from 10x to 60x magnification\n\n\nPrecision motorised x,y stage\nTravel Range = 110 mm x 80 mm Resolution = 100 nm\n\n\nZ-Control & Focus\nRange = 14.5 mm\n\n\nAutofocus \"Seek & Lock\" Technology\nSample \"Seek & Lock\". Finds focal plane for new sample and maintains focus stability during time-lapse experiments\n\n\nSample Vessels Supported\nGlass slides (25 by 75 mm); culture dish (35 mm diameter); Multiwell plates (6, 12, 24 & 96); Multiwell chamber coverslip (2, 4, 8)\n\n\nIncubation (option)\nStage-top incubator. Sliding lid for easy sample access and exchange. Objective heater for oil-immersion objectives\n\n\nWorkstation\n \n\n\nPC\nWindows™ 10 software 64 GB DDR4 RAM, 512 GB PCIe SSD Boot drive, 4 GB Graphics Card, 2 TB Image Data storage (option to add more)\n\n\nMonitor\n24 inch\n\n\n\n",
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"applications" : [ "cell-biology","developmental-biology" ],
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"name":"BC43 WF",
"sorting_name":"bc43 wf",
"image":"/assets/components/phpthumbof/cache/bc43-wf.9ddd748992cc3d3a53c20c6ed35aa073.png",
"content" : "25827",
"outline" : "BC43 WF is a new addition to our benchtop microscope range, ideal for routine imaging or small budgets and with so much growth potential.",
"outline_limited" : "BC43 WF is a new addition to our benchtop microscope range, ideal for routine imaging or small budgets and with so much growth potential.",
"highlights" : " Fast and easy to learn: take great images sooner with less need for support<\/p>, Compact, yet rich in features: offers multidimensional imaging in widefield and transmitted light modes<\/p>, Light-tight: no need for a dark room<\/p>",
"overview" : "",
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"features_benefits" : "Benchtop multimodal imaging system - ,Instant confocal: Blur-free imaging - ,Widefield imaging - ,Differential phase contrast & brightfield - ,Borealis uniform illumination - ,GPU-powered deconvolution - ",
"extended_tabs" : "\n\n\n\nMicroscope Unit\nBC43\n\n\nImaging Modes\nHigh-speed confocal, Widefield epifluorescence, Transmitted light - brightfield and Differential Phase Contrast\n\n\nImaging Methods\nSingle color, multicolor, z-stacking (volume), time-lapse, Optional modules: multi-field\/multi-well, area scan (montage) with tile stitching.\n\n\nClearView™ GPU\nClears image of non-specific sample background signal and improves resolution beyond the normal optical limits.\n\n\nCamera\n \n\n\nResolution\n6.5 µm pixel; 2048x2000 pixels (4.1 MP)\n\n\nQE\nUp to 82%\n\n\nField of view (mm)\n18.4 mm (diagonal)\n\n\nCooling\n0°C\n\n\nImages\n16-bit, monochrome\n\n\nIllumination\n \n\n\nFluorescence\n4 fixed wavelengths of 405 nm, 488 nm, 561 nm, 638 nm\n\n\nTransmitted light\nBroad spectrum visible light LED\n\n\nOptics (Objectives)\n \n\n\nObjective Lens Nosepiece\nMotorised 5 position turret\n\n\nObjective Magnifications\nBC43 is supplied with 2x objective for sample overview. Select additional objectives from 10x to 60x magnification\n\n\nPrecision motorised x,y stage\nTravel Range = 110 mm x 80 mm Resolution = 100 nm\n\n\nZ-Control & Focus\nRange = 14.5 mm\n\n\nAutofocus \"Seek & Lock\" Technology\nSample \"Seek & Lock\". Finds focal plane for new sample and maintains focus stability during time-lapse experiments\n\n\nSample Vessels Supported\nGlass slides (25 by 75 mm); culture dish (35 mm diameter); Multiwell plates (6, 12, 24 & 96); Multiwell chamber coverslip (2, 4, 8)\n\n\nIncubation (option)\nStage-top incubator. Sliding lid for easy sample access and exchange. Objective heater for oil-immersion objectives\n\n\nWorkstation\n \n\n\nPC\nWindows™ 10 software 64 GB DDR4 RAM, 512 GB PCIe SSD Boot drive, 4 GB Graphics Card, 2 TB Image Data storage (option to add more)\n\n\nMonitor\n24 inch\n\n\n\n",
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"page_link" : "https://andor.oxinst.com/products/benchtop-confocal-microscopes/bc43-wf",
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"name":"BeamFlex – Flexible Beampath Extension",
"sorting_name":"beamflex",
"image":"/assets/components/phpthumbof/cache/WITec_alpha300-RS.ff59d17388b534fca17b52620b005b61.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nReflection modes\nThe upright reflection mode follows the standard beampath, with illumination and detection performed through the objective above the sample.\nWith inverted reflection mode, both beampaths are redirected so that the light is introduced and collected from below the sample. For this configuration, the microscope's input and output coupler modules are relocated to a position adjacent to the sample stage.\nTransmission modes\nIn transmission mode, sample excitation and signal detection are performed from opposite sides of the sample. Both the illumination from above and detection from below, as well as inverted configurations are possible.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`427440`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"outline" : "The BioHeater is similar in design to the Closed Fluid Cell except that an integrated immersion heating element and temperature sensor are positioned in the fluid volume, allowing imaging in fluid between ambient and 80°C. It supports samples up to 25 mm in diameter. The kit includes various sample accessories and spare parts, as well as a membrane and clamp for sealed operation. (Compatible with all MFP-3D AFMs except Origin.)",
"outline_limited" : "The BioHeater is similar in design to the Closed Fluid Cell except that an integrated immersion heating element and temperature sensor are positioned in the fluid volume,...",
"highlights" : "Heats samples in liquids from ambient to 80°C,Ten ports are available—seven for liquid and gas exchange and electrical access, and three used by the heating element,Easy disassembly for cleaning",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
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"page_link" : "https://afm.oxinst.com/products/mfp-3d-liquid-environmental-control/mfp-3d-bioheater",
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"name":"C-Nano+",
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"content" : "Download Centre !If? &subject=`` &operator=`notempty` &then=`` &else=`` C+ Series EBSD Detectors\nThe C+ series EBSD detectors, the C-Nano+ and the C- Swift+, are 2nd generation entry-level detectors designed for every type of EBSD application. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`14383`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Symmetry S3\nSymmetry S3 is a 3rd generation detector based on the advanced CMOS technology and unique design features that have made Symmetry the market’s leading EBSD detector. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`6270`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtecHKL\nThis 16 page brochure illustrates why AZtec is the leading EBSD analysis platform on the market. Covers both hardware and software. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`10431`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` EBSD Explained\nEBSD Explained is a 24 page tutorial that not only gives newcomers a solid foundation in the underlining science of the subject, but also shows how the theory is applied in practice to get reliable and accurate EBSD results. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`10222`\n`",
"outline" : "The C-Nano+ is an outstanding entry-level EBSD detector. The innovative technology that has helped the Symmetry S3 detector make such an impact is implemented in the C-Nano+, delivering class-leading performance at an entry level. The C-Nano+ is suited to characterising all types of samples, but its high pixel resolution makes it ideal for detailed strain analyses as well as for routine work on complex and challenging materials.",
"outline_limited" : "The C-Nano+ is an outstanding entry-level EBSD detector. The innovative technology that has helped the Symmetry S3 detector make such an impact is implemented in the...",
"highlights" : " Full 1244 x 1024 pixel resolution patterns – ideal for high resolution EBSD<\/p>, Class-leading acquisition speed of > 600 pps<\/p>, Fibre optics delivering extreme sensitivity for low energy and low current analyses<\/p>, Distortion free images<\/p>",
"overview" : "The C-Nano+ is an EBSD detector that is designed for all types of materials and applications. Utilising a customised CMOS sensor, the C-Nano+ delivers a top acquisition speed exceeding 600 pps with exceptional 311 x 256 pixel resolution patterns: this makes it about 5-6 times faster than comparable CCD-based detectors, using patterns with at least 4 times as many pixels. The result is a performance that you can trust, with excellent data quality on even the most challenging of materials.\r\nThe lens-free fibre-optics design within the C-Nano+ ensures superb sensitivity as well as sub-pixel distortion levels, making this an ideal detector for detailed strain analyses for which excellent, high definition patterns are a necessity. The maximum analysis speeds can be achieved using very low beam currents (under 3 nA), while the full resolution mode delivers a maximum sensitivity of 900 pps \/ nA, enabling detailed and successful analyses of beam-sensitive and nanocrystalline materials.\r\nThe C-Nano+ also benefits from the multiple design features unique to the whole Oxford Instruments CMOS detector range, including the proximity sensor that will help to avoid unwanted and expensive collisions before they occur. This is a detector that you can trust to deliver the results you need, every time.",
"features" : "The C-Nano+ detector is your high-performance entry into CMOS technology:\r\n\r\n Guaranteed indexing speeds of 600 pps using only 3 nA beam current\r\n 311 x 256 pixel pattern resolution at maximum speed – 4 times more pixels than a sensitive CCD detector at comparable speeds\r\n Full megapixel resolution patterns (1244 x 1024 pixels) – ideal for strain analyses using high resolution EBSDGuaranteed sub-pixel distortion, ensuring an angular precision better than 0.05°\r\n Extreme sensitivity delivered by fibre-optics and an optimised phosphor screen, ensuring high quality patterns at low doses and low beam energies – resulting in maximum spatial resolution\r\n Seamless EDS integration even at the highest speeds\r\n Bellows SEM interface, maintaining the microscope’s vacuum integrity\r\n Unique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position\r\n Simple and intuitive detector settings, ensuring optimum results every time\r\n Five integrated forescatter detectors (optional), providing full colour complementary channelling contrast and atomic number contrast images.\r\n",
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{
"name":"C-RED 2 ER SWIR",
"sorting_name":"c-red 2 er swir",
"image":"/assets/components/phpthumbof/cache/c-red-2-er.776aed856141c229a5b47be5ff40ddd2.png",
"content" : "",
"outline" : "C-RED 2 ER is a highly sensitive extended SWIR camera, based on a VGA (640x512 pixels) ER-InGaAs detector array. The camera offers framerates up to 600 Hz. The C-RED 2 ER camera can support two detectors with shifted sensitivity up to 1.9 µm and to 2.2 µm.\r\n",
"outline_limited" : "C-RED 2 ER is a highly sensitive extended SWIR camera, based on a VGA (640x512 pixels) ER-InGaAs detector array. The camera offers framerates up to 600 Hz. The C-RED 2 ER camera...",
"highlights" : " 640 x 512 InGaAs sensor<\/p>, SWIR 1.1 - 1.9 μm or 1.3 - 2.2 μm<\/p>, 15 μm pixel pitch<\/p>, 70% QE, wavelength from 0.9 to 1.7 μm<\/p>, Up to 600 fps full frame<\/p>",
"overview" : "C-RED 2 ER by First Light Imaging\r\nC-RED 2 ER is a highly sensitive extended InGaAs camera series for extended SWIR imaging and opens new imaging and sensing opportunities for life science, research, laser measurements, and industrial applications.\r\nC-RED 2 ER are VGA (640 x 512 pixels) detectors with a 15 μm pixel pitch for high resolution, and with peak quantum efficiency > 70%. All models are able to run at 600 fps full frame, and up to 32066 fps in cropping mode. In addition, all models have an integrated two-stage thermoelectric cooler, which enables a cooling capability up to 60°C.\r\nC-RED 2 ER is available with two options of InGaAs detectors with shifted sensivity ranges:\r\n\r\n C-RED 2 ER 1.9 μm is sensitive in the range of 1.1 to 1.9 μm\r\n C-RED 2 ER 2.2 μm is sensitive in the range of 1.2 to 2.2 μm\r\n\r\nC-RED 2 ER 1.9 μm and C-RED 2 ER 2.2 μm are complementary to C-RED 2 in terms of sensitivity, as they cover the high end of the SWIR spectrum. The C-RED 2 ER 1.9 μm achieves a readout noise < 50 e- while C-RED 2 ER 2.2 μm readout noise is < 40 e-.\r\nThe development of extended range detectors based on InGaAs technology is a recent breakthrough in imaging. With a double thermoelectric cooling system, the camera is a straightforward solution for imaging in the far end of the SWIR spectrum without the cryogenic cooling required for HgCdTe.",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "\n \n \n Sensor Specifications\n C-RED 2 ER 1.9 μm\n C-RED 2 ER 2.2 μm\n \n \n Full sensitivity range (QE >10%)\n 1100 - 1900 nm\n 1300 - 2150 nm\n \n \n Quantum Efficiency >70%\n 1150 - 1800 nm\n 1380 - 2050 nm\n \n \n Maximum Speed Full Frame\n 600 fps\n \n \n Readout Noise at High Gain, Tint at 50 μs, 600 fps Full Frame\n <50 (@ -40°C) e-\n <40 (@ -55°C) e-\n \n \n Dark Current\n 20 (@ -40°C) ke\/p\/s\n 120 (@ -55°C) ke\/p\/s\n \n \n Quantization\n 14 bit\n \n \n Operability\n >95 (@ -40°C)%\n contact us\n \n \n Image Full well capacity at low gain, 600 fps\n 1500 ke-\n \n \n Image Full well capacity at med gain, 600 fps\n 130 ke-\n \n \n Image Full well capacity at high gain, 600 fps\n 34 ke-\n \n \n Maximum speed in 32 x 4 (min)\n 32066 fps\n \n \n Maximum speed in 320 x 256\n 1779 fps\n \n \n",
"options" : "",
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"businesses" : "andor",
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"applications" : [ "adaptive-optics","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","identification-of-contaminants-in-food-production-and-soil","inspection-and-process-control","quality-control-and-chemical-identification","solar-astronomy" ],
"applications_frontend" : "Adaptive Optics, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Identification of Contaminants in Food Production and Soil, Inspection and Process Control, Quality Control and Chemical Identification, Solar Astronomy",
"product_family" : "cr-series",
"product_family_frontend" : "C-RED Series",
"sorting_product_family" : "100",
"idx": 38,
"page_id": 25754,
"page_link" : "https://andor.oxinst.com/products/c-red-series/c-red-2-er",
"weight" : 0,
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{
"name":"C-RED 2 Lite SWIR",
"sorting_name":"c-red 2 lite swir",
"image":"/assets/components/phpthumbof/cache/c-red-2-lite.4a722670e250a242fa5fff16ff2c54a3.png",
"content" : "",
"outline" : "C-RED 2 Lite is a compact high speed low noise TEC-stabilized SWIR camera, able to run at 600 FPS with 30 electrons readout noise. With an optimized algorithm for precise sensor temperature stabilization, C-RED 2 Lite does not make any compromise on camera performances.\r\n",
"outline_limited" : "C-RED 2 Lite is a compact high speed low noise TEC-stabilized SWIR camera, able to run at 600 FPS with 30 electrons readout noise. With an optimized algorithm for precise sensor...",
"highlights" : " 640 x 512 InGaAs sensor<\/p>, SWIR 0.9 - 1.7 μm<\/p>, 15 μm pixel pitch<\/p>, 70% QE, wavelength from 0.9 to 1.7 μm<\/p>, Up to 600 fps full frame<\/p>",
"overview" : "C-RED 2 Lite by First Light Imaging\r\nThe most recent addition to the C-RED family, C-RED 2 Lite is the stabilized version of C-RED 2 with no fan. It can also be watercooled for better performances with an optional cooling plate. With an optimized algorithm for precise sensor temperature stabilization, C-RED 2 Lite does not make any compromise on camera performances despite environmental fluctuations.\r\nThe camera integrates a 640 x 512 InGaAs PIN Photodiode detector with 15 μm pixel pitch for high resolution, which embeds an electronic shutter with integration pulses shorter than 5 μs. C-RED 2 Lite is specially designed for quantitative applications such as laser beam profiling, hyperspectral imaging, thermography, etc..",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "\n \n \n Sensor Specifications\n C-RED 2 Lite\n \n \n Sensor Size\n 640 x 512 pixels\n \n \n Pixel Pitch\n 15 μm\n \n \n Maximum Speed Full Frame\n 600 fps\n \n \n Readout Noise at High Gain, Tint at 50 μs, 600 fps Full Frame (@ 5°C) \n <30 e-\n \n \n \n Quantization\n 14 bit\n \n \n Flat Quantum Efficiency 1.0 to 1.65 μm\n >70%\n \n \n Operability due to signal response (pixels with signal ± 0.3*median at 35°C)\n > 99.8%\n \n \n Maximum speed in 32 x 4 (min)\n 32066 fps\n \n \n Maximum speed in 320 x 256\n 1779 fps\n \n \n",
"options" : "",
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"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "adaptive-optics","analysis-of-environmental-contaminants","fabrication-and-characterisation-of-light-emitting-devices","identification-of-contaminants-in-food-production-and-soil","inspection-and-process-control","quality-control-and-chemical-identification","solar-astronomy" ],
"applications_frontend" : "Adaptive Optics, Analysis of Environmental Contaminants, Fabrication and Characterisation of Light Emitting Devices, Identification of Contaminants in Food Production and Soil, Inspection and Process Control, Quality Control and Chemical Identification, Solar Astronomy",
"product_family" : "cr-series",
"product_family_frontend" : "C-RED Series",
"sorting_product_family" : "100",
"idx": 39,
"page_id": 25714,
"page_link" : "https://andor.oxinst.com/products/c-red-series/c-red-2-lite",
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{
"name":"C-RED 2 SWIR",
"sorting_name":"c-red 2 swir",
"image":"/assets/components/phpthumbof/cache/c-red-2.aa6399a331f9a683cbbddcd27072a505.png",
"content" : "",
"outline" : "C-RED 2 is a revolutionary high speed low noise SWIR camera able to run at 600 fps full frame with a very low noise under 30 electrons and ultra low dark under 600 e\/p\/s.\r\n",
"outline_limited" : "C-RED 2 is a revolutionary high speed low noise SWIR camera able to run at 600 fps full frame with a very low noise under 30 electrons and ultra low dark under 600...",
"highlights" : " 640 x 512 InGaAs sensor<\/p>, SWIR 0.9 - 1.7 μm<\/p>, 15 μm pixel pitch<\/p>, 70% QE, wavelength from 0.9 to 1.7 μm<\/p>, Up to 600 fps full frame<\/p>",
"overview" : "C-RED 2 by First Light Imaging\r\nC-RED 2 is a revolutionary ultra high speed low noise Short Wave Infrared camera, able to run at 600 fps full frame with less than 30 electrons readout noise. To achieve this performance, C-RED 2 integrates a 640 x 512 InGaAs PIN Photodiode detector with 15 μm pixel pitch for high resolution, which embeds an electronic shutter with integration pulses shorter than 5 μs.\r\nC-RED 2 offers dark optimization for long exposure times up to 60 seconds and High Dynamic Range: 93 dB and true 16 bits. Designed for high-end low light SWIR applications, C-RED 2 offers new opportunities for science, research and industry.",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "\n \n \n \n \n Sensor Specifications\n \n \n C-RED 2\n \n \n \n \n Sensor Size\n \n \n 640 x 512 pixels\n \n \n \n \n Pixel Pitch\n \n \n 15 μm\n \n \n \n \n Maximum Speed Full Frame\n \n \n 600 fps\n \n \n \n \n Readout Noise at High Gain, Tint at 50 μs, 600 fps Full Frame\n \n \n < 30 e-\n \n \n \n \n Dark Current @ - 40°C\n \n \n < 600 e\/p\/s\n \n \n \n \n Quantization\n \n \n 14 bit\n \n \n \n \n Flat Quantum Efficiency 1.0 to 1.65 μm\n \n \n > 70%\n \n \n \n \n Operability due to signal response (pixels with signal ± 0.3*median at 20°C)\n \n \n > 99.8%\n \n \n \n \n Image Full well capacity\n \n \n low gain\n \n \n 1400 ke-\n \n \n \n \n med gain\n \n \n 128 ke-\n \n \n \n \n high gain\n \n \n 33 ke-\n \n \n \n \n Maximum speed in 32 x 4 (min)\n \n \n 32066 fps\n \n \n \n \n Maximum speed in 320 x 256\n \n \n 1779 fps\n \n \n \n \n\n",
"options" : "",
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"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "adaptive-optics","atmospheric-and-deep-space-imaging","fabrication-and-characterisation-of-light-emitting-devices","identification-of-contaminants-in-food-production-and-soil","quality-control-and-chemical-identification","solar-astronomy" ],
"applications_frontend" : "Adaptive Optics, Atmospheric & Deep Space Imaging, Fabrication and Characterisation of Light Emitting Devices, Identification of Contaminants in Food Production and Soil, Quality Control and Chemical Identification, Solar Astronomy",
"product_family" : "cr-series",
"product_family_frontend" : "C-RED Series",
"sorting_product_family" : "100",
"idx": 40,
"page_id": 25713,
"page_link" : "https://andor.oxinst.com/products/c-red-series/c-red-2",
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{
"name":"C-RED 3 SWIR",
"sorting_name":"c-red 3 swir",
"image":"/assets/components/phpthumbof/cache/c-red-3.fedbdd7340b135c492b380aa0ef25038.png",
"content" : "",
"outline" : "",
"outline_limited" : "",
"highlights" : " 640 x 512 InGaAs sensor<\/p>, 15 μm pixel pitch<\/p>, SWIR 0.9 - 1.7 μm<\/p>, 70% QE, wavelength from 0.9 to 1.7 μm<\/p>, Up to 600 fps full frame<\/p>",
"overview" : "C-RED 3 by First Light Imaging\r\nSpecially designed for short exposure time applications, C-RED 3 is a very compact high-speed VGA uncooled camera for short wave infrared (SWIR) imaging.\r\nC-RED 3 uses a 640 x 512 InGaAs PIN Photodiode detector with 15 μm pixel pitch for high resolution, which embeds an electronic shutter with integration pulses shorter than 5 μs. The cooling system has been removed and electronics squeezed to give a low size, weight and power consumption camera. C-RED 3 offers high performances at short integration times (below 10 ms).\r\nA patented adaptive bias allows to use the camera in any variable temperature environment. Autonomous, ultra compact and also available for OEM, C-RED 3 offers a solution for every application and every budget.",
"features" : "",
"features_benefits" : "Easy integration - The camera can be easily integrated in a system thanks to the holes on the bottom, the side, or the front, and has a C-Mount\/CS-Mount\/T-Mount optical interface for the objective. The core version (without housing) is even more easy to fit any custom system.,High sensitivity - C-RED 3 compensates the dark current, necessarily high for a non-regulated camera, by a very high frame rate. When used in windowing (ROI) mode at higher frame rates (up to 32 066 fps), the dark current is completely negligible.,Real-time adaptive bias\/dark correction - To compensate the effects of temperature and exposure time variations on the dark frame, C-RED 3 offers an adaptive correction. Dark frames are automatically computed by the camera firmware. Calibrated in factory, this process eliminates the need to perform multiple experimental bias\/dark acquisitions, hence simplifying your experiments.,Electronic shutter - C-RED 3 embeds an electronic shutter with integration pulses shorter than 5 μs in full frame mode.,Windowing and Region of Interest (ROI) - Windowing mode allows to achieve faster image rate while maintaining a very low noise, which is very interesting for FSO applications where a limited number of modes will be corrected, so a smaller amount of pixels are needed.,High frame rate - C-RED 3 can work at 600 fps in full frame mode. The frame rate increases up to several kHz in ROI mode (for example 9.5 kHz for a 64-by-64 pixels ROI).,Low camera latency - The delay between the end of integration and the first valid data on CameraLink in normal readout mode full frame is 22.2 μs (default) and can be tuned down to 7.4 μs.,Numerous synchronization mechanisms - Internal and external triggers allow optimal interface of the camera to the rest of the FSO and AO system (laser, computer, etc.).",
"extended_tabs" : "\n \n \n Sensor Specifications\n C-RED 3\n \n \n Sensor Size\n 640 x 512 pixels\n \n \n Pixel Pitch\n 15 μm\n \n \n Maximum Speed Full Frame\n 600 fps\n \n \n Readout Noise at high gain, Tint at 50 μs, 600 fps Full Frame\n < 40 e-\n \n \n Quantization\n 14 bit\n \n \n Flat Quantum Efficiency 1.0 to 1.65 μm\n > 70%\n \n \n Operability due to signal response (pixels with signal ± 0.3*median at 20°C)\n > 99.5%\n \n \n Image Full Well Capacity\n low gain\n 1400 ke-\n \n \n medium gain\n 120 ke-\n \n \n high gain\n 33 ke-\n \n \n Maximum speed in 32 x 4 (min)\n 32066 fps\n \n \n Maximum speed in 320 x 256\n 1779 fps\n \n \n",
"options" : "",
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"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "adaptive-optics","analysis-of-environmental-contaminants","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","identification-of-contaminants-in-food-production-and-soil","inspection-and-process-control","quality-control-and-chemical-identification","solar-astronomy" ],
"applications_frontend" : "Adaptive Optics, Analysis of Environmental Contaminants, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Identification of Contaminants in Food Production and Soil, Inspection and Process Control, Quality Control and Chemical Identification, Solar Astronomy",
"product_family" : "cr-series",
"product_family_frontend" : "C-RED Series",
"sorting_product_family" : "100",
"idx": 41,
"page_id": 25722,
"page_link" : "https://andor.oxinst.com/products/c-red-series/c-red-3",
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{
"name":"C-RED New Space SWIR",
"sorting_name":"c-red new space swir",
"image":"/assets/components/phpthumbof/cache/c-red-newspace.36929483d885cb0fbf449f4bf869740f.png",
"content" : "",
"outline" : "We are proud to introduce our latest innovation: C-RED New Space, a SWIR camera core specifically designed to uphold optical excellence and withstand the extreme conditions of space operations.\r\n",
"outline_limited" : "We are proud to introduce our latest innovation: C-RED New Space, a SWIR camera core specifically designed to uphold optical excellence and withstand the extreme conditions of...",
"highlights" : " SWIR 0.9 - 1.7 μm<\/p>, Full Frame 600 fps<\/p>, <30 e- RON<\/p>, 640 x 512 InGaAs, 15 μm pixel pitch<\/p>, 93 dB and true 16 bits<\/p>",
"overview" : "C-RED New Space by First Light Imaging\r\nC-RED New Space is a SWIR camera core based on a VGA InGaAs space-approved sensor with a resolution of 640x512 pixels and a 15µm pixel pitch, for a successful seamless integration into any system specifically satellite optical payloads. The camera offers extensive customization in hardware, electronic design and firmware to ensure optimal performance and support the demanding conditions of space operations.\r\nThe camera offers a full frame acquisition speed of 600 frames per second and up to 32066 frames per second in 32x4 in windowing mode. Its high frame rate optimizes temporal resolution, making it invaluable for applications that involve rapid changes or movements. This high framerate is combined to an extreme sensitivity and high dynamic range, without compromises.\r\nC-RED New Space offers a readout noise below 30 electrons and a 93 dB and true 16 bits high dynamic range mode: it enables imaging and sensing in ultra low light conditions and various light intensities. Additionally, the camera can operate across a large operational temperature range, making it suitable for challenging environments. Its advanced thermal design ensures low and repeatable noise, as well as maintained quantum efficiency performances.\r\nC-RED New Space is an indispensable tool for space projects.",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "\n \n \n \n Sensor Specifications\n \n \n C-RED New Space\n \n \n \n \n Sensor Size\n \n \n 640 x 512 pixels | 0.3 Mp\n \n \n \n \n Pixel Pitch\n \n \n 15 μm\n \n \n \n \n Quantization\n \n \n 14 bit\n \n \n \n \n Readout Noise at high gain, Tint at 50 μs, 600 FPS Full Frame at 5°C\n \n \n <30 e-\n \n \n \n \n Flat Quantum Efficiency from 1.1 μm to 1.65 μm\n \n \n >70%\n \n \n \n \n Operability due to signal response (pixels with signal ± 0.3*median at 20°C)\n \n \n >99.8 %\n \n \n \n \n Image full well capacity\n \n \n low gain\n \n \n 1.4 Me-\n \n \n \n \n medium gain\n \n \n 115 ke-\n \n \n \n \n high gain\n \n \n 34 ke-\n \n \n \n \n Frame rate\n \n \n full frame\n \n \n 600 fps\n \n \n \t\n \n 32 x 4 (min) pixels\n \n \n 32066 fps\n \n \n \n \n 320 x 256 pixels\n \n \n 1779 fps\n \n \n \n",
"options" : "",
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"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "adaptive-optics","atmospheric-and-deep-space-imaging","solar-astronomy" ],
"applications_frontend" : "Adaptive Optics, Atmospheric & Deep Space Imaging, Solar Astronomy",
"product_family" : "cr-series",
"product_family_frontend" : "C-RED Series",
"sorting_product_family" : "100",
"idx": 42,
"page_id": 25721,
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{
"name":"C-RED One SWIR",
"sorting_name":"c-red one swir",
"image":"/assets/components/phpthumbof/cache/c-red-one.92ae7ce3a426732fb5b621c0ec4da60c.png",
"content" : "",
"outline" : "C-RED One is a ultra high-speed photon counting SWIR camera using a unique 320 x 256 pixels MCT e-APD array with 24 μm pixel pitch. The sensor allows sub-electron readout noise, taking advantage of the e-APD noise free multiplication gain and non-destructive readout ability.\r\n",
"outline_limited" : "C-RED One is a ultra high-speed photon counting SWIR camera using a unique 320 x 256 pixels MCT e-APD array with 24 μm pixel pitch. The sensor allows sub-electron readout noise,...",
"highlights" : " 320 x 256 e-APD MCT<\/p>, 24 μm pixel pitch<\/p>, SWIR 0.80 - 2.43 μm<\/p>, 70% QE, wavelength from 1.20 to 2.43 μm<\/p>, Up to 3500 fps full frame<\/strong><\/p>, Subelectron readout noise<\/strong><\/p>, NEW Vibration Control System Option<\/a><\/strong><\/p>",
"overview" : "C-RED One by First Light Imaging\r\nThe discovery of electron initiated avalanche photodiodes (e-APD) using mercury cadmium telluride (MCT) semiconductor materials permitted a significant breakthrough in SWIR imaging. C-RED One uses a unique 320 x 256 pixels MCT e- APD array with 24 μm pixel pitch with a wide spectral response over J, H and K bands, and outstanding cosmetics.\r\nThe sensor delivers unprecedented sub-electron readout noise, taking advantage of the e-APD noise free multiplication gain and non-destructive readout ability.\r\nC-RED One is capable of capturing up to 3500 full frames per second, without compromising on subelectron readout noise or very low background. The camera can also capture multiple regions of interest (ROI) readout allowing faster image rate (10’s of KHz) while maintaining sub-electron readout noise.\r\nC-RED One offers multiple readout modes:\r\n\r\n Global reset: Single read, Correlated Double Sampling (CDS), multiple non-destructive readouts (NDR) including ramp up and Fowler modes\r\n Rolling Reset: Single, N readout and IOTA including Ramp up and Fowler modes\r\n\r\nC-RED One is an autonomous system: the sensor is placed in a sealed vacuum environment and cooled down to cryogenic temperature (80 K) using an integrated pulse tube with a high reliability. The vacuum regeneration is managed by the camera.\r\nA vibration control system allows for the reduction of vibrations is available for integration in highly sensitive systems. C-RED One is opening new opportunities for high\r\n sensitivity and high speed SWIR imaging.",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "\n \n \n Sensor Specifications\n C-RED One\n \n \n Maximum speed Full Frame single readout\n 3500 fps\n \n \n Readout Noise at 1720 fps CDS readout and gain x50, looking at a black body at a\ntemperature of 80 K\n <1e-\n \n \n Dark current looking at a black body at a temperature of 80 K and e-APD gain x10\n <80 e-\/p\/s\n \n \n Quantization\n 16 bit\n \n \n \tDetector Operating Temperature (No LN2)\n 80 K\n \n \n Flat Quantum Efficiency from 1.1 μm to 2.4 μm (J, H, K) at 100 K\n >60%\n \n \n Operability due to signal response \/ pixels with signal <0.8*median at bias of 9 V and\nintegration time of 10 ms\n <0.1%\n \n \n Operability due to CDS noise \/ pixels with noise <2*median at bias of 9V and integration\ntime of 10 ms\n <0.1%\n \n \n Excess noise Factor F\n <1.25\n \n \n Pulse tube cooling, vibration imparted to the detector with respect to the front flange of\nthe camera (RMS along each detector axis)\n <1 μm\n \n \n",
"options" : "",
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"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "adaptive-optics","atmospheric-and-deep-space-imaging","fabrication-and-characterisation-of-light-emitting-devices","solar-astronomy" ],
"applications_frontend" : "Adaptive Optics, Atmospheric & Deep Space Imaging, Fabrication and Characterisation of Light Emitting Devices, Solar Astronomy",
"product_family" : "cr-series",
"product_family_frontend" : "C-RED Series",
"sorting_product_family" : "100",
"idx": 43,
"page_id": 25706,
"page_link" : "https://andor.oxinst.com/products/c-red-series/c-red-one",
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{
"name":"C-Swift+",
"sorting_name":"c-swift+",
"image":"/assets/components/phpthumbof/cache/C-Swift%2B.10fd630bffca31cdef23bd12bad1deb8.jpg",
"content" : "Download Centre !If? &subject=`` &operator=`notempty` &then=`` &else=`` C+ Series EBSD Detectors\nThe C+ series EBSD detectors, the C-Nano+ and the C- Swift+, are 2nd generation entry-level detectors designed for every type of EBSD application. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`17670`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Symmetry S3\nSymmetry S3 is a 3rd generation detector based on the advanced CMOS technology and unique design features that have made Symmetry the market’s leading EBSD detector. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`11381`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` AZtecHKL\nThis 16 page brochure illustrates why AZtec is the leading EBSD analysis platform on the market. Covers both hardware and software. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`5244`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` EBSD Explained\nEBSD Explained is a 24 page tutorial that not only gives newcomers a solid foundation in the underlining science of the subject, but also shows how the theory is applied in practice to get reliable and accurate EBSD results. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`16169`\n` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Application Note - Direct Observations of Phase Transformations using High Temperature EBSD\nLearn about a new phosphor screen for the Oxford Instruments CMOS EBSD detector range that uses an optical interference filter to block out the infrared signal during high temperature EBSD experiments. This new technology enables faster and more sensitive analyses of microstructural changes measured in-situ at high temperatures. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload",
"outline" : "The C-Swift+ is a high-speed and versatile entry-level EBSD detector designed for routine materials analysis and high throughput sample characterisation.The C-Swift+ benefits from many of the features that have made the Symmetry such a groundbreaking EBSD detector including, of course, a customised CMOS sensor designed for EBSD.",
"outline_limited" : "The C-Swift+ is a high-speed and versatile entry-level EBSD detector designed for routine materials analysis and high throughput sample characterisation.The C-Swift+ benefits...",
"highlights" : " Guaranteed indexing speeds of > 2000 pps<\/p>, 622 x 512 pixel EBSPs at 250 pps<\/p>, Fibre optics delivering extreme sensitivity for low energy and low current analyses<\/p>, Distortion free images<\/p>",
"overview" : "The C-Swift+ is a class-leading, high throughput EBSD detector. As with the Symmetry S3 detector, the C-Swift+ uses a customised CMOS sensor coupled with fibre optics, to deliver both speed and sensitivity, ensuring high quality results on even the most challenging materials.\r\nThe C-Swift+’s maximum speed of 2000 pps is achieved with good pattern resolution (156 x 128 pixels), representing 4 times the number of pixels than is used by a comparable CCD-based detector operating at much lower speeds, ensuring reliable indexing, high hit rates and impressive throughput on all types of samples. The distortion-free optics, in partnership with the powerful indexing algorithms in the AZtec software, enables the C-Swift+ to deliver excellent angular precision down below 0.05°. For applications that demand higher quality patterns, the C-Swift+ can collect 622 x 512 pixel patterns at speeds up to 250 pps, making it ideal for complex multi-phase samples and detailed phase analysis.\r\nThis is a detector that has been designed for fast, effective sample characterisation. Every component of the system, from the unique proximity sensor to the optional integrated forescatter detectors, has been designed to maximise performance and ease of use, and to make EBSD a standard tool in every laboratory.",
"features" : "The C-Swift+ detector sets a new standard when speed is key:\r\n\r\n Guaranteed indexing speeds of > 2000 pps using only 8 nA beam current\r\n Exceptional sensitivity delivered by fibre optics and an optimised phosphor screen, ensuring high quality patterns at low doses and low beam energies – resulting in maximum spatial resolution\r\n 156 x 128 pixel pattern resolution at maximum speed – 4 times more pixels than a fast CCD detector operating at slower speeds\r\n Full resolution (622 x 512) patterns – ideal for detailed phase and deformation analyses\r\n Low distortion optics, ensuring an angular precision better than 0.05°.\r\n Seamless EDS integration even at the highest speeds\r\n Bellows SEM interface, maintaining the microscope’s vacuum integrity\r\n Unique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position\r\n Simple and intuitive detector settings, ensuring optimum results every time\r\n Five integrated forescatter detectors (optional), providing full colour complementary channelling contrast and atomic number contrast images.\r\n",
"features_benefits" : "",
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"businesses" : "nanoanalysis",
"businesses_frontend" : "NanoAnalysis",
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"page_id": 22331,
"page_link" : "https://nano.oxinst.com/C-Swift-plus",
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{
"name":"ClearView-GPU™ Deconvolution",
"sorting_name":"clearview-gpu™ deconvolution",
"image":"/assets/components/phpthumbof/cache/imaris-clearview-gpu-package.3ba3525ec985ca672225674c7e67a2c5.jpg",
"content" : "9882",
"outline" : "ClearView-GPU™ is intuitive and easy, makes use of the existing hardware due to GPU acceleration and can be run in batch on multiple datasets.",
"outline_limited" : "ClearView-GPU™ is intuitive and easy, makes use of the existing hardware due to GPU acceleration and can be run in batch on multiple datasets.",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "",
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"businesses" : "bitplane",
"businesses_frontend" : "Imaris",
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"applications_frontend" : "",
"product_family" : "image-analysis-software",
"product_family_frontend" : "Image Analysis Software",
"sorting_product_family" : "1.17",
"idx": 45,
"page_id": 11052,
"page_link" : "https://imaris.oxinst.com/products/image-analysis-software/clearview-gpu™-deconvolution",
"weight" : 0,
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{
"name":"Closed Fluid Cell",
"sorting_name":"closed fluid cell",
"image":"/assets/components/phpthumbof/cache/MFP-3D-AFM-Closed-Fluid-Cell.4c5fd94a3b94bb352f6981af2944f410.jpg",
"content" : "",
"outline" : "The Closed Fluid Cell (CFC) for MFP-3D AFMs is designed to hold gases or liquids either statically or with perfusion through configurable inlet\/outlet ports. The unique design enables the cell, sample, and cantilever holder to be fully assembled and sealed in a controlled environment (e.g. glovebox or hood) and then transferred to the AFM for use. Two related versions are available: 1) the “Fluid Cell Lite” that has no inlet\/outlet ports and minimizes evaporation but is not completely sealed, and 2) the “Electrical Closed Cell,” which enables electrical connections to the sample.",
"outline_limited" : "The Closed Fluid Cell (CFC) for MFP-3D AFMs is designed to hold gases or liquids either statically or with perfusion through configurable inlet\/outlet ports. The unique design...",
"highlights" : "Completely enclosed and sealed cell,Ten access ports for fluid for gas exchange,Easy cleaning prevents contamination,Accommodates a variety of sample mounts",
"overview" : "",
"features" : "",
"features_benefits" : "",
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"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-liquid-environmental-control",
"product_family_frontend" : "MFP-3D Accessories: Control Temperature & Liquid Environments",
"sorting_product_family" : "100",
"idx": 46,
"page_id": 305,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-liquid-environmental-control/mfp-3d-closed-fluid-cell",
"weight" : 0,
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{
"name":"Conductive AFM (ORCA)",
"sorting_name":"conductive afm (orca)",
"image":"/assets/components/phpthumbof/cache/ORCA-mfp.8402267ac7a33fc9f0d45bd365629adc.jpg",
"content" : "",
"outline" : "The ORCA™ Conductive AFM probe holder provides conductive AFM imaging and I-V measurement capabilities for all MFP-3D AFMs. The standard module is capable of measuring currents from ~1 pA to 20 nA. Other current ranges and Dual Gain versions are available",
"outline_limited" : "The ORCA™ Conductive AFM probe holder provides conductive AFM imaging and I-V measurement capabilities for all MFP-3D AFMs. The standard module is capable of measuring...",
"highlights" : "Powerful current sensing technique for electrical characterization of conductivity variations in resistive samples, Standard ORCA module is capable of measuring currents from ~1 pA to 20 nA.<\/p>,Dual Gain ORCA uses two separate amplifiers for an even wider current range, from ~1 pA to 10 µA",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "failure-analysis","fabrication" ],
"applications_frontend" : "Failure Analysis , Fabrication",
"product_family" : "mfp-3d-nanoelectrical-accessories",
"product_family_frontend" : "MFP-3D Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 47,
"page_id": 293,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-nanoelectrical-accessories/mfp-3d-orca-conductive-afm",
"weight" : 0,
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{
"name":"Conductive AFM (ORCA) - Cypher",
"sorting_name":"conductive afm (orca) - cypher",
"image":"/assets/components/phpthumbof/cache/Cypher-Conductive-AFM-ZnO-photocurrent.88f8d13600768d45a8b3a4c5a2114df1.jpg",
"content" : "",
"outline" : "ORCA™ on Cypher AFMs provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA. Other current ranges and Dual Gain versions are available.",
"outline_limited" : "ORCA™ on Cypher AFMs provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA. Other...",
"highlights" : "Powerful current sensing technique for electrical characterization of conductivity variations in resistive samples, Standard ORCA module is capable of measuring currents from ~1 pA to 20 nA.<\/p>, Dual Gain ORCA uses two separate amplifiers for an even wider current range, from ~1 pA to 10 µA<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Functional Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "failure-analysis","fabrication","process-mineralogy-and-chemical-analysis" ],
"applications_frontend" : "Failure Analysis , Fabrication, Process Mineralogy and Chemical Analysis",
"product_family" : "cypher-nanoelectrical-accessories",
"product_family_frontend" : "Cypher Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 48,
"page_id": 321,
"page_link" : "https://afm.oxinst.com/products/cypher-nanoelectrical-accessories/cypher-conductive-afm",
"weight" : 0,
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{
"name":"Conductive AFM",
"sorting_name":"conductive afm - jupiter xr",
"image":"/assets/components/phpthumbof/cache/jupiter-conductive-afm-stock.c25496abfe29d143ebe4716152ef4946.png",
"content" : "",
"outline" : "The Optimized Resistance Conductance Amplifier (ORCA™) cantilever holder enables conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents ranging from ~1 pA to 20 nA. The dual gain version expands the current measurement range to 10 µA.",
"outline_limited" : "The Optimized Resistance Conductance Amplifier (ORCA™) cantilever holder enables conductive AFM imaging and I-V measurement capabilities. The standard module is capable of...",
"highlights" : " Powerful current sensing technique for electrical characterization of conductivity variations in resistive samples<\/p>, Standard ORCA module measures currents from ~1 pA to 20 nA.<\/p>, Dual Gain ORCA uses two separate amplifiers for current range, from ~6 pA to 10 µA<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "jupiter-afm-accessories",
"product_family_frontend" : "Jupiter AFM Accessories",
"sorting_product_family" : "100",
"idx": 49,
"page_id": 9871,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/conductive-afm-imaging-orca",
"weight" : 0,
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{
"name":"Contact Resonance Viscoelastic Mapping Mode",
"sorting_name":"contact resonance viscoelastic mapping mode",
"image":"/assets/components/phpthumbof/cache/Cypher-contact-resonance-titanium-on-silicon.f8c9d49fd844fad96520db7ce1abd2c7.jpg",
"content" : "",
"outline" : "Contact Resonance Viscoelastic Mapping Mode for Cypher AFMs excels at quantitative mapping of both elasticity and viscoelastic damping for materials in the ~1 GPa to 100’s GPa modulus range. Asylum’s exclusive Dual AC™ Resonance Tracking (DART) technology improves the sensitivity and accuracy of the technique. Precise wide-band, frequency-independent actuation is available by either piezo drive (sample or cantilever) or blueDrive photothermal excitation. ",
"outline_limited" : "Contact Resonance Viscoelastic Mapping Mode for Cypher AFMs excels at quantitative mapping of both elasticity and viscoelastic damping for materials in the ~1 GPa to 100’s GPa...",
"highlights" : "Contact mode technique that measures both storage modulus, E’, and loss modulus, E’’,Good for samples from 1 GPa to 300 GPa",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "measurement-of-polymer-and-polymer-phase-properties","imaging-of-layered-polymer-structures-and-failure-analysis","analysing-polymer-additives" ],
"applications_frontend" : "Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Analysing Polymer Additives",
"product_family" : "cypher-nanomechanical-accessories",
"product_family_frontend" : "Cypher Accessories: Nanomechanical and Thermal Properties",
"sorting_product_family" : "100",
"idx": 50,
"page_id": 284,
"page_link" : "https://afm.oxinst.com/products/cypher-nanomechanical-accessories/cypher-contact-resonance",
"weight" : 0,
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{
"name":"Contact Resonance Viscoelastic Mapping Mode",
"sorting_name":"contact resonance viscoelastic mapping mode",
"image":"/assets/components/phpthumbof/cache/Cypher-contact-resonance-titanium-on-silicon.f8c9d49fd844fad96520db7ce1abd2c7.jpg",
"content" : "",
"outline" : "Contact Resonance Viscoelastic Mapping Mode for MFP-3D AFMs excels at quantitative mapping of both elasticity and viscoelastic damping for materials in the ~1 GPa to 300 GPa modulus range. Asylum’s exclusive Dual AC™ Resonance Tracking (DART) technology improves the sensitivity and accuracy of the technique. Precise wide-band, frequency-independent actuation is available for either the tip or sample.",
"outline_limited" : "Contact Resonance Viscoelastic Mapping Mode for MFP-3D AFMs excels at quantitative mapping of both elasticity and viscoelastic damping for materials in the ~1 GPa to 300 GPa...",
"highlights" : "Contact mode technique that measures both storage modulus, E’, and loss modulus, E’’, Good for samples from 1 GPa to 300 GPa<\/p>, Speed varies from 0.1-2 Hz line scan rates<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "measurement-of-polymer-and-polymer-phase-properties","imaging-of-layered-polymer-structures-and-failure-analysis","analysing-polymer-additives" ],
"applications_frontend" : "Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Analysing Polymer Additives",
"product_family" : "mfp-3d-nanomechanical-accessories",
"product_family_frontend" : "MFP-3D Accessories: Nanomechanical and Thermal Properties",
"sorting_product_family" : "100",
"idx": 51,
"page_id": 289,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-nanomechanical-accessories/mfp-3d-contact-resonance-viscoelastic-mapping-mode",
"weight" : 0,
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{
"name":"CoolerHeater",
"sorting_name":"coolerheater - jupiter xr",
"image":"/assets/components/phpthumbof/cache/CoolerHeater.a504d816d1f2dc667511cee52e2319e7.jpg",
"content" : "",
"outline" : "The CoolerHeater uses a Peltier element to cool and heat samples between temperature of -30°C up to 120°C. The accessory includes a coolant pump for experiments at temperatures below 0°C. The stage supports samples up to 15 mm in diameter. The sample can be immobilized magnetically, with the use of clamps, or with thermally conductive paste. The accessory connects directly into the Jupiter expansion port enabling all the controls and measurement functions to be accessed through the software interface.",
"outline_limited" : "The CoolerHeater uses a Peltier element to cool and heat samples between temperature of -30°C up to 120°C. The accessory includes a coolant pump for experiments at temperatures...",
"highlights" : " -30°C to 120°C temperature control<\/p>, Four 1\/16” access ports available for gas purging, electrical access, or injection of fluids (liquid holder required)<\/em><\/p>, Easy magnetic or clamp sample mounting<\/p>",
"overview" : "",
"features" : "",
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"businesses" : "asylum",
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"product_family" : "jupiter-afm-accessories",
"product_family_frontend" : "Jupiter AFM Accessories",
"sorting_product_family" : "100",
"idx": 52,
"page_id": 9869,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/coolerheater",
"weight" : 0,
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{
"name":"cryoRaman – Cryogenic Raman Imaging Microscope",
"sorting_name":"cryoraman",
"image":"/assets/components/phpthumbof/cache/WITec-attocube_cryoRaman.f4d0690c76afe259eaeadb6752c5c4cf.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nKey Features Excitation wavelengths from VIS to NIR with optimized spectrometers Low-vibration closed-cycle cryostats (attoDRY series) User-friendly data acquisition and evaluation software Exceptionally precise low temperature nanopositioner (attocube AN series) 1.8K to 300K operating temperatures Unique cryogenically compatible Raman-specific objectives (attocube cryogenic objectives) Solenoid magnets with a strength of up to 12T or vector magnets Full polarization control in excitation and detection Software-controlled laser power adjustment Automated switching from optical microscopy to spectroscopic imaging Automated spectrometer calibration light source and routines Time-correlated single photon counting (TCSPC) modes Low-wavenumber Raman peak detection !If? &subject=`` &operator=`notempty` &then=`` &else=`` Application Examples\nRaman image of tungsten diselenide (WSe2) recorded at 120K. Areas with one (green), two (blue) and three (red) layers were clearly identified from their Raman spectra.\nRaman image of a MoS2\/WSe2 heterostructure recorded at 2K. The colors represent different layer numbers, compositions and orientations.\nPolarization- and magnetic field-dependent Raman images of single- and multi-layer MoS2 at 2K. The A’1 \/E’ intensity ratio is color coded. The polarizer and analyzer were oriented perpendicular or parallel to each other as indicated.\nTemperature-dependent shift of photoluminescence (PL) spectra for WSe2. The PL images at different temperatures (300K, 200K, 50K and 2K) are color coded according to the PL peak position. The normalized PL spectra for each temperature are color coded accordingly, with solid and dashed lines representing spectra from the center and the outer edges of the single layer, respectively.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Award-winning Technology cryoRaman has won a 2022 R&D 100 Award in the Analytical\/Test category. This renowned worldwide science and innovation competition is held by R&D World magazine and received entries from a dozen different countries.\nRead the official press release Customer Publications Powered by Bioz See more details on Bioz\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`413055`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
"outline" : "cryoRaman brings Raman imaging with unmatched spatial resolution to very low temperature measurements. It was developed for researchers investigating materials that reveal novel properties when cooled to near absolute zero. By combining the performance and modularity of the witec360 Raman microscopes with advanced cryostat and nanopositioner technology, experiments down to 1.8K in high magnetic fields are made easily accessible and configurable.\r\nDesigned to meet existing and emerging challenges, cryoRaman offers a robust standard feature set that can be augmented through an extensive range of options.",
"outline_limited" : "cryoRaman brings Raman imaging with unmatched spatial resolution to very low temperature measurements. It was developed for researchers investigating materials that reveal novel...",
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"outline" : "The Digital Access Module provides digital I\/O to the controller for applications such as photon counting and synchronization to the AFM scan. The Extended Digital Interface Module also provides additional programmable TTL outputs.",
"outline_limited" : "The Digital Access Module provides digital I\/O to the controller for applications such as photon counting and synchronization to the AFM scan. The Extended Digital Interface Module...",
"highlights" : "Easily plugs into the ARC controller,Four BNC connectors allow for digital inputs and\/or outputs,Ideal for applications such as photon counting, synchronization of user experiments to the AFM scan, and general purpose digital I\/O control",
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"image":"/assets/components/phpthumbof/cache/df-200-product.fed581df0735d157be161fc3cf9f1c41.png",
"content" : "23137",
"outline" : "The game-changer in confocal microscopy - with the Andor Dragonfly you can image at an unrivalled, multi-modal combination of speed, sensitivity and confocality.",
"outline_limited" : "The game-changer in confocal microscopy - with the Andor Dragonfly you can image at an unrivalled, multi-modal combination of speed, sensitivity and confocality.",
"highlights" : "Instant Confocal,Simultaneous multi-color TIRF,Laser widefield imaging,Single molecule imaging,VIS - NIR wavelengths",
"overview" : "The Dragonfly naturally benefits from Andor EMCCD and sCMOS technologies, with motorized optical zoom, the system delivers industry-leading signal to noise and image fidelity. Applications ranging from single molecule to live cell confocal, TIRFM to whole embryo and thick tissue imaging all benefit from the system’s speed and sensitivity. Dragonfly delivers real-time visualization for rapid specimen evaluation and GPU-accelerated deconvolution to maximize resolution and throughput.",
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"content" : "23137",
"outline" : "Dragonfly 600 integrates super-resolution solutions compatible with confocal, widefield or TIRF. Furthermore, it incorporates the newly developed High Power Laser Engine (HLE) and new TIRF imaging modality, which exploits Borealis® illumination, B-TIRF (Borealis TIRF) for easy setup, more even illumination and thus more usable data across the field of view.",
"outline_limited" : "Dragonfly 600 integrates super-resolution solutions compatible with confocal, widefield or TIRF. Furthermore, it incorporates the newly developed High Power Laser Engine (HLE)...",
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"image":"/assets/components/phpthumbof/cache/Eclogite-1167x340.8b48568806912a4c29eb6b41ec1ad6ca.jpg",
"content" : "2636",
"outline" : "Oxford Instruments provides AZtec analysis software and a wide choice of SDD detectors for EDS analysis in the SEM or FIB.\r\n\r\nWe provide solutions from routine EDS microanalysis on a budget to the most advanced nanoanalysis where performance counts\r\nWe provide turn-key solutions for; Gunshot Residue, Mineral Liberation, ThinFilm analysis and more\r\nBased on a 'next generation' range of Silicon Drift Detectors, Ultim Max - includes the world's largest area SDD at 170 mm2\r\nx-act 10 mm2 SDD is ideal for applications that do not demand the full performance of the large area Ultim Max detectors\r\nAZtecEnergy EDS Software for SEM combines the latest generation of detector hardware, multi-tasking software, decades of EDS know-how and feedback from the world's largest user community to create a platform that pushes back the boundaries of EDS analysis\r\n",
"outline_limited" : "Oxford Instruments provides AZtec analysis software and a wide choice of SDD detectors for EDS analysis in the SEM or FIB.\r...",
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"image":"/assets/components/phpthumbof/cache/Eclogite-1167x340.8b48568806912a4c29eb6b41ec1ad6ca.jpg",
"content" : "12890",
"outline" : "Oxford Instruments provides AZtec analysis software and a wide choice of SDD detectors for EDS analysis in the SEM or FIB.\r\n\r\nWe provide solutions from routine EDS microanalysis on a budget to the most advanced nanoanalysis where performance counts\r\nWe provide turn-key solutions for; Gunshot Residue, Mineral Liberation, ThinFilm analysis and more\r\nBased on a 'next generation' range of Silicon Drift Detectors, Ultim Max - includes the world's largest area SDD at 170 mm2\r\nx-act 10 mm2 SDD is ideal for applications that do not demand the full performance of the large area Ultim Max detectors\r\nAZtecEnergy EDS Software for SEM combines the latest generation of detector hardware, multi-tasking software, decades of EDS know-how and feedback from the world's largest user community to create a platform that pushes back the boundaries of EDS analysis\r\n",
"outline_limited" : "Oxford Instruments provides AZtec analysis software and a wide choice of SDD detectors for EDS analysis in the SEM or FIB.\r...",
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"image":"/assets/components/phpthumbof/cache/TEM_superally.ae0c54debecf518dfc774fac1eccb700.jpg",
"content" : "2635",
"outline" : "AZtec provides the ultimate materials characterisation system for EDS applications in the TEM and STEM. It is ideal for users working at the frontiers of analytical performance.\r\n\r\nBased on Ultim Max range of Silicon Drift Detectors\r\n\r\nUltim Max 100TLE: our flagship 100 mm2 TEM detector is ideal for field emission TEMs and aberration corrected systems\r\n\r\nWindowless for better light element detection\r\nDual detector option offers the worlds most sensitive EDS solution with a solid angle greater than 2 steradians\r\n\r\n\r\nUltim Max TSR, provides a large solid angle for conventional 200kV TEMs\r\nXplore TEM is an 80 mm2 detector ideal for standard TEM applications\r\n\r\n\r\nAZtecTEM software provides the power to acquire and process EDS data in real-time including drift correction, spectral mapping and linescanning\r\n",
"outline_limited" : "AZtec provides the ultimate materials characterisation system for EDS applications in the TEM and STEM. It is ideal for users working at the frontiers of analytical performance.\r...",
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"image":"/assets/components/phpthumbof/cache/MFP-3D-AFM-probe-station.86a3216b443ec555659c2fdefae10b96.jpg",
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"outline" : "The Probe Station attaches to the MFP-3D scanner and allows easy electrical probing of samples, electrical biasing, and other measurements while the sample is being scanned with the AFM. A variety of electrical connections can be made and combined with various imaging modes.",
"outline_limited" : "The Probe Station attaches to the MFP-3D scanner and allows easy electrical probing of samples, electrical biasing, and other measurements while the sample is being scanned with...",
"highlights" : "Allows easy electrical probing while the sample is being scanned,Easily attaches to the MFP-3D stage",
"overview" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Nanotechnology",
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"applications" : [ "failure-analysis" ],
"applications_frontend" : "Failure Analysis ",
"product_family" : "mfp-3d-other-driving-forces-acccessories",
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"page_link" : "https://afm.oxinst.com/products/mfp-3d-other-driving-forces-acccessories/mfp-3d-electrical-probe-station",
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"name":"Electrochemical Strain Microscopy (ESM)",
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"image":"/assets/components/phpthumbof/cache/ESM-SilverParticles.9c162a255de75833d7d050ac1f39cf08.jpg",
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"outline" : "ESM is a novel scanning probe microscopy technique that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution. (Available on all MFP-3D AFMs except the MFP-3D Origin.)",
"outline_limited" : "ESM is a novel scanning probe microscopy technique that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution. (Available on all...",
"highlights" : "Probes electrochemical processes in battery and fuel cell materials,Measures the direct coupling of ionic current to strain in nm-scale volumes with unprecedented resolution",
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"applications" : [ "ev-technologies","battery-technology" ],
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"outline" : "ESM is a novel scanning probe microscopy technique available on Cypher AFMs that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.",
"outline_limited" : "ESM is a novel scanning probe microscopy technique available on Cypher AFMs that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented...",
"highlights" : "Probes electrochemical processes in battery and fuel cell materials,Measures the direct coupling of ionic current to strain in nm-scale volumes with unprecedented resolution",
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"applications" : [ "battery-technology","ev-technologies" ],
"applications_frontend" : "Battery Technology, EV Technologies",
"product_family" : "cypher-nanoelectrical-accessories",
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"page_link" : "https://afm.oxinst.com/products/cypher-nanoelectrical-accessories/cypher-electrochemical-strain-microscopy",
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"outline" : "The Electrochemistry Cell (EC Cell) enables characterization of electrochemical processes (EC-AFM). The EC Cell kit includes a liquid cup, probe holder, sample holder, and standard electrodes. Users may choose their own potentiostat. The EC Cell is glovebox compatible. Available on all Cypher AFMs except the Cypher S.",
"outline_limited" : "The Electrochemistry Cell (EC Cell) enables characterization of electrochemical processes (EC-AFM). The EC Cell kit includes a liquid cup, probe holder, sample holder, and...",
"highlights" : "Fully sealed EC cell with uniquely designed probe holder and liquid cup for easy imaging in fluid,Compatible with most common solvents electrolytes and electrode materials,Simple to clean and assemble, even with gloves,Optional heating and cooling stages allow investigation of electrochemical thermodynamics,Glovebox option provides the ultimate environmental control with no performance compromises",
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"outline" : "The Electrochemistry Cell (EC Cell) enables in situ studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials. The cell can be operated in a fully sealed configuration and may be equipped for heating up to 60°C (Available on all MFP-3D models. Heated version is not available on the Origin).",
"outline_limited" : "The Electrochemistry Cell (EC Cell) enables in situ studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials. The cell can be operated in a...",
"highlights" : "A variety of electrodes is supplied with the EC cell, yet the design is extremely adaptable to accept customized sample mounts or electrodes,All parts of the EC Cell that come into contact with the electrolyte are made of PEEK polymer for contamination-free imaging,Easily disassembled for cleaning and samples can be readily removed for cleaning or polishing.",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nKey Features Enclosure\nReduction of environmental interference from sources such as temperature fluctuations, air drafts and acoustic noise\nGas-phase control with air-tight option\nCompliance with Laser safety Class 1 available\nOptical, electronic and peripheral connection with sealed feed-throughs Rigid Support Frame\nPassive vibration damping for high-resolution imaging\nActive damping option for enhanced stability available\nOptical breadboard included for experimental flexibility\nSpace-efficient design with footprint of only 80 cm x 80 cm\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Glove Box-Compatible witec360 Raman Systems Automated microscope components enable remote control Compact instrument footprint requires minimal space Lasers, spectrometers, controller and PC are freely positionable outside enclosure Software-driven routines accelerate sample turnover\nFully automated Oxford Instruments Raman microscope in an environmental enclosure (glove box by MBRAUN, Garching, Germany).\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`544575`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"sorting_name":"environmental and temperature control",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` Temperature Control: Heating and Cooling Stages Warming stages: Room temperature (RT) to moderately warm temperatures Heating stages: Temperature ranges up to 600 °C Hot stages: Temperatures >1000 °C Combined cooling and heating stages: Temperature ranges from -196 °C to 600 °C Cryo-stages: Cooling down to 3.2 K Temperature, Gas and Humidity Control: Stage Top Incubators Upright stage top incubators Inverted stage top incubators\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` cryoRaman - cryogenic Raman imaging microscope\nCombining Oxford Instruments' high-performance Raman with advanced cryostat technology, cryoRaman allows measurements at temperatures down to 1.8 K. Find out more\nLaboratory setup of cryoRaman !If? &subject=`` &operator=`notempty` &then=`` &else=``\nContact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`645270`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"outline" : "The Environmental Controller interfaces with the BioHeater™, PolyHeater™, CoolerHeater, Petri Dish Heater, and Humidity Sensing Cell to provide unprecedented precision and accuracy. The Environmental Controller is sold separately but works with multiple accessories using the SmartStart™ interface to auto-configure each for easy plug and play operation.",
"outline_limited" : "The Environmental Controller interfaces with the BioHeater™, PolyHeater™, CoolerHeater, Petri Dish Heater, and Humidity Sensing Cell to provide unprecedented precision...",
"highlights" : "Unprecedented precision and accuracy,SmartStart autoconfigures for any accessory for plug and play operation",
"overview" : "",
"features" : "",
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"extended_tabs" : "",
"options" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
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"idx": 68,
"page_id": 300,
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"sorting_name":"ergo advanced automation",
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"outline" : "The Advanced Automation package for Jupiter streamlines automating measurements at different locations. It ensures that measurements are made with consistent best-known practices while also improving efficiency and usability. \r\nAdvanced Automation Features:\r\n\r\n Easy to use operator workflow for consistent results\r\n Includes stage automation for sites at any point on the Jupiter 200-mm chuck\r\n Fully customizable scan settings saved to recipe\r\n Create multiple scan profiles for different measurements in a single automation run\r\n\r\n\r\n\r\n",
"outline_limited" : "The Advanced Automation package for Jupiter streamlines automating measurements at different locations. It ensures that measurements are made with consistent best-known practices...",
"highlights" : "",
"overview" : "",
"features" : "",
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"extended_tabs" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Nanotechnology,Semiconductors,Superconductivity,material characterisation,Kelvin probe force microscopy (KPFM)",
"businesses" : "asylum",
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"idx": 69,
"page_id": 25659,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/ergo-advanced-automation",
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"name":"Ergo AFM Software",
"sorting_name":"ergo afm software",
"image":"/assets/components/phpthumbof/cache/Ergo-AFM-software.2afb46010f4c64954a4bd37e096b7b98.jpg",
"content" : "10545",
"outline" : "Ergo is the new software interface for Asylum Research AFMs. Its streamlined workflow makes it simpler and faster to acquire high-quality AFM data that you can trust.",
"outline_limited" : "Ergo is the new software interface for Asylum Research AFMs. Its streamlined workflow makes it simpler and faster to acquire high-quality AFM data that you can trust.",
"highlights" : "",
"overview" : "",
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"idx": 70,
"page_id": 9232,
"page_link" : "https://afm.oxinst.com/products/afm-software-family/ergo-afm-software",
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"name":"Ergo KPFM Software",
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"image":"/assets/components/phpthumbof/cache/ergo%206.1%20product%20page%20main%20image.2815d036f62d5436ed7a88ddb055433e.png",
"content" : " ",
"outline" : "Kelvin Probe Force Microscopy is used to image a sample’s electrical potential. It is a surface-probing technique that provides information on the surface potential and work function.\r\nErgo KPFM software automates both the setup and scan settings. What has traditionally been a more complicated mode to run is now as easy to use as Tapping mode.\r\nErgo KFPM implements single pass Heterodyne KPFM for the highest resolution and most accurate relative quantitative measurements.\r\nErgo KPFM features:\r\n\r\nAutomatic KPFM setup and scan parameters with AutoPilot™.Seamlessly switch between Heterodyne, Sideband, and Amplitude Modulated KPFM modes. All techniques are single pass.No 3rd party hardware required.",
"outline_limited" : "Kelvin Probe Force Microscopy is used to image a sample’s electrical potential. It is a surface-probing technique that provides information on the surface potential and work...",
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"name":"Ergo KPFM Software",
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"image":"/assets/components/phpthumbof/cache/ergo%206.1%20product%20page%20main%20image.2815d036f62d5436ed7a88ddb055433e.png",
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"outline" : "\r\n Kelvin Probe Force Microscopy is used to image a sample’s electrical potential. It is a surface-probing technique that provides information on the surface potential and work function.\r\n\r\nErgo KPFM software automates both the setup and scan settings. What has traditionally been a more complicated mode to run is now as easy to use as Tapping mode.\r\nErgo KFPM implements single pass Heterodyne KPFM for the highest resolution and most accurate relative quantitative measurements.\r\nErgo KPFM features:\r\n\r\n\r\n Automatic KPFM setup and scan parameters with AutoPilot™.\r\n Seamlessly switch between Heterodyne, Sideband, and Amplitude Modulated KPFM modes. All techniques are single pass.\r\n No 3rd party hardware required.",
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"idx": 72,
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{
"name":"Extended Z-Range Head",
"sorting_name":"extended z-range head",
"image":"/assets/components/phpthumbof/cache/MFP-3D-AFM-Extended-Z-Range-Head.33dea6e942ace47d7bd3640371d31b8a.jpg",
"content" : "",
"outline" : "The MFP-3D Extended Z-Range Head provides 40 µm Z range for imaging tall samples and long-range force measurements, with very minimal degradation of imaging performance (atomic resolution is still achievable).",
"outline_limited" : "The MFP-3D Extended Z-Range Head provides 40 µm Z range for imaging tall samples and long-range force measurements, with very minimal degradation of imaging performance...",
"highlights" : "Accommodates high feature samples with a 40 µm Z scan range,Proprietary nanopositioning sensors are utilized for unprecedented precision and accuracy",
"overview" : "",
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"extended_tabs" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM",
"businesses" : "asylum",
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"product_family" : "mfp-3d-miscellaneous-accessories",
"product_family_frontend" : "MFP-3D Accessories: Adapting to Experimental Needs",
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"idx": 73,
"page_id": 318,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-miscellaneous-accessories/mfp-3d-extended-z-head",
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"name":"Fast Force Mapping Mode (FFM)",
"sorting_name":"fast force mapping mode - cypher afm",
"image":"/assets/components/phpthumbof/cache/Cypher-Fast-Force-Mapping-polymer-blend-3APR2018.dd2db84357c0ef141976c3a2ba3da7ed.jpg",
"content" : "",
"outline" : "Fast Force Mapping on Cypher AFMs measures force-distance curves at high speed (up to 1000 Hz) while capturing every curve in the image. Both real-time and offline analysis models can be applied to calculate modulus, adhesion, and other properties.",
"outline_limited" : "Fast Force Mapping on Cypher AFMs measures force-distance curves at high speed (up to 1000 Hz) while capturing every curve in the image. Both real-time and offline analysis models...",
"highlights" : " Force-distance curve mapping mode that operates at up to 1000 Hz z-rate<\/p>,Captures every force curve in the image, with no missing curves or hidden data manipulation,Captures both deflection and height sensor data for accurate measurement of both axes,Real-time and offline analysis models can be applied to calculate modulus, adhesion and other properties. Models are fully accessible by users for verification and modification.,Good for samples from 10 kPa to 100 GPa",
"overview" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
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"applications" : [ "measurement-of-polymer-and-polymer-phase-properties","analysing-polymer-additives","imaging-of-layered-polymer-structures-and-failure-analysis" ],
"applications_frontend" : "Measurement of Polymer and Polymer Phase Properties, Analysing Polymer Additives, Imaging of Layered Polymer Structures and Failure Analysis",
"product_family" : "cypher-nanomechanical-accessories",
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"idx": 74,
"page_id": 285,
"page_link" : "https://afm.oxinst.com/products/cypher-nanomechanical-accessories/cypher-fast-force-mapping-mode",
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"name":"Fast Force Mapping Mode (FFM)",
"sorting_name":"fast force mapping mode - jupiter afm",
"image":"/assets/components/phpthumbof/cache/fast-force-mapping-ffm-463x400.e36362fdbc50205fb12273e5d4622d1d.png",
"content" : "",
"outline" : "Fast Force Mapping on Jupiter XR AFM measures force-distance curves at high speed (up to 2500 Hz) while capturing every curve in the image. Both real-time and offline analysis models can be applied to calculate modulus, adhesion, and other properties.",
"outline_limited" : "Fast Force Mapping on Jupiter XR AFM measures force-distance curves at high speed (up to 2500 Hz) while capturing every curve in the image. Both real-time and offline analysis...",
"highlights" : " Force-distance curve mapping mode that operates at up to 2500 Hz z-rate<\/p>,Captures every force curve in the image, with no missing curves or hidden data manipulation,Captures both deflection and height sensor data for accurate measurement of both axes,Real-time and offline analysis models can be applied to calculate modulus, adhesion and other properties. Models are fully accessible by users for verification and modification.,Good for samples from 10 kPa to 100 GPa",
"overview" : "",
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"extended_tabs" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
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"applications" : [ "analysing-polymer-additives","imaging-of-layered-polymer-structures-and-failure-analysis","measurement-of-polymer-and-polymer-phase-properties","semiconductor-defect-analysis","semiconductors-and-microelectronics" ],
"applications_frontend" : "Analysing Polymer Additives, Imaging of Layered Polymer Structures and Failure Analysis, Measurement of Polymer and Polymer Phase Properties, Semiconductor Defect Analysis, Semiconductors and Microelectronics",
"product_family" : "jupiter-afm-accessories",
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"page_id": 12179,
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"name":"Fast Force Mapping Mode (FFM)",
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"content" : "",
"outline" : "Force-distance curve mapping technique that operates at up to 300 Hz z-rate and captures every force curve in the image with real-time and offline models for additional data analysis (MFP-3D Infinity only).",
"outline_limited" : "Force-distance curve mapping technique that operates at up to 300 Hz z-rate and captures every force curve in the image with real-time and offline models for additional data...",
"highlights" : " Force-distance mapping mode that operates at up to 300 Hz z-rate<\/p>, Captures every force curve in the image – no missing curves or hidden data manipulation<\/p>,Realtime and offline analysis models can be applied to calculate modulus, adhesion and other properties. Models are fully user-accessible for modification.,Good for samples from 10 kPa to 100 GPa",
"overview" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
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"applications" : [ "measurement-of-polymer-and-polymer-phase-properties","imaging-of-layered-polymer-structures-and-failure-analysis","analysing-polymer-additives","solar-cell-electrical-and-structural-characterisation" ],
"applications_frontend" : "Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Analysing Polymer Additives, Solar Cell Electrical and Structural Characterisation",
"product_family" : "mfp-3d-nanomechanical-accessories",
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"content" : "",
"outline" : "The Fluid Cell Lite for MFP-3D AFMs is an economical fluid imaging accessory that allows for optical access to the sample from below. The portless fluid dish helps prevent accidental leakage and is ideal for multi-user AFM facilities where each user can have their own cell and avoid cross-contamination.",
"outline_limited" : "The Fluid Cell Lite for MFP-3D AFMs is an economical fluid imaging accessory that allows for optical access to the sample from below. The portless fluid dish helps prevent...",
"highlights" : "Inert material construction of PEEK and FKM eliminates cross-contamination to the sample,Accommodates glass cover slips through adapters (included),Economical fluid cell for multi-user facilities where each user can have their own dedicated cell",
"overview" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
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"content" : "",
"outline" : "The liquid cantilever holder for the Cypher ES creates a completely sealed liquid environment, which makes measurements in liquid much simpler and eliminates the risk of spills.",
"outline_limited" : "The liquid cantilever holder for the Cypher ES creates a completely sealed liquid environment, which makes measurements in liquid much simpler and eliminates the risk of...",
"highlights" : "Image in a completely sealed liquid environment, Easy to setup and use<\/p>, Eliminates the risk of liquid leaks that can damage other AFMs<\/p>, Can optionally be used with heating and cooling accessories<\/p>",
"overview" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
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"page_link" : "https://afm.oxinst.com/products/cypher-operating-in-liquid/cypher-es-sealed-liquid-cell",
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"image":"/assets/components/phpthumbof/cache/Cypher-ES-gas-cell-polymer-blend-melt.352a4416bd51200ec2d4256f5da7b594.jpg",
"content" : "",
"outline" : "The Cypher ES gas cell allows operation in an ambient air environment or can be completely sealed for imaging in a controlled gas environment. For instance, polymer samples can imaged under an inert argon atmosphere during high temperature heating to avoid oxidation. The gas cell is included with the Cypher ES but can also be purchased as a spare part.",
"outline_limited" : "The Cypher ES gas cell allows operation in an ambient air environment or can be completely sealed for imaging in a controlled gas environment. For instance, polymer samples...",
"highlights" : "The gas cell is completely sealed for imaging in a gas environment",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
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"product_family" : "cypher-temperature-control-accessories",
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"name":"Heater Sample Stage (Cypher ES)",
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"image":"/assets/components/phpthumbof/cache/Cypher-ES-heater-stage.e3e87b216a667af1882293465cb2d7ba.jpg",
"content" : "",
"outline" : "The Cypher ES Heating Stage allows heating of samples in gas environments from ambient to 250°C in a sealed environment.",
"outline_limited" : "The Cypher ES Heating Stage allows heating of samples in gas environments from ambient to 250°C in a sealed environment.",
"highlights" : "Heats from ambient to 250°C in a completely sealed environment,Low-drift design allows large temperature changes while maintaining the same imaging area,Temperature is controlled through software, manually or programmatically (e.g. ramp and soak cycles),Passive heat transfer and insulation eliminate the need for heat exchange liquids and pumps,No external control boxes or other modules are required. No extra clutter or complexity",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "measurement-of-polymer-and-polymer-phase-properties","imaging-of-layered-polymer-structures-and-failure-analysis","analysing-polymer-additives" ],
"applications_frontend" : "Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Analysing Polymer Additives",
"product_family" : "cypher-temperature-control-accessories",
"product_family_frontend" : "Cypher Accessories: Control Temperature and Gas Environments",
"sorting_product_family" : "3",
"idx": 80,
"page_id": 335,
"page_link" : "https://afm.oxinst.com/products/cypher-temperature-control-accessories/cypher-es-heater-sample-stage",
"weight" : 0,
},
{
"name":"Heating and Cooling Sample Stage (Cypher ES)",
"sorting_name":"heating and cooling sample stage (cypher es)",
"image":"/assets/components/phpthumbof/cache/Cypher-ES-cooler-heater.5cda3dd6c04bb6693ffef43ab3592d19.jpg",
"content" : "",
"outline" : "The Cypher ES CoolerHeater Sample Stage allows heating or cooling of samples in gas or liquid environments from 0° to 120°C in a sealed environment.",
"outline_limited" : "The Cypher ES CoolerHeater Sample Stage allows heating or cooling of samples in gas or liquid environments from 0° to 120°C in a sealed environment.",
"highlights" : "Allows heating or cooling of samples in gas or liquid environments from 0° to 120°C in a completely sealed environment,Low-drift design allows large temperature changes while maintaining the same imaging area,Temperature is controlled through software, manually or programmatically (e.g. ramp and soak cycles),Passive heat transfer and insulation eliminate the need for heat exchange liquids and pumps,No external control boxes or other modules are required. No extra clutter or complexity",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cypher-temperature-control-accessories",
"product_family_frontend" : "Cypher Accessories: Control Temperature and Gas Environments",
"sorting_product_family" : "3.01",
"idx": 81,
"page_id": 336,
"page_link" : "https://afm.oxinst.com/products/cypher-temperature-control-accessories/cypher-es-heating-cooling-sample-stage",
"weight" : 0,
},
{
"name":"Heating and Cooling Sample Stage",
"sorting_name":"heating and cooling sample stage",
"image":"/assets/components/phpthumbof/cache/CoolerHeater.a504d816d1f2dc667511cee52e2319e7.jpg",
"content" : "",
"outline" : "The CoolerHeater uses a Peltier element to heat and cool samples. Temperature can be continuously controlled from -30°C to +120°C. The system includes a coolant pump for work below 0°C. It supports samples up to 15 mm in diameter. The kit includes various sample accessories, as well as a membrane and clamp for sealed operation (compatible with all MFP-3D models except Origin).",
"outline_limited" : "The CoolerHeater uses a Peltier element to heat and cool samples. Temperature can be continuously controlled from -30°C to +120°C. The system includes a coolant pump for...",
"highlights" : "Heats and cools within the range of -30°C to +120°C,Four sealed access ports allow for dry or inert gas purge, injection of fluids, or electrical access,A coolant pump is required for measurements below ~0°C when the Peltier generates sufficient heat",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-temperature-control-accessories",
"product_family_frontend" : "MFP-3D Accessories: Control Temperature and Gas Environments",
"sorting_product_family" : "100",
"idx": 82,
"page_id": 302,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-temperature-control-accessories/mfp-3d-heating-cooling-stage",
"weight" : 0,
},
{
"name":"Heliox<\/b>VL",
"sorting_name":"helioxvl",
"image":"/assets/components/phpthumbof/cache/HelioxVL.533c2eca3187bfbafcd740c813c49506.png",
"content" : "12719",
"outline" : "A ³He sample-in-vacuum dipstick insert system compatible with wet cryostats.",
"outline_limited" : "A ³He sample-in-vacuum dipstick insert system compatible with wet cryostats.",
"highlights" : "Quick sample change,Easy to use, Compact design<\/p>",
"overview" : "This ³He refrigerator is based on advanced sorption pump technology combined with the specially engineered 1 K condenser and ³He pot. \r\n\r\nQuick sample change\r\nEasy to use\r\nCompact design\r\nCan be combined with a magnetic sample environment\r\nFor magnetic fields below 6 T, a small magnet can be mounted on to the IVC tube and provides magnet operation in a transport dewar\r\nFor magnetic fields over 6 T, the HelioxVL is combined with magnetic environments with our Integra product range, providing magnetic fields up to 21 T\r\nHelioxVLis compatible with IntegraAC, the recondensing liquid helium cryostat. IntegraAC has been developed to significantly reduce the consumption of liquid helium by recondensing helium gas evaporated within the system, which would otherwise be vented from the cryostat. This decreases the frequency of helium refills. Cryogenic systems can be kept cold continuously, even when in stand-by mode, leading to greater freedom to schedule experimental time\r\n\r\nA complete system consists of:\r\n\r\nAn insert including the self-contained ³He dump and cryogenic pump\r\nAn external small pump for the 1 K condensing stage\r\nThe controlling electronics and software\r\nThe diagnostic wiring\r\n",
"features" : "Flexibilty: Heliox insert systems suit all experiments at temperatures around 300 mK with single shot ³He refrigerators\r\nLow maintenance: the Heliox has an in-built cryopump \r\nLow vibration: the combination of cryogenic pumping and a coil condenser at 1 K provides an excellent environment for vibration-sensitive measurements ",
"features_benefits" : "",
"extended_tabs" : "Base temperature: ≤ 245 mK for ≥ 90 hrs with no applied heat load\nCooling power: 40 μW at ≤ 290 mK, with a hold time > 10 hrs \nTemperature range: Base temperature to 300 K \nTemperature stability: ±3 mK for T ≤ 1.2 K and ± 0.1 K for T > 1.2 K\n ,\nSemiconductor Quantum Hall effect\nQuantum dots\nSingle electron tunnelling\nQuantum computing Magneto-resistance\nHall effect\nRF transport high frequency conductivity\nSolid state physics heavy fermion systems\nMetal insulator transition\nSpin glass\nMesoscopic systems\nGiant magnetic resistance Specific heat\nDe Haas-van alphen oscillations\nSolid state NMR\nElectrical resistivity\nMagneto-resistance\nNeutron scattering\nSuperconductivity low Tc superconductors\nQuantum computing\nJosephson junctions\nFlux vortices\nQuantum initial phenomena electrical resistivity\nScanning spectroscopy (STM\/AFM)\nSQUID characterisation \nAC susceptibility\nAstrophysics & cosmology Low temperature detectors\nSuperconducting tunnel junctions\nGE bolometers Electrothermal measurements\nVoltage biased measurements\nLow energy photon detection\nMetrology Quantum hall effect\nVoltage standards\nCurrent standards Magneto-resistance\nDC & AC low frequency transport and magnetic measurements\nSingle electron tunnelling\n\n",
"options" : "A range of standard wiring\r\n(External) 1 K stage pumping system ",
"accessories" : "IntegraAC,MercuryiTC (supplied as standard with HelioxVL) ",
"tags" : "Semiconductors,Quantum Hall Effect,Quantum dots ,Single electron tunneling ,Quantum computing,Solid State Physics,Heavy fermions systems ,Metal insulator transition,Spin glass ,Mesoscopic systems ,Giant magnetic resistance,Superconductivity,Quantum initial phenomena,Magneto-resistance , RF transport ,High frequency conductivity,Joule-Thomson condensation,Quantum Information Processing,material characterisation,Magneto-transport Measurements",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","quantum-information-processing","quantum-transport-measurement","characterisation-of-low-dimensional-structures" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Information Processing, Quantum Transport Measurement, Characterisation of Low Dimensional Structures",
"product_family" : "helium3-refrigerators",
"product_family_frontend" : "Helium3 Refrigerators",
"sorting_product_family" : "100",
"idx": 83,
"page_id": 430,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/helium3-refrigerators/helioxvl",
"weight" : 0,
},
{
"name":"Heliox<\/b>VT",
"sorting_name":"helioxvt",
"image":"/assets/components/phpthumbof/cache/HelioxVT.2ee19dd87dc2b9bee45cc14a4e7778a4.png",
"content" : "12705",
"outline" : "A 3He sample-in-vacuum insert system compatible with 4He variable temperature inserts. ",
"outline_limited" : "A 3He sample-in-vacuum insert system compatible with 4He variable temperature inserts. ",
"highlights" : " High performance<\/p>, Easy to use<\/p>, Quick sample change<\/p>",
"overview" : "This sample-in-vacuum ³He refrigerator achieves less than 300 mK for more than 40 hrs and achieves 50 µW of cooling power at 350 mK for over 6 hrs.\r\nThe HelioxVT uses a cold gas environment with a 50 mm access, therefore no need for a 1 K pot on the insert. This provides two key benefits:\r\n\r\n\r\nThe sample temperature range of a new or existing VTI can be extended below 280 mK\r\n\r\n\r\nThere is no liquid helium in the horizontal sample plane making the HelioxVT ideal for neutron or X-ray scattering experiments\r\n\r\n\r\nA complete system consists of:\r\n\r\nHelioxVT insert\r\nTemperature controller to operate the refrigerator\r\nA variable temperature insert (VTI) with pump\r\n",
"features" : "Flexibility: Heliox insert systems suit experiments at temperatures around 300 mK, particularly ideal for neutron or X-ray scattering applications\r\nEase of use: The sample is accessed by removing the insert, warming to room temperature and removing the inner vacuum chamber (IVC) tail\r\nHigh performance: 300 mK for more than 40 hours (with no applied heat load)",
"features_benefits" : "",
"extended_tabs" : "Base Temperature: 300 mK for 40 hrs with no applied heat load\nCooling Power: < 350 mK for 6 hrs with 50 μW applied\nTemperature range: 300 mK to 300 K\nTemperature stability: ± 3 mK below 1.2 K; ± 0.1 K above 1.2 K,\nSemiconductor Quantum Hall effect\nQuantum dots\nSingle electron tunnelling\nQuantum computing Magneto-resistance\nHall effect\nRF transport high frequency conductivity\nSolid state physics heavy fermion systems\nMetal insulator transition\nSpin glass\nMesoscopic systems\nGiant magnetic resistance Specific heat\nDe Haas-van alphen oscillations\nSolid state NMR\nElectrical resistivity\nMagneto-resistance\nNeutron scattering\nSuperconductivity low Tc superconductors\nQuantum computing\nJosephson junctions\nFlux vortices\nQuantum initial phenomena electrical resistivity\nScanning spectroscopy (STM\/AFM)\nSQUID characterisation \nAC susceptibility\nAstrophysics & cosmology Low temperature detectors\nSuperconducting tunnel junctions\nGE bolometers Electrothermal measurements\nVoltage biased measurements\nLow energy photon detection\nMetrology Quantum hall effect\nVoltage standards\nCurrent standards Magneto-resistance\nDC & AC low frequency transport and magnetic measurements\nSingle electron tunnelling\n",
"options" : "Spare IVC tail, to suit magnet if required\r\nVTI\r\nHigh temperature thermometry (provided as standard)",
"accessories" : "MercuryiTC (supplied as standard with HelioxVT) ",
"tags" : "2D materials,graphene,Semiconductors,Quantum Hall Effect,Quantum dots ,Single electron tunneling ,Quantum computing,Solid State Physics,Heavy fermions systems ,Metal insulator transition,Spin glass ,Mesoscopic systems ,Giant magnetic resistance,Superconductivity,Quantum initial phenomena,Magneto-resistance , RF transport ,High frequency conductivity,Joule-Thomson condensation,quantum transport measurements,Quantum Information Processing,Ultra Low Temperature ,material characterisation",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","quantum-information-processing","quantum-transport-measurement","characterisation-of-low-dimensional-structures" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Information Processing, Quantum Transport Measurement, Characterisation of Low Dimensional Structures",
"product_family" : "helium3-refrigerators",
"product_family_frontend" : "Helium3 Refrigerators",
"sorting_product_family" : "100",
"idx": 84,
"page_id": 431,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/helium3-refrigerators/helioxvt",
"weight" : 0,
},
{
"name":"Spectrometers",
"sorting_name":"hexalight",
"image":"/assets/components/phpthumbof/cache/Hexalight-Titleimage.851f864f54d22b495223c28d0f46d332.png",
"content" : "Benefits\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Broadband capability Achieve top-tier optical performance across a wide spectral range (350 – 1100 nm) with proprietary Olaf-Hollricher-Design (OHD) lenses `&else=`Broadband capability Achieve top-tier optical performance across a wide spectral range (350 – 1100 nm) with proprietary Olaf-Hollricher-Design (OHD) lenses ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Application flexibility Switch effortlessly between high-resolution and broadband acquisition for diverse Raman and photoluminescence measurements using the motorised grating turret `&else=`Application flexibility Switch effortlessly between high-resolution and broadband acquisition for diverse Raman and photoluminescence measurements using the motorised grating turret ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Scalable architecture Easily adapt to future experimental needs with six grating positions for cost-efficient upgrades `&else=`Scalable architecture Easily adapt to future experimental needs with six grating positions for cost-efficient upgrades ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Streamlined operation Simplify handling and protect grating integrity with software-controlled grating selection for increased system uptime, longevity and user convenience `&else=`Streamlined operation Simplify handling and protect grating integrity with software-controlled grating selection for increased system uptime, longevity and user convenience ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Trustable, reproducible results Ensure the highest image accuracy and consistent, distortion-free results with ultra-precise automated grating positioning and the OHD lens-based optics `&else=`Trustable, reproducible results Ensure the highest image accuracy and consistent, distortion-free results with ultra-precise automated grating positioning and the OHD lens-based optics ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Exceptional signal sensitivity Use reduced laser power for sensitive samples and to detect even the faintest Raman signals via Hexalight’s mirror-free beam path and ultra-sensitive CCD cameras that maximize the signal intensity `&else=`Exceptional signal sensitivity Use reduced laser power for sensitive samples and to detect even the faintest Raman signals via Hexalight’s mirror-free beam path and ultra-sensitive CCD cameras that maximize the signal intensity ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`High-speed data acquisition Accelerate workflows and reduce integration times through Hexalight’s outstanding sensitivity `&else=`High-speed data acquisition Accelerate workflows and reduce integration times through Hexalight’s outstanding sensitivity `\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nConfigurations\nHexalight features a modular design which supports up to 6 integrated grating options and two focal lengths (300 mm and 600 mm). All configurations are adaptable from basic to advanced configurations, allowing for future upgrades to accommodate additional excitation wavelengths and evolving spectral requirements.\nContact us for discussing your application and finding the best Hexalight configuration for you\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nExperience highest grating flexibility\nSelecting the optimal diffraction grating is essential for achieving meaningful spectroscopic results. The choice depends on the spectral region of interest and required resolution. With 6 positions, Hexalight offers the flexibility to select the optimal grating for each of your applications in one system. This is especially valuable for advanced approaches that require a wide range of capabilities, such as obtaining varied spectral information from a single sample, working with different laser wavelengths, or performing correlative measurements such as Raman and photoluminescence (PL).\nGrating flexibility in Hexalight. Left: Grating optimized for full spectrum detection. Middle: Grating with a blazing angle optimized for the orange-red region of the spectrum facilitating high-resolution analysis. Right: Grating with optimized blazing angle in the blue range.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nMonolight: Applications with a fixed spectral configuration\nFor applications requiring only one spectral configuration, Monolight is the budget-conscious alternative to Hexalight. It features a single fixed grating while retaining key advantages of Hexalight’s optical design and throughput. \nMonolight is the standard spectrometer for the alphaCART portable Raman system.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nFibre-based Beam Delivery: Facts and Benefits\nOur advanced photonic fibre technology ensures that the Hexalight and Monolight spectrometers operate with the highest light transmission efficiency.\nBenefits of Fibre-Based Beam Delivery:\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Virtually Lossless Transmission: Ensures maximum signal throughput for sensitive Raman signal detection.`&else=`Virtually Lossless Transmission: Ensures maximum signal throughput for sensitive Raman signal detection.` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Enhanced Spatial Resolution: Fibre-generated diffraction-limited point light source ensures true confocality.`&else=`Enhanced Spatial Resolution: Fibre-generated diffraction-limited point light source ensures true confocality.` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`User-Friendly Operation: Pre-aligned fibre-coupling units simplify setup and provide long-term stability.`&else=`User-Friendly Operation: Pre-aligned fibre-coupling units simplify setup and provide long-term stability.` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Reduced Interference: Remote laser placement minimizes thermal and vibrational disruptions near the microscope`&else=`Reduced Interference: Remote laser placement minimizes thermal and vibrational disruptions near the microscope` Contact us\nIf you have any questions, or would like to speak to an expert or request pricing, we will reply to your enquiry shortly.\nContact Us !renderForm? &form=`685`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`620610`&force_language_de=``&force_language_fr=``",
"outline" : "Hexalight is the groundbreaking spectrometer at the core of witec360 Raman microscopes. It establishes new standards in throughput and spectral flexibility by incorporating an innovative lens-based, mirror-free design and providing unprecedented broadband capabilities.\r\nEngineered for the needs of advanced research and development, Hexalight delivers exceptional performance across the spectrum, making it ideal for multi-user environments by accommodating diverse applications within a single device. Its modular setup ensures long-term scalability to adapt to evolving needs and budgetary conditions.",
"outline_limited" : "Hexalight is the groundbreaking spectrometer at the core of witec360 Raman microscopes. It establishes new standards in throughput and spectral flexibility by incorporating an...",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "raman",
"businesses_frontend" : "Raman",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "microscope-components",
"product_family_frontend" : "Microscope Components",
"sorting_product_family" : "100",
"idx": 85,
"page_id": 29289,
"page_link" : "https://raman.oxinst.com/products/microscope-components/spectrometers",
"weight" : 0,
},
{
"name":"High Bandwidth Photodiode Option",
"sorting_name":"high bandwidth photodiode option",
"image":"/assets/components/phpthumbof/cache/MFP-3D-AFM-High-Bandwidth-Deflection-Head.25468715db1866f2c0990489696eb798.jpg",
"content" : "",
"outline" : "The High Bandwith Photodiode Option upgrades vertical and horizontal signal detection bandwidth to >5 MHz on MFP-3D AFMs. The high bandwidth signal is available on two coaxial connectors for external measurement. (The MFP-3D Infinity includes this capability, except that the signals are internally routed to high-speed ADCs in the controller.)",
"outline_limited" : "The High Bandwith Photodiode Option upgrades vertical and horizontal signal detection bandwidth to >5 MHz on MFP-3D AFMs. The high bandwidth signal is available on two coaxial...",
"highlights" : "Upgrades vertical and horizontal signal detection bandwidth to >5 MHz,Signal is available on two coaxial connectors for external measurement.",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-miscellaneous-accessories",
"product_family_frontend" : "MFP-3D Accessories: Adapting to Experimental Needs",
"sorting_product_family" : "100",
"idx": 86,
"page_id": 319,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-miscellaneous-accessories/mfp-3d-high-bandwidth-photodiode-option",
"weight" : 0,
},
{
"name":"High Power Laser Engine",
"sorting_name":"high power laser engine",
"image":"/assets/components/phpthumbof/cache/hle.c0c5a2a3fea92f6ed46900a8db84f1af.png",
"content" : "",
"outline" : "Andor's high-end laser engine delivers high power for SMLM applications and photostimulation imaging with mosaic and micropoint. Further, the user can perform gentle live imaging for days using the neutral density filters.",
"outline_limited" : "Andor's high-end laser engine delivers high power for SMLM applications and photostimulation imaging with mosaic and micropoint. Further, the user can perform gentle live imaging...",
"highlights" : " Two to seven multimode laser lines in a single chassis and up to ten lines in dual configuration<\/p>, Wide VIS-NIR wavelength range<\/p>, Power range 400 to 2500 mW<\/p>, Two or three fast galvo-switched fibre outputs<\/p>, Suitable for dSTORM, PAINT single molecule applications and photostimulation<\/p>",
"overview" : "HLE offers two to seven multimode laser lines in a single chassis and up to ten lines in dual configuration. Both engines can be outfitted with two or three fast galvo-switched fibre outputs. \r\nThe new HLE benefits from lower coherence multimode lasers and with power levels ranging from 400 to 2500 mW is suitable for studies like dSTORM and PAINT (point accumulation in nanoscale topography) single molecule applications and photostimulation. HLE is equipped with direct modulation (2-100%) as well as serial neutral density filters enabling a further 1,2 or 3 optical density units for ultra-low light live-cell imaging. Active power and thermal management deliver long-term, ultra-stable, agile illumination.",
"features" : "",
"features_benefits" : "Wide VIS-NIR spectral range - The HLE is compatible with a wide range of laser sources and wavelengths; the current selection covers from 405 up to 780 nm,Direct modulation Lasers - Obtain exceptional spectral range, high efficiency and stability,Three-port switch: multi-function flexibility - Switch effortlessly between modes,Multi-line laser source - Flexible configuration allows up to 7 lines in the HLE-700 and up to 10 lines in dual configuration,Thermally managed - Effective thermal regulation helps to provide long-term, ultra-stable performance,Borealis-compatible - Benefit from enhanced throughput and uniformity in widefield and spinning disk confocal systems",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "fluorescence-microscopy" ],
"applications_frontend" : "Fluorescence Microscopy",
"product_family" : "microscopy-components",
"product_family_frontend" : "Microscopy Components",
"sorting_product_family" : "100",
"idx": 87,
"page_id": 25628,
"page_link" : "https://andor.oxinst.com/products/microscopy-components/high-power-laser-engine",
"weight" : 0,
},
{
"name":"High Temperature Sample Heater",
"sorting_name":"high temperature sample heater",
"image":"/assets/components/phpthumbof/cache/PolymerHeater.e543c4eb0ab64ef09ed4bfbc458397fa.jpg",
"content" : "",
"outline" : "The PolyHeater is a modular heating stage designed for high temperature polymer studies from ambient to 300°C in air or a controlled gas environment. It supports samples up to 20 mm in diameter. It is also available as the PolyHeater+ for temperatures up to 380°C and can be used on the MFP-3D AFM Infinity, Origin+ and BIO models. ",
"outline_limited" : "The PolyHeater is a modular heating stage designed for high temperature polymer studies from ambient to 300°C in air or a controlled gas environment. It supports samples up to 20...",
"highlights" : "Metal heating stage embedded in ceramic and high performance plastic,Exquisite temperature control,Four 1\/16” ports can be used for inert gas purging or electrical connections to the sample. The cell can be fully sealed.,Easy sample mounting",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "measurement-of-polymer-and-polymer-phase-properties","imaging-of-layered-polymer-structures-and-failure-analysis","analysing-polymer-additives" ],
"applications_frontend" : "Measurement of Polymer and Polymer Phase Properties, Imaging of Layered Polymer Structures and Failure Analysis, Analysing Polymer Additives",
"product_family" : "mfp-3d-temperature-control-accessories",
"product_family_frontend" : "MFP-3D Accessories: Control Temperature and Gas Environments",
"sorting_product_family" : "100",
"idx": 88,
"page_id": 301,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-temperature-control-accessories/mfp-3d-high-temperature-heater",
"weight" : 0,
},
{
"name":"Environmental Control & High Voltage",
"sorting_name":"high voltage & environmental control",
"image":"/assets/components/phpthumbof/cache/HV-Accessory-Dark-926x800-compressed.89e5b814da21ab587ed07e72735bb8a8.png",
"content" : "",
"outline" : "The High Voltage Accessory Chuck for Jupiter AFMs enables high voltage experiments up to ± 150 V while using environmental control accessories. \r\nThis accessory is compatible with:\r\n\r\n PolyHeater\r\n CoolerHeater\r\n Variable Field Module - VFM\r\n\r\nWith the addition of the High Voltage Accessory Chuck to our suite of high voltage options, Jupiter continues to extend its unique electrical characterization capabilities, making it the highest performing, most versatile, large-sample AFM on the market.\r\n",
"outline_limited" : "The High Voltage Accessory Chuck for Jupiter AFMs enables high voltage experiments up to ± 150 V while using environmental control accessories. \r...",
"highlights" : "",
"overview" : "",
"features" : "",
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"tags" : "Atomic Force Microscopy,AFM,Nanoelectrical Properties,Nanotechnology,2D,2D materials,graphene,thin film,electrical measurements,Semiconductors",
"businesses" : "asylum",
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"product_family" : "jupiter-accessories-high-voltage-options",
"product_family_frontend" : "Jupiter Accessories: High Voltage Options",
"sorting_product_family" : "100",
"idx": 89,
"page_id": 23857,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/jupiter-accessories-high-voltage-options/high-voltage-and-environmental-control",
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"name":"High Voltage Accessory (HVA150)",
"sorting_name":"high voltage accessory (hva150)",
"image":"/assets/components/phpthumbof/cache/HVA150-product-image-6.787d2f4cf146109e97065af05afd3736.png",
"content" : "!generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"0\",\"tabTitle\": \"Videos\",\"content\": !jsonEncode? &input=`\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"1\",\"tabTitle\": \"Resources\",\"content\": !jsonEncode? &input=` Download PDF High Voltage Accessory for Jupiter XR AFM - Datasheet !If? &subject=`` &operator=`notempty` &then=` `\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`34` &formTpl=`protected-form-wrapper` &unique_id=`748`\n` Download PDF Piezoresponse Force Microscopy with Asylum Research AFMs - Application Note !If? &subject=`` &operator=`notempty` &then=` `\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`34` &formTpl=`protected-form-wrapper` &unique_id=`18802`\n`\n`}}`",
"outline" : "The High Voltage Accessory (HVA150) for Jupiter AFMs expands the bias range that can be used during AFM experiments up to ±150 V. This allows for advanced AFM characterization of piezoelectric & ferroelectrics materials, 2D materials and thin films. With the addition of HVA150, Jupiter XR continues to extend its unique capabilities, making it the highest performing, large sample AFM on the market. This new accessory allows for:\r\n\r\n High sensitivity even on weak piezo- and ferroelectric materials\r\n Tip and sample biases up to ±150 V\r\n High voltage sample chuck for samples up to 200 mm\r\n\r\n*HVA150 is an optional accessory upgrade for Jupiter AFMs",
"outline_limited" : "The High Voltage Accessory (HVA150) for Jupiter AFMs expands the bias range that can be used during AFM experiments up to ±150 V. This allows for advanced AFM...",
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"tags" : "Atomic Force Microscopy,AFM,2D materials,graphene,Semiconductors,gallery_category: Piezoresponse Force Microscopy,piezoresponse force microscopy (PFM)",
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"page_id": 21948,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/jupiter-accessories-high-voltage-options/high-voltage-afm-accessory",
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"name":"High Voltage Options and Kits",
"sorting_name":"high voltage options and kits",
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"content" : "",
"outline" : "These optional high voltage packages allow ±220 V, (up to ±150 V on the MFP-3D Infinity) to be applied between the tip and sample. Each package includes a high voltage amplifier and additional accessories for your specific application. Compatible with the Closed Fluid Cell, Variable Field Module 3, PolyHeater, Humidity Sensing Cell, and CoolerHeater. ",
"outline_limited" : "These optional high voltage packages allow ±220 V, (up to ±150 V on the MFP-3D Infinity) to be applied between the tip and sample. Each package...",
"highlights" : "Expand experimental capabilities with high voltage capabilities,Compatible with a wide range of MFP-3D accessories",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM",
"businesses" : "asylum",
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"applications_frontend" : "",
"product_family" : "mfp-3d-other-driving-forces-acccessories",
"product_family_frontend" : "MFP-3D Accessories: Other Driving Forces",
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"idx": 91,
"page_id": 313,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-other-driving-forces-acccessories/mfp-3d-high-voltage-options-and-kits",
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"name":"High-Voltage Piezoresponse Force Microscopy (PFM)",
"sorting_name":"high-voltage piezoresponse force microscopy (pfm)",
"image":"/assets/components/phpthumbof/cache/Cypher-HV-PFM.88d47b57b6bb57e0fb74969cd17792d4.jpg",
"content" : "",
"outline" : "The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes an integrated high voltage amplifier (±150 V), high voltage cantilever holder, high voltage sample mount, and conductive cantilevers.",
"outline_limited" : "The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit...",
"highlights" : "Crosstalk-free measurements,High sensitivity and speed,Uses exclusive Dual AC Resonance Tracking (DART), Enables tip biases up to ±150 V<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Functional Properties,Nanotechnology",
"businesses" : "asylum",
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"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cypher-nanoelectrical-accessories",
"product_family_frontend" : "Cypher Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 92,
"page_id": 323,
"page_link" : "https://afm.oxinst.com/products/cypher-nanoelectrical-accessories/cypher-high-voltage-piezoresponse-force-microscopy-pfm",
"weight" : 0,
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"name":"Humidity Sensing Cell",
"sorting_name":"humidity sensing cell",
"image":"/assets/components/phpthumbof/cache/HumiditySensingCell.086b51678cc0af4e52b258f7299a5b31.jpg",
"content" : "",
"outline" : "The Humidity Sensing Cell measures humidity conditions with a sensor located within a sealed sample cell. The cell supports samples up to 30 mm in diameter. In addition, a moat that surrounds the sample with a salt solution allows for humidity control. The kit includes various sample accessories, as well as a membrane and clamp for sealed operation (compatible with all MFP-3D AFMs except Origin).",
"outline_limited" : "The Humidity Sensing Cell measures humidity conditions with a sensor located within a sealed sample cell. The cell supports samples up to 30 mm in diameter. In addition, a moat...",
"highlights" : "Small sealed sample chamber with a dedicated side access port for the solid state humidity sensor,Humidity control can be accomplished by filling a cup with concentrated salt solutions or by flowing a mixture of dry and wet gas through one of the four access ports",
"overview" : "",
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"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
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"product_family" : "mfp-3d-temperature-control-accessories",
"product_family_frontend" : "MFP-3D Accessories: Control Temperature and Gas Environments",
"sorting_product_family" : "100",
"idx": 93,
"page_id": 303,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-temperature-control-accessories/mfp-3d-humidity-sensing-cell",
"weight" : 0,
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"name":"Humidity Sensing Cell (Cypher ES)",
"sorting_name":"humidity sensing cell (cypher es)",
"image":"/assets/components/phpthumbof/cache/CypherES-humidity-cell-placeholder.ee2f2e05e77b0fa0adf1e5fffc7e2733.jpg",
"content" : "",
"outline" : "The Cypher ES Humidity Sensing Cell allows operation in gases while measuring the humidity within the cell. Externally-controlled gas can be perfused or a channel around the sample can be filled with saturated salt solutions to achieve known humidity levels.",
"outline_limited" : "The Cypher ES Humidity Sensing Cell allows operation in gases while measuring the humidity within the cell. Externally-controlled gas can be perfused or a channel around the...",
"highlights" : "Measure humidity while imaging in gas",
"overview" : "",
"features" : "",
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"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
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"product_family" : "cypher-temperature-control-accessories",
"product_family_frontend" : "Cypher Accessories: Control Temperature and Gas Environments",
"sorting_product_family" : "3.03",
"idx": 94,
"page_id": 334,
"page_link" : "https://afm.oxinst.com/products/cypher-temperature-control-accessories/cypher-es-humidity-sensing-cell",
"weight" : 0,
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"name":"iDus 1.7µm InGaAs",
"sorting_name":"idus 1.7µm ingaas",
"image":"/assets/components/phpthumbof/cache/idus-17-product.d4b3cf8d32a3e5c81f93146571919ecc.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Andor iDus InGaAs 1.7 array series provide the most compact and optimized research-grade platform for Spectroscopy applications between 1 and 1.7 μm. The Thermo-Electrically cooled, in-vacuum sensors reach cooling temperatures of -90ºC where the best signal-to-noise ratio can be achieved for the majority of the applications in this spectral region.",
"outline_limited" : "Andor iDus InGaAs 1.7 array series provide the most compact and optimized research-grade platform for Spectroscopy applications between 1 and 1.7 μm. The Thermo-Electrically...",
"highlights" : "0.6 to 1.7 μm,Peak QE of > 85%,TE cooling to -90°C,UltraVac™,Single window design",
"overview" : "Andor's iDus InGaAs 1.7 array detector series provides the most optimized platform for Spectroscopy applications up to 1.7 µm. The TE-cooled, in-vacuum InGaAs camera sensors reach cooling temperatures of -90°C where best Signal-to-Noise ratio can be achieved. Indeed dark current will improve moderately below -90°C where scene black body radiation will dominate, while Quantum Efficiency of the sensor will be greatly impacted at these lower temperatures and lead to a lower Signal-to-Noise ratio.",
"features" : "",
"features_benefits" : "0.6 to 1.7 µm - Operating wavelength range,Peak QE of > 85% - High detector sensitivity,TE cooling to -90°C - Negligible dark current without the inconvenience of LN2,UltraVac™ - Permanent vacuum integrity, critical for deep cooling and sensor performance,Single window design - Delivers maximum photon throughput,25 µm pixel width option - Ideal for high-resolution NIR spectroscopy,Simple USB 2.0 connection - USB plug and play – no controller box. Inputs & Outputs: External Trigger, Fire and Shutter TTL readily accessible. I2C for the more adventurous user,Software selectable output amplifiers - Allows user to optimize operation with choice of High Dynamic Range (HDR) or High Sensitivity (HS) modes of operation,Minimum exposure time of 1.4 µs - Enables higher time-resolution and minimization of dark current contribution for applications with reasonable signal level",
"extended_tabs" : "",
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"accessories" : "ACC-6MM-TUBING-2xxxxM - 6 mm tubing option for ACC-XW-CHIL-160 ,ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-SHT-NS25B - Bistable Shutter, Standalone (not needed for Shamrock spectrographs) ,ACC-SD-VDM1000 - Shutter Driver for NS25B Bistable Shutter (not needed for Shamrock spectrographs) ,SR-ASZ-0033 - SR-750 Adapter Flange for InGaAs detector. ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
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"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","fabrication-and-characterisation-of-light-emitting-devices","food-security","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","inspection-and-process-control","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","modular-microspectroscopy","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, Food Security, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Inspection and Process Control, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "idus-spectroscopy-cameras",
"product_family_frontend" : "iDus Spectroscopy Cameras",
"sorting_product_family" : "100",
"idx": 95,
"page_id": 238,
"page_link" : "https://andor.oxinst.com/products/idus-spectroscopy-cameras/idus-1-7-ingaas",
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"name":"iDus 2.2µm InGaAs",
"sorting_name":"idus 2.2µm ingaas",
"image":"/assets/components/phpthumbof/cache/idus-22-product.0c3a5b9530bc257dd8b6f8114cc92039.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Andor’s iDus InGaAs 2.2 array detector series provides the most optimized platform for Spectroscopy applications between 1.6 and 2.2 µm. The TE-cooled, in-vacuum sensors reach cooling temperatures of -90°C where best Signal-to-Noise ratio can be achieved.",
"outline_limited" : "Andor’s iDus InGaAs 2.2 array detector series provides the most optimized platform for Spectroscopy applications between 1.6 and 2.2 µm. The TE-cooled, in-vacuum sensors reach...",
"highlights" : "0.8 to 2.2 µm,Peak QE of > 70%,TE cooling to -90°C,UltraVac™,Single window design",
"overview" : "Andor's iDus InGaAs 2.2 array detector series provides the most optimized platform for Spectroscopy applications up to 2.2 µm. The TE-cooled, in-vacuum InGaAs camera sensors reach cooling temperatures of -90°C where best Signal-to-Noise ratio can be achieved. Indeed dark current will improve moderately below -90°C where scene black body radiation will dominate, while Quantum Efficiency of the sensor will be greatly impacted at these lower temperatures and lead to a lower Signal-to-Noise ratio.",
"features" : "",
"features_benefits" : "0.8 to 2.2 µm - Operating wavelength range,Peak QE of > 70% - High detector sensitivity,TE cooling to -90°C - Negligible dark current without the inconvenience of LN2,UltraVac™ - Permanent vacuum integrity, critical for deep cooling and sensor performance,Single window design - Delivers maximum photon throughput,25 µm pixel width option - Ideal for high-resolution NIR spectroscopy,Simple USB 2.0 connection - USB plug and play – no controller box. Inputs & Outputs: External Trigger, Fire and Shutter TTL readily accessible. I2C for the more adventurous user,Software selectable output amplifiers - Allows user to optimize operation with choice of High Dynamic Range (HDR) or High Sensitivity (HS) modes of operation,Minimum exposure time of 1.4 µs - Enables higher time-resolution and minimization of dark current contribution for applications with reasonable signal level",
"extended_tabs" : "",
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"accessories" : "ACC-6MM-TUBING-2xxxxM - 6 mm tubing option for ACC-XW-CHIL-160 ,ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-SHT-NS25B - Bistable Shutter, Standalone (not needed for Shamrock spectrographs) ,ACC-SD-VDM1000 - Shutter Driver for NS25B Bistable Shutter (not needed for Shamrock spectrographs) ,SR-ASZ-0033 - SR-750 Adapter Flange for InGaAs detector. ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
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"businesses_frontend" : "Andor",
"applications" : [ "identification-of-contaminants-in-food-production-and-soil","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","nanomaterial-growth-and-characterisation" ],
"applications_frontend" : "Identification of Contaminants in Food Production and Soil, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Nanomaterial Growth and Characterisation",
"product_family" : "idus-spectroscopy-cameras",
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{
"name":"iDus 401 CCD",
"sorting_name":"idus 401 ccd",
"image":"/assets/components/phpthumbof/cache/idus-401-product.0c3a5b9530bc257dd8b6f8114cc92039.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "The iDus 401 features a deep-cooled, 1024 x 127 pixels CCD array ideally suited to low-light applications including fluorescence\/photoluminescence, Absorption\/Transmission and Raman spectroscopy. The 401’s range of Back-Illuminated and Back-Illuminated Deep-Depletion sensor options provide optimised detection performance from UV through Visible to Near IR.",
"outline_limited" : "The iDus 401 features a deep-cooled, 1024 x 127 pixels CCD array ideally suited to low-light applications including fluorescence\/photoluminescence, Absorption\/Transmission and...",
"highlights" : "Peak QE of 95%,TE cooling to -100°C,UltraVac™,Single window design,Fringe suppression technology",
"overview" : "The USB2.0-based iDus series is a compact, yet feature-rich platform suitable for demanding spectroscopy applications such as low-light UV\/NIR Photoluminence or Raman spectroscopy, as well as day-to-day routine laboratory operation and integration into industry-grade systems.\r\nThe iDus 401 boasts market-leading deep thermo-electric cooling to -100°C, complemented by Andor’s UltravacTM technology with its un-matched reliability track record in the scientific and industrial community. The iDus low-noise electronics allows seamless access to the best signal-to-noise ratio performance for the widest range of photon detection regimes.\r\nAnti-fringing comes as standard on back-thinned & back-illuminated sensors for this 1024 x 127, 26 μm pixels array optimized for high dynamic range, high resolution and rapid data acquisition from Far UV to NIR.",
"features" : "",
"features_benefits" : "Peak QE up to 95% - Visible-optimized ‘BVF’ & infrared-optimized ‘BR-DD’ model,Fringe suppression technology as standard - Fringing greatly eliminated (Deep-Depletion) or minimized (Back-Thinned ‘BVF‘),TE cooling down to -100°C - Critical for elimination of dark current detection limit - no inconvenience associated with LN2.,Ultravac™ - Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year after year,Single UV-grade fused silica window - Best UV-NIR throughput performance, specific AR coating and wedge options available.,26 x 26 μm pixels - Optimized pixel format for high dynamic range and resolution.,Software-selectable pre-amplifier gain - Choice of best SNR performance of dynamic range at the touch of a button.,USB 2.0 connection - Ideal for laptop operation. Seamless operation alongside USB-based Shamrock spectrograph family,Compact and rugged platform - Ideal for OEM integration & laboratory setups.,Solis software for Spectroscopy - Comprehensive, user-friendly interface for simultaneous detector & spectrograph control.,Software Development Kit (SDK) - Ease of control integration into complex setups: Matlab, Labview, Visual Basic or C\/C++.",
"extended_tabs" : "",
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"accessories" : "ACC-6MM-TUBING-2xxxxM - 6 mm tubing option for ACC-XW-CHIL-16 ,ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-SD-VDM1000 - Shutter Driver for NS25B Bistable Shutter (not needed for Shamrock spectrographs) ,ACC-SHT-NS25B - Bistable Shutter, Standalone (not needed for Shamrock spectrographs) ,LM-C - C-mount lens adaptor ,LM-NIKON-F - F-mount lens adaptor ,LMS-NIKON-F-NS25B - Nikon F-mount lens adaptor with shutter ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
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"businesses_frontend" : "Andor",
"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-microspectroscopy","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
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"name":"iDus 416 CCD",
"sorting_name":"idus 416 ccd",
"image":"/assets/components/phpthumbof/cache/idus-416-product.0c3a5b9530bc257dd8b6f8114cc92039.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Andor’s new iDus 416 platform boasts a unique combination of very low dark noise and very high QE, offering unrivalled sensitivity in the near-infrared. This makes it the ideal detector for NIR Raman and Photoluminescence, reducing greatly acquisition times and removing the need for inconvenient LN2 cooling.",
"outline_limited" : "Andor’s new iDus 416 platform boasts a unique combination of very low dark noise and very high QE, offering unrivalled sensitivity in the near-infrared. This makes it the...",
"highlights" : "Low dark current,Peak QE up to 95%,30 mm wide sensor,TE cooling down to -95ºC,15 µm pixels",
"overview" : "The unique 2000 x 256, 15 µm pixel array allows extended, broadband and high resolution spectral acquisition, while the fringe suppression technology virtually eliminates the optical etalonning at the higher wavelengths.\r\nWith its compact form factor and USB 2.0 connectivity, the iDus 416 can be seamlessly integrated to Shamrock USB 2.0 spectrographs and controlled from a laptop. Andor’s UltraVac™ technology carries a unique track record when it comes to performance and reliability, maintaining superb performance year after year for both Research users and industrial integrators.",
"features" : "",
"features_benefits" : "Low dark current - 10x better than Back-Illuminated Deep-Depletion NIMO sensors, best SNR in the NIR.,Peak QE up to 95% - Best detection capability in the NIR.,15 µm pixels - Ideal for high resolution spectroscopy.,30 mm wide sensor - Superior simultaneous band-pass capture,Fringe suppression technology as standard - Optical etalonning virtually eliminated.,TE cooling down to -95°C - Critical for elimination of dark current detection limit - no inconvenience associated with LN2,Ultravac™ - Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance year after year.,USB 2.0 connection - Ideal for laptop operation.,Compact and rugged platform - Ideal for OEM integration & laboratory setups.,Solis software for Spectroscopy - Comprehensive, user-friendly interface for simultaneous detector & spectrograph control,Software Development Kit (SDK) - Ease of control integration into complex setups: Matlab, Labview, Visual Basic or C\/C++",
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"accessories" : "ACC-6MM-TUBING-2xxxxM - 6 mm tubing option for ACC-XW-CHIL-160 ,ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-SD-VDM1000 - Shutter Driver for NS25B Bistable Shutter (not needed for Shamrock spectrographs) ,ACC-SHT-NS25B - Bistable Shutter, Standalone (not needed for Shamrock spectrographs) ,LM-C - C-mount lens adaptor ,LM-NIKON-F - F-mount lens adaptor ,LMS-NIKON-F-NS25B - Nikon F-mount lens adaptor with shutter ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_PLUG-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted inserts (camera side) and valved male\/female connectors (chiller\/recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-microspectroscopy","nanomaterial-growth-and-characterisation","optical-imaging-systems","quality-control-and-chemical-identification","rapid-analysis-of-illicit-substances" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Microspectroscopy, Nanomaterial Growth and Characterisation, Optical Imaging Systems, Quality Control and Chemical Identification, Rapid Analysis of Illicit Substances",
"product_family" : "idus-spectroscopy-cameras",
"product_family_frontend" : "iDus Spectroscopy Cameras",
"sorting_product_family" : "100",
"idx": 98,
"page_id": 228,
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{
"name":"iDus 420 CCD",
"sorting_name":"idus 420 ccd",
"image":"/assets/components/phpthumbof/cache/idus-420-product.632e35fe2489de2e8dbeae8e27d6b71a.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "The scientific grade, 1024 x 255 high speed spectroscopy CCD camera is ideally suited to rapid analysis, multi-channel and low-light applications including fluorescence and Raman spectroscopy. The 420’s range of Front (Open Electrode) and Back Illuminated and Deep Depletion sensor options provide optimised performance from UV through Visible to Near IR.",
"outline_limited" : "The scientific grade, 1024 x 255 high speed spectroscopy CCD camera is ideally suited to rapid analysis, multi-channel and low-light applications including fluorescence and Raman...",
"highlights" : " Peak QE of 95%<\/p>,TE cooling to -100°C,UltraVac™,Single window design,26 x 26 μm pixel size",
"overview" : "The USB2.0-based iDus series is a compact, yet feature-rich platform suitable for demanding spectroscopy applications such as low-light UV\/NIR Photoluminence or Raman spectroscopy, as well as day-to-day routine laboratory operation and integration into industry-grade systems.\r\nThe iDus 420 boasts market-leading deep thermo-electric cooling to -100°C, complemented by Andor’s UltravacTM technology with its un-matched reliability track record in the scientific and industrial community. The iDus low-noise electronics allows seamless access to the best signal-to-noise ratio performance for the widest range of photon detection regimes.\r\nThis 1024 x 255 pixel matrix boasts a range of far UV and VIS-optimized back-thinned sensors & NIR-optimized back-illuminated (‘fringe-suppressed’) sensor options. Its, 26 x 26 μm pixel size is optimized for high dynamic range and high resolution, while its 6.6 mm height is ideally suited to multi-track spectroscopy.",
"features" : "",
"features_benefits" : "Peak QE of 95% - Visible-optimized ‘BV\/BVF’ and broadband UV-NIR ‘BEX2-DD’ model,Fringe suppression technology as standard (BVF and BEX2-DD models) - Fringing greatly reduced (Deep-Depletion) or minimized (Back-Thinned ‘BVF’),Extended range dual-AR option - Superior UV-NIR broadband QE,TE cooling to -100°C - Critical for elimination of dark current detection limit - no inconvenience associated with LN2,UltraVac™ - Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year after year,Single UV-grade fused silica window - Best UV-NIR throughput performance, specific AR coating and wedge options available,USB 2.0 connection - Ideal for laptop operation. Seamless operation alongside USB-based Shamrock spectrograph family,26 x 26 μm pixel size - Optimized pixel format for high dynamic range and resolution,Software selectable Pre-Amplifier Gain - Choice of best SNR performance of dynamic range at the touch of a button,Compact and rugged platform - Ideal for OEM integration & laboratory setups,Solis software for Spectroscopy - Comprehensive, user-friendly interface for simultaneous detector & spectrograph control,Software Development Kit (SDK) - Ease of control integration into complex setups: Matlab, Labview, Visual Basic or C\/C++",
"extended_tabs" : "",
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"accessories" : "ACC-6MM-TUBING-2xxxxM - 6 mm tubing option for ACC-XW-CHIL-16 ,ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-SHT-NS25B - Bistable Shutter, Standalone (not needed for Shamrock spectrographs) ,ACC-SD-VDM1000 - Shutter Driver for NS25B Bistable Shutter (not needed for Shamrock spectrographs) ,LM-C - C-mount lens adaptor ,LM-NIKON-F - F-mount lens adaptor ,LMS-NIKON-F-NS25B - Nikon F-mount lens adaptor with shutter ,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-microspectroscopy","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "idus-spectroscopy-cameras",
"product_family_frontend" : "iDus Spectroscopy Cameras",
"sorting_product_family" : "100",
"idx": 99,
"page_id": 237,
"page_link" : "https://andor.oxinst.com/products/idus-spectroscopy-cameras/idus-420",
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{
"name":"iKon-L 936 CCD",
"sorting_name":"ikon-l 936 ccd",
"image":"/assets/components/phpthumbof/cache/ikon-l.af81eabb9169fcdcbc7a7312536cda11.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Andor’s iKon-L High Dynamic Range CCD camera offers outstanding resolution, field of view, sensitivity and dynamic range performance. It boast a proprietary large area 5-stage TE cooler enabling cooling of this large area sensor down to an unprecedented -100°C without the aggravation of liquid nitrogen. NEW ‘Dual AR Extended Range’ sensor option offers broadest QE coverage, from UV to NIR.",
"outline_limited" : "Andor’s iKon-L High Dynamic Range CCD camera offers outstanding resolution, field of view, sensitivity and dynamic range performance. It boast a proprietary large area...",
"highlights" : "TE cooling to -100°C,Large area 2048 x 2048 sensor,4-speed readout up to 5 MHz,Low read noise,UltraVac™",
"overview" : "Andor’s iKon-L 936 is designed with scientific imaging in mind. The 2048 x 2048 array and 13.5 µm pixel pitch combine to deliver a 27.6 x 27.6 mm active image area, TE cooled down to -100°C. The iKon-L offers outstanding resolution, field of view, sensitivity and dynamic range performance. Ultimate sensitivity performance is achieved through combination of > 90% QE (back-illuminated sensor), low noise readout electronics and exceptionally deep TE cooling. The NEW Dual AR deep depletion ‘BEX2-DD’ sensor option provides an unmatched QE profile, offering highest possible QE from UV through to NIR.\r\niKon-L boasts a proprietary large area 5-stage TE cooler (4-stage optional), enabling cooling of this large area sensor down to an unprecedented -100°C without the aggravation of liquid nitrogen or compressed gas cooling, perfect for the longest of exposure times. Such performance renders this camera ideal for low-light applications such as astronomy or luminescence imaging, with ideal OEM adaptability and support. USB 2.0 connectivity and multi-MHz readout options provide for ease of integration and operation.",
"features" : "",
"features_benefits" : "Broad wavelength coverage - Now available with BEX2-DD (UV-NIR Broadband) sensor option,TE cooling to -100°C - Critical for elimination of dark current detection limit,Fringe Suppression Technology™ - NIR etaloning greatly reduced (BEX2-DD sensor type),4-speed readout up to 5 MHz - Slower readout for low noise, faster speeds for dynamic processes and 5 MHz for vizualization mode,Ultra low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise performance available,Large area 2048 x 2048 sensor - Large field of view and high resolution.,UltraVac™ - Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year after year,Dual output - High Sensitivity output for low-light applications, or High Capacity output for maximum dynamic range,Integrated shutter - F-mount (EF optional) with integrated programmable 45 mm shutter,Fast Kinetics & Cropped Sensor modes - For fast temporal resolution down to sub-millisecond",
"extended_tabs" : "",
"options" : "",
"accessories" : "ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-USBX-EU - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) - EU ,ACC-USBX-UK - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) - UK ,ACC-USBX-US - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) - US ,OA-CCFM - C-mount to Canon FD-mount adapter ,OA-CF - C-mount to Nikon F-mount adapter ,OA-COFM - C-mount to Olympus OM adapter ,OA-CTOT - C-mount to T-mount adapter ,OA-ECAF - Auto extension tubes (set of 3) for Canon EF ,OA-ECMT - Auto extension tubes (set of 3) for C-mount ,OA-EF - Auto extension tubes (set of 3) for Nikon F ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "atmospheric-and-deep-space-imaging","automotive-engines","battery-technology","exoplanet-discovery","material-composition-and-structure","materials-for-the-power-generation-industry","near-earth-objects-and-space-debris","optical-imaging-systems","rock-core-analysis","structural-materials-and-components","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Atmospheric & Deep Space Imaging, Automotive Engines, Battery Technology, Exoplanet Discovery, Material Composition and Structure, Materials for the Power Generation Industry, Near Earth Objects and Space Debris, Optical Imaging Systems, Rock Core Analysis, Structural Materials and Components, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "ikon-xl-and-ikon-large-ccd-series",
"product_family_frontend" : "iKon Large CCD Series",
"sorting_product_family" : "100",
"idx": 100,
"page_id": 229,
"page_link" : "https://andor.oxinst.com/products/ikon-large-ccd-series/ikon-l-936",
"weight" : 0,
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{
"name":"iKon-L HF CCD",
"sorting_name":"ikon-l hf ccd",
"image":"/assets/components/phpthumbof/cache/ikon-l-hf.f3be31785632215a1bb1f44dafda5708.png",
"content" : "",
"outline" : "Andor’s iKon-L HF is built for scientific imaging! The outstanding design brings together the key elements in a single optimized format; the highest QE (95%) Back-illuminated sensor, a single directly bonded FOP and a unique spring-loaded \"Soft Dock\" mount. This design delivers the highest transmission and spatial resolution optical performance combined with the ultra-low noise performance of the outstanding iKon-L platform.",
"outline_limited" : "Andor’s iKon-L HF is built for scientific imaging! The outstanding design brings together the key elements in a single optimized format; the highest QE (95%) Back-illuminated...",
"highlights" : "Fiber optic front,Peak QE of 95%,13.5 x 13.5 μm pixel size,Large area 2048 x 2048 sensor,TE cooling to -35°C",
"overview" : "The outstanding design brings together the camera’s key elements in a single optimized unit: the highest QE (95%) Back-illuminated sensor, a single directly bonded FOP and a unique spring-loading “Soft Dock” mount. This design delivers the highest optical performance high transmission, spatial resolution performance along with the ultra-low noise of the outstanding iKon-L platform. This is the camera of choice for indirect high energy applications, energies from soft to hard X-ray were high spatial resolution imaging of low flux signal is required. We offer three variants to cover the most common requirements all of which can be further modified or changed to suit evolving need. The unique feature “Soft Dock” spring-loaded fibre optic allows quick and safe mounting of the camera to a wide variety of fragile instrumentation, streak cameras, image intensifiers as well as easy placement of a full range of “off the shelf” scintillators.",
"features" : "",
"features_benefits" : "Soft Dock - Unique spring-loaded Fibre optic design allows the camera to be mounted safely and securely against fragile instrumentation,Fiber optic fronted - 1:1 fibre optic as standard. Direct bonded for optimal transmission,Peak QE of 95% - High detector sensitivity @ 550nm, peak scintillator emission,13.5 x 13.5 µm pixel size - Optimal balance of dynamic range and resolution,Large area 2048 x 2048 sensor - Large field of view and high resolution,TE cooling to -35°C - Minimization of dark current and pixel blemish,Up to 5 MHz pixel readout - Slower readout for low noise, faster speeds for dynamic processes and 5 MHz for focusing mode,USB 2.0 connection - USB plug and play – no controller box,Ultra-low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise available,Dual output - High sensitivity output for low flux applications, or a high capacity output for maximum dynamic range with extensive binning.",
"extended_tabs" : "",
"options" : "",
"accessories" : "ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-MEC-08169 - 1:1.9 Taper housing – excludes the fibre-optic taper. Please contact your local Andor representative for taper options. ,ACC-OPT-03838 - Beryllium filter Ø 60 mm, 200 µm thick ,SCT-FLT_HLD-C045IKL - Ø 60 mm filter and Ø45 x 3 mm scintillator holder for iKon-L HF,SCT-FLT_HLD-H050IKL - Ø 60 mm filter and 50 x 50 x 3 mm scintillator holder for iKon-L HF ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "automotive-engines","battery-technology","material-composition-and-structure","structural-materials-and-components","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Automotive Engines, Battery Technology, Material Composition and Structure, Structural Materials and Components, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 101,
"page_id": 202,
"page_link" : "https://andor.oxinst.com/products/high-energy-detection/ikon-l-hf",
"weight" : 0,
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{
"name":"iKon-L SO CCD",
"sorting_name":"ikon-l so ccd",
"image":"/assets/components/phpthumbof/cache/ikon-l-so.e6c7a6cf3ddfa74020627fc0e4d464a7.png",
"content" : "",
"outline" : "Andor's iKon-L SO is a revolutionary large area CCD platform, offering back illuminated (> 90% QE) full frame sensors up to 4MPixel(2k x 2k), 1 MHz readoutand unparalleled priority TE cooling down to –100°C.",
"outline_limited" : "Andor's iKon-L SO is a revolutionary large area CCD platform, offering back illuminated (> 90% QE) full frame sensors up to 4MPixel(2k x 2k), 1 MHz readoutand unparalleled...",
"highlights" : "Open front end,Peak QE of 95%,13.5 x 13.5 μm pixel size,Large area 2048 x 2048 sensor,TE cooling to -100°C",
"overview" : "Andor’s iKon series offers outstanding sensitivity performance through a combination of > 95% QE back-illuminated sensors, low noise readout electronics and industry-leading, maintenance-free deep TE-cooling down to -100°C. It features high resolution 1 and 4.2 Megapixel large area sensor options (with 13 and 13.5 µm pixels respectively) for simultaneous high dynamic range and high spatial resolution imaging in the VUV and soft x-ray range.A convenient 16-point, knife-edge sealed 6” rotatable CF-152 flange provides a robust and highlyeffective seal to any compatible vacuum chamber interface. The iKon-M and -L also offer a USB2 interface and Labview or EPICS compatibility for seamless integration into complex setups.",
"features" : "",
"features_benefits" : "Open front end - DN100CF \/ 6” CF \/ CF-152 flange and knife-edge sealing provided as standard for direct interfacing to vacuum chambers (rotatable design for iKon-M models).,1 MP and 4.2 MP sensor options - Choice of acquisition speed or large field-of-view to best match experimental needs.,13.5 x 13.5 µm pixel size - Ideal balance of dynamic range and resolution, on-head binning to extend dynamic range.,Peak QE of 95% - High photon collection efficiency for maximising signal-to-noise ratios. ‘Enhanced’ process back-illuminated sensor options for increased QE in the soft x-ray range.,Thermo-electric cooling down to -100°C - Efficiently minimizes dark current noise for acquisitions requiring longer sensor exposure time, obtain better signal-to-noise ratios faster.,Low noise readout down to 2.9 e- - Intelligent low-noise electronics offer the most ‘silent’ system noise.,Up to 5 MHz pixel readout speed - Slow readout for low noise and best SNR performance, faster speed for studying dynamic processes and 5 MHz focusing mode.,USB 2.0 interface - Built-in robust plug and play interface as standard.,Cropped sensor mode - Tracking stability to ensure all readout circuits experience same temperature and operating conditions.,Enhanced Baseline Clamp - Slower readout for lowest noise, faster speeds for more rapid readout and focusing.,Windows, Linux & Labview - Andor’s user-friendly SDK supports both Windows and Linux OS. LabView VI package available.,Integrated in EPICS - Seamless integration and operation at EPICS-based particle accelerators.,Filter and filter holders options - Accommodate beryllium (or aluminium) windows with thickness down to 200 µm for removal of unwanted lower energy radiations (< 2 keV). Ø45.5 mm supported for iKon-M and Ø60 mm for iKon-L.",
"extended_tabs" : "",
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"accessories" : "ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-FLG-SO-GSKT-CU - Copper gasket for DN100CF \/ 6 “ CF open-front camera knife-edge vacuum seal ,ACC-USBX-EU \/ ACC-USBX-UK \/ ACC-USBX-US - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) - EU\/UK\/US ,FLG-SO-SY-CONVERT-45 - SO-SY adapter for iKon-M, Ø45.5 mm filter ,FLG-SO-SY-CONVERT-60 - SO-SY adapter for iKon-L, Ø60 mm filter ,SO-FILTER-MNT-IKONL - Optional filter holder for iKon-L only (supplied as standard for iKon-M) ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "material-composition-and-structure" ],
"applications_frontend" : "Material Composition and Structure",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 102,
"page_id": 209,
"page_link" : "https://andor.oxinst.com/products/high-energy-detection/ikon-l-so",
"weight" : 0,
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{
"name":"iKon-L SY CCD",
"sorting_name":"ikon-l sy ccd",
"image":"/assets/components/phpthumbof/cache/ikon_l_sy.a3fd541501d0772fb251c7451cb34839.png",
"content" : "https:\/\/andor.oxinst.com\/products\/cameras-for-x-ray-euv-electron-and-neutron-detection",
"outline" : "The iKon-L SY a high energy detector with multiple digitization rates up to 5MHz. It offers outstanding field of view, resolution and dynamic range and widely used across Astronomy and Bio-Imaging OEM applications. It has UltraVac™ cooling to -55°C.",
"outline_limited" : "The iKon-L SY a high energy detector with multiple digitization rates up to 5MHz. It offers outstanding field of view, resolution and dynamic range and widely used across Astronomy...",
"highlights" : "‘Standalone’ Be filter,Peak QE of 95%,13.5 x 13.5 μm pixel size,Large area 2048 x 2048 sensor,Up to 5 MHz pixel readout",
"overview" : "Andor’s iKon-L SY 936 is designed to block unwanted visible light with it’s built in Berylium foil window while allowing the lowest X-ray photon energies to be imaged. The 2048 x 2048 array and13.5 x 13.5 μm pixels combine to deliver a 27.6 x 27.6 mm active image area. The iKon-L SY 936 offers outstanding resolution, field of view, sensitivity and dynamic range performance. Ultimate sensitivity performance is achieved through combination of > 90% QE (back-illuminated sensor), optimally selected fibre and low noise readout electronics.\r\nTE cooled for stable performance without the aggravation of liquid nitrogen or compressed gas cooling, perfect for the longest of exposure times. USB 2.0 connectivity and multi-MHz readout options enable seamless integration and operation.",
"features" : "",
"features_benefits" : "Standalone’ Be filter - 250 µm Berylium window with a back filled chamber as standard,Peak QE of 95% - High detector sensitivity,13.5 x 13.5 µm pixel size - Optimal balance of dynamic range and resolution,Large area 2048 x 2048 sensor - Large field of view and high resolution,Up to 5 MHz pixel readout - Slower readout for low noise, faster speeds for dynamic processes and 5 MHz for focusing mode,USB 2.0 connection - USB plug and play – no controller box,Ultra-low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise available,Dual output - High sensitivity output for low-light applications, or a high capacity output for maximum dynamic range with extensive binning.,Cropped sensor mode - Specialised acquisition mode for continuous imaging with fast temporal resolution.,Enhanced baseline clamp - Essential for quantitative accuracy of dynamic measurements.",
"extended_tabs" : "",
"options" : "",
"accessories" : "XW-RECR - Re-circulator for enhanced cooling performance ,ACC-XW-CHIL-160 - Oasis 160 Ultra compact chiller unit ,ACC-USBX-EU \/ ACC-USBX-UK \/ ACC-USBX-US - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) - EU\/UK\/US ",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "material-composition-and-structure","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Material Composition and Structure, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 103,
"page_id": 204,
"page_link" : "https://andor.oxinst.com/products/high-energy-detection/ikon-l-sy",
"weight" : 0,
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{
"name":"iKon-M 934 CCD",
"sorting_name":"ikon-m 934 ccd",
"image":"/assets/components/phpthumbof/cache/ikon-m-series.5eda461021d0c79e3be91659c7539ce1.png",
"content" : "",
"outline" : "Andor’s iKon-M 934 low noise CCD camera series are designed to offer the ultimate in high-sensitivity, low noise performance, ideal for demanding imaging applications. These high resolution 1024 x 1024 CCD cameras boast up to 95% QEmax, high dynamic range, and 13μm pixels.",
"outline_limited" : "Andor’s iKon-M 934 low noise CCD camera series are designed to offer the ultimate in high-sensitivity, low noise performance, ideal for demanding imaging applications. These...",
"highlights" : "100 °C UltraVac™ TE Cooling,Up to 95% QE and extra-low noise floor,5 MHz readout for dynamic performance,Sensor formats up to 1MegaPixel,‘Deep depletion’ near-IR version available,Dedicated photovoltaic inspection model available",
"overview" : "Andor’s iKon-M 934 series cameras are designed to offer the ultimate in high-sensitivity, low noise performance, ideal for demanding imaging applications. These high resolution 1024 x 1024 CCD cameras boast up to 95% QEmax, high dynamic range, 13 μm pixels and exceptionally low readout noise. The iKon-M benefits from negligible dark current with industry-leading thermoelectric cooling down to -100°C. The ‘Deep Depletion’ sensor option offers ultimate performance for NIR applications, the new Dual AR coating extends the QE performance significantly across the UV\/visible region of the spectrum for the broadest possible spectral coverage from one sensor. Fringe Suppression Technology™ radically minimizes etaloning effects in the NIR. Rapid vertical shifts combined with fast kinetics acquisition mode, comprehensive trigger modes and custom coated wedge window options, render the deep Depletion models ideal for NIR optimized Bose Einstein Condensation applications.",
"features" : "",
"features_benefits" : "Extended range Dual-AR option - Superior UV-NIR broadband back-illuminated QE,TE cooling to -100°C - Critical for elimination of dark current detection limit,Fringe Suppression Technology™ - NIR etaloning greatly reduced (BR-DD and BEX2-DD sensor types),Up to 5 MHz pixel readout - High frame rates achievable,Ultra low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise performance available,UltraVac™ - Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year after year,13 x 13 μm pixel size - Optimal balance of dynamic range and resolution,Integrated shutter - C-mount shutter as standard. Closed during readout to avoid vertical smear,Cropped Sensor Mode - Specialised acquisition mode for continuous imaging with fastest possible temporal resolution,Enhanced Baseline Clamp - Quantitative accuracy of dynamic measurements",
"extended_tabs" : "",
"options" : "",
"accessories" : "ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-USBX-EU - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) EU ,ACC-USBX-UK - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) UK ,ACC-USBX-US - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) US ,OA-CCFM - C-mount to Canon FD-mount adapter ,OA-CF - C-mount to Nikon F-mount adapter ,OA-COFM - C-mount to Olympus OM adapter ,OA-CTOT - C-mount to T-mount adapter ,OA-ECAF - Auto extension tubes (set of 3) for Canon EF ,OA-EF - Auto extension tubes (set of 3) for Nikon F ,OA-ECMT - Auto extension tubes (set of 3) for C-mount ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "atmospheric-and-deep-space-imaging","exoplanet-discovery","optical-imaging-systems","quantum-optics","rock-core-analysis","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Atmospheric & Deep Space Imaging, Exoplanet Discovery, Optical Imaging Systems, Quantum Optics, Rock Core Analysis, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "ikon-xl-and-ikon-large-ccd-series",
"product_family_frontend" : "iKon Large CCD Series",
"sorting_product_family" : "100",
"idx": 104,
"page_id": 232,
"page_link" : "https://andor.oxinst.com/products/ikon-large-ccd-series/ikon-m-934",
"weight" : 0,
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{
"name":"iKon-M SO CCD",
"sorting_name":"ikon-m so ccd",
"image":"/assets/components/phpthumbof/cache/ikon-m-so-product.632e35fe2489de2e8dbeae8e27d6b71a.png",
"content" : "",
"outline" : "Andor’s USB 2.0 ikon-M SO series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface.",
"outline_limited" : "Andor’s USB 2.0 ikon-M SO series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable...",
"highlights" : "Open front end,Peak QE of 95%,13 x 13 μm pixel size,TE cooling to -100°C,Ultra-low noise readout",
"overview" : "Andor’s iKon series offers outstanding sensitivity performance through a combination of > 95% QE back-illuminated sensors, low noise readout electronics and industry-leading, maintenance-free deep TE-cooling down to -100°C. It features high resolution 1 and 4.2 Megapixel large area sensor options (with 13 and 13.5 μm pixels respectively) for simultaneous high dynamic range and high spatial resolution imaging in the VUV and soft x-ray range.\r\nA convenient 16-point, knife-edge sealed 6” rotatable CF-152 flange provides a robust and highlyeffective seal to any compatible vacuum chamber interface. The iKon-M and -L also offer a USB2 interface and Labview or EPICS compatibility for seamless integration into complex setups.",
"features" : "",
"features_benefits" : "Open front end - DN100CF \/ 6” CF \/ CF-152 flange and knife-edge sealing provided as standard for direct interfacing to vacuum chambers (rotatable design for iKon-M models).,1 MP and 4.2 MP sensor options - Choice of acquisition speed or large field-of-view to best match experimental needs.,13 x 13 µm pixel size - Ideal balance of dynamic range and resolution, on-head binning to extend dynamic range.,Peak QE of 95% - High photon collection efficiency for maximising signal-to-noise ratios. ‘Enhanced’ process back-illuminated sensor options for increased QE in the soft x-ray range.,Thermo-electric cooling down to -100°C - Efficiently minimizes dark current noise for acquisitions requiring longer sensor exposure time, obtain better signal-to-noise ratios faster.,Low noise readout down to 2.9 e- - Intelligent low-noise electronics offer the most ‘silent’ system noise.,Up to 5 MHz pixel readout speed - Slow readout for low noise and best SNR performance, faster speed for studying dynamic processes and 5 MHz focusing mode.,USB 2.0 interface - Built-in robust plug and play interface as standard.,Cropped sensor mode - Tracking stability to ensure all readout circuits experience same temperature and operating conditions.,Enhanced Baseline Clamp - Slower readout for lowest noise, faster speeds for more rapid readout and focusing.",
"extended_tabs" : "",
"options" : "",
"accessories" : "ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-FLG-SO-GSKT-CU - Copper gasket for DN100CF \/ 6 “ CF open-front camera knife-edge vacuum seal ,ACC-USBX-EU \/ ACC-USBX-UK \/ ACC-USBX-US - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) - EU\/UK\/US ,FLG-SO-SY-CONVERT-45 - SO-SY adapter for iKon-M, Ø45.5 mm filter ,FLG-SO-SY-CONVERT-60 - SO-SY adapter for iKon-L, Ø60 mm filter ,SO-FILTER-MNT-IKONL - Optional filter holder for iKon-L only (supplied as standard for iKon-M) ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "material-composition-and-structure","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Material Composition and Structure, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 105,
"page_id": 208,
"page_link" : "https://andor.oxinst.com/products/high-energy-detection/ikon-m-so",
"weight" : 0,
},
{
"name":"iKon-M SY CCD",
"sorting_name":"ikon-m sy ccd",
"image":"/assets/components/phpthumbof/cache/ikon_m_sy.4d24128845800f33f2f2c65971704e72.png",
"content" : "https:\/\/andor.oxinst.com\/products\/cameras-for-x-ray-euv-electron-and-neutron-detection",
"outline" : "Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from < 2.5 keV to > 20keV.",
"outline_limited" : "Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible...",
"highlights" : "5 Year Vacuum Warranty,‘Standalone’ Be Window,Multi-Megahertz readout,Crop mode operation,USB 2.0 connection",
"overview" : "Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from < 2.5 keV to > 20keV. This 1024 x 1024 sensor array with 13 x 13 μm pixels offers high dynamic range and high spatial resolution. Seamless software selection of a range of kHz and Multi-MHz readout speeds provide exceptionally low readout noise and faster frame rates respectively.",
"features" : "",
"features_benefits" : "UltraVac™ - 5 Year Warranty. Proprietary and proven vacuum process, critical for sustained vacuum integrity, sensor protection and unequalled cooling, year after year.,'Standalone’ Be Window - 200 µm Berylium window as standard,13 x 13 µm pixel size - Optimal balance of dynamic range and resolution,Ultra-low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise available,Multi-Megahertz pixel readout - High frame rates achievable (5 MHz in visualization mode, 50 kHz for the highest sensitivity and signal-to-noise ratio),USB 2.0 connection - USB plug and play – no controller box,Enhanced baseline clamp - Quantitative accuracy of dynamic measurements.,Cropped sensor mode - Specialized acquisition mode for continuous imaging with fast temporal resolution,Integrated in EPICS - Platform is fully integrated into the EPICS control software",
"extended_tabs" : "",
"options" : "",
"accessories" : "XW-RECR - Re-circulator for enhanced cooling performance ,ACC-XW-CHIL-160 - Oasis 160 Ultra compact chiller unit ,ACC-USBX-EU \/ ACC-USBX-UK \/ ACC-USBX-US - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) - EU\/UK\/US ",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "material-composition-and-structure","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Material Composition and Structure, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 106,
"page_id": 205,
"page_link" : "https://andor.oxinst.com/products/high-energy-detection/ikon-m-sy",
"weight" : 0,
},
{
"name":"iKon-XL SO CCD",
"sorting_name":"ikon-xl so ccd",
"image":"/assets/components/phpthumbof/cache/ikon-xl-so-product.9a82433d3dd4309b0731add7176cdcbc.png",
"content" : "",
"outline" : "The iKon-XL ‘SO’ very large area series offers a 16.8 MP, high resolution sensor platform with superb sensitivity and dynamic range up to 18-bit for challenging low-light direct X-Ray detection. It offers an extremely convenient platform with maintenance-free thermoelectric cooling down -75ºC as well as USB3 and long-distance direct fibre optic connectivity.",
"outline_limited" : "The iKon-XL ‘SO’ very large area series offers a 16.8 MP, high resolution sensor platform with superb sensitivity and dynamic range up to 18-bit for challenging...",
"highlights" : "Large area 16.8MP sensor,Peak QE of 95%,15 μm pixel size,Up to 18-bit digitization,TE cooling to -75°C",
"overview" : "Andor’s iKon-XL ‘SO’ is a TE-cooled, very large area CCD camera platform, accommodating big field of view sensors that are ideally suited to low light X-Ray imaging applications. It thermoelectrically cools back-illuminated 16.8 Megapixel sensors (e2v) down to -75°C, avoiding inconvenient maintenance-intensive LN2 cooling interface or unreliable cryo coolers. Extended Dynamic Range technology is complemented by up to 18-bit digitization. Flexible connectivity is standard through either USB 3.0 or a long distance direct fibre optic interface. iKon-XL is a high quality, robust and ‘hassle-free’ detector solution.",
"features" : "",
"features_benefits" : "Open-front end - DN160CF \/ 8” CF \/ CF-203 rotatable flange and knife-edge sealing provided as standard for direct interfacing to vacuum chambers,61.4 x 61.7 mm sensor - Very large field of view for extended imaging capabilities,15 x 15 µm pixel size - Ideal balance of dynamic range and resolution,Peak QE over 95% - High photon collection efficiency for maximising SNR,Thermo-electric cooling down to -75°C - Effective dark current and pixel blemish without the inconvenience of liquid nitrogen (LN2),Low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise,Fibre-optic or USB 3.0 interface flexibility - Built-in robust plug and play interface options as standard. Fibre optic for long distance solution,Extended Dynamic Range (18-bit) - Unique method to achieve lowest noise and maximum well depth within one scan. Supplemented by up to 18-bit digitization,Balanced Quad-port readout - Tracking stability to ensure all readout circuits experience same temperature and operating conditions,Multiple readout speeds, up to 3 or 4 MHz - Slower readout for lowest noise, faster speeds for more rapid readout and focusing",
"extended_tabs" : "",
"options" : "",
"accessories" : "SO-FILTER-MNT-IKONXL - Filter holder for iKon-XL SO, minimum recommended Beryllium window thickness is 250 µm (not included) ",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "material-composition-and-structure","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Material Composition and Structure, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 107,
"page_id": 207,
"page_link" : "https://andor.oxinst.com/products/high-energy-detection/ikon-xl-so",
"weight" : 0,
},
{
"name":"Imaging in Liquid",
"sorting_name":"imaging in liquid - jupiter xr",
"image":"/assets/components/phpthumbof/cache/jupiter-liquid-imaging-stock.291d0f03f624d4b2d5716fe6e963c748.png",
"content" : "",
"outline" : "Liquid imaging on Jupiter is enabled by a liquid specific cantilever holder and a CellLite sample holder. When used together, liquid evaporation is limited and the AFM is protected from accidental spills. As always, Asylum Research exclusive blueDrive technology renders liquid imaging simple to set up, stable for hours, and extremely reliable.",
"outline_limited" : "Liquid imaging on Jupiter is enabled by a liquid specific cantilever holder and a CellLite sample holder. When used together, liquid evaporation is limited and the AFM is protected...",
"highlights" : " blueDrive assures ease of use and imaging stability<\/p>, Cantilever holder design prevents evaporation and protects scanners<\/p>, Sample holder is chemically inert and easy to clean<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "jupiter-afm-accessories",
"product_family_frontend" : "Jupiter AFM Accessories",
"sorting_product_family" : "100",
"idx": 108,
"page_id": 9870,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/imaging-in-liquid",
"weight" : 0,
},
{
"name":"Imaris Stitcher",
"sorting_name":"imaris stitcher",
"image":"/assets/components/phpthumbof/cache/imaris_stitcher.5c722d5f712198343da7788f61df2408.jpg",
"content" : "2415",
"outline" : "Imaris Stitcher is the newest member of the Imaris family and is a stand-alone application made for precise alignment and fusing of multiple microscopy image tiles into one 2D, 3D or 4D volume.",
"outline_limited" : "Imaris Stitcher is the newest member of the Imaris family and is a stand-alone application made for precise alignment and fusing of multiple microscopy image tiles into one 2D, 3D...",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "bitplane",
"businesses_frontend" : "Imaris",
"applications" : [ "electron-microscopy","fluorescence-microscopy","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Electron Microscopy, Fluorescence Microscopy, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "image-analysis-software",
"product_family_frontend" : "Image Analysis Software",
"sorting_product_family" : "1.16",
"idx": 109,
"page_id": 2517,
"page_link" : "https://imaris.oxinst.com/products/image-analysis-software/imaris-stitcher",
"weight" : 0,
},
{
"name":"Integra<\/b> - helium magnet system",
"sorting_name":"integra - helium magnet system",
"image":"/assets/components/phpthumbof/cache/Integra---Solenoid-Magnets.72bf5a5d9096649f985f8414ed849dc9.png",
"content" : "12720",
"outline" : "A wide range of superconducting magnet systems up to 22 T, cooled by liquid helium.",
"outline_limited" : "A wide range of superconducting magnet systems up to 22 T, cooled by liquid helium.",
"highlights" : " Temperature range from 1.5 to 300 K using variable temperature insert (VTI)<\/p>, Compatible with existing ultra-low temperature inserts<\/p>, Ideal for highly vibration sensitive experiments<\/p>",
"overview" : "Building upon 50 years’ experience, we offer a wide range of wet superconducting magnet systems. The magnets can be integrated with our range of ultra-low temperature inserts including dilution refrigerators and 3He refrigerators.\r\n\r\nUp to 22 T from standard\r\nWide range of temperatures from 1.5 to 300 K, depending on the variable temperature inserts\r\nCan be integrated with our range of ultra-low temperature inserts including dilution refrigerators and 3He inserts\r\nIdeal for high vibration sensitive experiments\r\nOptimised, low loss, high temperature superconductor current leads as standard \r\n",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "\nCompensation coils can be used to improve the homogeneity at the centre of the field by reducing the rate at which the field drops at the end of the coils\nShim coils are used to remove residual field gradients, and may be wired in series with the main coils to give a basic level of correction ('series shims') or independently to give finer adjustment ('independent shims' with their own ISS10 shim power supply)\nModulation and gradient coils can be fitted into the bore of the magnet to provide a modulated (typically sinusoidal ac) magnetic field or a field gradient across the sample space. A single coils offers both options, and is powered via a separate set of current leads\nCancellation coils may be fitted above and\/or below a magnet to give a low field region close to the centre of field, frequently used with dilution refrigerator systems\n\nFurther magnet options, vector rotate, split pairs and more are available, please see our Custom & Speciality page or alternatively contact us for details.,Solenoids are fitted in a cryostat (dewar) and various dewar options are available as below:\n\nLow loss liquid-nitrogen shielded dewar\nIntegraAC - helium recondensing dewars \nVapour sheilded dewar for minimum vibration \nLambda point refrigerators available for 2.2K magnet operation \nAll stainless steel dewar for high field systems \n\nFurther dewar options are available through custom designed magnet systems - please contact us for details.,\nSemiconductors Quantum Hall effect\nQuantum dots\nSingle electron tunnelling\nQuantum computing Magneto-resistance\nHall effect\nRF transport\nHigh frequency conductivity\nSolid state physics Heavy fermion systems\nMetal insulator transition\nSpin glass\nMesoscopic systems\nGiant magnetic resistance Specific heat\nDe Haas-van Alphen oscillations\nSolid state NMR\nElectrical resistivity\nMagneto-resistance\nNeutron scattering\nSuperconductivity Low Tc superconductors\nQuantum computing\nJosephson junctions\nFlux vortices\nQuantum initial phenomena Electrical resistivity\nScanning spectroscopy (STM\/AFM)\nSQUID characterisation \nAC susceptibility\nAstrophysics & cosmology Low temperature detectors\nSuperconducting tunnel junctions\nGe bolometers Electrothermal measurements\nVoltage biased measurements\nLow energy photon detection\nMetrology Quantum Hall effect\nVoltage standards\nCurrent standards Magneto-resistance\nDC & AC low frequency transport and magnetic measurements\nSingle electron tunnelling\n",
"options" : "Variable Temperature Inserts, Sample Holders",
"accessories" : "",
"tags" : "",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","characterisation-of-low-dimensional-structures" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Characterisation of Low Dimensional Structures",
"product_family" : "magnet-system-configuration",
"product_family_frontend" : "Magnet System Configuration",
"sorting_product_family" : "100",
"idx": 110,
"page_id": 1492,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/magnet-system-configuration/integra-helium-magnet-systems",
"weight" : 0,
},
{
"name":"Integra<\/b>AC - recondensing helium magnet system",
"sorting_name":"integraac - recondensing helium magnet system",
"image":"/assets/components/phpthumbof/cache/IntegraAC.dc4aaea5edc7dea46d5868678b2a87b7.png",
"content" : "12721",
"outline" : "The IntegraAC range of recondensing helium systems has been developed to significantly reduce the consumption of liquid helium by recondensing helium gas evaporated within the system, this minimises running costs and conserves this limited resource. It is also compatible with a wide range of superconducting magnets.",
"outline_limited" : "The IntegraAC range of recondensing helium systems has been developed to significantly reduce the consumption of liquid helium by recondensing helium gas evaporated within the...",
"highlights" : " Zero helium consumption (depending on operating mode) <\/p>, Temperature range from 1.5 to 300 K using variable temperature insert (VTI)<\/p>, Compatible with existing ultra-low temperature inserts<\/p>",
"overview" : "Our range of helium recondensing dewars combined with our range of wet superconducting magnets is an alternative to using cryogen free magnets (or dry magnets). Not only do they minimise running costs and maximise experimental time but they also enable the most demanding magnet designs.\r\n\r\nWide range of temperatures from 1.5 to 300 K, depending on the variable temperature insert\r\nSignificantly reduces helium consumption and frequency of refills\r\nCompatible with all the standard range of dilution refrigerators, 3He inserts, VTI and superconducting magnets. This means you won't have to disrupt your experiments when you are upgrading your existing dewar\r\nOptimised, low loss, high temperature superconductor current leads as standard\r\nThe cryostat can be kept cold continuously which minimises the costs associated with cooling a sample\r\n\r\nOxford Instruments has unrivalled experience in the design of high field helium recondensing magnet systems. Recent installations in China, Japan and Australia have further strengthened the market acquired by us, working closely with key institutes in Europe and the United States. Oxford Instruments has been selected to supply a new neutron scattering magnet to the China Advanced Research Reactor (CARR). We have also supplied a state-of the-art high field magnet recondensing dewars to Diamond Light Source. Click here to read a case study from ISIS highlighting the delivery of OI magnets.\r\n ",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "\nSemiconductors Quantum Hall effect\nQuantum dots\nSingle electron tunnelling\nQuantum computing Magneto-resistance\nHall effect\nRF transport\nHigh frequency conductivity\nSolid state physics Heavy fermion systems\nMetal insulator transition\nSpin glass\nMesoscopic systems\nGiant magnetic resistance Specific heat\nDe Haas-van Alphen oscillations\nSolid state NMR\nElectrical resistivity\nMagneto-resistance\nNeutron scattering\nSuperconductivity Low Tc superconductors\nQuantum computing\nJosephson junctions\nFlux vortices\nQuantum initial phenomena Electrical resistivity\nScanning spectroscopy (STM\/AFM)\nSQUID characterisation \nAC susceptibility\nAstrophysics & cosmology Low temperature detectors\nSuperconducting tunnel junctions\nGe bolometers Electrothermal measurements\nVoltage biased measurements\nLow energy photon detection\nMetrology Quantum Hall effect\nVoltage standards\nCurrent standards Magneto-resistance\nDC & AC low frequency transport and magnetic measurements\nSingle electron tunnelling\n",
"options" : "Variable Temperature Inserts, Sample Holders\r\nLamdba point refrigerators available for 2.2K magnet operation \r\nGas recirculation kit for recovery and recondensation of insert helium pump exhaust \r\nFurther dewar options are available through custom designed magnet systems - please contact us for details ",
"accessories" : "",
"tags" : "",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","characterisation-of-low-dimensional-structures" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Characterisation of Low Dimensional Structures",
"product_family" : "magnet-system-configuration",
"product_family_frontend" : "Magnet System Configuration",
"sorting_product_family" : "100",
"idx": 111,
"page_id": 1496,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/magnet-system-configuration/recondensing-helium-magnet-system",
"weight" : 0,
},
{
"name":"Interferometric Displacement Sensor (IDS)",
"sorting_name":"interferometric displacement sensor (ids)",
"image":"/assets/components/phpthumbof/cache/Cypher%20IDS%20-%20slide%201%20%28463%20%C3%97%20401%20px%29.faba6d56011a2b4c54ba37f0f2632cd2.png",
"content" : "",
"outline" : "The Interferometric Displacement Sensor (IDS) option for Asylum Research Cypher AFMs enables more quantitative Piezoresponse Force Microscopy (PFM) by eliminating the dominant source of artifacts. The ability to measure the electromechanical response without the influence of electrostatic artifacts enables both the unambiguous measurement of polarization switching hysteresis loops in ferroelectrics and, for the first time, highly repeatable measurements of the effective electromechanical coupling coefficient (deff).\r\nKey Cypher IDS benefits:\r\nInterferometric detection avoids PFM artifacts due to electrostatic cantilever-sample interactions.More accurate, highly repeatable measurements of the electromechanical coupling coefficient (deff).Avoids switching spectroscopy artifacts that cause hysteresis loops in non-ferroelectric materials.Deflection noise floor that is 2-3× lower than typical OBD performance (typically <100 fm\/√Hz).",
"outline_limited" : "The Interferometric Displacement Sensor (IDS) option for Asylum Research Cypher AFMs enables more quantitative Piezoresponse Force Microscopy (PFM) by eliminating...",
"highlights" : "",
"overview" : "",
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"extended_tabs" : "Cypher IDS Bibliography\nKey papers explaining the Cypher IDS technology and advantages for Piezoresponse Force Microscopy:\nA. Labuda and R. Proksch, “Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope,” Appl. Phys. Lett., vol. 106, no. 25, p. 253103, Jun. 2015, https:\/\/doi.org\/10.1063\/1.4922210\nL. Collins, Y. Liu, O. S. Ovchinnikova, and R. Proksch, “Quantitative Electromechanical Atomic Force Microscopy,” ACS Nano, vol. 13, no. 7, pp. 8055–8066, Jul. 2019, https:\/\/doi.org\/10.1021\/acsnano.9b02883\nPapers applying the Cypher IDS to Hybrid organic-inorganic metal halide perovskites (e.g. MAPbI3):\nY. Liu et al., “Ferroic twin domains in metal halide perovskites,” MRS Advances, vol. 4, no. 51–52, pp. 2817–2830, Oct. 2019, https:\/\/doi.org\/10.1557\/adv.2019.358\nY. Liu et al., “Chemical nature of ferroelastic twin domains in CH3NH3PbI3 perovskite,” Nature Mater, vol. 17, no. 11, pp. 1013–1019, Nov. 2018, https:\/\/doi.org\/10.1038\/s41563-018-0152-z\nL. Collins, Y. Liu, O. S. Ovchinnikova, and R. Proksch, “Quantitative Electromechanical Atomic Force Microscopy,” ACS Nano, vol. 13, no. 7, pp. 8055–8066, Jul. 2019, https:\/\/doi.org\/10.1021\/acsnano.9b02883\nY. Liu et al., “Correlating Crystallographic Orientation and Ferroic Properties of Twin Domains in Metal Halide Perovskites,” ACS Nano, vol. 15, no. 4, pp. 7139–7148, Apr. 2021, https:\/\/doi.org\/10.1021\/acsnano.1c00310\nI. M. Hermes et al., “Anisotropic carrier diffusion in single MAPbI 3 grains correlates to their twin domains,” Energy Environ. Sci., vol. 13, no. 11, pp. 4168–4177, 2020, https:\/\/doi.org\/10.1039\/D0EE01016B\nPapers applying the Cypher IDS to Ferroelectric inorganic metal oxide perovskites:\nO. Paull et al., “Anisotropic epitaxial stabilization of a low-symmetry ferroelectric with enhanced electromechanical response,” Nat. Mater., vol. 21, pp. 74–80, 2022, https:\/\/doi.org\/10.1038\/s41563-021-01098-w\nK. P. Kelley et al., “Tensor factorization for elucidating mechanisms of piezoresponse relaxation via dynamic Piezoresponse Force Spectroscopy,” npj Comput Mater, vol. 6, no. 1, p. 113, Dec. 2020, https:\/\/doi.org\/10.1038\/s41524-020-00384-6\nK. P. Kelley et al., “Thickness and strain dependence of piezoelectric coefficient in BaTiO 3 thin films,” Phys. Rev. Materials, vol. 4, no. 2, p. 024407, Feb. 2020, https:\/\/doi.org\/10.1103\/PhysRevMaterials.4.024407\nY. Sharma et al., “Self‐Assembled Room Temperature Multiferroic BiFeO 3 ‐LiFe 5 O 8 Nanocomposites,” Adv. Funct. Mater., vol. 30, no. 3, p. 1906849, Jan. 2020, https:\/\/doi.org\/10.1002\/adfm.201906849\nPapers applying the Cypher IDS to Non-Perovskite Ferroelectrics (HfO2 and ZrO2):\nS. S. Cheema et al., “Enhanced ferroelectricity in ultrathin films grown directly on silicon,” Nature, vol. 580, no. 7804, pp. 478–482, Apr. 2020, https:\/\/doi.org\/10.1038\/s41586-020-2208-x\nZ. Zhang et al., “Epitaxial Ferroelectric Hf 0.5 Zr 0.5 O 2 with Metallic Pyrochlore Oxide Electrodes,” Adv. Mater., vol. 33, no. 10, p. 2006089, Mar. 2021, https:\/\/doi.org\/10.1002\/adma.202006089\nL. Collins and U. Celano, “Revealing Antiferroelectric Switching and Ferroelectric Wakeup in Hafnia by Advanced Piezoresponse Force Microscopy,” ACS Appl. Mater. Interfaces, vol. 12, no. 37, pp. 41659–41665, Sep. 2020, https:\/\/doi.org\/10.1021\/acsami.0c07809\nK.-W. Huang et al., “Sub-7-nm textured ZrO2 with giant ferroelectricity,” Acta Materialia, vol. 205, p. 116536, Feb. 2021, https:\/\/doi.org\/10.1016\/j.actamat.2020.116536\nY. Liu, R. Proksch, C. Y. Wong, M. Ziatdinov, and S. V. Kalinin, “Disentangling Ferroelectric Wall Dynamics and Identification of Pinning Mechanisms via Deep Learning,” Advanced Materials, vol. 33, no. 43, p. 2103680, Oct. 2021, https:\/\/doi.org\/10.1002\/adma.202103680\nPapers applying the Cypher IDS to 2D Materials:\nM. Checa et al., “Revealing Fast Cu-Ion Transport and Enhanced Conductivity at the CuInP 2 S 6 –In 4\/3 P 2 S 6 Heterointerface,” ACS Nano, vol. 16, no. 9, pp. 15347–15357, Sep. 2022, https:\/\/doi.org\/10.1021\/acsnano.2c06992\nA. Lipatov et al., “Direct observation of ferroelectricity in two-dimensional MoS2,” npj 2D Mater Appl, vol. 6, no. 1, p. 18, Dec. 2022, https:\/\/doi.org\/10.1038\/s41699-022-00298-5\nPapers applying the Cypher IDS to Cantilever Calibrations \/ Dynamics:\nA. Labuda et al., “Static and dynamic calibration of torsional spring constants of cantilevers,” Review of Scientific Instruments, vol. 89, no. 9, p. 093701, Sep. 2018, https:\/\/doi.org\/10.1063\/1.5045679\nA. Labuda et al., “Calibration of higher eigenmodes of cantilevers,” Rev. Sci. Instrum., vol. 87, no. 7, p. 073705, Jul. 2016, https:\/\/doi.org\/10.1063\/1.4955122\nA. Labuda, “Daniell method for power spectral density estimation in atomic force microscopy,” Review of Scientific Instruments, vol. 87, no. 3, p. 033704, Mar. 2016, https:\/\/doi.org\/10.1063\/1.4943292",
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"outline" : "Andor’s iStar 320T intensified CCD camera series are designed to offer the ultimate integrated detection solution for high resolution, ns-scale time-resolved Spectroscopy. It offers Multi-MHz readout for acquisition in excess of 322 spectra\/sec along with laptop-friendly, USB 2.0 connectivity and a fully integrated, software-controlled Digital Delay Generator.",
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"outline" : "Andor’s iStar 334T fast gated intensified CCDs series is designed to offer the ultimate integrated detection solution for high resolution, ns-scale time-resolved Imaging. The 1024 x 1024 array is ideally suited for a wide variety of time-resolved applications including Plasma analysis, & LIBS.",
"outline_limited" : "Andor’s iStar 334T fast gated intensified CCDs series is designed to offer the ultimate integrated detection solution for high resolution, ns-scale time-resolved Imaging. The...",
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"overview" : "Andor's iStar DH334T fast gated intensified CCDs series is designed to offer the ultimate integrated detection solution for high resolution, ns-scale time-resolved Imaging. The 1024 x 1024 array is ideally suited for a wide variety of time-resolved applications including Plasma analysis, LIBS when fitted to Andor Mechelle spectrograph, or fast transient phenomena.\r\nThe iStar DH334T fast gated intensified CCDs offers Multi-MHz readout, along with laptop-friendly, USB 2.0 connectivity and a fully integrated, software-controlled Digital Delay Generator (DDG™). This allows seamless integration of complex experiments at the touch of a button, with full timing and gain control through a single interactive interface. Generation 2 & 3 image intensifiers with various entrance input windows and phosphor options are available to match wavelength range requirements from 120 nm to 1100 nm.",
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"outline" : "Andor’s iStar 340T Intensified CCD sensor series is designed to offer the ultimate integrated detection solution for high resolution, ns-scale time-resolved Spectroscopy. The high resolution 2048 x 512 array with 13.5 µm pixel size offers a 4:1 aspect ratio which is ideally suited for use with Andor’s Shamrock Czerny-Turner spectrograph series and accessories.",
"outline_limited" : "Andor’s iStar 340T Intensified CCD sensor series is designed to offer the ultimate integrated detection solution for high resolution, ns-scale time-resolved Spectroscopy. The...",
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"overview" : "Andor's iStar 340T Intensified CCD sensor series is designed to offer the ultimate integrated detection solution for high resolution, ns-scale time-resolved Spectroscopy. The high resolution 2048 x 512 array with 13.5 µm pixel size offers a 4:1 aspect ratio which is ideally suited for use with Andor's Shamrock Czerny-Turner spectrograph series and accessories.\r\nThe iStar 340T Intensified CCD sensor boasts Multi-MHz readout along with laptop-friendly, USB 2.0 connectivity and a fully integrated, software-controlled Digital Delay Generator (DDG™). This allows seamless integration of complex experiments at the touch of a button, with full timing and gain control through a single interactive interface. Gen 2 & 3 image intensifiers with entrance input window and phosphor options are available to match wavelength range requirements from 120 nm to 1100 nm and minimum gating speeds requirements < 2 ns.",
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"outline" : "The innovative USB 3.0 iStar sCMOS boasts frame rates at least 50% faster than competing CCD or interline platforms (at equivalent pixel matrix size), while offering intrinsically low noise floor. A better signal-to-noise ratio can be achieved with lower intensifier amplification gain, yielding market-leading dynamic range performance. It also features ‘dual-frame’ capabilities for Particle Image Velocimetry (PIV) with optical inter-frame as low as 300 ns.",
"outline_limited" : "The innovative USB 3.0 iStar sCMOS boasts frame rates at least 50% faster than competing CCD or interline platforms (at equivalent pixel matrix size), while offering intrinsically...",
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"outline" : "Andor’s new iXon Life EMCCD (Electron Multiplying CCD) platform is available exclusively for fluorescence microscopy applications and is engineered to deliver single photon sensitivity with absolutely unparalleled price\/performance.",
"outline_limited" : "Andor’s new iXon Life EMCCD (Electron Multiplying CCD) platform is available exclusively for fluorescence microscopy applications and is engineered to deliver single photon...",
"highlights" : "Single photon sensitivity,Back-illuminated > 95% QE,Fast frame rates,Unique price\/performance,The ultimate detector for single molecules,Now with SRRF-Stream super-resolution",
"overview" : "Available in 1024 x 1024 and 512 x 512 sensor formats, each back-illuminated, to deliver the highest and broadest QE of any microscopy camera, and deep cooled down to -80oC for minimal darkcurrent, iXon Life represents a way to access, quite simply, the ultimate detector technology for single molecule biophysics and low-light live cell microscopy, in a distinctly budget friendly format.Now available with NEW SRRF-Stream technology, converting most modern conventional microscopes into a real time superresolution microscope, for imaging live and fixed cells with low excitation intensities and without the need for specialised photoswitchable fluorophores (e.g. works with GFP).",
"features" : "",
"features_benefits" : "Single Photon Sensitive & > 95% QE - Optimal SNR in light starved applications such as single molecule detection and quantum physics.,NEW ‘SRRF-Stream’ (optional) - Real time, cell super-resolution functionality. Living and fixed cells, works on most modern fluorescence microscopes. Super-resolution down to 50nm.,Overclocked readout speeds - Follow dynamic changing processes.,Crop Mode - Continuous imaging with fastest possible frame rate from centrally positioned ROIs. Highly enabling for live cell super-resolution and much more (e.g. 251 fps with 256 x 256 ROI).,TE cooling to -80°C - Elimination of dark current detection limit.,Superior Baseline Clamp and EM Stability - Essential for quantitative accuracy of dynamic measurements.,RealGain™ - Absolute EMCCD gain selectable directly from a linear and quantitative scale,OptAcquire - e Optimize the highly flexible iXon for different application requirements at the click of a button.,Count Convert - t Quantitatively capture and view data in electrons or incident photons. Applied either in real-time or post-processing, Count Convert does this important conversion for you.,EMCAL™ - Patented user-initiated self-recalibration of EM gain.",
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"name":"iXon Life 897 EMCCD",
"sorting_name":"ixon life 897 emccd",
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"outline" : "Andor’s new iXon Life EMCCD (Electron Multiplying CCD) platform is available exclusively for fluorescence microscopy applications and is engineered to deliver single photon sensitivity with absolutely unparalleled price\/performance.",
"outline_limited" : "Andor’s new iXon Life EMCCD (Electron Multiplying CCD) platform is available exclusively for fluorescence microscopy applications and is engineered to deliver single photon...",
"highlights" : "Single photon sensitivity,Back-illuminated > 95% QE,Fast frame rates,Unique price\/performance,The ultimate detector for single molecules,Now with SRRF-Stream super-resolution",
"overview" : "Available in 1024 x 1024 and 512 x 512 sensor formats, each back-illuminated, to deliver the highest and broadest QE of any microscopy camera, and deep cooled down to -80oC for minimal darkcurrent, iXon Life represents a way to access, quite simply, the ultimate detector technology for single molecule biophysics and low-light live cell microscopy, in a distinctly budget friendly format.Now available with NEW SRRF-Stream technology, converting most modern conventional microscopes into a real time superresolution microscope, for imaging live and fixed cells with low excitation intensities and without the need for specialised photoswitchable fluorophores (e.g. works with GFP).",
"features" : "",
"features_benefits" : "Single Photon Sensitive & > 95% QE - Optimal SNR in light starved applications such as single molecule detection and quantum physics.,NEW ‘SRRF-Stream’ (optional) - Real time, cell super-resolution functionality. Living and fixed cells, works on most modern fluorescence microscopes. Super-resolution down to 50nm.,Overclocked readout speeds - s Follow dynamic changing processes.,Crop Mode - Continuous imaging with fastest possible frame rate from centrally positioned ROIs. Highly enabling for live cell super-resolution and much more (e.g. 251 fps with 256 x 256 ROI).,TE cooling to -80°C - Elimination of dark current detection limit.,Superior Baseline Clamp and EM Stability - Essential for quantitative accuracy of dynamic measurements,RealGain™ - Absolute EMCCD gain selectable directly from a linear and quantitative scale.,OptAcquire - Optimize the highly flexible iXon for different application requirements at the click of a button,Count Convert - Quantitatively capture and view data in electrons or incident photons. Applied either in real-time or post-processing, Count Convert does this important conversion for you.,EMCAL™ - Patented user-initiated self-recalibration of EM gain.",
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"name":"iXon Ultra 888 EMCCD",
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"outline" : "The highly innovative iXon Ultra 888 is the world’s fastest Megapixel, Back-illuminated EMCCD camera, offering exceptional frame rates and single photon sensitivity across a large field of view. Building on a rich history of first to market innovation, the ‘supercharged’ iXon Ultra 888, represents a massive performance boost for the largest available EMCCD sensor, as well as the first USB3 enabled EMCCD camera.",
"outline_limited" : "The highly innovative iXon Ultra 888 is the world’s fastest Megapixel, Back-illuminated EMCCD camera, offering exceptional frame rates and single photon sensitivity across a...",
"highlights" : "30 MHz readout delivering 26 fps at 1024 x 1024,> 2.6x larger Field of View than ‘897’ model,Optically Centered Crop Mode – Live Cell Super Resolution at 697fps,Single Photon Sensitive,EX2 Technology for wider QE response,TE Cooling to -95°C",
"overview" : "The iXon Ultra 888 has been fundamentally re-engineered to facilitate 3x overclocking of the pixel readout speed to an unprecedented 30 MHz, whilst maintaining quantitative stability, accelerating the full frame rate performance to video rate. Furthermore, Andor’s unique ‘Crop Mode’ can be employed to further boost frame rates from a user defined sub-region, for example pushing a 512 x 512 sub-array to 93 fps and a 128 x 128 area to 697 fps. With a 1024 x 1024 sensor format and 13 µm pixel size, the resolving power, field of view and unparalleled speed of the iXon Ultra 888 render it the most attractive and versatile EMCCD option for demanding applications such as single molecule detection, super-resolution microscopy, live cell imaging and high time resolution astronomy.",
"features" : "",
"features_benefits" : "Single Photon Sensitive & > 95% QE - Optimal SNR in light starved applications such as single molecule detection and quantum physics.,NEW ‘SRRF-Stream’ (optional) - Real time, cell super-resolution functionality. Living and fixed cells, works on most modern fluorescence microscopes. Super-resolution down to 50nm.,Overclocked readout speeds - Follow dynamic changing processes.,Crop Mode - Continuous imaging with fastest possible frame rate from centrally positioned ROIs. Highly enabling for live cell superresolution and much more (e.g. 251 fps with 256 x 256 ROI).,TE cooling to -100°C - Elimination of dark current detection limit.,Superior Baseline Clamp and EM Stability - Essential for quantitative accuracy of dynamic measurements,RealGain™ - Absolute EMCCD gain selectable directly from a linear and quantitative scale.,Lower Noise CCD Mode - '2 in 1’ flexibility. EMCCD for ultra-sensitivity at speed, conventional CCD for longer acquisitions.,EX2 Technology - Extended QE response, beyond standard back-illuminated.,Fringe Suppression - Reduced etaloning in NIR.",
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"name":"iXon Ultra 897 EMCCD",
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"outline" : "The iXon Ultra platform takes the popular back-illuminated 512 x 512 frame transfer sensor and overclocks readout to 17 MHz, pushing speed performance to an outstanding 56 fps (full frame), whilst maintaining single photon sensitivity and quantitative stability throughout.",
"outline_limited" : "The iXon Ultra platform takes the popular back-illuminated 512 x 512 frame transfer sensor and overclocks readout to 17 MHz, pushing speed performance to an outstanding 56 fps...",
"highlights" : "Overclocked to 17 MHz readout for 56 fps full frame,Optically Centered Crop Mode – Live Cell Super Resolution at 569fps,Single Photon Sensitive,EX2 Technology for wider QE response,TE Cooling to -100 °C,Fringe Suppression",
"overview" : "Facilitated by a fundamental redesign, the iXon Ultra platform takes the popular back-illuminated 512 x 512 frame transfer sensor and overclocks readout to 17 MHz, pushing speed performance to an outstanding 56 fps (full frame), whilst maintaining quantitative stability throughout.\r\nUltimate Sensitivity is attained through deep thermoelectric cooling down to -100°C and industry-lowest clock induced charge noise. Additional unique features of the iXon Ultra 897 include USB 2.0 connectivity and direct raw data access for on the fly processing. EMCCD and conventional CCD readout modes provide heightened application flexibility, with a new ‘low and slow’ noise performance in CCD mode.",
"features" : "",
"features_benefits" : "Overclocked to 17 MHz readout - Pushes frames to 56 fps (full frame); 595 fps with 128 x 128 cropped sensor mode.,Optically Centred Crop Mode - Continuous imaging with fastest possible frame rate from centrally positioned ROIs. Highly enabling for live cell super-resolution and much more (e.g. 569 fps with 128 x 128 ROI).,EX2 Technology - Extended QE response, beyond standard back-illuminated.,TE cooling to -100°C - Critical for elimination of darkcurrent detection limit.,RealGain™ - Absolute EMCCD gain selectable directly from a linear and quantitative scale.,Fringe Suppression Technology - Reduced etaloning in NIR,OptAcquire - Optimize the highly flexible iXon for different application requirements at the click of a button,Count Convert - Quantitatively capture and view data in electrons or incident photons. Applied either in real time or postprocessing, Count Convert does this important conversion for you.,EMCAL™ - Patented user-initiated self-recalibration of EM gain.,iCam - Exposure time fast switching provides market leading acquisition efficiency.",
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"name":"iXon Ultra Blue 888 EMCCD",
"sorting_name":"ixon ultra blue 888 emccd",
"image":"/assets/components/phpthumbof/cache/ixon-ultra-888-product.03e247cefd1c761621fdd05085635a70.png",
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"outline" : "Drawing upon decades of market leadership in ultra-sensitive EMCCD technology, the Andor iXon Ultra Blue 888 model offers a significant enhancement in QE response across the blue and near-UV range, 200nm – 450nm, ideal for cutting edge applications such as ion trap quantum computing research and semiconductor metrology. ",
"outline_limited" : "Drawing upon decades of market leadership in ultra-sensitive EMCCD technology, the Andor iXon Ultra Blue 888 model offers a significant enhancement in QE response across the blue...",
"highlights" : " Blue\/UV-optimised QE: significantly boosted QE across the 200 – 450nm range<\/p>, Single Photon Sensitive<\/p>, Overclocked 30 MHz readout mode: 26 fps at 1018 x 1018<\/p>, >2.6x larger Field of View than ‘897’ model<\/p>, Crop Mode – huge speed boost from Region of Interest<\/p>, Vacuum TE Cooling to -95°C<\/p>",
"overview" : "The iXon Ultra Blue EMCCD significantly boosts Blue\/UV response while offering single photon sensitivity, high-speed and deep vacuum cooling for darkcurrent minimization. Drawing upon decades of market leadership in ultra-sensitive EMCCD technology, the new Andor iXon Ultra Blue camera offers a significant enhancement in QE response across the blue and near-UV range, 200nm – 450nm, ideal for cutting edge applications such as ion trap quantum computing research and semiconductor metrology. \r\niXon Ultra Blue 888 model features a 1018 x 1018, 13 µm pixel, back-illuminated EMCCD sensor format. Modes for overclocking of the pixel readout rate are readily available for accelerated frame rates. Additionally, Andor’s ‘Crop Mode’ can be employed to further boost frame rates from a user defined sub-region, for example pushing the iXon Ultra Blue 888 model to 251 fps from a 256 x 256 region of interest. \r\nThe camera also benefits from market-leading iXon Ultra cooling down to -95°C, ensuring minimization of darkcurrent contribution and permitting usage for long exposure conditions. Furthermore, thermal and clock induced charge events have been minimized for enhanced discrimination of single photons events in quantum entanglement experiments. Minimal data transfer latency can be accessed via an additional Camera Link Output port, facilitating direct access to data for ‘on the fly’ processing and fast feedback loops. iXon Ultra Blue also offers 2-in-1 Flexibility; EMCCD-mode for single photon sensitivity at speed and CCD-mode for long exposure capture of weak signal.\r\nThe iXon Ultra platform comes loaded with smart camera features: Count Convert allows data to be presented in electrons or incident photons; OptAcquire presents a series of one-click preset application-optimized configurations; FPGA timestamp hardware-generates a timestamp with10ns accuracy. \r\nCrucially, the iXon brand carries an outstanding reputation within the industry for quality and reliability, brandishing an unparalleled track record of minimal field failures.",
"features" : "",
"features_benefits" : "Blue\/UV-optimised QE - Ideal for low light emitters of blue\/UV photons, such as Ytterbium ion emission (370nm),Single Photon Sensitive - Image extremely weak signal, including individual trapped ions.,UV\/Blue optimized windows (optional) - super-high transmission in this range. If only ever for use in the UV\/Blue region, consider these window options during the ordering process.,1 Megapixel - Larger field of view and higher resolution EMCCD,Overclocked readout speeds - Follow dynamic changing processes.,Crop Mode - Continuous imaging with fastest possible frame rate from centrally positioned ROIs. Highly enabling for quantum imaging and much more (e.g. 251 fps with 256 x 256 ROI).,Minimal Data Latency - Camera Link output port to facilitate direct access to data for ‘on the fly’ processing and fast feedback loops.,TE cooling to -95°C - Elimination of dark current detection limit.,Minimized spurious noise - Minimal thermal and clock induced charge events for discrimination of single photons.,‘2-in-1’ Flexibility - EMCCD mode for ultra-sensitivity at speed, CCD mode for longer exposures.,RealGain™ - Absolute EMCCD gain selectable directly from a linear and quantitative scale.,EMCAL™ - Patented user-initiated self-recalibration of EM gain.,Superior Baseline Clamp and EM Stability - Essential for quantitative accuracy of dynamic measurements,Qualified down to -20°C ambient temperature - Excellent for use at observatories.",
"extended_tabs" : "\n \n \n Key Specifications\n \n \n Core Attributes\n Field of view, sensitivity and speed\n \n \n Sensor Format\n 1018 x 1018\n \n \n Pixel Size\n 13 µm\n \n \n Sensor Diagonal\n 18.8 mm\n \n \n Read Noise\n < 1 e- with EM Gain\n \n \n Cooling\n -95°C\n \n \n Darkcurrent\n 0.00011 e-\/pixel\/sec\n \n \n Spurious Background (CIC)\n 0.005 events\/pixel\n \n \n QE Options\n BV, EXF, UVB (Ultra); NBB (Ultra Blue)\n \n \n Frame Rate\n 26 fps (670 fps with 128x 128 Crop Mode)\n \n \n Pixel Well Depth\n 65,000 e-\n \n \n Embedded Electronic Shutter\n N\/A\n \n \n Interface\n USB 3.0 (additional Camera Link Output)\n \n \n",
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"name":"iXon Ultra Blue 897 EMCCD",
"sorting_name":"ixon ultra blue 897 emccd",
"image":"/assets/components/phpthumbof/cache/ixon-ultra-897-product.c2b566280fd401e5bc5a719fa6484f34.png",
"content" : "",
"outline" : "Drawing upon decades of market leadership in ultra-sensitive EMCCD technology, the Andor iXon Ultra Blue 897 model offers a significant enhancement in QE response across the blue and near-UV range, 200nm – 450nm, ideal for cutting edge applications such as ion trap quantum computing research and semiconductor metrology.",
"outline_limited" : "Drawing upon decades of market leadership in ultra-sensitive EMCCD technology, the Andor iXon Ultra Blue 897 model offers a significant enhancement in QE response across the blue...",
"highlights" : " Blue\/UV-optimised QE: significantly boosted QE across the 200 – 450nm range<\/p>, Single Photon Sensitive<\/p>, \n<\/p>\n Overclocked 17 MHz readout mode: 56 fps at 506 x 506<\/p>\n <\/p>, Crop Mode – huge speed boost from Region of Interest<\/p>, Vacuum TE Cooling to -100°C<\/p>",
"overview" : "The iXon Ultra Blue EMCCD significantly boosts Blue\/UV response while offering single photon sensitivity, high-speed and deep vacuum cooling for darkcurrent minimization. Drawing upon decades of market leadership in ultra-sensitive EMCCD technology, the new Andor iXon Ultra Blue camera offers a significant enhancement in QE response across the blue and near-UV range, 200nm – 450nm, ideal for cutting edge applications such as ion trap quantum computing research and semiconductor metrology. \r\niXon Ultra Blue 897 model features a 506 x 506, 16 µm pixel, back-illuminated EMCCD sensor format. Modes for overclocking of the pixel readout rate are readily available for accelerated frame rates. Additionally, Andor’s ‘Crop Mode’ can be employed to further boost frame rates from a user defined sub-region, for example pushing the iXon Ultra Blue 897 model to 569 fps from a 128 x 128 region of interest. \r\nThe camera also benefits from market-leading iXon Ultra cooling down to -100°C, ensuring minimization of darkcurrent contribution and permitting usage for long exposure conditions. Furthermore, thermal and clock induced charge events have been minimized for enhanced discrimination of single photons events in quantum entanglement experiments. Minimal data transfer latency can be accessed via an additional Camera Link Output port, facilitating direct access to data for ‘on the fly’ processing and fast feedback loops. iXon Ultra Blue also offers 2-in-1 Flexibility; EMCCD-mode for single photon sensitivity at speed and CCD-mode for long exposure capture of weak signal.\r\nThe iXon Ultra platform comes loaded with smart camera features: Count Convert allows data to be presented in electrons or incident photons; OptAcquire presents a series of one-click preset application-optimized configurations; FPGA timestamp hardware-generates a timestamp with10ns accuracy. \r\nCrucially, the iXon brand carries an outstanding reputation within the industry for quality and reliability, brandishing an unparalleled track record of minimal field failures.",
"features" : "",
"features_benefits" : "Blue\/UV-optimised QE - Ideal for low light emitters of blue\/UV photons, such as Ytterbium ion emission (370nm).,Single Photon Sensitive - Image extremely weak signal, including individual trapped ions.,UV\/Blue optimized windows (optional) - super-high transmission in this range. If only ever for use in the UV\/Blue region, consider these window options during the ordering process.,Overclocked readout speeds - Follow dynamic changing processes.,Crop Mode - Continuous imaging with fastest possible frame rate from centrally positioned ROIs. Highly enabling for quantum imaging and much more (e.g. 251 fps with 256 x 256 ROI).,Minimal Data Latency - Camera Link output port to facilitate direct access to data for ‘on the fly’ processing and fast feedback loops.,TE cooling to -100°C - Elimination of dark current detection limit.,Minimized spurious noise - Minimal thermal and clock induced charge events for discrimination of single photons.,‘2-in-1’ Flexibility - EMCCD mode for ultra-sensitivity at speed, CCD mode for longer exposures.,RealGain™ - Absolute EMCCD gain selectable directly from a linear and quantitative scale.,EMCAL™ - Patented user-initiated self-recalibration of EM gain.,Superior Baseline Clamp and EM Stability - Essential for quantitative accuracy of dynamic measurements,Qualified down to -20°C ambient temperature - Excellent for use at observatories.",
"extended_tabs" : "\n \n \n Key Specifications\n \n \n Core Attributes\n Sensitivity and speed\n \n \n Sensor format\n 506 x 506\n \n \n Pixel Size\n 16 µm\n \n \n Sensor Diagonal\n 11.6 mm\n \n \n Read Noise\n < 1 e- with EM Gain\n \n \n Cooling\n -100°C\n \n \n Darkcurrent\n 0.00015 e-\/pixel\/sec\n \n \n Spurious Background (CIC)\n 0.0018 events\/pixel\n \n \n QE Options\n BV, EXF, UVB (Ultra); NBB (Ultra Blue)\n \n \n Frame Rate\n 56 fps (595 fps with 128x 128 Crop Mode)\n \n \n Pixel Well Depth\n 145,000 e-\n \n \n Embedded Electronic Shutter\n N\/A\n \n \n Interface\n USB 3.0 (additional Camera Link Output)\n \n \n ",
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"product_family" : "ixon-emccd-camera-series",
"product_family_frontend" : "iXon EMCCD Camera Series",
"sorting_product_family" : "100",
"idx": 122,
"page_id": 28527,
"page_link" : "https://andor.oxinst.com/products/ixon-emccd-camera-series/ixon-blue-897-emccd",
"weight" : 0,
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{
"name":"Jupiter 5000 Series Radiation Shielded X-ray Tube",
"sorting_name":"jupiter 5000 series radiation shielded x-ray tube",
"image":"/assets/components/phpthumbof/cache/x-ray-tube-radiation-shielded-jupiter-5000-series.e5a76e40789044b0d487a08c65b53777.png",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nHow to Request Product Quotes\n1. In the table below, please click the “Add to quote list” button for all products that you would like quoted.\n2. Scroll to the bottom of the table and click the green “My Quote List” button to visit the submission form page.",
"outline" : "The Jupiter 5000 Series is a 50kV, 50W packaged X-ray tube designed for applications where high flux density and continuous operation are important.\r\nUtilizing our highly stable and high intensity X-ray tube technology, the Jupiter 5000 Series is ideal for medical imaging applications and most industrial inspection and non-destructive testing applications that require high resolution, including PCB assembly, battery, plastic, metal and mechanical parts inspection.\r\nThe 5000 Series features a stainless steel, lead-lined package that is filled with dielectric oil, which enables the unit to provide maximum X-ray shielding and heat dissipation. The design includes high voltage and filament connectors, making it ideal for plug and play operation.\r\nThe Jupiter 5000 Series is available in a wide range of spot sizes, targets and price points to meet your needs.",
"outline_limited" : "The Jupiter 5000 Series is a 50kV, 50W packaged X-ray tube designed for applications where high flux density and continuous operation are important.\r...",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "Wide operating range - enables optimal image contrast,Stable X-ray output - delivers high precision measurements,Low attenuation beryllium window - ensures high transmission of low energy X-rays,Fully-shielded compact package - eliminates X-ray leakage and easily integrates into your system",
"extended_tabs" : "\nAnalytical XRFCoating thickness gaugingElectronics inspectionPCB drilling & inspectionSolder joint inspection",
"options" : "",
"accessories" : "",
"tags" : "Radiation Shielded Packaged X-ray Source",
"businesses" : "x-ray-technology",
"businesses_frontend" : "X-Ray Technology",
"applications" : [ "analysis-of-environmental-contaminants","inspection-and-process-control","material-composition-and-structure","materials-for-the-power-generation-industry","process-mineralogy-and-chemical-analysis","solar-and-pv-technology","structural-materials-and-components","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Inspection and Process Control, Material Composition and Structure, Materials for the Power Generation Industry, Process Mineralogy and Chemical Analysis, Solar and PV Technology, Structural Materials and Components, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "x-ray-tube-assembly-radiation-shielded",
"product_family_frontend" : "X-ray Tube Assembly Radiation Shielded",
"sorting_product_family" : "100",
"idx": 123,
"page_id": 469,
"page_link" : "https://xray.oxinst.com/x-ray-tube-products/x-ray-tube-assembly-radiation-shielded/jupiter-5000-series",
"weight" : 0,
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{
"name":"Jupiter Discovery AFM",
"sorting_name":"jupiter discovery afm",
"image":"/assets/components/phpthumbof/cache/jupiter-discovery02.9530d535518d8ebbc6bec292e168c5bc.jpg",
"content" : "",
"outline" : "The Jupiter Discovery Atomic Force Microscope offers a unique combination of best-in-class performance along with exceptional ease of use. Whether in academia or industry, researchers expect high quality results with less training and effort. At the same time, today’s AFM measurements demand higher performance as users strive to resolve finer details and achieve higher accuracy, repeatability, and throughput. The Jupiter Discovery is the only AFM that meets these needs, delivering both the ultra-high performance and the exceptional usability that researchers need.",
"outline_limited" : "The Jupiter Discovery Atomic Force Microscope offers a unique combination of best-in-class performance along with exceptional ease of use. Whether in academia or industry,...",
"highlights" : " Next-Generation Design Delivers the Ultimate Performance<\/p>, Optimized Workflow for Simpler and More Productive User Experience<\/p>, Unmatched Configurability Satisfies Diverse Research Needs<\/p>",
"overview" : "",
"features" : "\r\n \r\n wistia-player[media-id='y8al25idxt']:not(:defined) { background: center \/ contain no-repeat url('https:\/\/fast.wistia.com\/embed\/medias\/y8al25idxt\/swatch'); display: block; filter: blur(5px); padding-top:56.25%; }\r\n \r\n\r\nNext-Generation AFM Design Delivers the Highest Performance of Any Large-Sample AFM\r\n\r\n Jupiter Discovery achieves ultra-high resolution and scan rates 5-20× faster than other AFMs, setting a new performance benchmark for large-sample AFMs.\r\n\r\nOptimized Workflow Provides a Simpler and More Productive User Experience\r\n\r\n Pre-mounted probes, a unique side-view camera, and exclusive FFM Topography imaging mode with Autopilot enable new users to go from sample loading to results in mere minutes.\r\n\r\nUnmatched Configurability Provides the Versatility to Meet the Needs of Any Research Group\r\n\r\n A vast selection of accessories and capabilities enables multidisciplinary research, while configuration options help span a wider range of research budgets.\r\n\r\nCore Facility manager? Learn more",
"features_benefits" : "",
"extended_tabs" : "\n Included Operating Modes\n Basic Modes\n Contact mode\n Fast Force Mapping Topography with Autopilot\n Force curves\n Frequency modulation\n Lateral force mode (LFM)\n Nanolithography and nanomanipulation\n Phase imaging\n Tapping mode (AC mode)\n \n Nanomechanical Modes\n Dual AC (Bimodal)\n Force mapping mode (force volume)\n Force modulation\n Loss tangent imaging\n \n Nanoelectrical and Functional Modes\n Electric force microscopy (EFM)\n Kelvin probe force microscopy (KPFM)\n Magnetic force microscopy (MFM)\n Dual AC Resonance Tracking (DART) piezoresponse force microscopy (PFM)\n Switching spectroscopy PFM\n Vector PFM.\n \n\n\n Optional Operating Modes\n Nanomechanical Modes\n AM-FM Viscoelastic Mapping Mode (requires blueDrive)\n Contact Resonance Viscoelastic Mapping Mode (requires blueDrive)\n Fast Force Modulus Mapping (FFM-Modulus)\n Torsional Force Microscopy (TFM) (blueDrive suggested)\n\n Nanoelectrical and Functional Modes\n Conductive AFM (CAFM) with ORCA\n Current mapping with Fast Force Mapping\n Ergo KPFM (single pass with heterodyne, sideband, and amplitude modulation)\n Nanoscale Time-Dependent Dielectric Breakdown (nanoTDDB)\n Scanning Capacitance Microscopy (SCM).\n \n,\n \n \n \n \n High Voltage nanoTDDB\n Nanoscale Time Dependent Dielectric Breakdown experiements up to ±150 V.\n \n Learn More >\n \n \n \n \n \n \n Conductive AFM\n Conductive AFM imaging with the new ORCA cantilever holder.\n \n Learn More >\n \n \n \n \n \n \n Scanning Capacitance Microscopy (SCM)\n Capacitance measurements down to 1 aF accompanied by high resolution imaging and fast scanning.\n \n Learn More >\n \n \n \n \n \n \n High Voltage Accessory\n High voltage operation up to ±150 V.\n \n Learn More >\n \n \n\n\n\n \n \n \n \n Imaging in Liquid\n Droplet imaging with the new liquid cantilever holder.\n \n Learn More >\n \n \n \n \n \n \n CoolerHeater\n Sub-zero temperature control with the CoolerHeater accessory.\n \n Learn More >\n \n \n \n \n \n \n Fast Force Mapping\n Force curve-based nanomechanical mapping mode.\n \n Learn More >\n \n \n \n \n \n \n Variable Magnetic Field Module\n Variation of magnetic field: in-plane and out-of-plane of the sample.\n \n Learn More >\n \n \n\n\n \n \n \n \n \n PolyHeater\n Sample heating up to 300°C with the PolyHeater accessory.\n \n Learn More >\n \n \n \n \n \n \n AM-FM Viscoelastic Mapping Mode\n Tapping mod-based nanomechanical mapping mode.\n \n Learn More >\n \n \n \n \n \n \n NanoRack\n Sample stage for experiments under tension or compression.\n \n Learn More >\n \n \n \n\n \n ,\n \n \n \n \n Support and Service Agreements\n More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users.\n \n\n \n \n \n \n \n \n Request Help with an Existing Asylum Research AFM\n \n Contact Customer Support >\n \n \n",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "jupiter-family-of-afms",
"product_family_frontend" : "Jupiter Family of AFMs",
"sorting_product_family" : "100",
"idx": 124,
"page_id": 28904,
"page_link" : "https://afm.oxinst.com/products/jupiter-family-of-afms/jupiter-discovery-afm",
"weight" : 0,
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{
"name":"Kelvinox<\/b>HA",
"sorting_name":"kelvinoxha",
"image":"/assets/components/phpthumbof/cache/Kelvinox-400ha.4e670fe9e60c2d6b53dfd78ec5ac00e7.png",
"content" : "12734",
"outline" : "A dilution refrigerator insert system with enhanced experimental access, integrated into a low-loss helium cryostat",
"outline_limited" : "A dilution refrigerator insert system with enhanced experimental access, integrated into a low-loss helium cryostat",
"highlights" : " More than 350 µW cooling power<\/p>, Wide range of applications<\/p>, Full automation of the insert cool-down<\/p>",
"overview" : "Kelvinox®HA dilution refrigerator is ideal for applications requiring high cooling power and enhanced experimental access such as quantum computing.\r\n\r\n Achieves more than 350 µW of cooling power, ideal for demanding experiments with high heat dissipation such as microwave cavity losses\r\n Less than 10 mK stable temperature: ideal for low temperature demagnetisation experiments\r\n Additional line-of-sight access ports, enabling a range of services to the IVC and sample space for the most demanding applications\r\n Improved experimental access with inserts, which provide a wide range of access ports\r\n Delivered with a gas handling system, which is fully automated and enables complete operation of a dilution refrigerator using sophisticated software and virtual instrument drivers for LabVIEW\r\n\r\nThe KelvinoxHA is made up of a primary insert and a dilution unit. It is compatible with IntegraAC, the recondensing liquid helium cryostat. IntegraAC has been developed to significantly reduce the consumption of liquid helium by recondensing helium gas evaporated within the system, which would otherwise be vented from the cryostat. This decreases the frequency of helium refills. Cryogenic systems can be kept cold continuously, even when in stand-by mode, leading to greater freedom to schedule experimental time.",
"features" : "Flexibility: The KelvinoxHA can be used for a wide range of applications\r\nVersatile: This is an ideal platform to customise your own experiment\r\nEase of use: All inserts are supplied with a gas handling system enabling automation of the insert cool down\r\nCost-effective: This dilution refrigerator can also be integrated into a helium recondensing dewar to minimise helium consumption",
"features_benefits" : "",
"extended_tabs" : "Base temperature: ≤ 10 mK\nBase temperature stability: ± 1 mK\nMaximum temperature: 1 K\nCooling power at 100 mK: ≥ 350 µW (guaranteed), ≥ 400 µW (typical)\nSample environment: Vacuum \nContinuous operation: Standard (no regeneration cycle is required)\n ,\nSemiconductor Quantum Hall effect\nQuantum dots\nSingle electron tunnelling\nQuantum computing Magneto-resistance\nHall effect\nRF transport high frequency conductivity\nSolid state physics heavy fermion systems\nMetal insulator transition\nSpin glass\nMesoscopic systems\nGiant magnetic resistance Specific heat\nDe Haas-van alphen oscillations\nSolid state NMR\nElectrical resistivity\nMagneto-resistance\nNeutron scattering\nSuperconductivity low Tc superconductors\nQuantum computing\nJosephson junctions\nFlux vortices\nQuantum initial phenomena electrical resistivity\nScanning spectroscopy (STM\/AFM)\nSQUID characterisation \nAC susceptibility\nAstrophysics & cosmology Low temperature detectors\nSuperconducting tunnel junctions\nGE bolometers Electrothermal measurements\nVoltage biased measurements\nLow energy photon detection\nMetrology Quantum hall effect\nVoltage standards\nCurrent standards Magneto-resistance\nDC & AC low frequency transport and magnetic measurements\nSingle electron tunnelling\n",
"options" : "Low eddy current sample holder",
"accessories" : "IntegraAC - recondensing helium cryostat",
"tags" : "Nanotechnology,Electrical transport measurements,Semiconductors,Quantum Hall Effect,Quantum dots ,Single electron tunneling ,Quantum computing,Solid State Physics,Heavy fermions systems ,Metal insulator transition,Spin glass ,Mesoscopic systems ,Giant magnetic resistance,Superconductivity,Quantum initial phenomena,Magneto-resistance , RF transport ,High frequency conductivity",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","quantum-information-processing","characterisation-of-low-dimensional-structures","quantum-transport-measurement" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Information Processing, Characterisation of Low Dimensional Structures, Quantum Transport Measurement",
"product_family" : "wet-dilution-refrigerators",
"product_family_frontend" : "Wet Dilution Refrigerators",
"sorting_product_family" : "100",
"idx": 125,
"page_id": 424,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/wet-dilution-refrigerators/kelvinox400ha",
"weight" : 0,
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{
"name":"Kelvinox<\/b>JT",
"sorting_name":"kelvinoxjt",
"image":"/assets/components/phpthumbof/cache/Kelvinox-JT.63e4aa83b1809059bc5bd38faaf32c7d.png",
"content" : "12733",
"outline" : "A dipstick-style dilution refrigerator insert system using Joule-Thomson condensation and compatible with wet or dry cryostats",
"outline_limited" : "A dipstick-style dilution refrigerator insert system using Joule-Thomson condensation and compatible with wet or dry cryostats",
"highlights" : " No need for VTI, can operate in a 4 K bath<\/p>, Can use helium bath, VTI or pulse tube refrigerator<\/p>, Extends the temperature range to below 25 mK<\/p>",
"overview" : "The Kelvinox®JT is a small, dipstick-style, dilution refrigerator, which features a Joule-Thomson condensation stage. It means the KelvinoxJT can operate in any 4 K environment – wet or dry – as it does not rely on a 1 K pot. KelvinoxJT is ideal for neutron or X-ray scattering experiments because there is no liquid helium in the sample horizontal plane.\r\n\r\nCompatible with our Cryofree® TeslatronPT, our wet Integra magnet systems, any liquid helium transport dewar or any VTI with a sample tube diameter of at least 50 mm\r\nQuick cool-down time: typically 6 hours from room temperature to base\r\nInner vacuum chamber (IVC) with automatic exchange gas control\r\nThe IVC is sealed using vacuum grease or caff paste (no Indium is required)\r\nWide temperature range: when operated in a VTI, the temperature can be controlled between 25 mK and 300 K\r\nOne spare 6 mm line-of sight port for installing experimental wiring\r\n",
"features" : "Flexibility: Can be used for a wide range of applications\r\nVersatile: Can operate in any 4 K environment – wet or dry\r\nEase of use : Supplied with a gas handling system enabling automation of the insert cool down\r\n ",
"features_benefits" : "",
"extended_tabs" : "Base temperature: 25 mK in a VTI, ≤ 40 mK in 4 K (exchange gas or liquid helium) environment\nBase temperature stability: ± 1 mK\nCooling power at 100 mK: ≥ 20 µW\nSystem cooldown from room temperature to < 100 mK: typically 6 hours in a wet environment and 12 hours in a dry environment,\nSemiconductor Quantum Hall effect\nQuantum dots\nSingle electron tunnelling\nQuantum computing Magneto-resistance\nHall effect\nRF transport high frequency conductivity\nSolid state physics heavy fermion systems\nMetal insulator transition\nSpin glass\nMesoscopic systems\nGiant magnetic resistance Specific heat\nDe Haas-van alphen oscillations\nSolid state NMR\nElectrical resistivity\nMagneto-resistance\nNeutron scattering\nSuperconductivity low Tc superconductors\nQuantum computing\nJosephson junctions\nFlux vortices\nQuantum initial phenomena electrical resistivity\nScanning spectroscopy (STM\/AFM)\nSQUID characterisation \nAC susceptibility\nAstrophysics & cosmology Low temperature detectors\nSuperconducting tunnel junctions\nGE bolometers Electrothermal measurements\nVoltage biased measurements\nLow energy photon detection\nMetrology Quantum hall effect\nVoltage standards\nCurrent standards Magneto-resistance\nDC & AC low frequency transport and magnetic measurements\nSingle electron tunnelling\n\n",
"options" : "",
"accessories" : "IntegraAC - recondensing helium cryostat",
"tags" : "Nanotechnology,Electrical transport measurements,Quantum dot measurements,Semiconductors,Quantum Hall Effect,Quantum dots ,Single electron tunneling ,Quantum computing,Solid State Physics,Heavy fermions systems ,Metal insulator transition,Spin glass ,Mesoscopic systems ,Giant magnetic resistance,Superconductivity,Quantum initial phenomena,Magneto-resistance , RF transport ,High frequency conductivity,Joule-Thomson condensation",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","characterisation-of-low-dimensional-structures","quantum-transport-measurement","quantum-information-processing" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Characterisation of Low Dimensional Structures, Quantum Transport Measurement, Quantum Information Processing",
"product_family" : "wet-dilution-refrigerators",
"product_family_frontend" : "Wet Dilution Refrigerators",
"sorting_product_family" : "100",
"idx": 126,
"page_id": 426,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/wet-dilution-refrigerators/kelvinoxjt",
"weight" : 0,
},
{
"name":"Kelvinox<\/b>MX",
"sorting_name":"kelvinoxmx",
"image":"/assets/components/phpthumbof/cache/Kelvinox-MX.46fb8c7635b62aab79907e09a019b26c.png",
"content" : "12722",
"outline" : "A dilution refrigerator insert system compatible with wet cryostats",
"outline_limited" : "A dilution refrigerator insert system compatible with wet cryostats",
"highlights" : " Minimum downtime - fast sample change <\/p>, Wide range of applications<\/p>, Full automation of the insert cool-down<\/p>",
"overview" : "The Kelvinox®MX range of wet dilution refrigerators were designed for seamless integration into magnetic and cryogenic environments. The range features interchangeable secondary inserts to allow the system to be configured for a wide range of experimental applications. The KelvinoxMX dilution refrigerator uniquely separates the cooling platform from the experimental services.\r\n\r\nFlexibility to change experimental configurations and thermodynamic performances, if needed\r\nMultiple users to carry out different configured experiments, with minimum downtime\r\nAccess to different applications by selecting the appropriate experimental insert\r\nSimple diagnostics for experimental wiring and set-up can be easily tested\r\nAll inserts are supplied with a gas handling system enabling automation of the insert cool down\r\n\r\nThe KelvinoxMX is made up from two main components; a primary insert, that provides a 50 mm line of sight access port, into which a range of interchangeable experimental inserts can be fitted and a dilution unit. \r\nKelvinoxMX is compatible with the IntegraAC, recondensing liquid helium cryostat. IntegraAC has been developed to significantly reduce the consumption of liquid helium by recondensing helium gas evaporated within the system, which would otherwise be vented from the cryostat. This decreases the frequency of helium refills. Cryogenic systems can be kept cold continuously, even when in stand-by mode, leading to greater freedom to schedule experimental time.",
"features" : "Flexibility: The KelvinoxMX range provides flexibility and modularity for a wide range of applications\r\nVersatile: This is an ideal platform to customise your own experiment\r\nEase of use: All inserts are supplied with a gas handling system enabling automation of the insert cool down",
"features_benefits" : "",
"extended_tabs" : "Cooling power at 100 mK: ≥ 400 µW for KelvinoxMX400 and ≥ 200 µW for KelvinoxMX200\nBase temperature: ≤ 10 mK (basic secondary insert fitted) and ≤ 17 mK (other secondary insert fitted) for KelvinoxMX400 and KelvinoxMX200\nBase temperature stability: ± 1 mK for KelvinoxMX400 and KelvinoxMX200\nMaximum temperature: 1 K for KelvinoxMX400 and KelvinoxMX200\nSample environment: Vacuum for KelvinoxMX400 and KelvinoxMX200\nContinuous operation: Standard for KelvinoxMX400 and KelvinoxMX200 (No regeneration cycle required),\nSemiconductor Quantum Hall effect\nQuantum dots\nSingle electron tunnelling\nQuantum computing Magneto-resistance\nHall effect\nRF transport high frequency conductivity\nSolid state physics heavy fermion systems\nMetal insulator transition\nSpin glass\nMesoscopic systems\nGiant magnetic resistance Specific heat\nDe Haas-van alphen oscillations\nSolid state NMR\nElectrical resistivity\nMagneto-resistance\nNeutron scattering\nSuperconductivity low Tc superconductors\nQuantum computing\nJosephson junctions\nFlux vortices\nQuantum initial phenomena electrical resistivity\nScanning spectroscopy (STM\/AFM)\nSQUID characterisation \nAC susceptibility\nAstrophysics & cosmology Low temperature detectors\nSuperconducting tunnel junctions\nGE bolometers Electrothermal measurements\nVoltage biased measurements\nLow energy photon detection\nMetrology Quantum hall effect\nVoltage standards\nCurrent standards Magneto-resistance\nDC & AC low frequency transport and magnetic measurements\nSingle electron tunnelling\n",
"options" : "Experimental (secondary) inserts",
"accessories" : "IntegraAC - recondensing helium cryostat",
"tags" : "Nanotechnology,Semiconductors,Quantum Hall Effect,Quantum dots ,Single electron tunneling ,Quantum computing,Solid State Physics,Heavy fermions systems ,Metal insulator transition,Spin glass ,Mesoscopic systems ,Giant magnetic resistance,Superconductivity,Quantum initial phenomena,Magneto-resistance , RF transport ,High frequency conductivity",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","quantum-information-processing","quantum-transport-measurement","characterisation-of-low-dimensional-structures" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Information Processing, Quantum Transport Measurement, Characterisation of Low Dimensional Structures",
"product_family" : "wet-dilution-refrigerators",
"product_family_frontend" : "Wet Dilution Refrigerators",
"sorting_product_family" : "100",
"idx": 127,
"page_id": 423,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/wet-dilution-refrigerators/kelvinoxmx",
"weight" : 0,
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{
"name":"Kelvinox<\/b>TLM",
"sorting_name":"kelvinoxtlm",
"image":"/assets/components/phpthumbof/cache/Kelvinox-TLM.fe51cb74973753f8c3bd742844bfb36a.png",
"content" : "12735",
"outline" : "A dilution refrigerator insert system providing top-loading of the sample directly into mixture, integrated into a low-loss helium cryostat",
"outline_limited" : "A dilution refrigerator insert system providing top-loading of the sample directly into mixture, integrated into a low-loss helium cryostat",
"highlights" : " More than 400 µW cooling power<\/p>, High stability of the thermal environment<\/p>, Full automation of the insert cool-down<\/p>",
"overview" : "Dilution refrigerator insert system providing top-loading of the sample directly into mixture. \r\n\r\nTop-loading of the sample directly into the 3He\/4He mixing chamber ensures good sample thermalisation, high stability of the thermal environment and optimum operation in high magnetic fields\r\nMulti-service, multi-user access: unique design which can be used with a range of sample probes such as a Swedish rotator or high frequency co-axial lines\r\nQuick and easy sample change: no need to remove the mixture during sample change, giving quicker experiment turnaround times and reducing the risk of leaks\r\nNon metallic sample environment: ideal for experiments such as solid state NMR, where removing metallic material surrounding the pickup coil resonant circuit, is key to accurate measurements. Typically, field sweeps of up to 2 T\/min leave the temperature of the mixture unaffected\r\nDelivered with a gas handling system, which enables automatic operation of a dilution refrigerator using sophisticated software and virtual instrument drivers for LabVIEW\r\n\r\nEvery KelvinoxTLM consists of a dilution unit proividing more than 400 µW at 100 mK measured at the helium mixture phase boundary. This is part of the insert, which features a still pumping line, 1 K pot, diagnostic wiring and inner vacuum can. \r\nThe Kelvinox400HA is made up of a primary insert and a dilution unit. It is compatible with IntegraAC, the recondensing liquid helium cryostat. IntegraAC has been developed to significantly reduce the consumption of liquid helium by recondensing helium gas evaporated within the system, which would otherwise be vented from the cryostat. This decreases the frequency of helium refills. Cryogenic systems can be kept cold continuously, even when in stand-by mode, leading to greater freedom to schedule experimental time.",
"features" : "Flexibility: The Kelvinox®TLM can be used for a wide range of applications\r\nHigh performance: Ensures good sample thermalisation, high stability of the thermal environment and guarantee of operation in high magnetic field\r\nEasy to use: All inserts are supplied with a gas handling system enabling automation of the insert cool down\r\nCost-effective: This dilution refrigerator can also be integrated into a helium recondensing dewar to minimise helium consumption",
"features_benefits" : "",
"extended_tabs" : "Base temperature: ≤ 15 mK\nBase temperature stability: ± 1 mK\nMaximum temperature: 1 K\nSample environment: Liquid\nCooling power at 100 mK: ≥ 400 µW (guaranteed), ≥ 600 µW (typical)\n ,\nSemiconductor Quantum Hall effect\nQuantum dots\nSingle electron tunnelling\nQuantum computing Magneto-resistance\nHall effect\nRF transport high frequency conductivity\nSolid state physics heavy fermion systems\nMetal insulator transition\nSpin glass\nMesoscopic systems\nGiant magnetic resistance Specific heat\nDe Haas-van alphen oscillations\nSolid state NMR\nElectrical resistivity\nMagneto-resistance\nNeutron scattering\nSuperconductivity low Tc superconductors\nQuantum computing\nJosephson junctions\nFlux vortices\nQuantum initial phenomena electrical resistivity\nScanning spectroscopy (STM\/AFM)\nSQUID characterisation \nAC susceptibility\nAstrophysics & cosmology Low temperature detectors\nSuperconducting tunnel junctions\nGE bolometers Electrothermal measurements\nVoltage biased measurements\nLow energy photon detection\nMetrology Quantum hall effect\nVoltage standards\nCurrent standards Magneto-resistance\nDC & AC low frequency transport and magnetic measurements\nSingle electron tunnelling\n\n",
"options" : "",
"accessories" : "IntegraAC - recondensing helium cryostat",
"tags" : "Nanotechnology,Electrical transport measurements,Quantum dot measurements,Semiconductors,Quantum Hall Effect,Quantum dots ,Single electron tunneling ,Quantum computing,Solid State Physics,Heavy fermions systems ,Metal insulator transition,Spin glass ,Mesoscopic systems ,Giant magnetic resistance,Superconductivity,Quantum initial phenomena,Magneto-resistance , RF transport ,High frequency conductivity",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","quantum-transport-measurement","quantum-information-processing","characterisation-of-low-dimensional-structures" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Transport Measurement, Quantum Information Processing, Characterisation of Low Dimensional Structures",
"product_family" : "wet-dilution-refrigerators",
"product_family_frontend" : "Wet Dilution Refrigerators",
"sorting_product_family" : "100",
"idx": 128,
"page_id": 425,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/wet-dilution-refrigerators/kelvinoxtlm",
"weight" : 0,
},
{
"name":"Kymera 193i Spectrograph",
"sorting_name":"kymera 193i spectrograph",
"image":"/assets/components/phpthumbof/cache/kymera-193-product.a065c722bb82550345c3ecc5b5623bee.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Andor’s Kymera 193i spectrograph has been designed with research-grade performance, versatility and ease of use in mind. The ‘intelligent’ motorized adaptive focusing allows access to the very best spectral resolution performance in any configuration with un-matched repeatability.",
"outline_limited" : "Andor’s Kymera 193i spectrograph has been designed with research-grade performance, versatility and ease of use in mind. The ‘intelligent’ motorized adaptive...",
"highlights" : "Adaptive Focus technology (patent WO2016012794 A3),Motorized dual-grating turret,Astigmatism-corrected optical design,Dual detector outputs,USB interface",
"overview" : "Andor’s Kymera 193i spectrograph has been designed with research-grade performance, versatility and ease of use in mind.\r\nThe ‘intelligent’ motorized adaptive focusing allows access to the very best spectral resolution performance in any configuration with un-matched repeatability. Its F\/3.6 aperture, combined with Andor’s world-class range of ultra-sensitive UV-NIR and SWIR detectors, offers a ‘workhorse’ spectroscopy platform with superb photon collection efficiency, ideal for challenging low-light micro-fluorescence \/ Raman applications or routine spectral acquisitions.\r\nThe indexed grating turret, dual output port and extensive accessories range provides a highly configurable platform to best match Academic and OEMs specific performance requirements. Dedicated micro-spectroscopy interfaces - including modular ‘cage system’ - allow seamless integration to microscopy setups, with Kymera spectrograph and accessories user-friendly control in ?Manager to provide a quick and easy setup of complex micro-spectroscopy acquisition including chemical mapping.",
"features" : "",
"features_benefits" : "193 mm focal length, F\/3.6 aperture - Ideal combination for a wide range of applications, ranging from luminescence\/ photoluminescence spectroscopy, to more demanding, higher resolution Raman spectroscopy,Adaptive Focus (patented) I - d) Intelligent and user-friendly interface, for uncompromised spectral resolution performance.,Dual-grating turret with xPressID™ RFID technology - Seamless field-upgradability with precise indexing interface, and user-friendly hatch access. Automatic gratings recognition and setup, with embedded RFID tags - minimum user interaction.,Astigmatism-corrected optical design - Toroidal optics enable multi-track fiber detection and excellent sample image relay from a microscope at the grating ‘0’ order,Dual outputs - Extended wavelength coverage when combining Andor UV-NIR CCD, EMCCD, ICCD and InGaAs cameras. Slit option for monochromator operation.,USB interface - Plug-and-play connectivity, ideal for laptop operation alongside Andor USB cameras,Seamless connection to microscopes - Adjustable height feet and choice of direct, lens relay, or cage system-based interfaces. 15 mm wide-aperture input slit for extended sample image relay and spectral analysis through the same optical path.,Protected silver-coated optics option - Most efficient for NIR\/SWIR detection when used in conjunction with Andor InGaAs cameras,Pre-aligned, pre-calibrated instrument - Individually characterized spectrograph-detector systems for out-of-the box operation,High repetition rate shutter - 10 Hz continuous operation and 40 Hz burst mode for ultrafast background acquisition and detector protection.",
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"accessories" : "",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-microspectroscopy","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "kymera-and-shamrock-spectrographs",
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"page_link" : "https://andor.oxinst.com/products/kymera-and-shamrock-spectrographs/kymera-193i",
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{
"name":"Kymera 328i Spectrograph",
"sorting_name":"kymera 328i spectrograph",
"image":"/assets/components/phpthumbof/cache/4aec1b34150279519281122490510477108.76e3ba7596c6f9a69f931f8f281eb125.jpg",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Intelligent and multi-modal spectroscopy platform for Physical and Life science",
"outline_limited" : "Intelligent and multi-modal spectroscopy platform for Physical and Life science",
"highlights" : "Adaptive Focus technology,TruRes™ – Highest spectral resolution,Quad-grating turret with eXpress™ RFID,Dual inputs and outputs maximum flexibility,µManager for micro-spectroscopy",
"overview" : "This highly modular spectrograph features patented Adaptive Focus, quadruple on-axis grating turret and TruRes™ technology, delivering superb spectral resolution performance. The unmatched configurability and highly intuitive user interface make it the perfect platform for a wide range of routine and more advanced spectroscopy experiments.\r\nThe intelligent, motorised Adaptive Focus of the Kymera allows automated access to the best optical performance for any grating, camera or wavelength range configuration. The TruRes™ option delivers unmatched spectral resolution for a third-meter focal length spectrograph, with performance enhancements exceeding 30%, extracting the very best performance from the Kymera without the need for a grating change or post-processing spectra mathematical alterations. Greater definition of dense Raman or plasma optical signatures can be achieved without compromise on bandpass, from UV to SWIR, at the touch of a button.",
"features" : "",
"features_benefits" : "328 mm focal length, F\/4.1 aperture - Ideal combination for a wide range of applications ranging from luminescence\/ photoluminescence spectroscopy to more demanding, higher resolution Raman spectroscopy or plasma studies,Adaptive Focus (patented) - Intelligent and user-friendly interface for uncompromised spectral resolution performance,TruRes™ - Intuitive, rapid and fully user-controlled option for greater than 30% true spectral resolution enhancement at the touch of a button. Enhance the discrimination power of your spectrograph without tedious grating or grating turret change.,Quad-grating turret with RFID technology - Seamless field-upgradability with precise indexing interface and user-friendly hatch access. Automatic gratings recognition with embedded RFID tags - minimum user interaction. Maximum resolution and band-pass flexibility at the touch of a button.,Astigmatism-corrected optical design - Toroidal optics enable multi-track fiber detection and excellent sample image relay from a microscope at the grating ‘0’ order,Robust on-axis wavelength drive - High accuracy direct-drive delivers superb single-grating and grating-to-grating center wavelength repeatability down to 4 and 10 pm respectively.,Dual detector outputs - Extended wavelength coverage when combining Andor UV-NIR CCD, EMCCD, ICCD and InGaAs cameras. Slit option for monochromator operation,Dual input ports - Greater setup flexibility for complex, multi-modal optical setups.,USB interface - Plug-and-play connectivity, ideal for laptop operation alongside Andor USB cameras.,Seamless connection to microscopes - Adjustable height feet and choice of direct, lens relay, or cage system-based interfaces. 15 mm wide-aperture input slit for extended sample image relay and spectral analysis through the same optical path.,Protected silver coated optics options - Most efficient for NIR\/SWIR detection when used in conjunction with Andor InGaAs cameras,Pre-aligned, pre-calibrated instrument - Individually characterized spectrograph-detector systems for out-of-the box operation,High repetition rate shutter - 10 Hz continuous operation and 40 Hz burst mode for ultrafast acquisition,µ-Manager software integration - Simultaneous control of Andor cameras, spectrographs and a wide range of microscopes and accessories through 1 single software platform. Dedicated, user-friendly spectrum handling interface,Monochromator capabilities - Extract best optical resolution while allowing use of single point detectors with sensitivity up to 12 ?m (Labview SDK-based solution only)",
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"businesses" : "andor",
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"applications" : [ "analysis-of-environmental-contaminants","automotive-engines","battery-technology","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","gunshot-residue-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","materials-for-the-power-generation-industry","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-microspectroscopy","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification","rapid-analysis-of-illicit-substances","rock-core-analysis" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Automotive Engines, Battery Technology, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Gunshot Residue Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Materials for the Power Generation Industry, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification, Rapid Analysis of Illicit Substances, Rock Core Analysis",
"product_family" : "kymera-and-shamrock-spectrographs",
"product_family_frontend" : "Kymera & Shamrock Spectrographs",
"sorting_product_family" : "100",
"idx": 130,
"page_id": 259,
"page_link" : "https://andor.oxinst.com/products/kymera-and-shamrock-spectrographs/kymera-328i",
"weight" : 0,
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"name":"Laser Options",
"sorting_name":"laser options",
"image":"/assets/components/phpthumbof/cache/Product_Laser.ec8298433f217ad212b880595fd77350.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nSpecifications Fiber-coupled lasers for flexible, safe and user-friendly operations Single mode fiber guaranteeing diffraction limited point light source at entry in microscopic body Reduced vibrational and thermal disturbances in Raman measurements due to remotely-located lasers with a flexible footprint Customer-oriented microscope configurations with the integration of multiple lasers Large portfolio of different lasers optimized for your applications available Wavelength range: 266 nm - 1064 nm Power range: 10 mW - 1500 mW; wavelength dependent Precise laser power measurement and control via TruePower Full control over the polarization direction of the incident and collected light with the polarization module\nStandard options of laser wavelengths\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Fiber-based Beam Delivery: Facts and Benefits\nOxford Instruments uses the newest photonic fiber technology for highly efficient light transmission.\nYour benefits: Virtually lossless energy transmission Extremely efficient optical throughput Highest spatial resolution and confocality provided by the fiber-transmitted diffraction-limited point light source User-friendly operation and long-term stability through pre-configured and pre-aligned fiber-coupling units Intricate polarization-dependent measurements possible\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nLaser safety Oxford Instruments Raman systems integrate safety class 2 to class 4 lasers. To ensure your safety, our microscopes can be equipped with interlocks, and enclosures that shield laser beams, to allow operations with a laser safety class of 1 or 1M.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`148645`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"businesses" : "raman",
"businesses_frontend" : "Raman",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "microscope-components",
"product_family_frontend" : "Microscope Components",
"sorting_product_family" : "100",
"idx": 131,
"page_id": 26550,
"page_link" : "https://raman.oxinst.com/products/microscope-components/laser",
"weight" : 0,
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"name":"Leg Extenders for Support of Thicker Samples",
"sorting_name":"leg extenders for support of thicker samples",
"image":"/assets/components/phpthumbof/cache/MFP-3D-AFM-Leg-Extenders.8bfad44b3dbbcb90895e9ceac680b8c4.jpg",
"content" : "",
"outline" : "The MFP-3D Leg Extenders raise the scan head to allow imaging of thicker samples up to 30 mm in height (inquire about thicker samples).",
"outline_limited" : "The MFP-3D Leg Extenders raise the scan head to allow imaging of thicker samples up to 30 mm in height (inquire about thicker samples).",
"highlights" : "Ideal for thick samples",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-miscellaneous-accessories",
"product_family_frontend" : "MFP-3D Accessories: Adapting to Experimental Needs",
"sorting_product_family" : "100",
"idx": 132,
"page_id": 320,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-miscellaneous-accessories/mfp-3d-leg-extenders",
"weight" : 0,
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"name":"RISE\/EDS – Correlative Raman-SEM Microscope with EDS ",
"sorting_name":"life science and pharmaceutical research",
"image":"/assets/uploads/raman/products/RISE-EDS/WITec_RISE_MOCKUP_052023_04_web_1000x864.jpg",
"content" : "The RISE\/EDS Technique - the perfect match RISE Microscopy\nRISE instruments seamlessly integrate confocal Raman imaging and scanning electron microscopy (SEM). They incorporate the sensitivity and non-destructive nature of Raman spectroscopy with the atomic resolution of electron microscopy.\nRaman imaging enables the identification of molecules, their allotropes and polymorphs, the determination of their orientation, purity and crystallinity, and the detection of strain states. SEM allows for the imaging of surface structures on the nanometer scale. EDS Microscopy\nEDS (Energy Dispersive X-ray Spectroscopy) is a technique for elemental and compositional analysis based on the detection and analysis of X-rays produced by electron irradiation of a sample. Ionisation causes an inner-shell electron of constituent atoms to be ejected. This creates a vacancy in the electron orbital. \nAn electron from an outer shell, with a higher energy level, transfers to the inner shell to stabilise it, and an X-ray is emitted during this process. This so-called characteristic X-ray has a specific energy value for each element. From such signals, it is possible to determine microstructure, composition and crystal structure.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nBenefits\nRISE\nEDS\nDetailed insight\nMolecular and bonding information, crystallinity, material stress and strain, crystal orientation\nElemental quantitation and distribution, microstructure and crystal structure\nWide-ranging analysis\nSub-micron and large-area molecular information, 3D chemical imaging\nPoint analysis,large area mapping, particle analysis\nDynamic vision\nAnalysis of chemical processes possible\nLive Chemical Imaging in real time with AZtecLive\nMultimode operation\nIndependent Raman operation, Raman-SEM image correlation\nSimultaneous SEM and EDS data acquisition\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Application Examples\nBattery materials\nInvestigation of battery cathode materials. EDS (top row) reveals the distribution of the individual metallic elements. RISE delivers complementary information on microstructure and the distribution of chemical components along with the carbon matrix.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Related Products WITec Products NanoAnalysis Products Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`853`&formTpl=`standard-form-wrapper` &unique_id=`830822`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"options" : "",
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"tags" : "",
"businesses" : "oxford-instruments",
"businesses_frontend" : "Oxford Instruments",
"applications" : [ "archaeology-and-the-arts","coatings-and-thin-films","energy-storage","food-technology","forensics","geo-science","life-science","materials-science","2d-materials","pharmaceutics","photovoltaics","polymers" ],
"applications_frontend" : "Archaeology & The Arts, Coatings & Thin Films, Energy Storage, Food Technology, Forensics, Geo Science, Life Science, Materials Science, Nano-Carbon & 2D Materials, Pharmaceutics & Cosmetics, Semiconductors & Photovoltaics, Polymers",
"product_family" : "en",
"product_family_frontend" : "EN",
"sorting_product_family" : "100",
"idx": 133,
"page_id": 29351,
"page_link" : "campaigns/emea/en/life-science-and-pharmaceutical-research",
"weight" : 0,
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{
"name":"Liquid Droplet Probe Holder (Cypher S)",
"sorting_name":"liquid droplet probe holder (cypher s)",
"image":"/assets/components/phpthumbof/cache/Cypher-S-droplet-holder-actin-filaments.ac9108d599d646706800d04e6ae3be86.jpg",
"content" : "",
"outline" : "The droplet cantilever holder is used for all measurements in liquid. It includes a low-evaporation chamber to minimize evaporation during longer term imaging sessions. The holder can be fully disassembled for cleaning.",
"outline_limited" : "The droplet cantilever holder is used for all measurements in liquid. It includes a low-evaporation chamber to minimize evaporation during longer term imaging sessions. The holder...",
"highlights" : "For fluid measurement in a small amount of liquid with minimal evaporation,Can be fully disassembled for cleaning",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Roughness,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cypher-operating-in-liquid",
"product_family_frontend" : "Cypher Accessories: Operating in Liquid Environments",
"sorting_product_family" : "100",
"idx": 134,
"page_id": 329,
"page_link" : "https://afm.oxinst.com/products/cypher-operating-in-liquid/cypher-liquid-droplet-probe-holder",
"weight" : 0,
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{
"name":"Liquid Perfusion Cell (Cypher ES)",
"sorting_name":"liquid perfusion cell (cypher es)",
"image":"/assets/components/phpthumbof/cache/Liquid-perfusion-cell-for-Cypher-ES-3APR2018.c4f13e43234860bb690f64cd44a9acb4.jpg",
"content" : "",
"outline" : "The liquid perfusion cantilever holder allows liquid to be perfused or exchanged using gravity flow or syringes through an otherwise fully sealed liquid cell. ",
"outline_limited" : "The liquid perfusion cantilever holder allows liquid to be perfused or exchanged using gravity flow or syringes through an otherwise fully sealed liquid cell. ",
"highlights" : "Image in a completely sealed environment, Ports enables perfusion or exchange using gravity flow or syringes<\/p>, Integrated pressure sensor allows the cell to be pressure-tested to ensure that it is sealed<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
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"product_family" : "cypher-operating-in-liquid",
"product_family_frontend" : "Cypher Accessories: Operating in Liquid Environments",
"sorting_product_family" : "100",
"idx": 135,
"page_id": 331,
"page_link" : "https://afm.oxinst.com/products/cypher-operating-in-liquid/cypher-es-liquid-perfusion-cell",
"weight" : 0,
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"name":"Liquid Perfusion Cell (Cypher VRS)",
"sorting_name":"liquid perfusion cell (cypher vrs)",
"image":"/assets/components/phpthumbof/cache/Liquid-perfusion-cell-for-Cypher-ES-3APR2018.c4f13e43234860bb690f64cd44a9acb4.jpg",
"content" : "",
"outline" : "The liquid perfusion cantilever holder allows liquid to be perfused or exchanged using gravity flow or syringes through an otherwise fully sealed liquid cell. ",
"outline_limited" : "The liquid perfusion cantilever holder allows liquid to be perfused or exchanged using gravity flow or syringes through an otherwise fully sealed liquid cell. ",
"highlights" : "Image in a completely sealed environment, Ports enables perfusion or exchange using gravity flow or syringes<\/p>, Integrated pressure sensor allows the cell to be pressure-tested to ensure that it is sealed<\/p>, Fluid exchange ports positioned to better support small samples for video-rate imaging<\/p>",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
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"sorting_product_family" : "100",
"idx": 136,
"page_id": 332,
"page_link" : "https://afm.oxinst.com/products/cypher-operating-in-liquid/cypher-vrs-liquid-perfusion-cell",
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"name":"Marana sCMOS",
"sorting_name":"marana scmos",
"image":"/assets/components/phpthumbof/cache/marana-scmos-blue.e9c243cf3c4518289734f78df913c72e.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Marana is Andor’s high performance sCMOS camera platform for Astronomy and Physical Sciences, featuring 95% Quantum Efficiency (QE) and market-leading vacuum cooling to -45 °C. The platform offers solutions for large field of view and high-speed imaging\/spectroscopy.",
"outline_limited" : "Marana is Andor’s high performance sCMOS camera platform for Astronomy and Physical Sciences, featuring 95% Quantum Efficiency (QE) and market-leading vacuum cooling to -45 °C....",
"highlights" : " 95% QE & -45 °<\/sup>C cooling<\/strong> - most sensitive back-illuminated sCMOS available<\/p>, 4.2 Megapixel \/ up to 32mm sensor <\/strong>– perfect for astronomy<\/p>, NEW<\/span> 135 fps High Speed Mode<\/strong> – track fast events without smear<\/p>, NEW<\/span> 1.0 e- Low Noise Mode<\/strong> – for the most light-starved conditions<\/p>, NEW<\/span> Long Exposure Capability<\/strong> – photometry over a wider exposure range<\/p>",
"overview" : "Marana is Andor’s latest high performance sCMOS camera platform, ideal for diverse applications within the physical sciences such as astronomy, Bose Einstein Condensation, quantum optics, hyperspectral imaging, neutron tomography and fast spectroscopy. Both Marana models feature 4.2 Megapixel sensors, 95% Quantum Efficiency (QE) and market-leading vacuum cooling to -45 °C, making Marana the most sensitive back-illuminated sCMOS platform available. Andor’s unique capability to deliver the ultimate in sCMOS sensitivity means Signal to Noise can be optimized under light starved conditions, ideal for tracking smaller orbital objects, spectroscopic detection of trace concentrations and BEC fluorescence detection of discrete numbers of atoms\/ions. Higher sensitivity also means that exposure times can be shortened, facilitating faster frame rate measurements of dynamic processes.\r\nCrucially, Marana sCMOS reads out 4.2 Megapixel high resolution arrays in less than 50 milliseconds, while maintaining very low read noise; hundreds of times faster than a similar resolution CCD detector.\r\nThe innovative ‘dual-amplifier’ approach to extended dynamic range is ideal for accurately visualizing and quantifying challenging scenes that have both extremely weak and bright regions, such as solar measurements and spectroscopic materials characterisations. Furthermore, to achieve best-in-class quantification accuracy, Andor have implemented enhanced on-head intelligence to deliver market-leading linearity of > 99.7% across the whole dynamic range, ideal for accurate photometry.\r\nMarana 4.2B-11: This large field of view option utilizes a unique Anti-Glow Technology approach that enables one to usefully access the entire 2048 x 2048 array, offering an impressive 32mm sensor diagonal, which in combination with fast frame rates up to 24 fps (16-bit) and 48 fps (12-bit), renders the camera ideal for large sky scanning astronomy applications such as orbital debris tracking and Near Earth Asteroid detection. It is also ideal for dense multi-fiber hyperspectral applications. Marana 4.2B-11 also comes with a choice of QE profiles, the UV enhanced option (‘BU’) extending usefulness towards specific application requirements between 260nm and 400nm.\r\n\r\n \r\n \r\n \r\n \r\n \r\n \r\n\r\nNEW Marana 4.2B-6: This high speed model achieves 74 fps (16-bit) and is the most sensitive back-illuminated camera available for imaging or spectroscopic applications requiring fast frame rates, such as Quantum Gas dynamics, fast high resolution spectroscopy, hyperspectral imaging and non-destructive imaging of sample dynamics via X-Ray or Neutron Radiography. The smaller 6.5 μm pixel is better suited to resolution matching across many laboratory-based optical imaging configurations, as well as in echelle spectroscopy.\r\nThe Marana platform can be readily adapted to Adaptive Optics wavefront sensing. Not only is it capable of producing hundreds of fps with ROIs, it is also specifically architected to minimize data transfer lag. Furthermore, the fast frame rate of Marana can be harnessed to massively extend dynamic range and effective well depth through fast stacking (accumulation) of images or spectra.",
"features" : "\r\n \r\n \r\n \r\n \r\n \r\n Feature\r\n \r\n \r\n Benefit\r\n \r\n \r\n \r\n \r\n All Marana Models\r\n \r\n \r\n \r\n \r\n Up to 95% QE & lowest noise\r\n \r\n \r\n Maximum signal to noise for light starved measurements. Detect smaller orbital debris; BEC fluorescence.\r\n \r\n \r\n \r\n \r\n Vacuum cooled to -45°C\r\n \r\n \r\n Very weak signals require lowest noise floor and longer exposures: Don’t be restricted by camera thermal noise!\r\n \r\n \r\n \r\n \r\n 4.2 Megapixel\r\n \r\n \r\n High pixel resolution, maintaining image clarity over an extended field of view\r\n \r\n \r\n \r\n \r\n The ONLY vacuum back-illuminated sCMOS\r\n \r\n \r\n Andor’s proprietary UltraVac™ technology protects the sensor from (a) QE degradation, and (b) moisture condensation\r\n \r\n \r\n \r\n \r\n Extended Dynamic Range (EDR) Mode\r\n \r\n \r\n ‘One snap quantification’ across the full dynamic range - perfect for Photometry.\r\n \r\n \r\n \r\n \r\n > 99.7% linearity\r\n \r\n \r\n Market leading quantitative accuracy over the whole signal range.\r\n \r\n \r\n \r\n \r\n Fan and liquid cooling as standard\r\n \r\n \r\n Liquid cooling for maximum sensitivity.\r\n \r\n \r\n \r\n \r\n Adaptive Optics Ready\r\n \r\n \r\n Minimize lag after data collection - transfer of row data immediately after exposing.\r\n \r\n \r\n \r\n \r\n Spectroscopy Mode\r\n \r\n \r\n On-board intelligence delivering spectroscopists-friendly spectra and multi-track data prior to transfer through CoaXPress or USB interface. Upfront data size reduction and easier user data processing.\r\n \r\n \r\n \r\n \r\n 32-bit Binning Mode\r\n \r\n \r\n Access huge dynamic range through extensive pixel binning. User-selectable data bit-depth up to 32-bit, transmitted upstream over the camera interface.\r\n \r\n \r\n\r\n \r\n \r\n NEW Python Ready\r\n \r\n \r\n Python wrapper integration and full supporting documentation in latest camera SDK helps integration and full control of custom-build systems.\r\n \r\n \r\n \r\n \r\n USB 3.0 and CoaXPress connectivity options\r\n \r\n \r\n USB 3.0 provides flexibility. CoaXPress enables the highest speeds to capture the most dynamic events\r\n \r\n \r\n \r\n \r\n Marana 4.2B-11 (11 μm pixels)\r\n \r\n \r\n \r\n \r\n Glow Suppression Technology\r\n \r\n \r\n Compensates the effects of sensor amplifier glow, allowing access to the full 4.2 Megapixel array.\r\n \r\n \r\n \r\n \r\n 11 μm pixels and 32 mm sensor diagonal\r\n \r\n \r\n Largest field of view sCMOS, compatible with wide range of acquisition times. Large sky scanning;Tomography.\r\n \r\n \r\n \r\n\r\n\r\n \r\n \r\n \r\n Marana 4.2B-6 (6.5 μm pixels)\r\n \r\n \r\n \r\n \r\n 6.5 μm pixels\r\n \r\n \r\n Smaller pixels better suited to some optical systems, e.g. echelle astrospectroscopy and cold atom imaging.\r\n \r\n \r\n \r\n \r\n NEW Low Noise Mode\r\n \r\n \r\n Reduces read noise down to 1.0 e- at the expense of pixel well depth. Ideal for light starved conditions, when absolute sensitivity is a priority.\r\n \r\n \r\n \r\n \r\n NEW High Speed Mode\r\n \r\n \r\n Acquire images at high speeds of up to 135 fps in full frame 16-bit mode via CoaXPress! Boost speeds even further using regions of interest.\r\n \r\n \r\n \r\n \r\n NEW Global Clear Mode\r\n \r\n \r\n Purges charge from all rows of the sensor simultaneously at the exposure start. Tight synchronization with pulsed sources.\r\n \r\n \r\n \r\n \r\n NEW Long Exposure Capability\r\n \r\n \r\n Enhanced Glow Suppression Technology enables exposures up to several minutes.\r\n \r\n \r\n \r\n \r\n \r\n\r\n",
"features_benefits" : "",
"extended_tabs" : "\n \n \n \n \n Model\n \n \n Marana 4.2B-11\n \n \n Marana 4.2B-6\n \n \n \n \n Sensor Type\n \n \n Back-Illuminated Scientific CMOS\n \n \n \n \n Array Size\n \n \n 2048 (W) x 2048 (H) 4.2 Megapixel\n \n \n 2048 (W) x 2046 (H) 4.2 Megapixel\n \n \n \n \n Pixel Size\n \n \n 11 x 11 μm\n \n \n 6.5 x 6.5 μm\n \n \n \n \n Image Area\n \n \n 22.5 mm x 22.5 mm (31.9 mm diagonal)\n \n \n 13.3 mm x 13.3 mm (18.8 mm diagonal)\n \n \n \n \n Readout Modes\n \n \n Rolling Shutter\n \n \n Rolling Shutter and Global Clear\n \n \n \n \n Pixel readout rate\n \n \n 100 MHz (High Dynamic Range mode, 16-bit)200 MHz (Fast Speed mode, 12-bit)\n \n \n 310 MHz (Fast High Dynamic Range mode, 16-bit)180 MHz (Low Noise mode, 12-bit)\n \n \n \n \n Quantum Efficiency\n \n \n up to 95%\n \n \n \n \n Read Noise (e-) median\n \n \n 1.6 e- (at any readout rate)\n \n \n 1.0 e- (Low Noise, 12-bit)\n 1.6 e- (High Dynamic Range, 16-bit)\n 1.9 e- (High Speed, 11-bit)\n \n \n \n \n Dark CurrentAir cooled (@-25°C )Water\/liquid cooled (@ -45°C)\n \n \n 0.7 e-\/pixel\/s0.3 e-\/pixel\/s\n \n \n 0.15 e-\/pixel\/s0.10 e-\/pixel\/s\n \n \n \n \n Linearity\n \n \n > 99.7%\n \n \n \n \n Photon Response Non-Uniformity (PRNU)\n \n \n < 0.5% (@ half-light range)\n \n \n \n \n Data range\n \n \n 16-bit (High Dynamic Range mode)12-bit (Fast Speed mode)\n \n \n 16-bit (Fast High Dynamic Range mode)12-bit (Low Noise mode)\n \n \n \n \n Interface\n \n \n USB 3.0 - (CoaXPress available on request)\n \n \n USB 3.0 and CoaXPress\n \n \n \n \n\n,The Most Sensitive Back-illuminated sCMOS Available\n\nMarana back-illuminated sCMOS cameras feature 95% Quantum Efficiency (QE) and market-leading vacuum cooling down to -45 °C, minimizing noise floor. The darkcurrent of the GS400BSI and GS2020BSI sensors are significant contributors to overall system noise, so effective cooling becomes essential. With air cooling, Marana has almost 5x lower darkcurrent than the nearest physical science competing camera. Furthermore, the new low noise mode of Marana 4.2B-6 offers only 1.0 e- noise floor, ideal for the most light-starved use cases.\nHaving the most sensitive Back-illuminated sCMOS camera carries a host of practical advantages within Astronomy and Physical Sciences, for example:\n\n Detect smaller objects - More successful Space Debris and NEO tracking\n Lower laser powers\/doses - preserve photosensitive samples\n Lower detection limits - detect and quantify trace concentrations, e.g. spectroscopy\n Lower exposure times - follow faster events with high SNR, e.g. Pulsars and fast BEC dynamics\n Narrowband filters – for example, narrowband Solar imaging of specific emission lines\n Detect fluorescence from discrete atoms - more successful BEC experiments\n\n\"Back-illuminated sensors are valued specifically for their enhanced sensitivity. It makes sense to choose the most sensitive camera adaption of this high-end technology\"\nGlow Suppression: Accessing the Entire Sensor Array with Longer Exposures\n\nThe GSense back-illuminated sensors from GPixel, present in the Marana models and some competing cameras, are widely recognised to suffer from glow at the edges of the sensor. Glow is especially prevalent in the GS400BSI sensor (used in Marana 4.2B-11), but is also present to a lesser extent in the GS2020BSI sensor (used in Marana 4.2B-6). This glow manifests as false signal and is exposure dependent. The competitor approach is either to (a) live with the glow; (b) only use the middle region of the sensor; or (c) firmware restrict exposure times to 30 milliseconds in order to contain the impact of glow on experiments! Either way, this fundamentally restricts performance and usefulness across a range of applications, either through field of view limitation or through sensitivity limitation.\nAndor have studied and characterised this sensor issue in detail and have developed and implemented an ‘glow-suppression’ technology to suppress the effect of sensor glow on the image. This approach involves (a) shutting down glowing amplifiers during a large portion of the exposure and (b) mapping the impact of any residual glow across a wide exposure range and flat field correcting for it (on camera).\nThe figure to the right shows a dark image of the GSense400BSI back-illuminated sensor with and without glow suppression – the difference it makes is stark and has enabled Andor to open up the full 2048 x 2048 array, while also allowing users to access exposure times up to several seconds.\nThis Glow Suppression approach is very effective in widening the exposure range for the Marana models. The acceptable long exposure threshold will ultimately be defined by application usage. At longer exposures there will still be an elevated noise impact from the amplifier glow, especially at the sensor edges, so applications which require high SNR from the edge pixels may be limited to shorter exposure times. The table below is more of a guide, and ultimately, we advise that the practically usable exposure range should be tested by the end user.\n\n \n \n \n\n Minimum Exposure\n Recommended Maximum Exposure\n Hard coded Maximum Exposure (software)\n \n \n Marana 4.2B-6\n Microseconds\n 5 minutes\n 10 minutes\n \n \n Marana 4.2-11\n Microseconds\n 60 seconds\n 10 minutes\n \n \n \nGuide only: Recommended Maximum Exposure for Marana models. We recommend that users test maximum usable exposure within the context of intended application usage.\nExtended Dynamic Range and Superb Linearity\nThe innovative Dual Amplifier architecture of sCMOS sensors uniquely circumvents the need to choose between high or low gain amplifiers, in that signal can be sampled simultaneously by both high gain (low noise) and low gain (high capacity) amplifiers. As such, the lowest noise of the sensor can be harnessed alongside the maximum well depth, affording widest possible dynamic range. Uniquely for such a relatively small pixel design, this allows for dynamic range performance of 53,000:1 in Marana 4.2B-11.\nFurthermore, on-camera intelligence delivers a significant linearity advantage, providing unparalleled quantitative measurement accuracy across the full dynamic range.\nThe fast, low noise readout of Marana sCMOS is also ideal for massively extending dynamic range through rapid stacking (accumulation) of multiple frames. For example, the plot below shows Dynamic Range and Effective Well Depth as a function of the number of stacked (accumulated) frames, plotted for Marana 4.2B-6. A Dynamic Range of 188,280:1, and a corresponding Effective Well Depth of 1,650,000 electrons can be reached with only 30 stacked frames. At maximum frame rate, this number of accumulated frames takes only 0.4 secs to acquire, achieving > 2 fps. This capability is significant for a range of challenges across imaging and spectroscopic characterisations.\n\nFast Frame Rates\nThe sCMOS sensors in Marana 4.2B-6 and Marana 4.2B-11 have highly parallel readout architecture, facilitating high data readout rates and therefore fast frame rates. All columns possess their own Amplifier and Analogue to Digital Converter (ADC), meaning that all columns are read out in parallel. Region of Interest (ROI) can be utilized to considerably boost frame rates further.\nMarana 4.2-6 offers particularly fast frame rate capability of 74 fps (full array) with 16-bit data range, or a new High-Speed Mode of 135 fps with 11-bit data range. This renders it ideal for dynamic applications while avoiding motion smear, such as Quantum Gas (e.g. BEC) dynamics or Hyperspectral Imaging.\nMarana 4.2-11 combines rapid frame rates with extended field of view, ideal for applications in astronomy such as Space Debris and NEO tracking, Pulsar imaging, Solar polarimetry and Lucky imaging\/Speckle Interferometry. \nMarana models are architected to offer both 16-bit and 12\/11-bit modes. Lower bit depth modes are selected specifically to accelerate frame rates, while sacrificing wide dynamic range, useful for imaging fast phenomena that are exclusively low light, such as following dynamics on discrete numbers of fluorescent ultra cold atoms\/ions.\n\n \n \n \n \n ROI Size (W x H))\n Max Frame Rate (fps) USB 3.0 (CXP)\n \n \n 16-bit Mono16\n 11-bit (High Speed) Mono12 Packed\n \n \n 2048 x 2048\n 43 (74)\n 48\n \n \n 1400 x 1400\n 92 (108)\n 120 (198)\n \n \n 1200 x 1200\n 125 (126)\n 164 (230)\n \n \n 1024 x 1024\n 147 (147)\n 231 (270)\n \n \n 512 x 512\n 294 (294)\n 536 (539)\n \n \n 256 x 256\n 582 (582)\n 1061 (1061)\n \n \n 128 x 128\n 1148 (1148)\n 2073 (2073)\n \n \n \n \n\nRolling Shutter and Simulated Global Shutter\nBoth Marana models utilize a Rolling Shutter exposure mechanism. Rolling shutter essentially means that different lines of the array are exposed at different times as the read out ‘wave’ sweeps through the sensor, a row at the bottom starting the exposure approximately 21 ms before rows at the sensor’s distal edge. The lowest readout noise and fastest frame rates are available from this mode. Rolling shutter only presents an issue when imaging relatively large, fast-moving objects within the field. Then, aside from the risk of motion blur that can affect any imaging condition in which rate of motion is being temporally under-sampled, there is an additional possibility of rolling shutter spatial distortion. However, distortion is less likely when relatively small objects are moving at a rate that is being temporally oversampled by the frame rate, which in fact describes the vast majority of use cases.\n\nA further potential downside of rolling shutter is that different regions of the exposed image will not be precisely correlated in time to other regions, which can be essential for some applications. For example, if a cell is electrically stimulated and it is important to measure the onset of calcium sparks relative to the stimulation event, then rolling shutter should not be used. In this case, a true global shutter mode is required, available in ZL41 Wave 5.5 sCMOS cameras.\nMultiple Optical Mount Options\n\nMarana 4.2B-11 ships as default with standard F-mount optical coupling, however, the user can readily convert the camera for use with a C-mount lenses, simply by selecting this additional optical mount accessory at time of order. C-mount may be used with cropped sub-array sizes up to 1400 x 1400, yielding a 22mm sensor diagonal.\nFor attachment to various professional telescope configurations, the Marana 4.2B-11 front end can be direct mounted, providing f\/# 0.7 with 72° cone angle. Through engagement with Andor’s Customer Special Request (CSR) service, custom mount faceplates can be tailored to your specific optical needs.\nLikewise, while the smaller field of view Marana 4.2B-6 ships as native C-mount, an F-mount accessory may be ordered to convert the camera for use with F-mount lenses, for example to access lower f# input.\nFast Spectroscopy Mode\nMarana 4.2B-6 and Marana 4.2B-11 can be readily adapted to the needs of fast spectroscopy, yielding up to greater than 11K spectra\/sec. Such spectral rates are ideal for following fast reaction dynamics on sub-millisecond stopped flow timescales. Fast spectral kinetics capability can also be used for ‘pseudo-gated’ time-resolved functionality, whereby the first series of spectra from a fast series can be discarded to ‘gate out’ the effects of the initial exciting laser pulse.\nOn-camera FPGA real time asymmetric pixel binning allows for optimized optical matching and maximum photon collection, while a complimentary on-camera bit depth of 32-bit capability allows for very high binned effective well depths, ideal for fast transient absorption measurements.\nSpurious Noise Filter\nAndor’s Marana sCMOS camera comes equipped with an in-built FPGA filter that operates in real time to reduce the frequency of occurrence of high noise pixels. This real time filter corrects for pixels that would otherwise appear as spurious ‘salt and pepper’ noise spikes in the image.\nThe appearance of such noisy pixels is analogous to the situation of Clock Induced Charge (CIC) noise spikes in EMCCD cameras, in that it is due to the fact that we have significantly reduced the noise in the bulk of the sensor that the remaining small percentage of spuriously high noise pixels can become an aesthetic issue. The filter employed dynamically identifies such high noise pixels and replaces them with the mean value of the neighbouring pixels.\nFPGA Timestamp\nThe Marana platform can generate a timestamp for each image that is accurate to 25 nanoseconds. Accurate timestamps can be important where precise knowledge of frame time impacts temporal dynamic analysis. This is especially important for fast events, where computer and interface latencies need to be considered, for example in Pulsar studies.\nFlexible pixel binning\nThe Marana models feature on-camera flexible pixel binning, user definable to 1 pixel granularity. Greater binning flexibility can be useful for some photon starved applications where resolution can be sacrificed in favour of enhanced photon collection area per pixel - e.g. extremely low light luminescence experiments.\n\n",
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"businesses" : "andor",
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"applications" : [ "adaptive-optics","modular-microspectroscopy","near-earth-objects-and-space-debris","quantum-optics","solar-astronomy","speckle-and-lucky-imaging" ],
"applications_frontend" : "Adaptive Optics, Modular Microspectroscopy, Near Earth Objects and Space Debris, Quantum Optics, Solar Astronomy, Speckle & Lucky Imaging",
"product_family" : "scmos-camera-series",
"product_family_frontend" : "sCMOS Camera Series",
"sorting_product_family" : "100",
"idx": 137,
"page_id": 2449,
"page_link" : "https://andor.oxinst.com/products/scmos-camera-series/marana-scmos",
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{
"name":"Marana-X sCMOS",
"sorting_name":"marana-x scmos",
"image":"/assets/components/phpthumbof/cache/marana-x-scmos-blue.72e9551b91918e82b8739a0cd110c1fa.png",
"content" : "",
"outline" : "Marana-X is Andor’s ground breaking sCMOS platform tailored to EUV and soft X-ray applications. Hand crafted to deliver market leading performance and versatility Marana-X reads out a 4.2 Megapixel high resolution array in less than 50 milliseconds while maintaining very low read noise. The Marana-X is available in two variants, a large area 11 μm 4.2 megapixel format and a 6.5 μm 4.2 megapixel format.",
"outline_limited" : "Marana-X is Andor’s ground breaking sCMOS platform tailored to EUV and soft X-ray applications. Hand crafted to deliver market leading performance and versatility Marana-X reads...",
"highlights" : " High Resolution<\/strong> - 4.2 Megapixel<\/p>, High Sensitivity<\/strong> - Up to 99% QE<\/p>, Fast Speeds<\/strong> - Up to 135 fps<\/p>, High Dynamic Range<\/strong> - Up to 16-bit<\/p>, EMP Resistant<\/strong> - CoaXPress data interface<\/p>",
"overview" : "Marana-X is Andor’s ground breaking sCMOS platform tailored to EUV and soft X-ray applications. Hand crafted to deliver market leading performance and versatility Marana-X reads out a 4.2 Megapixel high resolution array in less than 50 milliseconds while maintaining very low read noise; hundreds of times faster than similar resolution CCD detectors.\r\nUnparalleled Quantum Efficiency\r\nThe new Marana-X sCMOS boasts superior quantum efficiency in the EUV-1 keV energy range compared to existing CCDs. The excellent quantum efficiency of the Marana-X complements its high end scientific CMOS technology allowing the minimisation of experimental time and maximum data throughput with a rapid 135 fps full frame. Additionally, the sensor quantum efficiency and life time of the Marana-X has been fully characterised in a recent scientific publication by Harada and coworkers.",
"features" : "",
"features_benefits" : "Up to 99% QE & lowest noise - Maximum signal to noise for light starved measurements. Achieve high contrast faster,Vacuum cooled to -45°C - Very weak signals require lowest noise floor and longer exposures: Don’t be restricted by camera thermal noise,4.2 Megapixel - High pixel resolution, maintaining image clarity over an extended field of view,The ONLY uncoated back-illuminated sCMOS - The Marana-X incorporated the world’s first uncoated back-illuminated sCMOS sensor enabling unparalleled EUV – soft x-ray detection,Extended Dynamic Range (EDR) Mode - One snap quantification’ across the full dynamic range, capture high and low intensity images in the same image,> 99.7% linearity - Market leading quantitative accuracy over the whole signal range,Fan and liquid cooling as standard - Liquid cooling for maximum sensitivity,USB 3.0 and CoaXPress connectivity options - USB 3.0 provides flexibility. CoaXPress enables the highest speeds to capture the most dynamic events, and EMP resistant data transfer",
"extended_tabs" : "\n \n \n \n Model\n Marana-X 4.2B-6\n \n \n Sensor Type\n Back-Illuminated Scientific CMOS\n \n \n Array Size\n 2048 (W) x 2046 (H) 4.2 Megapixel\n \n \n Pixel Size\n 6.5 x 6.5 µm\n \n \n Image Area\n 13.3 mm x 13.3 mm (18.8 mm diagonal)\n \n \n Readout Modes\n Rolling Shutter and Global Clear\n \n \n Pixel Readout Rates\n 310 MHz (Fast High Dynamic Range mode, 16-bit)180 MHz (Low Noise mode, 12-bit)570 MHz (High Speed mode, 11-bit)\n \n \n Quantum Efficiency\n Up to 99%\n \n \n Read Noise (e-) median\n 1.0 e- (Low Noise mode, 12-bit)1.6 e- (Fast High Dynamic Range mode, 16-bit)1.9 e- (High Speed mode, 11-bit)\n \n \n Active area pixel well depth\n 42 000 e- (Fast High Dynamic Range mode, 16-bit)2100 e- (Low Noise mode, 12-bit)2100 e- (High Speed mode, 11-bit)\n \n \n Dynamic Range\n 34 000:1 (Fast High Dynamic Range mode, 16-bit)\n \n \n \n",
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"businesses" : "andor",
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"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 138,
"page_id": 11119,
"page_link" : "https://andor.oxinst.com/products/high-energy-detection/marana-x-scmos",
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"name":"Mechelle 5000 Spectrograph",
"sorting_name":"mechelle 5000 spectrograph",
"image":"/assets/components/phpthumbof/cache/31f81674150279307158974245811015992.791390d1324ffedb5ffe0b5054eaa71c.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Andor’s new Mechelle ME5000 Echelle spectrograph has been designed to provide simultaneous recording of a wide wavelength range (200-975 nm) in one acquisition. It has no moving components is available in a pre-aligned detector\/spectrometer format.",
"outline_limited" : "Andor’s new Mechelle ME5000 Echelle spectrograph has been designed to provide simultaneous recording of a wide wavelength range (200-975 nm) in one acquisition. It has no...",
"highlights" : "Compact and robust design,Patented optical design,Auto-temperature correction,N2 purged,Pre-aligned detector\/spectrograph",
"overview" : "Andor’s new Mechelle ME5000 Echelle spectrograph has been designed to provide simultaneous recording of a wide wavelength range (200-975 nm) in one acquisition. It has no moving components is available in a pre-aligned detector\/spectrometer format. The Andor Mechelle spectrograph is based on the echelle grating principal and its patented optical design provides extremely low cross-talk and maximum resolution compared with other spectrographs.",
"features" : "",
"features_benefits" : "Compact and robust design with no moving components - Ideal for non-lab based applications,Patented optical design - Ensures maximum resolution and extremely low cross-talk,Auto-temperature correction - Corrects for the variation of prisms optical refractive index with temperature,N2 purged - Enables maximum throughput in the UV region,Pre-aligned detector\/spectrograph solution - Enables fast, efficient experimental set-up,Low F\/number - Highly efficent light collection,Wide range of accessories available - Including fibre optics, slits, aiming Laser, collector\/collimator and calibration lamps,Andor Solis software - Extracts automatically a full wavelength calibrated spectrum from a complex echelle image and offers system advanced data manipulation capabilities,Peak labelling with NIST table - Easy tagging of known atomic species at the press of a button",
"extended_tabs" : "",
"options" : "",
"accessories" : "ACC-LK-HGAR-OCE - Mercury-Argon calibration lamp with SMA connector ,LK-DHRD-OCE-CAL - Deuterium-Halogen lamp, radiometrically calibrated (230 to 1,050 nm) ,ME-OPT-0007 - UV-NIR light collector \/ collimator with laser module for F\/# = 2 collection ,ME-SHT-9002 - Mechelle shutter unit (recommended when using iKon-M DU934P-yy-9FL) ,ME-SLT-25x25 - Mechelle 25 x 25 µm slit ,ME-SLT-10x50 - Mechelle 10 x 50 µm slit ,ME-SLT-50x25 - Mechelle 50 x 25 µm slit ,ME-SLT-25x50 - Mechelle 25 x 50 µm slit ,ME-SLT-50x50 - Mechelle 50 x 50 µm slit ,ME-SLT-100x50 - Mechelle 100 x 50 µm slit ,ME-SLT-200x50 - Mechelle 200 x 50 µm slit ",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-low-dimensional-structures","fabrication-and-characterisation-of-light-emitting-devices","forensic-soil-analysis-and-other-trace-analysis","gunshot-residue-analysis","identification-of-contaminants-in-food-production-and-soil","material-composition-and-structure","materials-for-the-power-generation-industry","measurement-of-chemical-and-molecular-composition","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","rock-core-analysis" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, Forensic Soil Analysis and Other Trace Analysis, Gunshot Residue Analysis, Identification of Contaminants in Food Production and Soil, Material Composition and Structure, Materials for the Power Generation Industry, Measurement of Chemical and Molecular Composition, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Rock Core Analysis",
"product_family" : "mechelle-spectrograph",
"product_family_frontend" : "Mechelle Spectrograph",
"sorting_product_family" : "100",
"idx": 139,
"page_id": 252,
"page_link" : "https://andor.oxinst.com/products/mechelle-spectrograph/mechelle-5000",
"weight" : 0,
},
{
"name":"Mercury<\/b>iPS",
"sorting_name":"mercuryips",
"image":"/assets/components/phpthumbof/cache/Mercury-IPS.d34b48a273d8830b41ea4dda4e9a89dc.png",
"content" : "12737",
"outline" : "A superconducting intelligent magnet power supply.",
"outline_limited" : "A superconducting intelligent magnet power supply.",
"highlights" : " Stable measurements<\/p>, Configurable<\/p>, Expandable functionality<\/p>",
"overview" : "The MercuryiPS is an intelligent fully configurable magnet power supply system. It enables automated control of a wide range of superconducting magnets, including NMR, high field, beamline and Vector Rotate magnet systems. MercuryiPS is a bi-polar, high-stability, four quadrant power supply with incorporated quench protection. It includes temperature control of the main high-power sense resistor to prevent output current drift. The MercuryiPS is fully controllable by remote command via TCP\/IP, USB, RS232 or optional GPIB.\r\nMercuryiPS has an on board temperature sensing for diagnostic monitoring of magnet temperature. It also includes an option for LHe\/LN2 level meter expansion card, additional temperature sensing cards, and an auxiliary port expansion card. ",
"features" : "Modular design: Based on ±60 A modules with ±10 V compliance and can be configured in parallel, series and matrix modes from the basic ±60 A with ±10 V output up to ±600 A with ±10 V or ±300 A with ±20 V output configurations.\r\nVersatile: Communications support a full range of interface options (Ethernet, USB, RS232, and optional GPIB) with downloadable Mercury function library for LabVIEW.\r\nComplete cryogenic system automation: Quench protection and auto-rundown where the MercuryiPS can be programmed to run magnet down safely in event of magnet temperature rise, low cryogen levels or triggered by an external TTL signal. The MercuryiPS can also be configured to control the system Lambda fridge.",
"features_benefits" : "",
"extended_tabs" : "Configurable module (typical specifications)\n\nOutput current: ± 60 A nominal (± 62.5 A maximum) via rear panel busbar permodule\nOutput voltage: ± 10 V\nOutput polarity: Bi-polar\nCurrent setting resolution: 0.15 mA\nCurrent resolution: 0.1 mA\nCurrent stability: ± 2 mA\nMax sweep rate: 1200 A\/min\nResolution: 0.01 A\/min\nLoad inductance: Up to 1000H\nSwitch heater output: 0 to 120 mA into 0 – 100 ohms.12 V compliance\nMax steady state power: 600 W\n\nInput\n\nMains input: 3 pin UL\/CSA compliant. Auto range setting\nSupply voltage: 90 to 264 VAC\nFrequency: 47 to 63Hz\n\nInterface\n\nRS232: With isobus support. Configured as DCE\nEthernet: 10\/100 RS422 IEE802.3\nUSB: Serial port emulation\nGPIB: IEEE-488 (Option)\nRS485 Modbus: Control between Master and Slave\n,\nEnergise superconducting magnets in both positive and negative directions\nEnergise vector-rotate superconducting magnets\nControl a Lambda fridge\nRead up to 9 temperatures\nRead up to 8 pressures\nRead cryogen levels\n",
"options" : "",
"accessories" : "MercuryiTC",
"tags" : " optical measurements,electrical measurements,spectroscopy techniques,Quench protection,superconducting magnets",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","quantum-information-processing","quantum-transport-measurement","characterisation-of-low-dimensional-structures","modular-optical-spectroscopy" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Information Processing, Quantum Transport Measurement, Characterisation of Low Dimensional Structures, Modular Optical Spectroscopy",
"product_family" : "control-electronics",
"product_family_frontend" : "Control Electronics",
"sorting_product_family" : "100",
"idx": 140,
"page_id": 434,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/control-electronics/mercuryips",
"weight" : 0,
},
{
"name":"Mercury<\/b>iTC",
"sorting_name":"mercuryitc",
"image":"/assets/components/phpthumbof/cache/MercuryiTC.1a3dfd4152043a10f946e5bc323241bb.png",
"content" : "12736",
"outline" : "A cryogenic programmable intelligent temperature controller.",
"outline_limited" : "A cryogenic programmable intelligent temperature controller.",
"highlights" : " Multi-channel<\/p>, Accurate<\/p>, Ability to upgrade<\/p>",
"overview" : "The MercuryiTC is a versatile cryogenic environment controller. In its basic form it includes a single channel high-resolution (24 bit) temperature measurement circuit which supports all the standard cryogenic sensors (ruthenium oxide, cernox, silicon diodes, platinum, thermocouple and RhFe). With the constant voltage mode it enables reliable, accurate temperature measurement using negative temperature sensors (NTC) down to below 250 mK. The base unit enables PID loop configuration control of a single heater output up to 80W (40 V, 2 A). \r\nThe base unit incorporates a versatile touch screen display with signal widgets (18 widgets) that are user configurable to display any of the internal system signals. The unit is fully controllable by remote command via TCP\/IP, USB, RS232 or optional GPIB. Any of the available system signals are also available by remote command.\r\nThe base unit is expandable with plug-and-play cards. There are 9 expansion slots, 8 multi-use and 1 dedicated for GPIB. The expansion slots allow the addition of 8 extra temperature sensor cards, or 3 temperature sensor cards coupled with 3 additional 80W heater cards to form a total of 4 independent PID loops. Or pressure sensors cards can be added which can be used to control cryogen flow via Auxiliary (Gas Control) cards. \r\nPlease note: The temperature sensor – heater PID loop algorithm also includes a feature to balance a cooling cryogen flow without the need of a pressure card. The MercuryiTC will also support the Cryogen level meter card for monitoring Helium and Nitrogen cryogen levels",
"features" : "\r\nMeasures and controls temperatures to below 250 mK with a precision of 0.1 mK (24 bit A to D resolution)\r\nHeater output up to 80 W per channel\r\nSoftware switchable between true constant voltage source or current source for sensor excitation, preventing self-heating and allowing for high quality measurements at the lowest temperature\r\nSupports all standard cryogenic sensors (ruthenium oxide, cernox, silicon diodes, platinum, thermocouple and RhFe)\r\nBase system includes a single temperature sensor input and 80W heater output for precise temperature PID control\r\nCustomisation is possible through the addition of plug and play expansion cards. The controller features 9 expansion slots (8 multi-function slots and a dedicated GPIB slot) which can be used to extend its capability. Expansion cards include additional temperature sensor inputs and heater outputs, pressure transducer inputs, stepper motor drive allowing gas flow regulation for efficient use of liquid helium in flow cryostats and cryogen level metering of both helium and nitrogen\r\n\r\nSystem control\r\n\r\nThe intuitive touch screen user interface facilitates easy monitoring, control and configuration of your experimental system.\r\n\r\nEasy pc connection to your Mercury instrument via multiple remote ports\r\n\r\nInterfaces: Ethernet, Serial, USB or optional GPIB\r\n\r\nEasy integration within your data acquisition programs for monitoring and remote control of your cryogenic and superconducting magnet system\r\n\r\nThe MercuryiTC has also a number of pre-configured control modes e.g., Heliox control, Lambda Fridge control, Rotator control, etc.\r\n\r\nRear panel connections\r\n",
"features_benefits" : "",
"extended_tabs" : "Thermometry\n\nNumber of inputs: 1 included as standard, up to 8 extra\nA\/D Resolution: 24-bit\nMaximum reading rate: Up to 4 readings per sec.\nIsolation: All sensors independently isolated\nSupported sensor types: All standard types of cryogenic RTD’s plus diodes and thermocouples\n\nHeater\n\nNumber of outputs: 1 incl. as standard, up to 3 extra\nDAC Resolution: 16-bit\nMax heater power: 80 W\nMax current: 2 A\nMax voltage: 40 V\nHeater load range: 20 Ohms to 120 Ohms\nHeater noise (0 - 2 MHz): < 2 mV \n\nConfiguration options\n\nSensor input: Up to 9\nHeater output: Up to 4\nN2 \/ He level meter: Up to 2\nAuxiliary control (stepper motor): Up to 4\nGPIB: 1\n\nControl\n\nNumber of loops: 1 incl. as standard, up to 3 extra\nPID control: Fixed or zonal\nSet point: Programmable\nProportional gain: 0 to 200 K (resolution 0.1)\nIntegral time: 0 to 200 mins (resolution 0.001)\nDerivative rate: 0 to 300 mins (resolution 0.001)\n\n Pressure Reading\n\nNumber of inputs: Up to 4\nA\/D Resolution: 24-bit\nMaximum reading rate: Up to 4 readings per sec.\nAbsolute accuracy: ±0.1% full scale in each range\nVoltage Ranges: 10V, 1.6V, 0.8V, 0.4V, 0.2V, 0-0.1V (Auto-ranging)\nCurrent Ranges: 4-20mA (20mA, 16mA, 8mA, 4mA Auto-ranging) \nSensor Excitation Voltage: 0 V(off) , 10V±5% or 15V±5%\nSensor Excitation Current: 0 - 20 mA\nSupported sensor types: Voltage, Current and Ratiometric\n\n \nCryogen Level Reading\n\nNumber of cards: Up to 2\nEach card supports a Helium Level input and a Nitrogen Level input\nHelium Level specifications\n\nExcitation current settings: 20 mA to 280 mA in 20 mA steps\nExcitation current accuracy: ±5%\nExcitation voltage: 40 V maximum\nProbe resistance: 0 to 300 ohms\nProbe resistance accuracy: ±0.2%\nProbe resistance stability: ±0.1%\nA\/D Resolution: 24-bit\nReading rate: 1 sample every 10s or 1 sample every 30 minutes.\nIsolation: All sensors independently isolated\n\nNitrogen Level input\n\nProbe source voltage: 12 VDC\nProbe source oscillator frequency range: 5 kHz to 90 kHz\nProbe sensing resolution (level): 0.1%\nProbe sensing accuracy (level): 0.5%\n\n,\nControl the temperature of a chamber (e.g. VTI) via PID control of a heater and stepper motor control of cooling gas flow\nControl the pressure of a chamber (e.g. VTI) via stepper motor control of cooling gas flow\nControl of a Heliox insert\nControl a Lambda fridge\nDrive 4 independent PID loops\nDrive a sample rotator\nRead up to 9 temperatures\nRead up to 8 pressures\nRead cryogen levels\nDrive up to 4 heaters (80W each\nDrive up to 2 stepper motors\n",
"options" : "Expansion cards \r\nLabView library downloadable from Mercury Support ",
"accessories" : "MercuryiPS",
"tags" : "",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","quantum-information-processing","quantum-transport-measurement","characterisation-of-low-dimensional-structures","modular-optical-spectroscopy" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Information Processing, Quantum Transport Measurement, Characterisation of Low Dimensional Structures, Modular Optical Spectroscopy",
"product_family" : "control-electronics",
"product_family_frontend" : "Control Electronics",
"sorting_product_family" : "100",
"idx": 141,
"page_id": 433,
"page_link" : "https://nanoscienceold.oxinst.com/resources/products/control-electronics/mercuryitc",
"weight" : 0,
},
{
"name":"MicroFlow Perfusion Cell",
"sorting_name":"microflow perfusion cell",
"image":"/assets/components/phpthumbof/cache/MFP-3D-AFM-micro-flow-perfusion-cell.a2ab7b021f8110b0e5f6191991db586d.jpg",
"content" : "",
"outline" : "The MicroFlow Cell is similar to the standard MFP-3D cantilever holder but includes fluid exchange ports that can be used to exchange the liquid in a small volume around the probe.",
"outline_limited" : "The MicroFlow Cell is similar to the standard MFP-3D cantilever holder but includes fluid exchange ports that can be used to exchange the liquid in a small volume around the...",
"highlights" : "Includes two fluid exchange ports,Ideal for small volume fluid imaging",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-liquid-environmental-control",
"product_family_frontend" : "MFP-3D Accessories: Control Temperature & Liquid Environments",
"sorting_product_family" : "100",
"idx": 142,
"page_id": 310,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-liquid-environmental-control/mfp-3d-microflow-cell",
"weight" : 0,
},
{
"name":"MicroPoint",
"sorting_name":"micropoint",
"image":"/assets/components/phpthumbof/cache/micropoint4.a758275b4e416cbbf7df44c8c863094b.png",
"content" : "21569",
"outline" : "MicroPoint provides a flexible and field-proven tool for photo-stimulation. Supplied with a patented compact, pulsed nitrogen pumped tunable dye laser it is capable of ablation, bleaching and uncaging over a wavelength range of 365 to 656 nm.\r\nWithin the EU MicroPoint is only available for research purposes and not for commercial use.",
"outline_limited" : "MicroPoint provides a flexible and field-proven tool for photo-stimulation. Supplied with a patented compact, pulsed nitrogen pumped tunable dye laser it is capable of ablation,...",
"highlights" : "Simultaneous laser delivery, microscope viewing and image acquisition,Low maintenance with fiber optic delivery that maintains alignment when system is moved,Quick set-up with manual beam positioning or automatic pattern generation,User control of ablation and illumination plane provided by z-axis telescope,Precise control of energy provided by motorized variable attenuator slide",
"overview" : "MicroPoint provides a flexible and field-proven tool for photo-stimulation. Supplied with a patented compact, pulsed nitrogen pumped tunable dye laser it is capable of ablation, bleaching and uncaging over a wavelength range of 365 to 656 nm. Broad wavelength range and energy control allow MicroPoint to be optimized for a wide range of scenarios. More than 20 wavelengths can be utilized with available dye resonator cells, while appropriate dichroic filter sets enable simultaneous imaging and photo-stimulation of the specimen. MicroPoint is supplied with a UV-Vis imaging quality Epi illumination adapter for both current and previous generation microscopes from Leica, Nikon, Olympus and Zeiss. MicroPoint systems consist of a wavelength tuneable pulsed laser, coupling optics, beam steering optics, a microscope adapter, a selection of beam splitters and interference filters, and a motorized or manually driven optical attenuator to adjust spot size and power. There are two MicroPoint versions available: MicroPoint Manual \r\nAngular and spatial alignment of the illumination at the sample target is manually controlled via a 2-axis joystick. This manual version can be upgraded in-situ to provide galvo or bluetooth control. MicroPoint Galvo \r\nGalvanometer based beam steering is provided through PC control, enables precise and repeatable laser ablation and\/or illumination in synchronization with other experiment parameters.",
"features" : "",
"features_benefits" : "Simultaneous laser delivery, microscope viewing and image acquisition - ,Low maintenance with fiber optic delivery that maintains alignment when system is moved - ,Quick set-up with manual beam positioning or automatic pattern generation - ,User control of ablation and illumination plane provided by z-axis telescope - ,Precise control of energy provided by motorized variable attenuator slide - ",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "fluorescence-microscopy" ],
"applications_frontend" : "Fluorescence Microscopy",
"product_family" : "photostimulation",
"product_family_frontend" : "Photostimulation",
"sorting_product_family" : "100",
"idx": 143,
"page_id": 221,
"page_link" : "https://andor.oxinst.com/products/photostimulation/micropoint",
"weight" : 0,
},
{
"name":"Microstat<\/b>He",
"sorting_name":"microstathe",
"image":"/assets/components/phpthumbof/cache/MicrostatHe.974a2a8e436a3d07a2356fbbf59416e5.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`140400`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A 4 K helium-flow, sample-in-vacuum cryostat system designed for optical microscopy.",
"outline_limited" : "A 4 K helium-flow, sample-in-vacuum cryostat system designed for optical microscopy.",
"highlights" : " 3.2 K - 500 K temperature range<\/p>, Quick cool-down time and low helium consumption<\/p>, Short working distance<\/p>",
"overview" : "\r\n3.2 K - 500 K temperature range. May be extended down to 2.2 K when used with a rotary pump (not supplied as standard)\r\nCooling to 4.2 K around 10 minutes\r\nLow liquid helium consumption, <0.45 L\/h when used with a low-loss transfer siphon\r\nCompact and lightweight - just 1.8 kg\r\nShort working distance - less than x mm (need figure)\r\nConfigured for reflectance and transmission measurements\r\nMeasurement-ready, via 10-pin electrical wiring to the sample\r\nSupplied with a MercuryiTC temperature controller\r\n1 year standard warranty\r\n",
"features" : "Low cryogen consumption: Brings significant benefits in terms of running cost\r\nSimple: The experimental windows and sample holders can be easily changed\r\nEasy to use: A range of window materials are available. Please contact your local sales representative for more information\r\nSoftware control: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system\r\nVersatile: The MicrostatHe “cold unit” is interchangeable between the MicrostatHe-R and OptistatCF-V enabling a modular set of optical cryostats for huge experimental flexibility",
"features_benefits" : "",
"extended_tabs" : "Temperature range: 3.2 to 500 K, may be extended down to 2.2 K \nTemperature stability: ± 0.1 K\nSystem may also be run with liquid nitrogen, temperature range: 77 to 500 K\nLiquid helium consumption at 4.2 K: < 0.45 l\/hr\nCool down consumption: 1.3 litres (nominal)\nRoom temperature to base temperature: approx. 10 minutes with pre-cooled transfer siphon\nCryostat weight: 1.8 kg,A typical system comprises of:\n\nCryostat\nTransfer siphon\nGas flow\nTemperature Controller\nAccessories and Manuals\nSoftware\n,Micro-FTIR: Study of molecular bonds in crystal lattices\nMicro-Raman Scattering and inelastic light scattering: Study of molecular energy levels\nMicro-luminescence: Studies of Quantum Dot structures in AS\/GaHS\nMicro-Photoluminescence \/ Micro-Photoluminescence: Study of semiconductors\nMicro-luminescence: Quantum systems, dots\/wires\/wells",
"options" : "",
"accessories" : "",
"tags" : "Micro-FTIR,Micro-Raman Scattering,Micro-luminescence,Micro-Photoluminescence,Micro-luminescence",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cryostats-for-microscopy",
"product_family_frontend" : "Optical Cryostats for Microscopy",
"sorting_product_family" : "100",
"idx": 144,
"page_id": 416,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-microscopy/microstathe",
"weight" : 0,
},
{
"name":"Microstat<\/b>He-R",
"sorting_name":"microstathe-r",
"image":"/assets/components/phpthumbof/cache/MicrostatHe-R.5c47831bedd1ac2d69ffb81e18890b68.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`1033560`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A 4 K helium-flow, sample-in-vacuum cryostat system with a narrow rectangular tail, designed for optical microscopy.",
"outline_limited" : "A 4 K helium-flow, sample-in-vacuum cryostat system with a narrow rectangular tail, designed for optical microscopy.",
"highlights" : " 3.2 K - 500 K temperature range<\/p>, Quick cool-down time and low helium consumption<\/p>, Short working distance<\/p>",
"overview" : "\r\n3.2 K - 500 K temperature range. May be extended down to 2.2 K when used with a rotary pump (not supplied as standard)\r\nCooling to 4.2 K in around 10 minutes\r\nLow liquid helium consumption, <0.45 L\/h when used with a low-loss transfer siphon\r\nCompact and lightweight, just 1.5 kg\r\nShort working distance, less than 3 mm\r\nSuperb optical access, up to 110 degrees in reflectance in two orthogonal directions\r\nMeasurement-ready, via 10-pin electrical wiring to the sample\r\nSupplied with a MercuryiTC temperature controller\r\n1 year standard warranty\r\n",
"features" : "Low cryogen consumption: Brings significant benefits in terms of running cost\r\nSimple: The experimental windows and sample holders can be easily changed\r\nEasy to use: A range of window materials are available. Please contact your local sales representative for more information\r\nSoftware control: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system\r\nVersatile: The MicrostatHe-R “cold unit” is interchangeable between the MicrostatHe and OptistatCF-V, enabling a modular set of optical cryostats for huge experimental flexibility",
"features_benefits" : "",
"extended_tabs" : "Temperature range: 3.2 to 500 K, may be extended down to 2.2 K \nTemperature stability: ± 0.1 K\nSystem may also be run with liquid nitrogen, temperature range: 77 to 500 K\nLiquid helium consumption at 4.2 K: < 0.45 l\/hr\nCool down consumption: 1.3 litres (nominal)\nRoom temperature to base temperature: approx. 10 minutes with pre-cooled transfer siphon\nCryostat weight: 1.5 kg,A typical system comprises of:\n\nCryostat\nTransfer siphon\nGas flow\nTemperature Controller\nAccessories and Manuals\nSoftware\n,Micro-FTIR: Study of molecular bonds in crystal lattices\nMicro-Raman Scattering and inelastic light scattering: Study of molecular energy levels\nMicro-luminescence: Studies of Quantum Dot structures in AS\/GaHS\nMicro-Photoluminescence \/ Micro-Photoluminescence: Study of semiconductors\nMicro-luminescence: Quantum systems, dots\/wires\/wells",
"options" : "",
"accessories" : "",
"tags" : "compact cryostats, optical measurements,electrical measurements,spectroscopy techniques,Electroluminescence,THz spectroscopy,Ultrafast spectroscopy,Electrical transport measurements,Photoluminescence,Fluorescence,FTIR,Raman scattering,UV/VIS reflectivity,UV/VIS absorption,sample in vacuum,Micro-FTIR,Micro-Raman Scattering,Micro-luminescence,Micro-Photoluminescence,Micro-luminescence",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cryostats-for-microscopy",
"product_family_frontend" : "Optical Cryostats for Microscopy",
"sorting_product_family" : "100",
"idx": 145,
"page_id": 421,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-microscopy/microstathe-r",
"weight" : 0,
},
{
"name":"Microstat<\/b>HiRes",
"sorting_name":"microstathires",
"image":"/assets/components/phpthumbof/cache/MicrostatHiRes.5a87c9058e21360b530111bc36dc592c.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`849960`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A 4 K helium-flow, sample-in-vacuum cryostat system designed for high-resolution microscopy.",
"outline_limited" : "A 4 K helium-flow, sample-in-vacuum cryostat system designed for high-resolution microscopy.",
"highlights" : " 3.4 K - 500 K temperature range<\/p>, Quick cool-down time and low helium consumption<\/p>, Lowest vibration of any helium-cooled optical cryostat<\/p>",
"overview" : "\r\n 3.4 K - 500 K temperature range. May be extended down to 2.7 K when used with a rotary pump (not supplied as standard)\r\n Cooling to 4.2 K in around 15 minutes\r\n Low liquid helium consumption, <0.70 L\/h when used with a low-loss transfer siphon\r\n Compact and lightweight, 1.5 kg\r\n Short working distance, just 2.2 mm\r\n Ideal for Quantum Dot applications\r\n Extremely low sample vibration, less than 20 nm in optimal conditions\r\n Configured for reflectance and transmission measurements\r\n Measurement-ready, via 10-pin electrical wiring to the sample\r\n Supplied with a MercuryiTC temperature controller\r\n 1 year standard warranty\r\n",
"features" : "Versatile: The MicrostatHiRes can be fitted with an interchangeable pillar for easy integration into a magnet bore.\r\nLow cryogen consumption: Brings significant benefits in terms of running cost.\r\nSimple: The experimental windows and sample holders can be easily changed.\r\nEasy to use: A range of window materials are available. Please contact your local sales representative for more information.\r\nSoftware control: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system.",
"features_benefits" : "",
"extended_tabs" : "\nTemperature range: 3.4 to 500 K measured at the heat exchanger, may be extended down to 2.7 K\nTemperature stability: ± 0.1 K\nSystem may also be run with liquid nitrogen, temperature range: 77 to 500 K\nLiquid helium consumption at 4.2 K: < 0.7 l\/hr\nCool down consumption: 0.8 litres (nominal)\nRoom Temperature to base temperature: approx. 15 minutes with pre-cooled transfer siphon\nTypical sample position drift at constant temperature of 4.2 K: 0.15 µm per hour\nTypical sample position drift on cooling from 300 to 4.2 K: 13.0 µm per hour\nVibration measured using a scanning electron microscope with all system components securely held: better than 20 nm\nCryostat weight: approx 1.5 kg\n,A typical system comprises of:\n\nCryostat\nTransfer siphon\nGas flow\nTemperature Controller\nAccessories and Manuals\nSoftware\n,Micro-FTIR: Study of molecular bonds in crystal lattices\nMicro-Raman Scattering and inelastic light scattering: Study of molecular energy levels\nMicro-luminescence: Studies of Quantum Dot structures in AS\/GaHS\nMicro-Photoluminescence \/ Micro-Photoluminescence: Study of semiconductors\nMicro-luminescence: Quantum systems, dots\/wires\/wells",
"options" : "",
"accessories" : "",
"tags" : "sample in vacuum,Micro-FTIR,Micro-Raman Scattering,Micro-luminescence,Micro-Photoluminescence,Micro-luminescence,Quantum dot measurements",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cryostats-for-microscopy",
"product_family_frontend" : "Optical Cryostats for Microscopy",
"sorting_product_family" : "100",
"idx": 146,
"page_id": 417,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-microscopy/microstathires",
"weight" : 0,
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{
"name":"Microstat<\/b>N",
"sorting_name":"microstatn",
"image":"/assets/components/phpthumbof/cache/MicrostatN.6198db3a9cfbbfd25dc92d9e3493e698.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`1050840`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A 77 K nitrogen-cooled cryostat system designed for microscopy applications.",
"outline_limited" : "A 77 K nitrogen-cooled cryostat system designed for microscopy applications.",
"highlights" : " 77 K - 500 K temperature range<\/p>, Quick cooldown time and low Nitrogen consumption<\/p>, Very compact design and short working distance<\/p>",
"overview" : "\r\n 77 K - 500 K temperature range\r\n Cooling to 77 K in around 10 minutes\r\n Low cryogen consumption, < 0.5 l\/h\r\n Small and compact - 90 mm diameter, 24 mm thick\r\n Configured for reflectance and transmission measurements\r\n Short working distance - as low as 2 mm\r\n Accommodates samples up to 8 mm thick\r\n Supplied with a nitrogen dewar for easy filling\r\n Measurement-ready, via 4-pin electrical wiring to the sample\r\n Supplied with a MercuryiTC temperature controller\r\n 1 year standard warranty\r\n",
"features" : "Low cryogen consumption: Brings significant benefits in terms of running cost\r\nSimple: The experimental windows and sample holders can be easily changed\r\nVersatile: A range of window materials are available. Please contact your local sales representative for more information\r\nSoftware control: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system",
"features_benefits" : "",
"extended_tabs" : "Temperature range: 77 to 500 K\nTemperature stability: ± 0.5 K\nLiquid nitrogen consumption rate: 0.5 l\/hr (nominal)\nRoom Temperature to base temperature: < 10 min with pre-cooled transfer siphon\nSample change time: approx. 30 min (cryostat must be warmed up to access the sample space)\nSample position stability: designed to give positional stability of the sample holder of approximately 1 µm\nCryostat weight: 0.4 kg,A typical system comprises of:\n\nCryostat\nTransfer siphon\nGas flow\nTemperature Controller\nAccessories and Manuals\nSoftware\n,Micro-FTIR: Study of molecular bonds in crystal lattices\nMicro-Raman Scattering and inelastic light scattering: Study of molecular energy levels\nMicro-luminescence: Studies of Quantum Dot structures in AS\/GaHS\nMicro-Photoluminescence \/ Micro-Photoluminescence: Study of semiconductors\nMicro-luminescence: Quantum systems, dots\/wires\/wells",
"options" : "",
"accessories" : "",
"tags" : "electrical measurements,Micro-FTIR,Micro-Raman Scattering,Micro-luminescence,Micro-Photoluminescence,Micro-luminescence",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cryostats-for-microscopy",
"product_family_frontend" : "Optical Cryostats for Microscopy",
"sorting_product_family" : "100",
"idx": 147,
"page_id": 420,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-microscopy/microstatn",
"weight" : 0,
},
{
"name":"Mosaic",
"sorting_name":"mosaic",
"image":"/assets/components/phpthumbof/cache/mosaic-product.a065c722bb82550345c3ecc5b5623bee.png",
"content" : "21568",
"outline" : "Mosaic is the perfect tool for photostimulation applications such as Optogenetics, optophysiology,",
"outline_limited" : "Mosaic is the perfect tool for photostimulation applications such as Optogenetics, optophysiology,",
"highlights" : "Unlimited flexibility in shape, size, complexity of illumination mask,Simultaneous illumination of multiple regions of interest,Precise illumination of areas of interest that protects the target specimen,Zero delta acquisition time for true digital excitation,Complementary illumination option enables on and off control",
"overview" : "Mosaic is the perfect tool for photostimulation applications such as Optogenetics, optophysiology, photobleaching\/activation and uncaging. This patented combination of digital mirror device used with a microscope delivers high speed targeting of complex light patterns to your sample. For optogenetics you can even combine complimentary activating and inhibitory wavelengths at the same time for tight spatial target protein control.",
"features" : "",
"features_benefits" : "Simultaneous illumination of multiple regions of interest - Performs simultaneous imaging and photo-stimulation,On-board pattern storage for high-speed ROI sequencing - Delivers flexible, multi-ROI-specific control of illumination intensity,Region specific grey-scaling available for light dosing with 4, 6 and 8 bit per pixel modulation depth - Augments wide range of techniques: optogenetics, bleaching\/activation and uncaging,Comprehensive DMD triggering modes - Ideal for high speed physiological studies,Wide range of light sources - LEDs, lasers and arc lamps - Integrate with electro\/optophysiology workstations,Long lifetime and low maintenance - Reduce overheads",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "fluorescence-microscopy" ],
"applications_frontend" : "Fluorescence Microscopy",
"product_family" : "photostimulation",
"product_family_frontend" : "Photostimulation",
"sorting_product_family" : "100",
"idx": 148,
"page_id": 220,
"page_link" : "https://andor.oxinst.com/products/photostimulation/mosaic",
"weight" : 0,
},
{
"name":"Multi-user Management",
"sorting_name":"multi-user management",
"image":"/assets/components/phpthumbof/cache/Multi-User-Management.9ca5333331f94be7e27215b87a816970.png",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` Facilitate user right management with groups\nUsers can be combined in groups based on positions, roles, departments, training levels or other criteria. Each group can be associated with its specific set of rights settings, which determine the available system features and data access rights and permissions. Assigning individual users to a user group will align them with its access rights. Ensure the compliance with your institution’s regulations \nThe possibility to individually control rights and permissions ensures data integrity and thus assists industrial facilities in their efforts to comply with good practice (GxP) guidelines and regulations such as the US Food and Drug Administration’s (FDA) 21 CFR Part 11. This is especially important for customers working in strictly regulated areas, such as pharmaceutical research and development.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`304825`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
"outline" : " ",
"outline_limited" : " ",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "raman",
"businesses_frontend" : "Raman",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "software",
"product_family_frontend" : "Software",
"sorting_product_family" : "100",
"idx": 149,
"page_id": 26533,
"page_link" : "https://raman.oxinst.com/products/software/multi-user-management",
"weight" : 0,
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{
"name":"Nanonis Tramea<\/b>",
"sorting_name":"nanonis tramea",
"image":"/assets/components/phpthumbof/cache/Nanonis-Tramea.80c95f86495fa817ad953e3048fcd9ea.png",
"content" : "12739",
"outline" : "Nanonis Tramea™ is a measurement system ideal for quantum transport measurements. In conjunction with our world-leading cryogenic research tools, it offers fast, multi-channel measurements to our users working in quantum technologies. ",
"outline_limited" : "Nanonis Tramea™ is a measurement system ideal for quantum transport measurements. In conjunction with our world-leading cryogenic research tools, it offers...",
"highlights" : " Powerful, ultrafast measurement solution<\/p>, Customisable and user friendly software interface<\/p>, Automated signal acquisition and data processing<\/p>, Common ground plane<\/p>",
"overview" : "Nanonis Tramea can be integrated accross our entire product range and is compatible with our integrated magnets and patented sample loading pucks. We are the only supplier capable of offering Nanonis Tramea measurement solution at mK temperatures, with dilution refrigerators such as Triton. We also integrate it with products in the 1 K - 300 K temperature range, for example with TeslatronPT or OptistatDry BLV.\r\nNanonis Tramea is a complete measurement platform which is customisable, has high-resolution AD\/DA conversion, signal conditioning and fast signal processing. The system seamlessly interacts with our MercuryiTC temperature control and MercuryiPS magnet power supply electronics, meaning you can control your magnet, cryostat temperature and your experimental routines all in one place. \r\nThe ultra-low temperatures and high magnetic fields provided by our Triton dilution refrigerator make it a key research tool in revealing the quantum properties of many materials of interest. Our Triton systems already lead the way in experiment-readiness with high-density RF and DC wiring capability, unique sample exchange mechanisms, and unbeatable superconducting magnet integration. SPECS’ Nanonis Tramea is a natural complementary partner to the Triton, with its fast, multi-channel, multi-functional capability, a full replacement for the traditional measurement rack.\r\nNanonis Tramea Quantum Dot Simulator\r\nThe quantum dot simulator lets you explore the complete Nanonis Tramea measurement system as if it were connected to a real quantum dot. Learn the operation of the software without any risk. It simulates a typical single top-gate defined quantum dot, and includes the full feature set of the software. Possible measurements include single gate sweeps, left- vs. right-gate sweeps as well as stability diagrams. Lock-in operation allows differential conductance measurements.\r\nTo download the simulator, click here.",
"features" : "High resolution measurement solution: A total of up to 48 output channels are available, which can all be controlled simultaneously by the software. 80 internal signals can be employed for signal generation, detection and feedback – up to 20,000 data points per second. Nanonis Tramea uses the fastest 20-bit, 1-ppm DA-converters available on the market\r\nSimultaneous multi-functionality: Nanonis Tramea is an advanced measurement solution, which combines the functionality of several different single-purpose instruments into a single, high-performance, compact, fully software-controlled package. Nanonis Tramea offers functionality of the following dedicated instruments: Precision DC sources - Lock-in amplifiers - High-resolution data acquisition instruments - Oscilloscopes - Spectrum analyzers - Arbitrary waveform generators - Software measurement suites\r\nExcellent signal performance: All analogue signals are converted quickly into the digital domain where all signal processing is performed. This means no interference with external noise or crosstalk is possible\r\nSuperior and customisable user interface: Modular, flexible software and hardware architecture, with add-on options including a full-featured LabVIEW-based programming interface or scripting module\r\nAutomated signal acquisition and data processing: Handles even the most complex experiments using workflow-optimised solutions that deliver high user efficiency\r\nBase configuration: Nanonis Tramea comes with a real time controller (TRC) and one signal conversion unit (TSC) providing you with 8 inputs and 8 outputs, which can be upgraded.\r\nSoftware included in the base configuration: Oscilloscope and spectrum analyser up to tens of Hz, FPGA and real-time signal processing, signal conditioning, signal charts and history, long term spectrum, generic sweeper, signal handling, intelligent adaptive oversampling, software for data acquisition and quantum dot simulator. Up to 80 internal signals, 24 simultaneously for display and acquisition. Fully integrated control of the MercuryiPS and MercuryiTC\r\nHardware upgrades: Tramea can be upgraded to have combinations up to 24 inputs and 48 outputs by adding extra Tramea Signal Conversion (TSC) or Tramea Signal Output (TSO) units to the base configuration\r\nSoftware upgrades: PI controller, Function generator, LabVIEW programming interface, Scripting module, High resolution oscilloscope and spectrum analyser, and up to 8 lock-ins",
"features_benefits" : "",
"extended_tabs" : "\nQuantum Hall effect\nQuantum spin Hall effect \nTopological insulators\nMajorana fermions \nGraphene \nCarbon Nanotubes\nQuantum dots \nQuantum point contacts \nSpin-qubits in quantum dots \nQuantum rings \nNanodevices \nCharacterising materials\nI-V characterisation \n",
"options" : "",
"accessories" : "",
"tags" : "Electrical transport measurements,Quantum Hall Effect,Quantum dots ,Quantum computing,quantum transport measurements,Quantum Information Processing,Ultra Low Temperature ,material characterisation,Magneto-transport Measurements",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "nanomaterial-growth-and-characterisation","battery-technology","quantum-information-processing","quantum-transport-measurement","characterisation-of-low-dimensional-structures","modular-optical-spectroscopy" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Information Processing, Quantum Transport Measurement, Characterisation of Low Dimensional Structures, Modular Optical Spectroscopy",
"product_family" : "measurement-systems",
"product_family_frontend" : "Measurement Systems",
"sorting_product_family" : "100",
"idx": 150,
"page_id": 432,
"page_link" : "https://nanoscienceold.oxinst.com/accessories-test/measurement-systems/nanonis-tramea",
"weight" : 0,
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{
"name":"NanoRack Sample Stretching Stage",
"sorting_name":"nanorack sample stretching stage",
"image":"/assets/components/phpthumbof/cache/nanorack-sample-stretching-afm-accessory.cfe2e4fa290c04a504373c32226ca91f.png",
"content" : "",
"outline" : "Extract new information from your samples with the NanoRack™. This unique sample stage applies symmetric tensile or compressive loading to samples about a central area that can be simultaneously observed with the AFM. The stage features a large range to achieve high strains and an integrated load cell to measure high stresses with forces up to 80 N. (Compatible with all MFP-3D AFMs except Origin. Also compatible with Jupiter XR AFM.)",
"outline_limited" : "Extract new information from your samples with the NanoRack™. This unique sample stage applies symmetric tensile or compressive loading to samples about a central area that can...",
"highlights" : "High-strain, high-travel manual stretching stage provides two axis tensile stress control,Returns both stress and strain data,Can be used under tension or compression,Allows control of the sample image region under different loads",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-other-driving-forces-acccessories",
"product_family_frontend" : "MFP-3D Accessories: Other Driving Forces",
"sorting_product_family" : "100",
"idx": 151,
"page_id": 312,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-other-driving-forces-acccessories/mfp-3d-nanorack-sample-stretching-stage",
"weight" : 0,
},
{
"name":"NanoRack Sample Stretching Stage",
"sorting_name":"nanorack sample stretching stage - jupiter xr",
"image":"/assets/components/phpthumbof/cache/nanorack-sample-stretching-afm-accessory.cfe2e4fa290c04a504373c32226ca91f.png",
"content" : "",
"outline" : "Extract new information from your samples with the NanoRack™. This unique sample stage applies symmetric tensile or compressive loading to samples about a central area that can be simultaneously observed with the AFM. The stage features a large range to achieve high strains and an integrated load cell to measure high stresses with forces up to 80 N. (Compatible with Jupiter AFMs as well as all MFP-3D AFM's except for Origin.)",
"outline_limited" : "Extract new information from your samples with the NanoRack™. This unique sample stage applies symmetric tensile or compressive loading to samples about a central area that can...",
"highlights" : " High-strain, high-travel manual stretching stage provides two axis tensile stress control<\/p>, Returns both stress and strain data<\/p>, Can be used under tension or compression<\/p>, Allows control of the sample image region under different loads<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "jupiter-afm-accessories",
"product_family_frontend" : "Jupiter AFM Accessories",
"sorting_product_family" : "100",
"idx": 152,
"page_id": 11557,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/nanorack-sample-stretching-stage",
"weight" : 0,
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{
"name":"Nanoscale Time Dependent Dielectric Breakdown (NanoTDDB)",
"sorting_name":"nanoscale time dependent dielectric breakdown (nanotddb)",
"image":"/assets/components/phpthumbof/cache/NanoTDDB-SiO2-Film.dfc3780649e514d8a187b3958e1281d4.jpg",
"content" : "",
"outline" : "NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to ±220 V can be applied while monitoring current through a conductive AFM probe (Available for all MFP-3D models except Origin. Voltage range on MFP-3D Infinity is ±150 V).",
"outline_limited" : "NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to ±220 V can be applied while monitoring current...",
"highlights" : "The spatial resolution of the AFM tip enables local measurements of dielectric breakdown (~20 nm) on much smaller length scales than possible with conventional probe stations,Precisely select measurement points from high-resolution images, or a grid of points can be mapped and analyzed",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Functional Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "failure-analysis","process-mineralogy-and-chemical-analysis" ],
"applications_frontend" : "Failure Analysis , Process Mineralogy and Chemical Analysis",
"product_family" : "mfp-3d-nanoelectrical-accessories",
"product_family_frontend" : "MFP-3D Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 153,
"page_id": 298,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-nanoelectrical-accessories/mfp-3d-nanoscale-time-dependent-dielectric-breakdown-nanotddb",
"weight" : 0,
},
{
"name":"Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)",
"sorting_name":"nanoscale time dependent dielectric breakdown (nanotddb)",
"image":"/assets/components/phpthumbof/cache/nanoscale-time-dependent-dielectric-breakdown.e4086e1716c73a52a4df9ca36005bbfd.png",
"content" : "",
"outline" : "NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current through a conductive AFM probe.",
"outline_limited" : "NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while...",
"highlights" : "The spatial resolution of the AFM tip enables local measurements of dielectric breakdown (~20 nm) on much smaller length scales than possible with conventional probe stations,Precisely select measurement points from high-resolution images, or a grid of points can be mapped and analyzed",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Functional Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "failure-analysis","process-mineralogy-and-chemical-analysis" ],
"applications_frontend" : "Failure Analysis , Process Mineralogy and Chemical Analysis",
"product_family" : "cypher-nanoelectrical-accessories",
"product_family_frontend" : "Cypher Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 154,
"page_id": 326,
"page_link" : "https://afm.oxinst.com/products/cypher-nanoelectrical-accessories/cypher-nanoscale-time-dependent-dielectric-breakdown-nanotddb",
"weight" : 0,
},
{
"name":"Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)",
"sorting_name":"nanoscale time dependent dielectric breakdown (nanotddb)",
"image":"/assets/components/phpthumbof/cache/nano-ttdb-product-image-FINAL-463x401-compressed.5505b84838e5dc6b67a159bb9df8d08f.png",
"content" : "",
"outline" : "NanoTDDB enables characterization of dielectric breakdown with nanoscale precision on Jupiter AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current through a conductive AFM probe.\r\n\r\n The spatial resolution of the AFM tip enables local measurements of dielectric breakdown (~20 nm) on much smaller length scales than possible with conventional probe stations\r\n Precisely select measurement points from high-resolution images, or a grid of points can be mapped and analyzed\r\n\r\n\r\n\r\n*nanoTDDB is an optional accessory upgrade for Jupiter AFMs",
"outline_limited" : "NanoTDDB enables characterization of dielectric breakdown with nanoscale precision on Jupiter AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current...",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Nanoelectrical Properties,Nanotechnology,2D,2D materials,graphene,thin film,electrical measurements,Semiconductors",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "jupiter-accessories-high-voltage-options",
"product_family_frontend" : "Jupiter Accessories: High Voltage Options",
"sorting_product_family" : "100",
"idx": 155,
"page_id": 23544,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/jupiter-accessories-high-voltage-options/nano-tddb-time-dependent-dielectric-breakdown",
"weight" : 0,
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{
"name":"Newton 920 CCD",
"sorting_name":"newton 920 ccd",
"image":"/assets/components/phpthumbof/cache/newton-940-product.2d0450470c407127bacfb004df32daa4.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "The Newton 920 spectroscopic CCD camera series integrates a 1024 x 256 pixels array with 26 µm pixels for highest dynamic range, high Quantum Efficiency and ultra-low noise floor to provide highest signal to noise and best detection performance for a wide range of photon fluxes.",
"outline_limited" : "The Newton 920 spectroscopic CCD camera series integrates a 1024 x 256 pixels array with 26 µm pixels for highest dynamic range, high Quantum Efficiency and ultra-low noise floor...",
"highlights" : "Peak QE up to 95%,Extended range dual-AR option,TE cooling down to -100ºC,Ultravac™,Multi-Megahertz Readout",
"overview" : "This high-end USB2.0 Newton CCD series brings together Andor’s ultra fast, low noise electronics platform and market-leading deep thermo-electric cooling to -100°C, complemented by Andor’s Ultravac™ technology with its un-matched reliability track record in the scientific and industrial community.\r\nBroadband detection rates of up to 1,600 spectra per second are enabled with intelligent Crop Mode operation. The Newton CCD is an ideal tool for ultrafast UV, VIS or NIR spectroscopy (or all the above with the Dual AR-coating BEX2-DD technology!), covering applications such as fast material characterisation, chemical & catalysis, online process monitoring, non-invasive medical diagnosis and spectroscopy techniques including Raman, Fluorescence\/Photoluminescence, Non-Linear spectroscopies.\r\nThe Newton 940 series offers 13.5 x 13.5 μm pixels for the highest UV to VIS resolution spectroscopy, while the 920 series and its 26 x 26 μm offers the highest dynamic range for UV to NIR applications. Both > 6.6 mm high sensors are ideally suited for multi-track spectroscopy.",
"features" : "",
"features_benefits" : "Peak QE up to 95% - Visible-optimized ‘BV\/BVF’ and broadband UV-NIR ‘BEX2-DD’ model,Fringe suppression technology - Fringing greatly reduced (Deep-Depletion) or minimized (Back-Thinned ‘BVF’),Extended range dual-AR option - Superior UV-NIR broadband QE,TE cooling to -100°C - Critical for elimination of dark current detection limit - no inconvenience associated with LN2,UltraVac™ - Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year-after-year,Multi-Megahertz Readout - High repetition rates achievable with low noise electronics,Crop Mode Operation - Up to 1,600 spectra per second rates,Single UV-grade fused silica window - Best UV-NIR throughput performance, specific AR coating and wedge options available,USB 2.0 Connection - Universal plug-and-play capability, ideal for laptop operation. Seamless operation alongside USB-based Shamrock spectrograph family,26 μm pixels - Larger pixel well depth for higher dynamic range acquisition,Software-selectable pre-amplifier gain - Choice of best SNR performance of dynamic range at the touch of a button,Solis software for Spectroscopy - Comprehensive, user-friendly interface for simultaneous detector & spectrograph control,Software Development Kit (SDK) - Ease of control integration into complex setups: Matlab, Labview, Visual Basic or C\/C++",
"extended_tabs" : "",
"options" : "",
"accessories" : "ACC-6MM-TUBING-2xxxxM - 6 mm tubing option for ACC-XW-CHIL-16 ,ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-SHT-NS25B - Bistable Shutter, Standalone (not needed for Shamrock spectrographs) ,ACC-SD-VDM1000 - Shutter Driver for NS25B Bistable Shutter (not needed for Shamrock spectrographs) ,LM-C - C-mount lens adaptor ,LM-NIKON-F - F-mount lens adaptor ,LMS-NIKON-F-NS25B - Nikon F-mount lens adaptor with shutter ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
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"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "newton-ccd-and-emccd-cameras",
"product_family_frontend" : "Newton CCD and EMCCD Cameras",
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"idx": 156,
"page_id": 240,
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{
"name":"Newton 940 CCD",
"sorting_name":"newton 940 ccd",
"image":"/assets/components/phpthumbof/cache/newton-940-product.2d0450470c407127bacfb004df32daa4.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "The Newton 940 spectroscopic CCD camera series integrates a 2048 x 512 pixels array with high resolution 13.5 µm pixels, high Quantum Efficiency and ultra-low noise floor to provide highest signal to noise and best detection performance for a wide range of photon fluxes.",
"outline_limited" : "The Newton 940 spectroscopic CCD camera series integrates a 2048 x 512 pixels array with high resolution 13.5 µm pixels, high Quantum Efficiency and ultra-low noise floor to...",
"highlights" : "Multi-Megahertz Readout,TE cooling to -100°C,UltraVac™,Down to 13.5 x 13.5 μm pixel size,Crop Mode Operation",
"overview" : "This high-end USB2.0 Newton CCD series brings together Andor’s ultra fast, low noise electronics platform and market-leading deep thermo-electric cooling to -100°C, complemented by Andor’s Ultravac™ technology with its un-matched reliability track record in the scientific and industrial community.\r\nBroadband detection rates of up to 940 spectra per second are enabled with intelligent Crop Mode operation. The Newton 940 CCD is an ideal tool for ultrafast UV and VIS , covering applications such as material characterisation, chemical & catalysis and spectroscopy techniques including Raman, Fluorescence\/Photoluminescence, Non-Linear spectroscopies.\r\nThe Newton 940 series offers 13.5 x 13.5 µm pixels for the highest UV to VIS resolution spectroscopy, while the 920 series and its 26 x 26 µm offers the highest dynamic range for UV to NIR applications. Both > 6.6 mm high sensors are ideally suited for multi-track spectroscopy.",
"features" : "",
"features_benefits" : "Peak QE up to 95% - Visible-optimized ‘BV’ model,Extended range dual-AR option - Superior UV-NIR broadband QE,TE cooling to -100°C - Critical for elimination of dark current detection limit - no inconvenience associated with LN2,UltraVac™ - Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year-after-year,Multi-Megahertz Readout - High repetition rates achievable with low noise electronics,Crop Mode Operation - Up to 940 spectra per second rates,Single UV-grade fused silica window - Best UV-NIR throughput performance, specific AR coating and wedge options available,USB 2.0 Connection - Universal plug-and-play capability, ideal for laptop operation. Seamless operation alongside USB-based Shamrock spectrograph family,Down to 13.5 x 13.5 µm pixels - Optimized pixel format for high resolution spectroscopy,Software-selectable pre-amplifier gain - Choice of best SNR performance of dynamic range at the touch of a button,Solis software for Spectroscopy - Comprehensive, user-friendly interface for simultaneous detector & spectrograph control,Software Development Kit (SDK) - Ease of control integration into complex setups: Matlab, Labview, Visual Basic or C\/C++",
"extended_tabs" : "",
"options" : "",
"accessories" : "ACC-6MM-TUBING-2xxxxM - 6 mm tubing option for ACC-XW-CHIL-16 ,ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-SHT-NS25B - Bistable Shutter, Standalone (not needed for Shamrock spectrographs) ,ACC-SD-VDM1000 - Shutter Driver for NS25B Bistable Shutter (not needed for Shamrock spectrographs) ,LM-NIKON-F - F-mount lens adaptor ,LM-C - C-mount lens adaptor ,LMS-NIKON-F-NS25B - Nikon F-mount lens adaptor with shutter ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-microspectroscopy","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "newton-ccd-and-emccd-cameras",
"product_family_frontend" : "Newton CCD and EMCCD Cameras",
"sorting_product_family" : "100",
"idx": 157,
"page_id": 241,
"page_link" : "https://andor.oxinst.com/products/newton-ccd-and-emccd-cameras/newton-940",
"weight" : 0,
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{
"name":"Newton 970 EMCCD",
"sorting_name":"newton 970 emccd",
"image":"/assets/components/phpthumbof/cache/newton-940-product.2d0450470c407127bacfb004df32daa4.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Newton 970 EMCCD offers unrivalled detection capabilities for spectroscopic applications with challenging photon fluxes, down to single photon. It utilizes a 1600 x 200 array of 16 µm pixels, with thermoelectric cooling down to -100°C resulting for best signal-to-noise ration",
"outline_limited" : "Newton 970 EMCCD offers unrivalled detection capabilities for spectroscopic applications with challenging photon fluxes, down to single photon. It utilizes a 1600 x 200 array of 16...",
"highlights" : "EM sensor,Multi-Megahertz Readout,TE cooling to -100°C,UltraVac™,16 x 16 µm pixel size",
"overview" : "EM technology enables photoelectrons from each pixel to be multiplied on the sensor before readout, providing single photon sensitivity. The Newton EM platform combines a 1600 x 200 (or 1600 x 400) array of 16 µm pixels, thermoelectric cooling down to -100°C for negligible dark current, 3MHz readout and USB 2.0 plug-and-play connectivity to provide unrivalled performance for spectroscopic applications. The dual output amplifiers allow software selection between either a conventional High Sensitivity or Electron Multiplying outputs to suit a broad range of photon regime conditions. This makes the Newton EMCCD the ideal choice for ultrafast chemical mapping applications e.g. SERS, TERS or luminescence mapping.",
"features" : "",
"features_benefits" : "EM sensor technology - ",
"extended_tabs" : "",
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"tags" : "",
"businesses" : "andor",
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"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-microspectroscopy","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "newton-ccd-and-emccd-cameras",
"product_family_frontend" : "Newton CCD and EMCCD Cameras",
"sorting_product_family" : "100",
"idx": 158,
"page_id": 243,
"page_link" : "https://andor.oxinst.com/products/newton-ccd-and-emccd-cameras/newton-970",
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{
"name":"Newton 971 EMCCD",
"sorting_name":"newton 971 emccd",
"image":"/assets/components/phpthumbof/cache/newton-940-product.2d0450470c407127bacfb004df32daa4.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "The most sensitive EMCCD spectroscopic detector ever offers you active pixels of 1600 x 400 along with 16 x 16 µm pixel size along with the -100°C TE cooling. It’s variable readout rates enable data readout at up to 3 Megahertz, through the plug and play USB interface.",
"outline_limited" : "The most sensitive EMCCD spectroscopic detector ever offers you active pixels of 1600 x 400 along with 16 x 16 µm pixel size along with the -100°C TE cooling....",
"highlights" : "EM sensor,Multi-Megahertz Readout,TE cooling to -100°C,UltraVac™,16 x 16 μm pixel size",
"overview" : "EM technology enables charge from each pixel to be multiplied on the sensor before readout, providing single photon sensitivity. The Newton EM platform combines a 1600 x 200 (or 1600 x 400) array of 16 µm pixels, thermoelectric cooling down to -100°C for negligible dark current, 3MHz readout and USB 2.0 plug-and-play connectivity to provide unrivalled performance for spectroscopic applications. The dual output amplifiers allow software selection between either a conventional High Sensitivity or Electron Multiplying outputs to suit a broad range of photon regime conditions. This makes the Newton EMCCD the ideal choice for ultrafast chemical mapping applications e.g. SERS, TERS or luminescence mapping.",
"features" : "",
"features_benefits" : "EM sensor technology - ",
"extended_tabs" : "",
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"accessories" : "ACC-6MM-TUBING-2xxxxM - 6 mm tubing option for ACC-XW-CHIL-16 ,ACC-SD-VDM1000 - Shutter Driver for NS25B Bistable Shutter (not needed for Shamrock spectrographs) ,ACC-SHT-NS25B - Bistable Shutter, Standalone (not needed for Shamrock spectrographs) ,ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,LM-C - C-mount lens adaptor ,LM-NIKON-F - F-mount lens adaptor ,LMS-NIKON-F-NS25B - Nikon F-mount lens adaptor with shutter ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-microspectroscopy","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Microspectroscopy, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "newton-ccd-and-emccd-cameras",
"product_family_frontend" : "Newton CCD and EMCCD Cameras",
"sorting_product_family" : "100",
"idx": 159,
"page_id": 244,
"page_link" : "https://andor.oxinst.com/products/newton-ccd-and-emccd-cameras/newton-971",
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{
"name":"Newton SO CCD",
"sorting_name":"newton so ccd",
"image":"/assets/components/phpthumbof/cache/newton-so-product.2d0450470c407127bacfb004df32daa4.png",
"content" : "",
"outline" : "Andor’s Newton SO series features high-QE sensors for direct detection of soft X-Ray, EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface.",
"outline_limited" : "Andor’s Newton SO series features high-QE sensors for direct detection of soft X-Ray, EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152...",
"highlights" : "Open front end,Multi-Megahertz readout,TE cooling to -100°C,Down to 13.5 x 13.5 μm pixel size,Crop mode operation",
"overview" : "Andor’s Newton series offers outstanding sensitivity performance through a combination of > 95% QE back-illuminated sensors, low noise readout electronics and industry-leading, maintenance-free deep TE-cooling down to -100°C. It features a 1024 x 255 (26 µm pixel) and a 2048 x 512 (13.5 µm pixel) matrix options optimised for high dynamic range & high speed and high spatial resolution Spectroscopy in the VUV and soft x-ray range.A convenient 16-point, knife-edge sealed 6” rotatable CF-152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface. The Newton SO platform also offers a USB2 interface and Labview or EPICS compatibility for seamless integration into complex setups.",
"features" : "",
"features_benefits" : "Open front end - DN100CF \/ 6” CF \/ CF-152 flange and knife-edge sealing provided as standard for direct interfacing to vacuum chambers (rotatable design for iKon-M models).,1024 x 255 and 2048 x 512 sensor options - Choice of high acquisition speed and dynamic range or high resolution.,26 x 26 and 13.5 x 13.5 µm pixel size options - Ideal balance of dynamic range and resolution.,Peak QE up to 95% - High photon collection efficiency for maximising signal-to noise ratios. ‘Enhanced’ process back-illuminated sensor options for increased QE in the soft x-ray range.,Thermo-electric cooling down to -100°C - Efficiently minimizes dark current noise for acquisitions requiring longer sensor exposure time, obtain better signal-to-noise ratios faster.,Low noise readout down to 2.5 e- - Intelligent low-noise electronics offer the most ‘silent’ system noise.,Up to 5 MHz pixel readout speed (3 MHz for 940 model) - Slow readout for low noise and best SNR performance, faster speed for studying dynamic processes.,Cropped sensor mode - Specialized acquisition mode for continuous imaging with fast temporal resolution, spectral rates up to 1,600 sps.,USB 2.0 interface - Built-in robust plug and play interface as standard.,Enhanced baseline clamp - Slower readout for lowest noise, faster speeds for more rapid readout and focusing,Software Development Kit (SDK) - Ease of control integration into complex setups: Matlab, Labview, Visual Basic, C\/C++ or Linux.,Integrated in EPICS - Seamless integration and operation at EPICS-based particle accelerators.,Filter and filter holders options - Accommodate beryllium (or aluminium) windows with thickness down to 200 µm for removal of unwanted lower energy radiations,Open-front to standalone converter options - Provides maximum flexibility – camera can attach directly to a vacuum chamber, or be used as standalone with a beryllium filter",
"extended_tabs" : "",
"options" : "",
"accessories" : "ACC-6MM-TUBING-2X2.5 \/ ACC-6MM-TUBING-2X2.5 - 2.5 and 5 m black hose options to chiller\/recirculator,ACC-FLG-SO-GSKT-CU - Copper gasket for DN100CF \/ 6” CF open-front camera knife-edge vacuum seal ,ACC-OPT-02839 - Beryllium filter, Ø45.5 mm, 250 µm thick ,ACC-USBX-EU \/ ACC-USBX-UK \/ ACC-USBX-US - USB Extender: Icron USB 2.0 Ranger 2201 (100 m) - EU\/UK\/US ,FLG-SO-SY-CONVERT-45 - SO-SY adapter for Newton CCD, Ø45.5 mm filter ,XC-CHILLER-AL - Ultra Compact Chiller Unit, Thermo-Electric based cooling technology,XC-COOL-HOSE_BARB-06 - Chiller and recirculator hose kit, 100 cm clear hose with fitted valved male\/female connectors (chiller or recirculator side), spare male\/female un-valved connectors (for hose extension ACC-6MM-**** black hose options),XC-COOLANT_702-070L - 700 mL Propylene Glycol with corrosion and biological inhibitors,XC-RECR-AL - Coolant re-circulator for deeper-cooling performance",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "material-composition-and-structure" ],
"applications_frontend" : "Material Composition and Structure",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 160,
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{
"name":"Newton SY CCD",
"sorting_name":"newton sy ccd",
"image":"/assets/components/phpthumbof/cache/newton-sy.411e8a7a70c6e2e1308c550ec058391f.png",
"content" : "https:\/\/andor.oxinst.com\/products\/cameras-for-x-ray-euv-electron-and-neutron-detection",
"outline" : "Andor’s Newton SY series features a high-QE sensors for direct detection of soft X-Ray photons. A convenient beryllium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies. Variable readout rates enable data readout at up to 3 Megahertz, through the plug and play USB interface.",
"outline_limited" : "Andor’s Newton SY series features a high-QE sensors for direct detection of soft X-Ray photons. A convenient beryllium foil window blocks visible wavelengths with minimal...",
"highlights" : "5 Year Vacuum Warranty,‘Standalone’ Be Window,Multi-Megahertz readout,Crop mode operation,USB 2.0 connection",
"overview" : "Andor’s Newton SY series features a high-QE sensors for direct detection of soft X-ray photons. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies. Direct detection energy range from < 2.5 keV to > 20keV, sensor dependent. Variable readout rates enable data readout at up to 3 Megahertz, through the plug and play USB interface. The camera utilizes a 1024 x 255 (1024 x 256 for BR-DD model) or 2048 x 512 array of 26 x 26 μm or 13.5 x 13.5 μm pixels, with thermoelectric cooling down to -100°C, resulting in negligible dark current and provides unrivalled performance for spectroscopic applications. The camera comes with Andor’s UltraVac™ technology providing a worry free 5 year vacuum warranty as standard.",
"features" : "",
"features_benefits" : "UltraVac™ - 5 Year Warranty. Proprietary and proven vacuum process, critical for sustained vacuum integrity, sensor protection and unequalled cooling, year after year.,‘Standalone’ Be Window - 200 µm Berylium window as standard,Multi-Megahertz readout - High repetition rates achievable with low noise electronics,Down to 13.5 x 13.5 μm pixel size - Optimal balance of dynamic range and resolution,Crop mode operation - Specialized acquisition mode for continuous imaging with fast temporal resolution,USB 2.0 connection - USB plug and play – no controller box,Enhanced baseline clamp - Quantitative accuracy of dynamic measurements,Integrated in EPICS - Platform is fully integrated into the EPICS control software",
"extended_tabs" : "",
"options" : "",
"accessories" : "XW-RECR - Re-circulator for enhanced cooling performance ,ACC-XW-CHIL-160 - Oasis 160 Ultra compact chiller unit ,XU-RECR\/TRANS - USB 2.0 - Transmitter and Receiver, including 2 power supplies ",
"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "material-composition-and-structure" ],
"applications_frontend" : "Material Composition and Structure",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 161,
"page_id": 213,
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{
"name":"OCAM2<\/sup>",
"sorting_name":"ocam2",
"image":"/assets/components/phpthumbof/cache/ocam2-emccd.d2fc6ce72e2ad471f84c0cec6d13775a.png",
"content" : "",
"outline" : "Designed for Pioneers, Not for Everyone.\r\nOCAM2K and OCAM2S are high speed low noise EMCCD cameras able to run at 2067 fps (3700 fps in binning) with subelectron readout noise, operating from 400 nm to 900 nm with a 95% peak QE typical. OCAM2K and OCAM2S also offer low latency: 43μs between exposure and first pixel availability.",
"outline_limited" : "Designed for Pioneers, Not for Everyone.\r...",
"highlights" : " 240 x 240 Cooled EMCCD sensor<\/p>, Up to 2067 FPS full frame<\/p>, Subelectron readout noise<\/p>, Ultra-low latency<\/p>, CameraLink® interface<\/p>",
"overview" : "OCAM2 by First Light Imaging\r\nOCAM2K and OCAM2S are high speed low noise EMCCD cameras able to run at 2067 fps (3700 fps in binning) with subelectron readout noise.\r\nTo achieve this performance, OCAM2K integrates the Teledyne E2V CCD220 sensor, a Peltier-cooled 240 x 240 pixel frame-transfer 8- output back-illuminated sensor. Whereas, OCAM2S features an integrated electronic shutter and uses the Teledyne E2V CCD 219 Peltier-cooled 240 x 240 pixel 8 output split frame transfer CCD.\r\nThe Embedded Electronic Shutter in OCAM2S is able to deliver an arbitrary number of integration pulses that can be shorter than 1 μs with a precision better than 50 ns.\r\nTo minimize smearing, the CCD220 and CCD219 high speed metal buttressed clock lines are driven by OCAM2K and OCAM2S at a speed as high as 7 Mlines\/s transferring each frame in the store section in only 12 microseconds. OCAM2K and OCAM2S also offers an extremely low latency: 43 μs between exposure and first pixel availability.\r\nDeveloped by astronomers for astronomers for visible imaging, with up to 95% quantum efficiency over a wide spectrum (from 400 to 900 nm), the EMCCD cameras OCAM2K and OCAM2S are the fastest visible cameras with subelectron read out noise. For wavefront sensing applications, OCAM2K and OCAM2S can be equipped with a 20 x 20 subapertures microlens array (customizable on request).",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "\n \n \n Sensor Specifications\n OCAM2S\n OCAM2K\n \n \n Maximum Speed Full Frame\n 2067 fps\n \n \n Mean readout noise at 2000 FPS and multiplication gain ~600\n 0.4 e\n \n \n Dark signal at 2000 FPS at -45°C\n <0.01 e- pixel-1 frame-1\n \n \n Quantization\n 14 bit\n \n \n Peak Quantum Efficiency at 650 nm\n >90%\n \n \n Linearity at gain x1000 from 10 e- to 150 e-\n <3.5%\n \n \n Linearity at gain x1 from 15,000 e- to 150,000 e-\n <3.5%\n \n \n Image Full Well capacity at gain x1\n 80 000 e-\n 270 000 e-\n \n \n Parallel CTE at gain x1, 750 FPS\n N\/A\n min 99.99%\n \n \n Parallel CTE at gain x1, 750 FPS\n N\/A\n min 99.99%\n \n \n Ultra low latency Camera Link® Full interface\n 43 μs\n \n \n Maximum speed in 2 x 2 binning mode\n 3700 fps\n \n \n Shutter Resolution\n <0.05 μs\n N\/A\n \n \n",
"options" : "",
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"tags" : "",
"businesses" : "andor",
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"applications" : [ "adaptive-optics","atmospheric-and-deep-space-imaging","solar-astronomy" ],
"applications_frontend" : "Adaptive Optics, Atmospheric & Deep Space Imaging, Solar Astronomy",
"product_family" : "ocam-emccd-camera-series",
"product_family_frontend" : "OCAM EMCCD Camera Series",
"sorting_product_family" : "100",
"idx": 162,
"page_id": 25697,
"page_link" : "https://andor.oxinst.com/products/ocam-emccd-camera-series/ocam",
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{
"name":"OmniProbe 350",
"sorting_name":"omniprobe 350",
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"content" : "!generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=` Based on our 9th generation probe design OmniProbe 350 delivers precise nanoscale control from a compact, port mounted footprint which minimises interference with other detectors and accessories. With a stable probe platform and sub-nanometre piezoelectric motors, our current generation of probes has low vibration, low drift, and superb positioning accuracy, which is combined with our intuitive user interface, where movement direction is calibrated to the image.\nThe result is class leading performance for routine lift-out and when combined with a variable tilt grid holder OmniProbe 350 can create plan-view and TKD samples without direct handling of the grid or complex multistage lift-out. Download Centre !If? &subject=`` &operator=`notempty` &then=`` &else=`` OmniProbe 350\nDiscover why OmniProbe 350 is the best-in-class 3-axis nanomanipulator for fast and efficient routine TEM Lamella preparation !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`15561`\n`\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Features\",\"content\": !jsonEncode? &input=` Superior linearity - Linearity is a measure of the deviation of the probe tip from the requested movement direction. A probe that moves in a straight line in all directions can:\nLift-out safely, without hitting the side of the trench\nProduce TEM lamella faster using smaller milled trenches\nIntuitive user interface where controls directly reflect the movement of the probe in the electron image\nSmooth continuous motion - Lamella preparation workflows require the probe to make physical contact and smooth motion ensures this can be done without risk of dropping or damaging the sample.\nPrecise movement with stored positions\nMove from fully retracted to operating position with a single click\nSave user defined working positions\nStable probe platform - Stability is a combination of vibration and drift. Attaching samples to the probe tip is done by a gas deposition process that can take several minutes. Any drift or vibration of the tip during this process can result in stresses within the sample or sudden movement of the sample at the point it is cut free\nThe stable Omniprobe platform minimises vibration and drift when idle, reducing these risks\nPort mounted design retracts fully within the chamber when not in use so there is no compromise to your microscope\nNo restriction on sample size\nNo restriction on stage tilt\nNo interference with other detectors or accessories\nProbe electrical connection includes +\/-10V power supply for voltage contrast imaging\nLow noise option can be combined with 3rd party electronics to perform EBIC, EBAC, and other electrical testing methods. \n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"OmniProbe Family\",\"content\": !jsonEncode? &input=` Use our handy comparison table below to help you choose the best OmniProbe for your application and to compare specifications.\nSPECIFICATION\n OMNIPROBE\nOmniProbe 350 Cryo lift-out\nOmniProbe 350\nOmniProbe 400\nLinearity\n500 nm\n500 nm\n250 nm\nEncoder resolution\n<50nm\n<50 nm\n10 nm\nInsertion repeatability\n15 μm*\n5 μm\n2 μm\nMin velocity\n50 nm\/s\n50 nm\/s\n10 nm\/s\nMax Velocity\n250 μm\/s\n250 μm\/s\n500 μm\/s\nCompucentric rotation\n✘\n✘\n✔\nIntegrated temperature sensor\n✔\n✘\n✘\nApplication\nSite specific lift-out\n✔\n✔\n✔\nPlan-view\nP\nP\n✔\nVent free plan-view\n✘\n✘\n✔\nBackside Thinning\n✘\n✘\nP\nAtom Probe tomography sample preparation\nP\nP\n✔\nCryogenic liftout\n✔\n✘\n✘\nVoltage contrast imaging\n✘\n✔\n✔\nCharge neutralisation\n✔\n✔\n✔\nOn-Tip analysis\n✘\n✘\n✔\nEBIC measurements\n✘\nO\nO\nEBAC measurements\n✘\nO\nO\nIn Situ tip change\n✘\nO\n✔\nP: Requires an OmniPivot holder O: Available as Option * at constant temperature\n`}}`",
"outline" : "OmniProbe 350 is a 3-axis, port mounted manipulator featuring piezoelectric motors with closed loop feedback, ideally suited for routine TEM lamella preparation. Precise and intuitive control means you can work quickly and confidently without the risk of damage or sample loss.",
"outline_limited" : "OmniProbe 350 is a 3-axis, port mounted manipulator featuring piezoelectric motors with closed loop feedback, ideally suited for routine TEM lamella preparation. Precise and...",
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"applications_frontend" : "Additive Manufacturing, Automotive Sensors, Battery Technology, Solar Cell Electrical and Structural Characterisation, Material Composition and Structure, Failure Analysis , Fabrication and Characterisation of Light Emitting Devices, Rock Core Analysis, Electron Microscopy",
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"name":"OmniProbe 350 Cryo lift-out",
"sorting_name":"omniprobe 350 cryo lift-out",
"image":"/assets/components/phpthumbof/cache/OP350%20CRYO%20S-SHAFT%20S-CRYO%20LIGHTWEIGHT%20C_ProductPage.0ad13bd5a0bddc790f9e16ea459fe3b8.png",
"content" : "!generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=` Oxford Instruments OmniProbe cryo lift-out option extends lift-out capability to cryogenic samples, including those prepared by high-pressure freezing.\nCryo-FIB lift-out can be performed on samples that are cooled as low as -180ºC by third party cryo systems. This enables nanoanalysis over a wide range of new sample types, and across many industries, by cryo-TEM or cryo-atom probe instruments.\nThe cryo lift-out option consists of a custom probe shaft assembly with thermally isolated probe tip that is passively cooled via direct connection to the cryo system’s cold finger. A non-exclusive license is included to practice Oxford Instruments’ proprietary ice attachment method.The cryo lift-out option is available for the OmniProbe 350 system and is field retrofittable.\nMost batteries use organic electrolytes currently, and the interfaces between electrodes and electrolyte are critical to many aspects of battery performance. Many processes that occur at these interfaces are not well understood, due to a lack of ability to directly study them at high resolution. By pairing cryo lift-out with cryo-TEM\/STEM, for the first time very high resolution imaging can be achieved at these liquid-solid interfaces. Although liquid cell holders can be employed for TEM imaging, they are limited by the sample size and the type of liquid that can be used. More viscous liquids such as organic electrolytes cause the thin windows of the liquid cells to bulge out, leading to reduced resolution through scattering effects and beam broadening.With cryo lift-out, one achieves very high resolution images of batteries by freezing them, extracting a cross-section from the liquid-solid interface by cryo-FIB lift-out, and FIB thinning to <100nm thickness for high resolution study of the interface.\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Features\",\"content\": !jsonEncode? &input=`\nExpand research opportunities\nAchieve high quality data on samples formerly difficult or impossible to analyze at high resolution\nMaterials that normally react with Ga+ or are heat-sensitive\nAqueous samples and those with liquid-solid interfaces\nBatteries, bio-implants, hydrogels\nAny sample too large for plunge-freezing\nObtain superior images and results\nImprove data quality by reducing artifacts induced by Ga+ FIB\nAvoid chemical reactions (ex: III-V materials)\nAvoid temperature effects (ex: polymers)\nImprove tomographic data reconstruction and accuracy\nAchieve better ultrastructure preservation by avoiding cryoultramicrotome-induced sample compression\nAchieve high quality results from TEM and atom probe analysis of large cells and tissues\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"OmniProbe Family\",\"content\": !jsonEncode? &input=` Our comparison table below will help you choose the best OmniProbe for your application and to compare specifications. SPECIFICATION\n OMNIPROBE\nOmniProbe 350 Cryo lift-out\nOmniProbe 350\nOmniProbe 400\nLinearity\n500 nm\n500 nm\n250 nm\nEncoder resolution\n<50 nm\n<50 nm\n10 nm\nInsertion repeatability\n15 μm*\n5 μm\n2 μm\nMin velocity\n50 nm\/s\n50 nm\/s\n10 nm\/s\nMax Velocity\n250 μm\/s\n250 μm\/s\n500 μm\/s\nCompucentric rotation\n✘\n✘\n✔\nIntegrated temperature sensor\n✔\n✘\n✘\nAPPLICATION\nSite specific lift-out\n✔\n✔\n✔\nPlan-view\nP\nP\n✔\nVent free plan-view\n✘\n✘\n✔\nBackside Thinning\n✘\n✘\nP\nAtom Probe tomography sample preparation\nP\nP\n✔\nCryogenic liftout\n✔\n✘\n✘\nVoltage contrast imaging\n✘\n✔\n✔\nCharge neutralisation\n✔\n✔\n✔\nOn-Tip analysis\n✘\n✘\n✔\nEBIC measurements\n✘\nO\nO\nEBAC measurements\n✘\nO\nO\nIn Situ tip change\n✘\nO\n✔\nP: Requires an OmniPivot holder O: Available as Option * at constant temperature\n`}}` Scientific Poster !If? &subject=`` &operator=`notempty` &then=`` &else=`` A Universal Method of In Situ FIB Lift-Out for Cryogenic Samples\n In situ FIB lift-out is a common method for preparing site specific transmission samples at room temperature, but is not suitable for cryogenic samples. Here we present a variation of the FIB lift-out method for the preparation of cryogenic samples, which overcomes the limits of the current methods. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`6023`\n`",
"outline" : "Oxford Instruments OmniProbe cryo lift-out option extends lift-out capability to cryogenic samples, including those prepared by high-pressure freezing.\r\nCryo-FIB lift-out can be performed on samples that are cooled as low as -180ºC by third party cryo systems. This enables nanoanalysis over a wide range of new sample types, and across many industries, by cryo-TEM or cryo-atom probe instruments.",
"outline_limited" : "Oxford Instruments OmniProbe cryo lift-out option extends lift-out capability to cryogenic samples, including those prepared by high-pressure freezing.\r...",
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{
"name":"OmniProbe 400",
"sorting_name":"omniprobe 400",
"image":"/assets/components/phpthumbof/cache/OmniProbe%20400-2.8b73926179ee32b6fc62239a006ff99a.png",
"content" : "!generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=` A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance, the OmniProbe 400 is the ultimate nanomanipulator for high resolution and high throughput applications.\n43 performance\nNanoscale manipulation and testing in the SEM and varied lift-out TEM sample preparations in the FIB can be performed easily while using optimized working distances\n4 degrees of freedom (X, Y, Z, R)\n4 mm or more working distance\n4 motion strengths: encoder resolution, motor resolution, repeatability, linearity\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Features\",\"content\": !jsonEncode? &input=` Accuracy\nNanometre-resolution piezo actuators and 10nm closed-loop encoders provide industry-leading precision, linearity and smooth motion\nSpeed\nAutomation on multiple levels enables results in the fewest steps possible\nInsertion repeatability eliminates tip realignment\nChange tips in 3 minutes without venting\nConcentric rotation enables rapid tip sharpening, tip cleaning, and sample repositioning\nSafely and precisely navigate to stored positions close to the sample and back to park\nAccurate closed-loop feedback control\nThe OmniProbe 400 uses a closed-loop control to deliver smooth motion, dependable accuracy, and a high degree of integration. In addition to very high motion resolution, the OmniProbe 400 integrates motorized concentric rotation and fast in situ tip changes as standard:\nNon-pneumatic insertion and retraction is gentle to fragile samples\nMove with high accuracy, linearity and repeatability\nMove diagonally in ANY direction (omnidirectionality)\nNavigate orthogonally at any sample tilt\nRapidly orient samples to specific angles\nPerform smooth and precise manipulation over long distances\nAlways know where the probe tip is, even when outside the field of view\nMove predictably for all port installations\nUse fixed and user-programmable positions to reduce operator fatigue and increase success rates\nAvoid collisions\nRotate concentrically\nChange tips in situ\nIn-situ tip change\nProbe needles can be replaced in under 3 minutes without venting the microscope\nAtmospheric contamination is avoided and the high vacuum preserved for the best performance\nSamples attached to tips can be safely stored for later use, allowing multiple users to maintain their throughput\nConcentric rotation\nThe tip stays in the field of view for rapid tip shaping and sample reorienting without risk of sample loss or accidental venting.\nPosition with sub-degree accuracy\nExtend the needle life\nCreate fine tips exhibiting ohmic behaviour\nPrepare micro tips for nanoparticle manipulations that use Van der Waals forces\nReorient samples for plan-view, side-view and backside preparations\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"OmniProbe Family\",\"content\": !jsonEncode? &input=` Discover our comparison table below to help you choose the best OmniProbe for your application and to compare specifications.\nSPECIFICATION\n OMNIPROBE\nOmniProbe 350 Cryo lift-out\nOmniProbe 350\nOmniProbe 400\nLinearity\n500 nm\n500 nm\n250 nm\nEncoder resolution\n<50 nm\n<50 nm\n10 nm\nInsertion repeatability\n15 μm*\n5 μm\n2 μm\nMin velocity\n50 nm\/s\n50 nm\/s\n10 nm\/s\nMax Velocity\n250 μm\/s\n250 μm\/s\n500 μm\/s\nCompucentric rotation\n✘\n✘\n✔\nIntegrated temperature sensor\n✔\n✘\n✘\nAPPLICATION\nSite specific lift-out\n✔\n✔\n✔\nPlan-view\nP\nP\n✔\nVent free plan-view\n✘\n✘\n✔\nBackside Thinning\n✘\n✘\nP\nAtom Probe tomography sample preparation\nP\nP\n✔\nCryogenic liftout\n✔\n✘\n✘\nVoltage contrast imaging\n✘\n✔\n✔\nCharge neutralisation\n✔\n✔\n✔\nOn-Tip analysis\n✘\n✘\n✔\nEBIC measurements\n✘\nO\nO\nEBAC measurements\n✘\nO\nO\nIn Situ tip change\n✘\nO\n✔\nP: Requires an OmniPivot holder O: Available as Option * at constant temperature\n`}}` Download Centre !If? &subject=`` &operator=`notempty` &then=`` &else=`` OmniProbe 400\nDiscover why OmniProbe 400 is the ultimate nanomanipulation solution for high throughput lift-out, offering 4-axis control to simplify advanced workflows !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`6916`\n` Application Notes !If? &subject=`` &operator=`notempty` &then=`` &else=`` Multi-Scale Analysis of Dislocations and Grain Boundaries for Improving mc-Si Solar Cell Performance\nSolar cells are being increasingly used globally and it is important that improvements are made on the production of Mc-Si cells to enhance efficiency. Analysis of these solar cells using EBIC, TEM and APT. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload",
"outline" : "A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and performance, the OmniProbe 400 is the ultimate nanomanipulator for high resolution and high throughput applications.",
"outline_limited" : "A ninth generation of nanomanipulator, the OmniProbe 400 exploits innovative piezo actuation for best in class nanoscale positioning. Optimised for maximum flexibility and...",
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"applications_frontend" : "Additive Manufacturing, EV Technologies, Automotive Sensors, Battery Technology, Solar and PV Technology, Material Composition and Structure, Mechanical and Electrical Properties, Failure Analysis , Characterisation of Low Dimensional Structures, Rock Core Analysis, Structural Materials and Components, Process Mineralogy and Chemical Analysis",
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{
"name":"OpenView Series Glass X-ray Tube",
"sorting_name":"openview series glass x-ray tube",
"image":"/assets/components/phpthumbof/cache/x-ray-tube-products-openview-tube.1fd3756f18e00785acf59e8d89bde2e0.png",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nHow to Request Product Quotes\n1. In the table below, please click the “Add to quote list” button for all products that you would like quoted.\n2. Scroll to the bottom of the table and click the green “My Quote List” button to visit the submission form page.",
"outline" : "This X-ray tube delivers a 40-degree wide cone angle, providing a large field of view even at high magnifications. Designed for high-resolution imaging, it is ideal for cabinet X-ray systems and other applications that demand precision and clarity.\r\nAn optional industry-leading artifact-free beryllium window is available for enhanced image quality, particularly in low-contrast imaging where background and subject densities are closely matched. This makes the tube an excellent choice for advanced imaging tasks, including soft tissue biopsy applications. Long tube life is achieved by ultra-high vacuum maintained with the Oxford Instruments' unique getter technology.",
"outline_limited" : "This X-ray tube delivers a 40-degree wide cone angle, providing a large field of view even at high magnifications. Designed for high-resolution imaging, it is ideal for cabinet...",
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"features_benefits" : "Wide operating range - enables optimal image contrast,Artifact-free Be Window - Enhances image quality and removes radio-opaque artifacts from diagnostic images,Wide field of view - Single-frame acquisition of large specimen images",
"extended_tabs" : "\n Specimen radiography\n CT imaging for life sciences\n Phase-contrast imaging\n Pre-clinical imaging\n Small animal imaging\n",
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"tags" : "Glass X-ray Tube",
"businesses" : "x-ray-technology",
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"applications_frontend" : "Analysis of Environmental Contaminants, Cancer Diagnosis, Material Composition and Structure, Materials for the Power Generation Industry, Process Mineralogy and Chemical Analysis, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "glass-envelope-x-ray-tubes",
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{
"name":"Optistat<\/b>CF-V",
"sorting_name":"optistatcf-v",
"image":"/assets/components/phpthumbof/cache/OptistatCFV.1b31d7d2b1dfe1c7881433bc1efaa347.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`1037880`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A 4 K helium-flow, sample-in-vacuum cryostat system. ",
"outline_limited" : "A 4 K helium-flow, sample-in-vacuum cryostat system. ",
"highlights" : " 3.2 K - 500 K temperature range<\/p>, Quick cool-down time and low helium consumption<\/p>, Superb optical access<\/p>",
"overview" : "The Optistat range of cryostats are designed to meet the needs of the most demanding spectroscopy applications. Excellent optical and electrical access, wide temperature ranges, compact design and best-in-class cryogenic performance are matched to an extensive range of different options to ensure there is a cryostat perfectly matched to your experimental requirements. They offer different sample environments to best suit the requirements of your sample, and different cooling technologies to meet the needs of your laboratory.\r\n\r\n 3.2 K - 500 K temperature range. May be extended down to 2.2 K when used with a rotary pump (not supplied as standard)\r\n Cooling to 4.2 K in about 10 minutes\r\n Low liquid helium consumption, <0.45 L\/h when used with a low-loss transfer siphon\r\n Large sample space for studying samples with a wide range of size and geometry\r\n Configured for reflectance and transmission measurements\r\n Minimal number of windows in the optical path, reducing reflective losses\r\n Superb optical access (f\/0.9) for measurements requiring light collection\r\n Large illumination area: 23 mm diameter window aperture\r\n Demountable radiation shield windows to maximise transmission intensity\r\n Compact size allowing easy integration into commercial spectrometers\r\n Measurement-ready, via 10-pin electrical wiring to the sample\r\n Supplied with a MercuryiTC temperature controller\r\n 1 year standard warranty\r\n",
"features" : "Low cryogen consumption: Brings significant benefits in terms of running cost\r\nQuick experiments: A range of sample holders and probes, including liquid cuvettes sample holders and height adjust\/rotate probes, are available\r\nSimple: The experimental windows and sample holders can be easily changed\r\nVersatile: A range of window materials are available. Please contact your local sales representative for more information\r\nSuperior performance: A dynamic exchange gas model, suitable for low conductivity or high heat load samples, is available. Please contact your local sales representative for more information\r\nSoftware control: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system\r\nVersatile: The OptistatCF-V “cold unit” is interchangeable between the MicrostatHe and MicrostatHe-R, enabling a modular set of optical cryostats for huge experimental flexibility\r\n ",
"features_benefits" : "",
"extended_tabs" : "Temperature range: 3.2 to 500 K, may be extended down to 2.2 K\nTemperature stability: ± 0.1 K\nSystem may also be run with liquid nitrogen, temperature range: 77 to 500 K\nLiquid helium consumption rate at 4.2 K: < 0.45 l\/hr\nCool down consumption: 1.3 litre (nominal)\nRoom Temperature to base temperature: approx. 10 min with pre-cooled transfer siphon\nSample change time: approx. 60 min (sample can be changed with the cryostat cold)\nWeight: 2 kg,A typical system consists of:\n\nCryostat\nTemperature Controller\nAccessories and Manuals\nSoftware\n,UV \/ Visible spectroscopy: Experiments at low temperatures reveal the interaction between the electronic energy levels and vibrational modes in solids.Infra-red spectroscopy: Low temperature IR spectroscopy is used to measure changes in interatomic vibrational modes as well as other phenomena such as the energy gap in a superconductor below its transition temperature.Raman spectroscopy: Lower temperatures result in narrower lines associated with the observed Raman excitations.Photoluminescence: At low temperatures, spectral features are sharper and more intense, thereby increasing the amount of information available.",
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"tags" : "compact cryostats, optical measurements,electrical measurements,spectroscopy techniques,Electrical transport measurements,Photoluminescence,FTIR,Raman scattering,UV/VIS reflectivity,UV/VIS absorption,sample in vacuum",
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"product_family" : "cryostats-for-spectroscopy",
"product_family_frontend" : "Optical Cryostats for Spectroscopy",
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"name":"Optistat<\/b>CF-X",
"sorting_name":"optistatcf-x",
"image":"/assets/components/phpthumbof/cache/OptistatCF.5e6c9d86f666f9d99ca8778df155fb28.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`855360`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A 4 K helium-flow, top-loading cryostat with sample in static exchange gas.",
"outline_limited" : "A 4 K helium-flow, top-loading cryostat with sample in static exchange gas.",
"highlights" : " 3.4 - 300 K temperature range<\/p>, Quick sample change via top-loading sample probe<\/p>, Superb optical access<\/p>",
"overview" : "\r\n Temperature range: 3.4 - 300 K. May be extended up to 500 K with the high-temperature window option and extended down to 2.2 K when used with a rotary pump (not supplied as standard)\r\n Cooling to 4.2 K in about 25 minutes\r\n Short sample change time via a top-loading sample probe - as quick as 5 minutes\r\n Low liquid helium consumption: <0.55 L\/h when used with a low-loss transfer siphon\r\n Configured for reflectance and transmission measurements\r\n Superb optical access for measurements requiring light collection\r\n Large illumination area: 15 mm diameter window aperture\r\n Compact size allowing easy integration into commercial spectrometers\r\n Measurement-ready, via 10-pin electrical wiring to the sample\r\n Supplied with a MercuryiTC temperature controller\r\n",
"features" : "Low cryogen consumption: Brings significant benefits in terms of running cost\r\nQuick experiments: A range of sample holders and probes, including liquid cuvettes sample holders and height adjust\/rotate probes, are available\r\nSimple: The experimental windows and sample holders can be easily changed\r\nVersatile: A range of window materials are available. Please contact your local sales representative for more information\r\nSuperior performance: A dynamic exchange gas model, suitable for low conductivity or high heat load samples, is available. Please contact your local sales representative for more information\r\nSoftware control: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system",
"features_benefits" : "",
"extended_tabs" : "Temperature range: 3.4 to 300 K, may be extended up to 500 K and down to 2.3 K\nTemperature stability: ± 0.1 K\nSystem may also be run with liquid nitrogen, temperature range: 77 to 500 K\nLiquid helium consumption rate at 4.2 K: < 0.55 l\/hr\nCool down consumption: 1.5 litre (nominal)\nRoom Temperature to base temperature: approx. 25 min with pre-cooled transfer siphon\nSample change time: approx. 5 min (sample can be changed with the cryostat cold)\nWeight: 3.7 kg,A typical system comprises of:\n\n Cryostat\n Sample holder\n Spectroscopy windows \n MercuryiTC temperature controller\n,UV \/ Visible spectroscopy: Experiments at low temperatures reveal the interaction between the electronic energy levels and vibrational modes in solids.Infra-red spectroscopy: Low temperature IR spectroscopy is used to measure changes in interatomic vibrational modes as well as other phenomena such as the energy gap in a superconductor below its transition temperature.Raman spectroscopy: Lower temperatures result in narrower lines associated with the observed Raman excitations.Photoluminescence: At low temperatures, spectral features are sharper and more intense, thereby increasing the amount of information available.",
"options" : "",
"accessories" : "",
"tags" : "Nanotechnology,compact cryostats, optical measurements,electrical measurements,Photoluminescence,FTIR,Raman scattering,UV/VIS reflectivity,UV/VIS absorption,sample-in-exchange-gas",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cryostats-for-spectroscopy",
"product_family_frontend" : "Optical Cryostats for Spectroscopy",
"sorting_product_family" : "100",
"idx": 168,
"page_id": 414,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-spectroscopy/optistatcf-x",
"weight" : 0,
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{
"name":"Optistat<\/b>DN-V",
"sorting_name":"optistatdn-v",
"image":"/assets/components/phpthumbof/cache/Optistat-DN-V.83d6dc8afaca08d65721c5cd3d39ef62.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`219240`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A 77 K nitrogen bath, sample-in-vacuum cryostat.",
"outline_limited" : "A 77 K nitrogen bath, sample-in-vacuum cryostat.",
"highlights" : " 77 K - 500 K temperature range<\/p>, Large sample space<\/p>, Long cryogen hold time<\/p>",
"overview" : "\r\n 77 K- 500 K temperature range\r\n Cooling to 77 K in about 20 minutes\r\n Long cryogen hold time, around 15 hours, providing a full working day's operation\r\n Large sample space for studying samples with a wide range of size and geometry\r\n Minimal number of windows in the optical path, reducing reflective losses\r\n Superb optical access (f\/1) for measurements requiring light collection\r\n Large illumination area, 35 mm diameter window aperture\r\n Configured for reflectance and transmission measurements\r\n Compact size allowing easy integration into commercial spectrometers\r\n Measurement-ready, via 10-pin electrical wiring to the sample\r\n Supplied with a MercuryiTC temperature controller\r\n 1 year standard warranty\r\n",
"features" : "Low cryogen consumption: Brings significant benefits in terms of running cost\r\nQuick experiments: A range of sample holders and probes, including liquid cuvettes sample holders and height adjust\/rotate probes, are available\r\nSimple: The experimental windows and sample holders can be easily changed\r\nVersatile: A range of window materials are available. Please contact your local sales representative for more information\r\nSoftware control: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system",
"features_benefits" : "",
"extended_tabs" : "Temperature range: 77.2 to 500 K\nTemperature stability: ± 0.1 K\nLiquid nitrogen hold time: 15 hrs at 77 K (nominal)\nRoom temperature to base temperature: approx. 20 min\nWeight: 5 kg,A typical system comprises of:\n\nCryostat\nTemperature Controller\nAccessories and Manuals\nSoftware\n,UV \/ Visible spectroscopy: Experiments at low temperatures reveal the interaction between the electronic energy levels and vibrational modes in solids.\nInfrared spectroscopy: Low temperature IR spectroscopy is used to measure changes in interatomic vibrational modes as well as other phenomena such as the energy gap in a superconductor below its transition temperature.\nRaman spectroscopy: Lower temperatures result in narrower lines associated with the observed Raman excitations.\nPhotoluminescence: At low temperatures, spectral features are sharper and more intense, thereby increasing the amount of information available.",
"options" : "",
"accessories" : "",
"tags" : " optical measurements,electrical measurements,spectroscopy techniques,Electroluminescence,Ultrafast spectroscopy,Electrical transport measurements,Photoluminescence,Fluorescence,FTIR,Raman scattering,UV/VIS reflectivity,UV/VIS absorption,sample in vacuum,Gas absorption",
"businesses" : "nanoscience",
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"idx": 169,
"page_id": 419,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-spectroscopy/optistatdn-v",
"weight" : 0,
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{
"name":"Optistat<\/b>DN-X",
"sorting_name":"optistatdn-x",
"image":"/assets/components/phpthumbof/cache/Optistat-DN.1b31d7d2b1dfe1c7881433bc1efaa347.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`699840`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A 77 K nitrogen bath, top-loading cryostat with sample in static exchange gas.",
"outline_limited" : "A 77 K nitrogen bath, top-loading cryostat with sample in static exchange gas.",
"highlights" : " 77 K - 500 K temperature range<\/p>, Quick sample change via top-loading sample probe<\/p>, Long cryogen hold time<\/p>",
"overview" : "\r\n 77 K - 500 K temperature range\r\n Cooling to 77 K in about 20 minutes\r\n Short sample change time via a top-loading sample probe - as quick as 5 minutes\r\n Long cryogen hold time, around 15 hours, providing a full working day's operation\r\n Superb optical access (f\/1) for measurements requiring light collection\r\n Configured for reflectance and transmission measurements\r\n Large illumination area, 15 mm diameter window aperture\r\n Compact size allowing easy integration into commercial spectrometers\r\n Measurement-ready, via 10-pin electrical wiring to the sample\r\n Supplied with a MercuryiTC temperature controller\r\n 1 year standard warranty\r\n",
"features" : "Low cryogen consumption: Brings significant benefits in terms of running cost\r\nQuick experiments: A range of sample holders and probes, including liquid cuvettes sample holders and height adjust\/rotate probes, are available\r\nSimple: The experimental windows and sample holders can be easily changed\r\nVersatile: A range of window materials are available. Please contact your local sales representative for more information\r\nSoftware control: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system",
"features_benefits" : "",
"extended_tabs" : "Temperature range: 77.2 to 300 K, may be extended up to 500 K\nTemperature stability: ± 0.1 K\nLiquid nitrogen hold time: 15 hrs at 77 K (nominal)\nRoom temperature to base temperature: approx. 20 min\nSample change time: approx. 5 min (sample can be changed with the cryostat cold)\nWeight: 5 kg,A typical system comprises of:\n\n OptistatDN nitrogen cryostat\n Sample holder and rod\n Up to five sets of windows. (four radial; one axial). Each set includes two windows (radiation shield and outer case windows)\n MercuryiTC temperature controller\n High vacuum pumping system\n,UV \/ Visible spectroscopy: Experiments at low temperatures reveal the interaction between the electronic energy levels and vibrational modes in solids.Infra-red spectroscopy: Low temperature IR spectroscopy is used to measure changes in interatomic vibrational modes as well as other phenomena such as the energy gap in a superconductor below its transition temperature.Raman spectroscopy: Lower temperatures result in narrower lines associated with the observed Raman excitations.Photoluminescence: At low temperatures, spectral features are sharper and more intense, thereby increasing the amount of information available.",
"options" : "",
"accessories" : "",
"tags" : " optical measurements,electrical measurements,spectroscopy techniques,Electroluminescence,THz spectroscopy,Ultrafast spectroscopy,Electrical transport measurements,Photoluminescence,Fluorescence,FTIR,Raman scattering,UV/VIS reflectivity,UV/VIS absorption,sample-in-exchange-gas",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
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"product_family" : "cryostats-for-spectroscopy",
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"sorting_product_family" : "100",
"idx": 170,
"page_id": 418,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-spectroscopy/optistatdn-x",
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{
"name":"Optistat<\/b>Dry BLV",
"sorting_name":"optistatdry blv",
"image":"/assets/components/phpthumbof/cache/OptistatDry-BLV.b13df8274de82edfa0fe41a5483c988d.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`149040`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A Cryofree® optical cryostat for spectroscopy applications providing a temperature-controlled, sample-in-vacuum measurement environment, with sample access via a unique bottom-loading mechanism.",
"outline_limited" : "A Cryofree® optical cryostat for spectroscopy applications providing a temperature-controlled, sample-in-vacuum measurement environment, with sample access via a unique...",
"highlights" : " Wide sample temperature range: < 3 K to 300 K<\/p>, Easy set-up and operation, no liquid cryogens are required<\/p>, Unique sample loading, reducing time between experiments<\/p>",
"overview" : "The bottom-loading OptistatDry BLV for spectroscopy consists of a compact cryostat with optical access, cooled by a closed-cycle refrigerator. This cryogen free cryostat is capable of cooling samples to helium temperatures without the need for liquid cryogens. This provides significant benefits in terms of ease of use and running costs and enables optical and electrical measurements to be carried out on your samples. It is also very easy to use with the help of our patent pending sample holders, windows, and wiring options.\r\n\r\n \r\n 3 - 300 K temperature range\r\n \r\n \r\n No liquid cryogens required\r\n \r\n \r\n Suitable for a wide range of experiments and different spectroscopy techniques\r\n \r\n \r\n Optical access better than f\/1 \r\n \r\n \r\n Measurement-ready via 12 or 20-pin DC wiring to the sample space\r\n \r\n \r\n Supplied with a MercuryiTC temperature controller\r\n \r\n 1 year standard warranty\r\n",
"features" : "Versatile: Suitable for a wide range of experiments and different spectroscopy techniques. Designed to interface with both imperial (1”) and metric (25 mm) optical benches.\r\nUpgradeable: A wide range of different sample holders, windows and wiring options enable you to customise and upgrade your system as your experimental needs develop.\r\nFast experiment: Changing samples via the unique sample access port is quick and simple, eliminating the need to remove the cryostat from the optical bench or re-align your optics after each and every sample change.\r\nCryofree: No liquid cryogens are required. \r\nEase of use: Only requiring single phase electrical power means the system is easy to install in a standard laboratory environment. Air- or water-cooled compressors are available.\r\nSoftware: Oxford Instruments electronics products are controllable through the software using RS232, USB (serial emulation), TCP\/IP or GPIB interfaces. LabVIEW function libraries and virtual instruments are provided for Oxford Instruments electronics products to allow PC-based control and monitoring. These can be integrated into a complete LabVIEW data acquisition system.",
"features_benefits" : "",
"extended_tabs" : "Temperature range: < 3 K to 300 K \nTemperature stability: ± 0.1 K\nVibration: typical RMS displacement of 10 microns at the sample position\nRoom temperature to base temperature: < 3 hours\nTypical cooling power: 0.2 W at 4.2 K\nOptical access: 28 mm diameter clear view f1\nDimensions (HxWxD): 635-900 (adjustable) x 240 x 290 mm\nTotal cryostat weight: 23 kg \nNotes:\n•The standard cryostat is fitted with 4 optical radial windows and 1 blank axial window•Base temperature may be reduced by fitting blanks to each of the windows. Radial window blanks are supplied as spares with the system•The maximum operating temperature will be set accordingly in the MercuryiTC supplied with the system\n \n \n ,A typical system comprises of:\n\nCryostat\nTemperature controller\nCryocooler and compressor\nAccessories and manuals\n,\nUV\/Visible spectroscopy\nInfrared spectroscopy\nRaman spectroscopy\nPhotoluminescence\nElectrical properties\n",
"options" : "",
"accessories" : "",
"tags" : "2D materials,graphene,Cryogen free cryostat,compact cryostats, optical measurements,electrical measurements,spectroscopy techniques,Electroluminescence,THz spectroscopy,Ultrafast spectroscopy,Electrical transport measurements,Photoluminescence,Fluorescence,FTIR,Raman scattering,UV/VIS reflectivity,UV/VIS absorption,sample in vacuum",
"businesses" : "nanoscience",
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"product_family" : "cryostats-for-spectroscopy",
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"sorting_product_family" : "100",
"idx": 171,
"page_id": 412,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-spectroscopy/optistatdry-blv",
"weight" : 0,
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{
"name":"Optistat<\/b>Dry TLEX",
"sorting_name":"optistatdry tlex",
"image":"/assets/components/phpthumbof/cache/OptistatDry-TLEX.6f51296268e4d8a685554dd0266f5668.png",
"content" : "Contact Sales Team !renderForm? &form=`1080`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`307800`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=``",
"outline" : "A Cryofree® optical cryostat for spectroscopy applications providing a temperature-controlled, sample-in-exchange-gas measurement environment, with sample access via a unique top-loading mechanism.",
"outline_limited" : "A Cryofree® optical cryostat for spectroscopy applications providing a temperature-controlled, sample-in-exchange-gas measurement environment, with sample access via a...",
"highlights" : " Wide sample temperature range: < 4 K to 300 K<\/p>, Easy set-up and operation, no liquid cryogens are required<\/p>, Unique sample loading, reducing time between experiments<\/p>",
"overview" : "The top-loading OptistatDry TLEX for spectroscopy comprises a compact cryostat with optical access, cooled by a closed-cycle refrigerator. This cryogen free cryostat is capable of cooling samples to helium temperatures without the need for liquid cryogens. This provides significant benefits for usability, running costs and enables simultaneous optical and electrical measurments via extensive window access and wiring options. \r\n\r\nWide sample temperature range from < 4 K to 300 K\r\nQuick sample change in < 5 minutes via top loading probe\r\nA wide range of different windows and wiring options enable you to upgrade your system as your experimental needs develop\r\nNo liquid cryogens are required\r\nOptimised optical access with f1 and a clear view of 15 mm diameter\r\nIdeal for samples that have low thermal conductivity, including powder or samples in liquid phase\r\nThe sample-in-exchange-gas environment provides all the cooling you need for samples that are not suited for a vacuum environment, such as biological, life science or chemistry experiments\r\nWater and air-cooled compressor options available\r\n1 year standard warranty\r\n",
"features" : "Versatile: Suitable for a wide range of experiments and spectroscopy techniques. Designed to interface with all types of optical benches; the feet match both Imperial (1\" spacing) and Metric (25 mm spacing).\r\nTop-loading capability: OptistatDry TLEX minimises the time between experiments and maximise sample throughput. Removing the sample rod whilst the cryostat is kept cold enables you to swap from one sample to the next less than 45 minutes. You can leave the cryostat in situ on the optical bench during sample change, eliminating the need for time-consuming re-alignment of your optical set-up.\r\nUpgradeable: A wide range of different sample holders, windows and wiring options enable you to upgrade your system as your experimental needs develop.\r\nEase of use: No liquid cryogens are required, Air or water-cooled compressors are available, single phase electrical power means the system is easy to install in all standard laboratory environments. \r\nOptical excellence: Comes with f1 and large optical access as standard. A wide range of different window materials are available to suit different wavelengths, wedged windows and anti-reflection coatings are also available.",
"features_benefits" : "",
"extended_tabs" : "Temperature range: < 4 K to 300 K \nTemperature stability: ± 0.1 K\nVibration: typical RMS displacement of 10 microns at the sample position\nRoom temperature to base temperature: < 6 hours\nSample change time: < 45 minutes (sample can be changed with the cryostat cold)\nCooling power: ~ 0.2 W at 5 K\nSample space size: 20 mm diameter\nOptical access: f1\nDimensions (HxWxD): 800-880 (adjustable) x 240 x 400 mm\nTotal cryostat weight: 28 kg,A typical system comprises of:\n\nCryostat\nTemperature Controller\nCryocooler and Compressor\nAccessories and Manuals\n,\nUV\/Visible spectroscopy\nInfrared spectroscopy\nRaman spectroscopy\nPhotoluminescence\nElectrical properties\nFTIR\nFluorescence\n",
"options" : "",
"accessories" : "",
"tags" : "Cryogen free cryostat,compact cryostats, optical measurements,electrical measurements,spectroscopy techniques,Electroluminescence,THz spectroscopy,Ultrafast spectroscopy,Electrical transport measurements,Photoluminescence,Fluorescence,FTIR,Raman scattering,UV/VIS reflectivity,UV/VIS absorption,sample-in-exchange-gas",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
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"product_family" : "cryostats-for-spectroscopy",
"product_family_frontend" : "Optical Cryostats for Spectroscopy",
"sorting_product_family" : "100",
"idx": 172,
"page_id": 413,
"page_link" : "https://nanoscienceold.oxinst.com/products/optical-cryostats-for-spectroscopy/optistatdry-tlex",
"weight" : 0,
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{
"name":"ParticleScout – Particle Analysis and Identification",
"sorting_name":"particlescout",
"image":"/assets/components/phpthumbof/cache/WITec_ParticleScout.d29d353b8b32dc544008b124ee02e713.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nParticleScout - Find, Classify and Identify Microparticles\nEnhanced sample survey and particle visualization capabilities: Bright field\/dark field, Image Stitching & Focus Stacking. ParticleScout features the most flexible and useful sample survey capabilities available. White-light Microscopy: Bright field\/dark field, transmission\/reflection. Selectable Objectives: Sample survey and Raman measurements can take advantage of various objective types, e. g. for an initial overview and subsequent high-resolution Raman analysis. Image Stitching: Scans of many sample areas can be combined into one measurement for a large-area overview of widely-distributed particles. Focus Stacking: This unique capability dramatically increases the depth of focus for sharp and defined particle imaging. Advanced categorization tools facilitate the selection of relevant particles with unprecedented ease.\nUser-defined classification of particles by shape and size offers access to wide-ranging properties.\nCategorization can be carried out according to: Area, Perimeter, Bounding Box, Max. Feret Diameter, Min. Feret Diameter, Aspect Ratio, Equivalent Diameter and many others.\nApplication of Boolean filters for precise grouping.\nAutomated mask creation for subsequent Raman analysis.\nWide-ranging particle properties can be selected through filters for subsequent Raman analysis.\nParticle identification is quick and straightforward when your Raman microscope is equipped with ParticleScout.\nParticleScout makes full use of Raman imaging’s advantages in fast, label-free and nondestructive chemical characterization while accelerating the workflow for the researcher. In seamless combination with the TrueMatch database management software, the user can build a catalog of particles based on their constituent molecular components linked to physical attributes such as size or aspect ratio and produce a report that quantifies specific particles in a sample. Comprehensive report algorithms make ParticleScout the perfect tool for finding correlations between the physical and chemical attributes of particles.\nUser-selectable combinations of filters can highlight relevant groups of particles to show their quantities and prevalence relative to other groups. This degree of customization in report generation enhances the effect of targeted investigations. From large-area imaging to high-resolution spectroscopy, the technology underlying ParticleScout provides thorough and detailed insight to the researcher.\nExamples of Reports. !If? &subject=`` &operator=`notempty` &then=`` &else=``\nParticleScout Selected Features Integration time optimization – reduces measurement time and minimizes the effects of fluorescence. Vignetting correction – ensures uniform brightness throughout the image plane. Smart zoom – displays particle information dynamically depending on viewed area. Sample area targeting – allows the selection of multiple regions of interest for each investigation. Dark-field, bright-field, epifluorescence and transmission sample illumination – provides the best option for each type of particle. Round sample wedge sectioning – allows the selection of an area for data acquisition, typically on a filter, that can be extrapolated to represent the whole. Smart separation of particles – differentiates materials in densely packed, heterogeneous samples. Quantitative report formatting – presents data using table, bar graph histogram and pie chart templates for ease and clarity.\nParticleScout's new integration time optimization feature: Time saving and efficient\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nApplications\nPacked with our most advanced technology, ParticleScout will redefine your expectations for particle analysis tools and allow new approaches for your applications. Environmental Science\nIn studies of pollution and environmental analysis, ParticleScout is an invaluable tool that can accelerate the characterization of materials such as microplastics and industrial waste. Food Technology\nParticleScout is well suited to the analysis of water and ingredients used for food production. The measurement picture shows baking powder particles. Pharmaceutics\nDrug delivery system advancement requires the characterization of powders and particulates in raw and final products. ParticleScout generates extensive reports for the research lab or the QA department. Cosmetics\nParticle analysis studies are crucial in the development and certification of new cosmetic products. The measurement picture shows particles in a peeling cream, which were classified according to several parameters. Industrial Applications\nProduction processes and clean room maintenance, including dust particle and residue monitoring, can greatly benefit from ParticleScout analysis. Geosciences\nComposition and particle analysis of mineral powders deliver profound insights when performing natural resource investigation, core material characterization or sediment analysis.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` ParticleScout Video Introduction\nWatch this video to learn how to determine physical and chemical properties of particles with confocal Raman microscopy.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nHear How ParticleScout Makes a Difference\n$testimonials? &rows=`[ { \"quote\": \"We are impressed every day by how reliably and precisely the confocal Raman system from Oxford Instruments performs in particle analysis. The analysis of even the smallest plastic particles, for example in milk, places the highest demands on the system. With the CONTROL software used to operate the system in combination with ParticleScout, however, we are optimally equipped and achieve excellent results.\", \"person\": \"Dr. Felix Thier, Environment Agency Austria, Wien, Austria\", \"image\": \"\", \"textColour\": \"\"\n} ]`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nAwards ParticleScout has been recognized by The Analytical Scientist Innovation Awards (TASIAs) as one of the most inventive scientific products of 2019. The Analytical Scientist is a print and online journal that covers the latest developments in measurement science. The goal of the TASIAs, which are determined by a panel of experts, is “To highlight the latest and greatest technology, instrumentation and software making waves throughout the analytical science community.” ParticleScout has received a Wiley Analytical Science Award 2021. This award recognizes outstanding innovation in equipment used for scientific analysis. A neutral jury of experts at Wiley created a shortlist from the full range of submissions, and then the readers of the print and digital editions of Wiley Analytical Science’s portfolio of journals voted for their favorites. The winners were announced during the Wiley Analytical Science Conference 2020 and ParticleScout won 2nd Place in the category “Spectroscopy and Microscopy”.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`62`&formTpl=`standard-form-wrapper` &unique_id=`33418`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"overview" : "",
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"features_benefits" : "",
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"options" : "",
"accessories" : "",
"tags" : "",
"businesses" : "raman",
"businesses_frontend" : "Raman",
"applications" : [ "food-technology","forensics","geo-science","materials-science","pharmaceutics","polymers" ],
"applications_frontend" : "Food Technology, Forensics, Geo Science, Materials Science, Pharmaceutics & Cosmetics, Polymers",
"product_family" : "software",
"product_family_frontend" : "Software",
"sorting_product_family" : "100",
"idx": 173,
"page_id": 18864,
"page_link" : "https://raman.oxinst.com/products/software/particlescout",
"weight" : 0,
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{
"name":"Petri Dish Heater and Petri Dish Holder",
"sorting_name":"petri dish heater and petri dish holder",
"image":"/assets/components/phpthumbof/cache/MFP-3D-AFM-Petri-Dish-Holder-Heater.98cf23eb559f58635885f830ecb7732d.jpg",
"content" : "",
"outline" : "The Petri Dish Heater for MFP-3D AFMs enables heating temperature-sensitive biological samples, specifically living cells, at physiologically-relevant temperatures ranging from ambient to 45°C. The kit includes an assortment of Petri dishes, a membrane that minimizes evaporation, and a magnetic clamp to secure the dish to the sample plate (compatible with all MFP-3D AFMs except Origin). The Petri Dish Holder is a basic, non-heating version (compatible with all MFP-3D AFMs).",
"outline_limited" : "The Petri Dish Heater for MFP-3D AFMs enables heating temperature-sensitive biological samples, specifically living cells, at physiologically-relevant temperatures ranging...",
"highlights" : "Ideal for researchers who prefer to image cells in culture dishes with minimal handling of their samples,Accepts a variety of glass-bottom and polystyrene dishes as well as typical 1” x 3” glass slides,Heating option is optimized for sensitive cell experiments that require near-native conditions",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanomechanical Properties,Nanoelectrical Properties,Roughness,Functional Properties,Force Spectroscopy,Nanotechnology",
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"outline" : "The Piezo Force Module enables operation at high tip biases up to ±220 V for very high sensitivity and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics (up to ±150 V on MFP-3D Infinity). Compatible with all MFP-3D AFMs except Origin.",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nHow to Request Product Quotes\n1. In the table below, please click the “Add to quote list” button for all products that you would like quoted.\n2. Scroll to the bottom of the table and click the green “My Quote List” button to visit the submission form page.",
"outline" : "Developed for applications that require high resolution over a wide-angle field of view, the Pinnacles 50kV Microfocus X-ray source features high flux output. Its compact design is fully radiation shielded and insulated with an integrated high voltage cable located on the side of the tube for easy connection. The Shasta µF power supply has been optimized to power the Pinnacles 50kV Microfocus X-ray tube.\r\nThe Shasta µF power supply has been optimized to power the Pinnacles 50kV Microfocus X-ray tube.",
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"features_benefits" : "Wide operating range - enables optimal image contrast,Wide field of view - allows imaging of large samples in one exposure,Fully shielded package - eliminates X-ray leakage for operator safety,Integrated high voltage cable - simplifies installation and system integration",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nKey Features Polarization dependent white light microscopy in transmission and\/or reflection Freely rotatable linear polarizer and analyzer for any VIS\/NIR spectroscopic input lasers and spectral ranges Left and right-handed circular polarization options Manual and motorized polarizer and analyzer rotations possible Software-controlled, fully automated polarizer\/analyzer angle rotation series Integration in workflow manager for automatic recording of full confocal sequences with consecutively different analyzer and\/or polarizer orientations EquiLight: Quasi-depolarizer to minimize the spectrometer grating's polarization-dependence Full petrographic solution upon request\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` The Principle\nWaveplates in the polarizer module can rotate the linearly polarized light from the laser in a defined direction (half wave plate, λ\/2) or transform it into circularly or elliptically polarized light (quarter wave plates, λ\/4). A polarization filter in the analyzer within the detection path filters the light from the sample along a selectable polarization axis before detection.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Polarization-resolved Raman imaging\nUsing polarization analysis in combination with Raman spectroscopy enables the probing of advanced molecular information of the sample including the symmetry of the respective vibrations. As such, the orientation of different domains, chirality and optical anisotropy can easily be visualized.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nApplication Examples Polarization-resolved Raman spectroscopy of polyethylene (PE) revealing the stretching-induced fiber alignment within PE plastic foil. 3D heatmaps visualize the polarization-dependent Raman intensity for several modes, including the symmetrical C-C stretching (1130 rel. cm-1), CH2 bending (1417, 1441 and 1464 rel. cm-1), and C-H stretching (2849 and 2883 rel. cm-1) in the stretched condition (right). Polarization-resolved analysis of the highly-oriented biotite crystals in metamorphic rock. Left: Parallel polarized white light transmission image. Middle: Polar plots of Raman mode intensities of the T6O6-ring bending modes in individual biotite grains. Right: TrueComponent Analysis image of different spatial crystal orientations. Left: Polarized Raman imaging series of the nacre of an abalone shell acquired with a fixed, perpendicular incident and detection angle (cross-polarized configuration) and a rotation in 5-degree steps, resolving the highly organized structuring of aragonite. Right: Representative Raman spectra of the color-coded areas show characteristic aragonite lattice vibration modes at 153 rel. cm-1 (translational), 206 rel. cm-1 (wobbling) and 1085 rel. cm-1 (CO-stretching).\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nLiterature Technical Note Polarization-resolved Raman microscopy and spectroscopy Open PDF\n!If? &subject=`` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`` &formTpl=`protected-form-wrapper` &unique_id=`0`\n`\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`20550`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"outline" : "The PolyHeater is a heating stage designed for high temperature polymer studies with temperature ranging from ambient to 250°C. The stage supports samples up to 15 mm in diameter. The sample can be immobilized magnetically, with the use of clamps, or with thermally conductive paste. The accessory connects directly into the Jupiter expansion port enabling all the controls and measurement functions to be accessed through the software interface.",
"outline_limited" : "The PolyHeater is a heating stage designed for high temperature polymer studies with temperature ranging from ambient to 250°C. The stage supports samples up to 15 mm in diameter....",
"highlights" : " Ambient to 250°C temperature control<\/p>, Four 1\/16” ports available for gas purging or electrical connections to the sample<\/p>, Easy magnetic or clamp sample mounting<\/p>",
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"product_family" : "cryofree-dilution-refrigerators",
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"name":"Proteox5mK",
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"outline" : "Andor’s PV Inspector NIR Camera is designed to offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection, delivering > 90% QE beyond 800 nm and incorporating Fringe Suppression Technology™ to minimize fringing effects in the NIR",
"outline_limited" : "Andor’s PV Inspector NIR Camera is designed to offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection, delivering > 90% QE...",
"highlights" : "QE > 90% beyond 800 nm,5 MHz and 3 MHz readout speeds,Dual Exposure Ring Mode,Fringe Suppression Technology ™,UltraVac™",
"overview" : "Andor’s PV Inspector NIR Camera is designed to offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection, delivering > 90% QE beyond 800 nm and incorporating Fringe Suppression Technology™ to minimize fringing effects in the NIR. The 1024 x 1024 array boasts high resolution 13 μm pixels, and benefits from negligible darkcurrent with thermoelectric cooling down to -70°C. PV Inspector offers industry highest throughput via rapid readout speeds up to 5 MHz, combined with a unique ‘dual exposure ring mode’ that allows fast exposure switching. A lockable USB 2.0 port ensures secure vibration resistant connectivity.\r\nThe enhanced NIR sensitivity and unique high speed modes of the PV Inspector enable dual exposure EL inspection at rates in excess of 1 cell per second, ideally suited for very high throughput PV inspection systems as found in stringers and cell sorters. Rapid, dual exposure imaging, allows for quantitative measurement of cells under distinct bias levels.",
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"features_benefits" : "QE > 90% beyond 800 nm, optimized for NIR - Very high detector sensitivity in near infra-red,5 MHz and 3 MHz readout speeds - Rapid frame rates for high throughput cell inspection,Dual Exposure Ring Mode - Unique acquisition mode for exposure time switching,Fringe Suppression Technology ™ - Minimizes etaloning effects in the NIR, optimizes optical resolution,UltraVac™ - Critical for sustained vacuum integrity and to maintain unequalled cooling and QE performance, year after year,Single AR-coated window design - NIR optimized anti-reflection coating,Thermoelectric cooling to -70°C (air cooled) - Critical for elimination of dark current detection limit,Lockable USB connection - Ensures secure, vibration resistant connectivity,Cooling on power-up - PV Inspector does not require PC connectivity to maintain stable thermoelectric cooling,Enhanced Baseline Clamp - Essential for quantitative accuracy of dynamic measurements.",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` RayShield Coupler Raman spectra measurements at extremely low wavenumbers down to below 10 rel. cm-1 Provides access to additional information from Stokes and anti-Stokes Raman signals close to the Rayleigh line Specialized filter set available for a variety of laser wavelengths (488, 532, 633, and 785 nm) RayLine Filters High-pass filters with sharp edges Several filters available with wavelength-dependent low cut-offs\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nApplication Examples\nRaman spectra of different MoS2 layers acquired with an Oxford Instruments Raman microscope including RayShield Coupler (excitation wavelength: 532 nm; grating: 2400 lines\/mm; integration time: 5s).\nRaman image of a solution of L-cysteine in a mixture of water and different herbal oils. Most of the L-cysteine is dissolved in the water phase (blue). In the oil phase (yellow), an undissolved cysteine crystal (red) is visible. The green areas likely represent one of the herbal oil ingredients. The Raman spectrum of L-cysteine has characteristic peaks in the low-frequency range, which were clearly resolved by the Raman microscope equipped with RayShield.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`370585`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"content" : "The RISE Technique For RISE microscopy samples are automatically transferred from one measuring position to the other within the vacuum chamber of the SEM, streamlining the workflow and drastically improving the instrument's ease of use.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Application Examples\nRaman-SEM image overlay of a hamster brain tissue sample. Color-coded Raman image parameters: Green: White brain matter; Red: Gray brain matter; 100 µm x 100 µm, 300 x 300 pixels = 90,000 spectra, 50 ms integration time per spectrum.\nRaman-SEM image overlay of a GaAs semiconductor sample. Color-coded Raman image parameters: Yellow: Gold substrate; Red: GaAs; Blue: Residues from production; 50 µm x 50 µm, 300 x 300 pixels = 90,000 spectra, 34 ms integartion time per spectrum.\nRaman-SEM image overlay of a PMMA-PS polymer blend. Color-coded Raman image parameters: Green: Polystyrene; Red: Polymethyl methacrylate.\nRISE Microscopy and EDX analysis of a geological sample. Left: Overlaid SEM-EDX image: Three different element groups can be distinguished (Orange: Si, O; Purple: Si, Al, Fe, Ca; Green: Na). Middle: The Raman-SEM image overlay of the same sample area shows the distribution of the molecular compounds. Right: Corresponding Raman spectra.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` RISE Key Features Scanning Electron Microscopy:\nScanning Electron Microscopy features a variety of analysis techniques. With RISE, the chemistry of molecular compounds can be imaged additionally. Confocal Raman Microscopy: Confocal Raman Imaging with unprecedented performance in speed, sensitivity, and resolution Hyperspectral image generation with the information of a complete Raman spectrum at every image pixel Excellent diffraction limited lateral resolution of 200 - 300 nm Outstanding depth resolution ideally suited for 3D image generation and depth profiles Ultrahigh-throughput lens-based spectroscopic system for highest sensitivity and best performance in spectral resolution Ultra-fast Raman imaging option with only 0.76 ms integration time per spectrum Non-destructive imaging technique: no staining or fixation of the sample required\nRISE Microscopy is suitable for you...\n...as a Raman newcomer you will benefit from the ease-of-use and intuitive measurement procedure\n...as an experienced user you will appreciate the exceptional correlative microscope performance with the advantages of both techniques included in one instrument\nMaterials science, nanotechnology, polymer science, geoscience, life science, pharmaceutical industry...\n...regardless of the field in which you are working, RISE Microscopy will empower you with its unique imaging capabilities\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Customer Publications Powered by Bioz See more details on Bioz\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Literature WITec RISE Brochure Open PDF\n!If? &subject=`` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`` &formTpl=`protected-form-wrapper` &unique_id=`0`\n` Application Note RISE Microscopy (Raman-SEM) Open PDF\n!If? &subject=`` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`` &formTpl=`protected-form-wrapper` &unique_id=`0`\n` Application Note Raman-SEM (RISE) Imaging of 2D Materials Open PDF\n!If? &subject=`` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`` &formTpl=`protected-form-wrapper` &unique_id=`0`\n`\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Award Winning Technology RISE Microscopy has been recognized with a 2015 Photonics Prism Award. An expert jury named the correlative RISE microscope as winner in the metrology category. The Prism Award is given for top innovations in the field of photonics, granted by Photonics Media and sponsored by the international Society for Optics and Photonics (SPIE).\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`530875`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` Sample Holders\nSample holders are available for various devices in open and closed configurations. Magnetic and flexible clamps ensure the correct positioning of the sample during measurements. An optional quick-change setup allows for a simplified switching out of different holders.\nExamples: Microscope slide holder Cuvette holder Petri and culture dish holder Multi-well plate holder Culture flask holder and more... Specialized Stages\nA variety of specialized stages enable measurements under controlled environmental conditions.\nExamples: Temperature devices Specialized sample chambers Specimen rotation stages Adapters for vacuum applications Mechanical treatment devices Electrical exposure devices and more...\nFor more options, please contact our team.\nContact us !renderForm? &form=`685`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`458265`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`656915`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"options" : "",
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"tags" : "",
"businesses" : "raman",
"businesses_frontend" : "Raman",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "microscope-components",
"product_family_frontend" : "Microscope Components",
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"idx": 185,
"page_id": 26554,
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"name":"Sample Mounts",
"sorting_name":"sample mounts",
"image":"/assets/components/phpthumbof/cache/Sample-Mounts-For-The-MFP-3D-AFM.648e85aae88abb7adb9c79acbd870395.jpg",
"content" : "",
"outline" : "A variety of sample mounts are available for MFP-3D AFMs in addition to the standard magnetic mount and clip mount. These include mounts for SEM stubs and coverslips.",
"outline_limited" : "A variety of sample mounts are available for MFP-3D AFMs in addition to the standard magnetic mount and clip mount. These include mounts for SEM stubs and coverslips.",
"highlights" : "A wide range of sample mounts including SEM stubs and coverslips",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
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"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-miscellaneous-accessories",
"product_family_frontend" : "MFP-3D Accessories: Adapting to Experimental Needs",
"sorting_product_family" : "100",
"idx": 186,
"page_id": 315,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-miscellaneous-accessories/mfp-3d-sample-mounts",
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"name":"Sample Positioning and Scanning",
"sorting_name":"sample positioning and scanning",
"image":"/assets/components/phpthumbof/cache/WITec_Sample-Positioning.96c93841a74cc6030156f084489d760f.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` Standard Stages\nManual and motorized translation stages:\n25 mm x 25 mm50 mm x 50 mm100 mm x 50 mm150 mm x 150 mm250 mm x 150 mm350 mm x 300 mm\nPiezo-actuated stages: 30 µm x 30 µm x 10 µm 100 µm x 100 µm x 20 µm 200 µm x 200 µm x 20 µm Special Customer Solutions\nFor samples with special requirements, please contact us to find and develop the best solution.\nThe witec360 Semiconductor Edition Raman microscope featuring a 350 mm x 300 mm motorized translation stage. !If? &subject=`` &operator=`notempty` &then=`` &else=``\nContact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`286330`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"tags" : "",
"businesses" : "raman",
"businesses_frontend" : "Raman",
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"product_family" : "microscope-components",
"product_family_frontend" : "Microscope Components",
"sorting_product_family" : "100",
"idx": 187,
"page_id": 18920,
"page_link" : "https://raman.oxinst.com/products/microscope-components/positioning-stages",
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{
"name":"Sample<\/b>Protect Switching Unit",
"sorting_name":"sampleprotect switching unit nanoscience oxford instruments",
"image":"/assets/components/phpthumbof/cache/Untitled%20design%20%2822%29.7a1aac3189cddb7ba1cc4de381a1ba1d.png",
"content" : "Overview\nThe SampleProtect Switching Unit (SPSU) is a 24-channel unit in a 3U high enclosure designed for 19” rack mounting. The 24 signal lines are configured in 12 twisted pairs. At the rear of the unit there are 2 x 50-way sub-D connectors. One connector is used to connect all the signal lines to the measurement probe (or cryostat), the second is a feed-through link to connect any of the lines to additional instrumentation as an alternative to the individual BNC and Twinax connectors on the front panel. The 50-way connectors accept the SPSU Measurement Cable (quoted separately). With this connection configuration, the unit switches can be used to switch any of the signal lines between signal, open, measurement ground or protective ground. Sample Protect Switching Unit 3U high and designed for 19” rack mounting 2 x 50 way rear mounted sub-D connectors Connection to the signal lines of the measurement probe or cryostat Feed-through link to connect any of the lines to additional instrumentation (an alternative to using the individual BNC and Twinax on front panel) Unit switches can be used to switch any of the signal lines between signal, measurement ground or protective ground. Each signal line has a BNC or Twinax port for connection directly to measurement electronics or diagnostics. High-quality make-before-break switches Low resistance Au contacts Sealed against moisture ingress to avoid future contact corrosion Internal signal routings designed to minimise cross-talk Line resistance kept to a minimum\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nThe measurement cable is a carefully specified cable constructed of 13 twisted pairs, 10 pairs of 26 (19\/38) AWG tinned Cu and 3 pairs of 22 (19\/34) AWG tinned Cu. Each pair is individually screened with a foil screen. Each screen has external insulation to isolate it from all the other screens. Each screen also has a drain wire.\nIn addition, the cable has an overall foil screen which has internal insulation plus an external screen braid. The overall screen also has a drain wire. This construction facilitates overall screening with the outer screen connected to protective ground but in addition any pair can be screened to a specific measurement ground for that channel. The cross-talk increases with frequency as expected and is shown in specifications.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nSample Protect Sample Unit - SPSU ItemValueTemperature Range0 to 40° CVoltage rating50 VRMSRecommended Frequency RangeDC – 100 kHzMutual Capacitance38 pF @1 kHzLine Inductance< 0.30 µHConductor DC line Resistance< 0.18 Ω @20° CShield DC line Resistance< 0.12 Ω @20° C\nCross-talk signal induced in channel 2 resulting from an excitation drive current in channel 1 plotted as a function of frequency:\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nMeasurement Grade Cable ItemValueValue26AWG pairs26AWG pairs22AWG pairsNumber of twists12 \/ft (minimum)12 \/ft (minimum)Temperature Range-40 to 80°C-40 to 80°CVoltage rating300VRMS300VRMSMutual Capacitance30pF\/ft @ 1kHz38pF\/ft @ 1kHzGround Capacitance54pF\/ft @ 1kHz68pF\/ft @ 1kHzCharacteristic Impedance55Ω43ΩLine Inductance0.18µH\/ft0.16µH\/ftConductor DC line Resistance38Ω \/ 1000ft @ 20°C15.5Ω \/ 1000ft @ 20°CShield DC line Resistance34Ω \/ 1000ft @ 20°C14.5Ω \/ 1000ft @ 20°C\nCross-talk signal induced in one conductor of a twisted pair resulting from an excitation drive current in a conductor of another twisted pair in the same cable construction, plotted as a function of frequency. Each pair is shielded with shields grounded to instrument ground:\nThe crosstalk measurements shown were measured on a 180cm length of cable. Cross-talk increases with frequency as expected.",
"outline" : "Provides experimenters with an end-to-end method of protecting sensitive samples from accidental electrostatic discharge (ESD).",
"outline_limited" : "Provides experimenters with an end-to-end method of protecting sensitive samples from accidental electrostatic discharge (ESD).",
"highlights" : " Can be used with Proteox, Teslatron and experimental measurement probes<\/p>, High quality measurement grade cables<\/p>, Low noise<\/p>",
"overview" : "\r\n\r\n",
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"features_benefits" : "",
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"tags" : "",
"businesses" : "nanoscience",
"businesses_frontend" : "NanoScience",
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"idx": 188,
"page_id": 1392,
"page_link" : "https://nanoscienceold.oxinst.com/accessories-test/sampleprotect-switching-unit–-nanoscience-oxford-instruments",
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{
"name":"Scanning Capacitance Microscopy (SCM)",
"sorting_name":"scanning capacitance microscopy (scm)",
"image":"/assets/components/phpthumbof/cache/SCM-Web-SRAM-Channels.1803dcce1ef70889e20cb68faae589a8.png",
"content" : "",
"outline" : "Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF) signal to map electric charge carrier locations, dopant levels, and dopant types (p-type vs. n-type) in semiconductors and other samples. The newly designed Asylum Research SCM accessory offers significantly higher performance and capability than any other currently available SCM module. Benefits include:",
"outline_limited" : "Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF)...",
"highlights" : " Measures not just differential capacitance (dC\/dV), but also capacitance, which is linearly correlated with dopant concentrations, enabling simpler interpretation of SCM data<\/p>, Over 20× faster scanning improves productivity (images in as little as 10 seconds!)<\/p>, High sensitivity enables measurements on semiconductors<\/a>, energy storage devices<\/a> and 2D materials<\/a><\/p>, Higher resolution imaging reveals smaller structures<\/p>",
"overview" : "",
"features" : "",
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"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
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"product_family" : "outreach",
"product_family_frontend" : "Outreach",
"sorting_product_family" : "100",
"idx": 189,
"page_id": 10275,
"page_link" : "https://afm.oxinst.com/library/outreach/scanning-capacitance-microscopy-scm",
"weight" : 0,
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"name":"Scanning Capacitance Microscopy (SCM) Module",
"sorting_name":"scanning capacitance microscopy (scm) - jupiter xr",
"image":"/assets/components/phpthumbof/cache/SCM-Web-SRAM-Channels.1803dcce1ef70889e20cb68faae589a8.png",
"content" : "",
"outline" : "Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter atomic force microscopes that uses a microwave radio frequency (RF) signal to map electric charge carrier locations, dopant levels, and dopant types (p-type vs. n-type) in semiconductors and other samples. The newly designed Asylum Research SCM accessory offers significantly higher performance and capability than any other currently available SCM module. Benefits include:",
"outline_limited" : "Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter atomic force microscopes that uses a microwave radio frequency (RF)...",
"highlights" : " Measures not just differential capacitance (dC\/dV), but also capacitance, which is linearly correlated with dopant concentrations, enabling simpler interpretation of SCM data<\/p>, Over 20× faster scanning improves productivity (images in as little as 10 seconds!)<\/p>, High sensitivity enables measurements on semiconductors<\/a>, energy storage devices<\/a> and 2D materials<\/a><\/p>, Higher resolution imaging reveals smaller structures<\/p>",
"overview" : "",
"features" : "",
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"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "jupiter-afm-accessories",
"product_family_frontend" : "Jupiter AFM Accessories",
"sorting_product_family" : "100",
"idx": 190,
"page_id": 10231,
"page_link" : "https://afm.oxinst.com/products/jupiter-afm-accessories/scanning-capacitance-microscopy",
"weight" : 0,
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"name":"Scanning Capacitance Microscopy (SCM): Accessory for Cypher AFM",
"sorting_name":"scanning capacitance microscopy (scm): accessory for cypher afm",
"image":"/assets/components/phpthumbof/cache/SCM-Web-SRAM-Channels.1803dcce1ef70889e20cb68faae589a8.png",
"content" : "",
"outline" : "Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF) signal to map electric charge carrier locations, dopant levels, and dopant types (p-type vs. n-type) in semiconductors and other samples. The newly designed Asylum Research SCM accessory offers significantly higher performance and capability than any other currently available SCM module. Benefits include:",
"outline_limited" : "Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF)...",
"highlights" : " Measures not just differential capacitance (dC\/dV), but also capacitance, which is linearly correlated with dopant concentrations, enabling simpler interpretation of SCM data<\/p>, Over 20× faster scanning improves productivity (images in as little as 10 seconds!)<\/p>, High sensitivity enables measurements on semiconductors<\/a>, energy storage devices<\/a> and 2D materials<\/a><\/p>, Higher resolution imaging reveals smaller structures<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cypher-nanoelectrical-accessories",
"product_family_frontend" : "Cypher Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 191,
"page_id": 10232,
"page_link" : "https://afm.oxinst.com/products/cypher-nanoelectrical-accessories/scanning-capacitance-microscopy",
"weight" : 0,
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{
"name":"Scanning Microwave Impedance Microscopy (sMIM)",
"sorting_name":"scanning microwave impedance microscopy (smim)",
"image":"/assets/components/phpthumbof/cache/sMIM-Data-Channels%21%20%281%29.5aad0e677b023beb7a1d63aed3f5e484.jpg",
"content" : "",
"outline" : "sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).",
"outline_limited" : "sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).",
"highlights" : "Provides higher lateral resolution (<50 nm) and superior signal-to-noise (>10X),Operates up to 80X faster and at lower power compared to competing technologies",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Functional Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "failure-analysis","fabrication","process-mineralogy-and-chemical-analysis" ],
"applications_frontend" : "Failure Analysis , Fabrication, Process Mineralogy and Chemical Analysis",
"product_family" : "mfp-3d-nanoelectrical-accessories",
"product_family_frontend" : "MFP-3D Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 192,
"page_id": 299,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-nanoelectrical-accessories/mfp-3d-scanning-microwave-impedance-microscopy-smim",
"weight" : 0,
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{
"name":"Scanning Microwave Impedance Microscopy (sMIM) for cypher",
"sorting_name":"scanning microwave impedance microscopy (smim) for cypher",
"image":"/assets/components/phpthumbof/cache/cypher-smim.5a4f27e0d09239289c93a65409e1644c.jpg",
"content" : "",
"outline" : "sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.",
"outline_limited" : "sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.",
"highlights" : " Provides higher lateral resolution (10×)<\/p>, Operates up to 80× faster and at lower power compared to competing technologies<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
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"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Functional Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "failure-analysis" ],
"applications_frontend" : "Failure Analysis ",
"product_family" : "cypher-nanoelectrical-accessories",
"product_family_frontend" : "Cypher Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 193,
"page_id": 327,
"page_link" : "https://afm.oxinst.com/products/cypher-nanoelectrical-accessories/cypher-scanning-microwave-impedance-microscopy-smim",
"weight" : 0,
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{
"name":"Scanning Thermal Microscopy (SThM)",
"sorting_name":"scanning thermal microscopy (sthm)",
"image":"/assets/components/phpthumbof/cache/StHMHardDriveHead_.029446cb8a0032338f10c5353a5d484c.jpg",
"content" : "",
"outline" : "Novel microfabricated silicon probes and the SThM probe holder for MFP-3D AFMs enable both single point and mapping measurements of temperature and thermal conductivity with higher resolution than conventional Wollaston-wire probes.",
"outline_limited" : "Novel microfabricated silicon probes and the SThM probe holder for MFP-3D AFMs enable both single point and mapping measurements of temperature and thermal conductivity...",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Roughness,Functional Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-nanomechanical-accessories",
"product_family_frontend" : "MFP-3D Accessories: Nanomechanical and Thermal Properties",
"sorting_product_family" : "100",
"idx": 194,
"page_id": 292,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-nanomechanical-accessories/mfp-3d-scanning-thermal-microscopy-sthm",
"weight" : 0,
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{
"name":"Scanning Tunneling Microscopy (STM)",
"sorting_name":"scanning tunneling microscopy (stm)",
"image":"/assets/components/phpthumbof/cache/MFP3D-HOPG-STM%21%20%281%29.6e4fce59ecccf2cbacfcd1176a95de6b.jpg",
"content" : "",
"outline" : "STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.",
"outline_limited" : "STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Roughness,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "mfp-3d-nanoelectrical-accessories",
"product_family_frontend" : "MFP-3D Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 195,
"page_id": 296,
"page_link" : "https://afm.oxinst.com/products/mfp-3d-nanoelectrical-accessories/mfp-3d-scanning-tunneling-microscopy-stm",
"weight" : 0,
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{
"name":"Scanning Tunneling Microscopy (STM)",
"sorting_name":"scanning tunneling microscopy (stm)",
"image":"/assets/components/phpthumbof/cache/398475c8150462478099286092310939480.b7dd754949018750bfd07a3d0a417a14.jpg",
"content" : "",
"outline" : "STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.",
"outline_limited" : "STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.",
"highlights" : " Useful for ultra-high resolution imaging of conductive samples<\/p>",
"overview" : "",
"features" : "",
"features_benefits" : "",
"extended_tabs" : "",
"options" : "",
"accessories" : "",
"tags" : "Atomic Force Microscopy,AFM,Scanning Probe Microscopy,SPM,Nanoelectrical Properties,Nanotechnology",
"businesses" : "asylum",
"businesses_frontend" : "Asylum Research",
"applications" : [ "" ],
"applications_frontend" : "",
"product_family" : "cypher-nanoelectrical-accessories",
"product_family_frontend" : "Cypher Accessories: Nanoelectrical Properties",
"sorting_product_family" : "100",
"idx": 196,
"page_id": 325,
"page_link" : "https://afm.oxinst.com/products/cypher-nanoelectrical-accessories/cypher-scanning-tunneling-microscopy-stm",
"weight" : 0,
},
{
"name":"Shamrock 500i Spectrograph",
"sorting_name":"shamrock 500i spectrograph",
"image":"/assets/components/phpthumbof/cache/shamrock-500-product.5b5c59477bf6bd3b5ee6bab963659793.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "The Andor Shamrock SR-500i imaging spectrometer is based on Czerny-Turner optical design. The optimized optical design provides exceptional performance for multi-track Spectroscopy. The Shamrock 500i is available as a pre-aligned, pre-calibrated camera\/spectrometer detection solution allowing for seamless integration in user set-up.",
"outline_limited" : "The Andor Shamrock SR-500i imaging spectrometer is based on Czerny-Turner optical design. The optimized optical design provides exceptional performance for multi-track...",
"highlights" : "Pre-aligned, pre-calibrated spectrograph,Image astigmatism correction,USB 2.0 interface,Motorized, indexed triple grating turret,Dual detector outputs",
"overview" : "The Andor Shamrock 500i imaging spectrometer is the latest addition of the Andor family of spectrometers based on Czerny-Turner optical design. The optimized optical design provides exceptional performance for multi-track Spectroscopy.\r\nThe Shamrock 500i is available as a pre-aligned, pre-calibrated camera\/spectrometer detection solution allowing for seamless integration in user set-up. The Spectroscopy-dedicated software interface provides an interactive and intuitive platform for simultaneous detector(s) and spectrometer real-time control.",
"features" : "",
"features_benefits" : "Pre-aligned, pre-calibrated detector & spectrograph - Motorized, individually factory-calibrated systems – out-of-the-box operation and seamless integration to experimental set-ups,Image astigmatism correction - Optimised toroidal optics for high density multi-track capabilities,USB 2.0 interface - Plug and play connectivity, ideal for laptop operation alongside Andor USB cameras,Motorized, indexed triple grating turret - Easily upgreadable in-the-field,Dual detector outputs - For extended wavelength coverage when combining Andor UV-Visible CCD and InGaAs cameras. Compatible with Andor’s range of CCD, ICCD & EMCCD cameras,Wide range of accessories available - The ultimate in modular set-up and in-field upgradability,Silver-protected coated optics options - Most efficient for near-infrared detection when used in conjunction with Andor InGaAs cameras",
"extended_tabs" : "",
"options" : "",
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"tags" : "",
"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "analysis-of-environmental-contaminants","characterisation-of-catalyst-material","characterisation-of-low-dimensional-structures","counterfeit-pharmaceuticals","fabrication-and-characterisation-of-light-emitting-devices","food-security","forensic-soil-analysis-and-other-trace-analysis","gunshot-residue-analysis","identification-of-contaminants-in-food-production-and-soil","in-situ-observation-of-chemical-reactions","material-composition-and-structure","materials-for-the-power-generation-industry","measurement-of-chemical-and-molecular-composition","measurement-of-polymer-and-polymer-phase-properties","modular-optical-spectroscopy","nanomaterial-growth-and-characterisation","quality-control-and-chemical-identification" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Gunshot Residue Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Materials for the Power Generation Industry, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "kymera-and-shamrock-spectrographs",
"product_family_frontend" : "Kymera & Shamrock Spectrographs",
"sorting_product_family" : "100",
"idx": 197,
"page_id": 254,
"page_link" : "https://andor.oxinst.com/products/kymera-and-shamrock-spectrographs/shamrock-500i",
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{
"name":"Shamrock 750 Spectrograph",
"sorting_name":"shamrock 750 spectrograph",
"image":"/assets/components/phpthumbof/cache/shamrock-750-product.5b5c59477bf6bd3b5ee6bab963659793.png",
"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "The Andor Shamrock SR-750 is based on Czerny-Turner optical design. The Shamrock is available as a pre-aligned detector\/spectrometer option allowing for seamless integration of software, electronics, optics and detector. There is also a fast and interactive graphical software interface allowing full control of all the spectrograph functions.",
"outline_limited" : "The Andor Shamrock SR-750 is based on Czerny-Turner optical design. The Shamrock is available as a pre-aligned detector\/spectrometer option allowing for seamless integration of...",
"highlights" : "Pre-aligned, pre-calibrated detector & spectrograph,USB 2.0 interface,Motorized, indexed triple grating turret,Dual detector outputs,Multi-track enhanced option",
"overview" : "The Shamrock 750 offers the highest resolution of the Shamrock family, but is also well suited for applications requiring multi-track capabilities.\r\nThis rugged platform features a comprehensive range of light coupling accessories and gratings, and combines ideally with Andor’s market leading CCD, Electron Multiplying CCDs, InGaAs and Intensified CCDs.\r\nState-of-the-art Solis Spectroscopy software offer a dedicated and intuitive interface for spectrograph, detectors and motorized accessory control as well as easy detection parameter set-up.",
"features" : "",
"features_benefits" : "Pre-aligned, pre-calibrated detector & spectrograph - Motorized, individually factory-calibrated systems – out-of-the-box operation and seamless integration to experimental set-ups,USB 2.0 interface - Plug and play connectivity, ideal for laptop operation alongside Andor USB cameras,Motorized, indexed triple grating turret - Easily upgradable in-the-field,Dual detector outputs - For extended wavelength coverage when combining Andor UV-Visible CCD and InGaAs cameras. Compatible with Andor’s range of CCD, ICCD & EMCCD cameras,Multi-track enhanced option - Optimizes system performance for low cross-talk, high density multi-leg fibre signal acquisition,Wide range of accessories available - The ultimate in modular set-up and in-field upgradability,Silver-protected coated optics options - Most efficient for near-infrared detection when used in conjunction with Andor InGaAs cameras",
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"applications_frontend" : "Analysis of Environmental Contaminants, Characterisation of Catalyst Material, Characterisation of Low Dimensional Structures, Counterfeit Pharmaceuticals, Fabrication and Characterisation of Light Emitting Devices, Food Security, Forensic Soil Analysis and Other Trace Analysis, Gunshot Residue Analysis, Identification of Contaminants in Food Production and Soil, In-Situ Observation of Chemical Reactions, Material Composition and Structure, Materials for the Power Generation Industry, Measurement of Chemical and Molecular Composition, Measurement of Polymer and Polymer Phase Properties, Modular Optical Spectroscopy, Nanomaterial Growth and Characterisation, Quality Control and Chemical Identification",
"product_family" : "kymera-and-shamrock-spectrographs",
"product_family_frontend" : "Kymera & Shamrock Spectrographs",
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"idx": 198,
"page_id": 257,
"page_link" : "https://andor.oxinst.com/products/kymera-and-shamrock-spectrographs/shamrock-750",
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"name":"Shasta 2 Series X-ray Tube Power Supply",
"sorting_name":"shasta 2 series x-ray tube power supply",
"image":"/assets/components/phpthumbof/cache/Shasta-2%20Power%20Supply.7bc5d99992ba6593101094e200481557.png",
"content" : "",
"outline" : "Oxford Instruments Shasta 2 series power supply features a robust design that has been optimized to power grounded filament X-ray tubes from Oxford Instruments, yet its versatility enables it to power virtually any grounded filament X-ray tube.\r\nUtilizing closed loop emission control circuitry that delivers low ripple, Shasta provides highly regulated beam current and high stability resulting in superior performance. Local and remote analog control enables convenient operation in setting voltage & emission current.\r\nModels with grid focus control are designed to provide optimal performance with our Apogee tubes.",
"outline_limited" : "Oxford Instruments Shasta 2 series power supply features a robust design that has been optimized to power grounded filament X-ray tubes from Oxford Instruments, yet its versatility...",
"highlights" : "",
"overview" : "",
"features" : "",
"features_benefits" : "Compact Design - easy to integrate into benchtop systems,Digital and analog control - simple interface to a variety of systems,Filament pre-heat - quick startup times and long tube life",
"extended_tabs" : "\nXRF\nMedical Imaging\nIndustrial Inspection\nNDT\n",
"options" : "",
"accessories" : "",
"tags" : "X-ray Source Power Supply",
"businesses" : "x-ray-technology",
"businesses_frontend" : "X-Ray Technology",
"applications" : [ "analysis-of-environmental-contaminants","inspection-and-process-control","material-composition-and-structure","materials-for-the-power-generation-industry","process-mineralogy-and-chemical-analysis","solar-and-pv-technology","structural-materials-and-components","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Analysis of Environmental Contaminants, Inspection and Process Control, Material Composition and Structure, Materials for the Power Generation Industry, Process Mineralogy and Chemical Analysis, Solar and PV Technology, Structural Materials and Components, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "x-ray-tube-power-supply",
"product_family_frontend" : "X-ray Tube Power Supply",
"sorting_product_family" : "100",
"idx": 199,
"page_id": 476,
"page_link" : "https://xray.oxinst.com/x-ray-tube-products/x-ray-tube-power-supply/shasta-series",
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"name":"SHG and THG",
"sorting_name":"shg and thg",
"image":"/assets/components/phpthumbof/cache/SHG-titleimage.1180ed7fc07af33b653885befef58bd6.png",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nKey Features Sensitive detection of SHG and THG effects Diffraction-limited spatial resolution Flexible measurements under high\/low temperatures, high pressure, and magnetic fields Automatic polarization-resolved measurements Integration into the workflow manager for automatic recording of full sequences Correlative analysis of Raman, PL and SHG imaging Compatibility with RISE applications Fiber-coupled pulsed laser (standard at 1064 nm) Multiple options for tunable free-beam lasers (fs laser) What is SHG\nSecond Harmonic Generation (SHG) is a nonlinear optical process that converts two photons of incident light into a single photon of emission. SHG depends on the non-centrosymmetric symmetry of a material’s structure and is highly responsive to variations in crystal orientation, crystal symmetry, layer thickness, and stacking order.\n!generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"Materials\",\"tabTitle\": \"Material Sciences\",\"content\": !jsonEncode? &input=` SHG in 2D Material Sciences\nThe physical properties of 2D materials, including transition metal dichalcogenides (MX₂) and hexagonal boron nitride (hBN), are strongly influenced by factors such as crystal symmetry, thickness, and stacking order. Combined with atomic force microscopy (AFM) and piezoresponse force microscopy (PFM), SHG is a valuable tool for analyzing the properties of piezoelectric and ferroelectric materials.\nPhotoluminescence (PL), SHG and PFM phase image of a lithographic drawing of a rabbit in lead zirconate titanate (PZT). Image courtesy: Oxford Instruments\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nPolarization-resolved SHG for crystal orientation analysis\nPolarization-resolved SHG measurements provide detailed insights into the crystal orientation in 2D materials, enabling precise structural characterization and analysis of grain alignment.\nSHG images of a 2D material heterogeneous structure at different polarization angles of the exciting light (0° red, 60° blue, 120 ° green), showing the different orientation of individual grains. Image courtesy: Oxford Instruments.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nHigh-resolution visualization of grain boundaries with SHG\nSHG imaging is highly sensitive to grain boundaries in 2D materials, as demonstrated on this example of an MoS₂ flake. Polarization-resolved SHG revealed differences in crystal orientation between grains and detected strain fields, based on the asymmetric patterns in the polar plots at the different positions in the flake.\nRead more about the correlative analysis of MoS₂ using Raman, SHG and PL in our Application Note.\nAnalysis of a MoS₂ flake. Left: Raman image; Middle: SHG image; Right: Polar plot of polarization-resolved SHG measurments at different positions within the flake. Image courtesy: Oxford Instruments\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"LifeScience\",\"tabTitle\": \"Life Sciences\",\"content\": !jsonEncode? &input=` SHG and THG in Bio-imaging\nNonlinear optical microscopy for bio-imaging provides deep insights into tissue morphology, structure, and cellular organization. It is commonly applied in cell biology, developmental biology, and disease research.\nSHG imaging visualizes non-centrosymmetric structures, such as collagen in the extracellular matrix (ECM) and myosin filaments, offering information on tissue remodelling, cell migration, and fibrosis. THG imaging detects structural interfaces, enabling label-free imaging of cellular and subcellular features, including membranes, organelles, and lipid droplets, in their natural state.\nSHG and THG imaging of subcutaneous tissue. Left: SHG-brightfield image overlay; Right: THG-brightfield overlay visualizing fat cells (red) and fat cell membranes (blue). Sample courtesy: Prof. Jiang Chunhuan, Changchun Institute of Applied Chemistry, CIAC CAS, China.\n`}}` !If? &subject=`` &operator=`notempty` &then=`` &else=``\nLiterature Application Note Correlative Imaging of 2D Material Heterostructures: Raman, PL and SHG Find out more Application Note Correlative High-resolution Imaging of TMDs Open PDF\n!If? &subject=`` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`` &formTpl=`protected-form-wrapper` &unique_id=`0`\n` Application Note Confocal Raman Imaging and Correlative Techniques in Life Science Find out more\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`468540`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"businesses" : "raman",
"businesses_frontend" : "Raman",
"applications" : [ "life-science","materials-science","2d-materials" ],
"applications_frontend" : "Life Science, Materials Science, Nano-Carbon & 2D Materials",
"product_family" : "imaging-options",
"product_family_frontend" : "Imaging Options",
"sorting_product_family" : "100",
"idx": 200,
"page_id": 29260,
"page_link" : "https://raman.oxinst.com/products/imaging-options/shg-thg",
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{
"name":"Scanning Near-field Optical Microscopy (SNOM)",
"sorting_name":"snom",
"image":"/assets/components/phpthumbof/cache/SNOM-principle.8a25ce955c528c01169031c90592d067.png",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nKey Features Seamless combination of high-resolution surface imaging (SNOM) and molecular information (Raman) in one device Resolution capabilities beyond the diffraction limit down to ~60 nm laterally Patented cantilever-based SNOM sensor technique for increased flexibility and stability SNOM imaging in transmission or reflection mode with optional fluorescence setup Highly sensitive video camera to view sample and SNOM tip in transmission Microscope base with active vibration isolation system Integrated measurement control and data analysis via the witec360’s Software Suite Compatibility with AFM and other correlative imaging techniques !If? &subject=`` &operator=`notempty` &then=`` &else=`` The SNOM Principle\nSNOM pushes the boundaries of optical imaging by exploiting the “near-field” (evanescent field) created when laser light is focused through the small aperture of a SNOM tip. Its diameter determines the optical resolution, typically 60 – 100 nm. To generate an optical image, the sample is scanned point-by-point and line-by-line beneath the aperture. Simultaneously, a beam deflection setup similar to that used in AFM contact mode ensures that the cantilever maintains constant contact with the sample surface. This approach allows for a simultaneous acquisition of both topographical and optical data, providing a detailed view of the sample’s surface.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Cantilever-based SNOM sensor technique \nThe SNOM option in witec360 microscopes operates using unique, microfabricated near-field active sensor tips and highly sensitive photon detectors. The sensor tip is magnetically held at the end of the objective’s arm, enabling simultaneous control of both the cantilever and the sample position. !If? &subject=`` &operator=`notempty` &then=`` &else=``\nApplication Examples\nSNOM image of a surface plasmon-polariton wave launched on a nano-structured metal grid.\nSNOM image of a cellular nucleus.\nSNOM image of human chromosomes in the metaphase.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`599375`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"businesses" : "raman",
"businesses_frontend" : "Raman",
"applications" : [ "life-science","materials-science","2d-materials" ],
"applications_frontend" : "Life Science, Materials Science, Nano-Carbon & 2D Materials",
"product_family" : "imaging-options",
"product_family_frontend" : "Imaging Options",
"sorting_product_family" : "100",
"idx": 201,
"page_id": 29285,
"page_link" : "https://raman.oxinst.com/products/imaging-options/snom",
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{
"name":"Software Development Kit",
"sorting_name":"software development kit",
"image":"/assets/components/phpthumbof/cache/sdk-logo.a3990320135f534b4f49ddb903d748e1.png",
"content" : "",
"outline" : "The Andor Software Development Kit (SDK) gives the programmer access to the Andor camera and spectrograph range. The key part of the SDK is the dynamic link library which can be used with a wide variety of programming environments including C, C++, C#, Visual Basic and LabVIEW. Additionally, Andor’s SDK comes with an in built Python wrapper as standard for full integration between the SDK and Python scripts. Dedicated, separate SDKs are available for Windows, LabVIEW, Matlab or Linux - user must specify the appropriate platform at time of order.",
"outline_limited" : "The Andor Software Development Kit (SDK) gives the programmer access to the Andor camera and spectrograph range. The key part of the SDK is the dynamic link library which can be...",
"highlights" : "Programming access to the Andor product range, Compatible with Windows 8, 10 and Linux<\/p>,32-bit and 64-bit versions available,Control CCD temperature and shutter operations,Save and read files",
"overview" : "The Andor Software Development Kit (SDK) gives the programmer access to the Andor camera and spectrograph range. The key part of the SDK is the dynamic link library which can be used with a wide variety of programming environments including C, C++, C#, Visual Basic and LabVIEW.\r\nThe SDK provides a suite of functions that allow you to configure the data acquisition process in a number of different ways. There are also functions to control the CCD temperature and shutter operations, and to save and read files. The driver will automatically handle its own internal memory requirements.\r\nTo use the SDK effectively the user must develop a software package to configure the acquisition, provide memory management, process the data and create the software interfaces.\r\nThe library is compatible with Windows 8 and 10. Currently Andor provides both 32-bit and 64-bit versions of the SDK. A Linux version of the SDK is also available.",
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"businesses" : "andor",
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"applications" : [ "nanomaterial-growth-and-characterisation","measurement-of-chemical-and-molecular-composition","battery-technology","gunshot-residue-analysis","forensic-soil-analysis-and-other-trace-analysis","analysis-of-environmental-contaminants","material-composition-and-structure","characterisation-of-low-dimensional-structures","fabrication-and-characterisation-of-light-emitting-devices","modular-optical-spectroscopy","characterisation-of-catalyst-material","food-security","quality-control-and-chemical-identification","in-situ-observation-of-chemical-reactions","fluorescence-microscopy","counterfeit-pharmaceuticals","rock-core-analysis" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Measurement of Chemical and Molecular Composition, Battery Technology, Gunshot Residue Analysis, Forensic Soil Analysis and Other Trace Analysis, Analysis of Environmental Contaminants, Material Composition and Structure, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, Modular Optical Spectroscopy, Characterisation of Catalyst Material, Food Security, Quality Control and Chemical Identification, In-Situ Observation of Chemical Reactions, Fluorescence Microscopy, Counterfeit Pharmaceuticals, Rock Core Analysis",
"product_family" : "software-development-kit",
"product_family_frontend" : "Software Development Kit (SDK)",
"sorting_product_family" : "100",
"idx": 202,
"page_id": 253,
"page_link" : "https://andor.oxinst.com/products/software-development-kit/software-development-kit",
"weight" : 0,
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{
"name":"Solis I",
"sorting_name":"solis i",
"image":"/assets/components/phpthumbof/cache/955d864a150272160090244747210303416.9dfbedfc6b9e5db2551d0f27305319a0.png",
"content" : "",
"outline" : "The Andor Solis (i) software platform is designed for image capture and analysis and is used in a wide range of scientific fields including fluorescence imaging, Bose-Einstein Condensation, single fluorophore labelling, upper atmosphere studies, X-ray studies and Raman imaging.",
"outline_limited" : "The Andor Solis (i) software platform is designed for image capture and analysis and is used in a wide range of scientific fields including fluorescence imaging, Bose-Einstein...",
"highlights" : "",
"overview" : "The Andor Solis (i) software platform is designed for image capture and analysis and is used in a wide range of scientific fields including fluorescence imaging, Bose-Einstein Condensation, single fluorophore labelling, upper atmosphere studies, X-ray studies and Raman imaging.\r\nThe Solis (i) software contains a comprehensive list of edge-detection algorithms including first derivative (Sobel, Kirsch, Prewitt and Robinson), second derivative and the Roberts Cross edge detector. Smoothing filters include the Mean, Median and Gaussian filters while in the frequency space Solis includes Low Pass and High Pass filtering.\r\nSolis (i) provides the user with full control over the camera including pixel readout rate, horizontal and vertical binning, exposure time, pre-amplifier setting, electron multiplying gain (EMCCD compatible systems) and various triggering options.\r\nThe software's region of interest (ROI) feature allows the user to chart in real time such quantities as maximum, mean and standard deviation as a kinetic series of images is acquired.",
"features" : "",
"features_benefits" : "Real-time image display (video mode) ideal for aligning experiments - ,Advanced data spooling direct to hard disk allowing large data sets to be acquired - ,Increase your signal above the read noise floor with RealGain™ control (EMCCD compatible systems only) - ,Minimize vibrations with \"Silent Fan\" operation - ,Kinetic series recording and playback - ,Through-series ROI analysis simple generation of kinetic plots, utilizing ROI statistics - ,Various real-time and playback display options, including 3D profile - ,Comprehensive image analysis operations - ,Extensive export options, including FITS, TIF, BMP and AVI - ,Extended AndorBasic programming language - ,Real-time X and Y line profile sectioning - ,Simple multiple region-of-interest(ROI) selection and sizing - ,ROI \"hot spot\" selection for discrimination of background pixels within ROI - ,Intuitive and comprehensive user-defined thresholding and auto-scaling - ,Data histogram enabling easy image display data scaling - ",
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"businesses" : "andor",
"businesses_frontend" : "Andor",
"applications" : [ "optical-imaging-systems","fluorescence-microscopy","automotive-engines","battery-technology","material-composition-and-structure","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Optical Imaging Systems, Fluorescence Microscopy, Automotive Engines, Battery Technology, Material Composition and Structure, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "solis-software",
"product_family_frontend" : "Solis Software",
"sorting_product_family" : "100",
"idx": 203,
"page_id": 226,
"page_link" : "https://andor.oxinst.com/products/solis-software/solis-i",
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"name":"Solis S",
"sorting_name":"solis s",
"image":"/assets/components/phpthumbof/cache/850af92f150272238730504983810438014.9dfbedfc6b9e5db2551d0f27305319a0.png",
"content" : "",
"outline" : "For spectroscopy applications, the Andor Solis (s) is the appropriate software platform. It has been specifically tailored to enable the user to quickly configure their acquisition, capture the data and display and process results in a user-friendly manner. The user can also control Andor's range of Spectrographs in a direct and responsive manner.",
"outline_limited" : "For spectroscopy applications, the Andor Solis (s) is the appropriate software platform. It has been specifically tailored to enable the user to quickly configure their...",
"highlights" : "Full spectrograph and camera control,View your data in 2D, 3D, stacked and overlaid,Data export options SIF, GRAMS, ASCII XY, FITS,Easy automation of your experiment with additional commands,Automatic spectral line identification",
"overview" : "For spectroscopy applications, the Andor Solis (s) is the appropriate software platform. It has been specifically tailored to enable the user to quickly configure their acquisition, capture the data and display and process results in a user-friendly manner. The user can also control Andor's range of Spectrographs in a direct and responsive manner.",
"features" : "",
"features_benefits" : "Full spectrograph and camera control within the same package - ,Flexible data display: view your data in 2D, 3D, stacked and overlaid - ,Data export options SIF, GRAMS, ASCII XY, FITS - ,Easy automation of your experiment with additional commands added to the AndorBasic programming language - ,User defined background and data colours allow the user to optimise the screen under low light or low contract monitors - ",
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"businesses" : "andor",
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"applications" : [ "nanomaterial-growth-and-characterisation","measurement-of-chemical-and-molecular-composition","gunshot-residue-analysis","forensic-soil-analysis-and-other-trace-analysis","analysis-of-environmental-contaminants","material-composition-and-structure","measurement-of-polymer-and-polymer-phase-properties","characterisation-of-low-dimensional-structures","fabrication-and-characterisation-of-light-emitting-devices","modular-optical-spectroscopy","characterisation-of-catalyst-material","food-security","quality-control-and-chemical-identification","in-situ-observation-of-chemical-reactions","counterfeit-pharmaceuticals","identification-of-contaminants-in-food-production-and-soil" ],
"applications_frontend" : "Nanomaterial Growth and Characterisation, Measurement of Chemical and Molecular Composition, Gunshot Residue Analysis, Forensic Soil Analysis and Other Trace Analysis, Analysis of Environmental Contaminants, Material Composition and Structure, Measurement of Polymer and Polymer Phase Properties, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, Modular Optical Spectroscopy, Characterisation of Catalyst Material, Food Security, Quality Control and Chemical Identification, In-Situ Observation of Chemical Reactions, Counterfeit Pharmaceuticals, Identification of Contaminants in Food Production and Soil",
"product_family" : "solis-software",
"product_family_frontend" : "Solis Software",
"sorting_product_family" : "100",
"idx": 204,
"page_id": 227,
"page_link" : "https://andor.oxinst.com/products/solis-software/solis-s",
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"name":"Solis T",
"sorting_name":"solis t",
"image":"/assets/components/phpthumbof/cache/83adc922150272288826185555510427438.791390d1324ffedb5ffe0b5054eaa71c.png",
"content" : "",
"outline" : "The Andor Solis (t) software platform is the option for time resolved work and has additional features to enable control of the iStar camera range. Applications include Laser Induced Breakdown Spectroscopy (LIBS), Laser Induced Fluorescence (LIF), combustion and Time-resolved Resonance Raman Spectroscopy.",
"outline_limited" : "The Andor Solis (t) software platform is the option for time resolved work and has additional features to enable control of the iStar camera range. Applications include Laser...",
"highlights" : "Easy configuration of the built-in Digital Delay Generator,Improved signal-to-noise,Advanced data spooling direct to hard disk,Real-time Photon Counting mode",
"overview" : "The Andor Solis (t) software platform is the option for time resolved work and has additional features to enable control of the iStar camera range. Applications include Laser Induced Breakdown Spectroscopy (LIBS), Laser Induced Fluorescence (LIF), combustion and Time-resolved Resonance Raman Spectroscopy.",
"features" : "",
"features_benefits" : "Easy configuration of the built-in Digital Delay Generator (DDG™) allowing you to fully control your ultra-fast gating requirements with minimum fuss - ,Improved signal-to-noise with the \"Integrate On Chip\" function - ,Advanced data spooling direct to hard disk allowing large data sets to be acquired - ,Automatically locate your light pulse with Andor's unique temporal \"Find Pulse\" feature: automatically scans the optical window to locate the time period with the highest signal for a given time window, then sets the gate delay and width appropriately - ,Real-time Photon Counting mode enables you to watch your data build at even very low flux levels - ",
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"applications_frontend" : "Automotive Engines, Material Composition and Structure, Characterisation of Low Dimensional Structures, Fabrication and Characterisation of Light Emitting Devices, Optical Imaging Systems, Modular Optical Spectroscopy",
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"content" : "Customer Publications Powered by Bioz See more details on Bioz",
"outline" : "Sona is Andor’s latest high performance sCMOS camera series, specifically for life science imaging applications. The new and enhanced Sona-6 Extreme is now more sensitive and faster! An exceptional combination of sensitivity, speed and resolution for optimal imaging performance across many applications.",
"outline_limited" : "Sona is Andor’s latest high performance sCMOS camera series, specifically for life science imaging applications. The new and enhanced Sona-6 Extreme is now more sensitive and...",
"highlights" : " 95% QE & -45 °<\/sup>C cooling<\/strong> - most sensitive back-illuminated sCMOS available<\/p>, Up to 135 fps full frame<\/strong> – follow dynamic processes without smear<\/p>, > 99.7% linearity<\/strong> – superb quantitative accuracy across full dynamic range<\/p>, 6.5 µm & 11µm pixel size options<\/strong> <\/strong><\/span><\/span> <\/strong>– suit most magnifications & applications<\/p>, SRRF-Stream+ technology <\/strong>- resolve detail to ~100 nm from a normal microscope<\/p>",
"overview" : "Sona is Andor’s latest high performance sCMOS camera series, specifically developed for life science imaging applications. All Sona models feature the latest back-illuminated sCMOS sensor technology with 95% Quantum Efficiency (QE). Sona exploits Andor’s technical know how as a leader in sCMOS technology to extract the very best from these new generation sensors. Sona is the only back-illuminated sCMOS camera with a permanent vacuum technology for unmatched longevity and deepest cooling. \r\nNew Sona-6 Extreme\r\n\r\n Back-illuminated 4.2 Megapixel sensor with 6.5 µm pixels. This format matches perfectly with modern microscope port sizes and provides optimal resolution for the widely used 40x and 60x magnifications. A QE of 95% maximizes signal collection, which when combined with thermoelectric cooling to -45°C, results in an ultra-low noise floor, and the highest possible sensitivity for demanding low-light applications.\r\n The Sona-6 just got more sensitive and even faster! With “Sona Extreme” we have boosted the capabilities of the Sona-6 to the maximum. Read noise has been reduced by over 25% to boost detection. A new High-Speed mode accelerates the sensor to a stunning 135 fps! Image quality has also been enhanced with PRNU improved by 25%! So whether you are capturing the faintest signals, or dynamic processes of the cell, the latest Sona-6 is sure to provide exceptional imaging performance.\r\n\r\nSona-11\r\n\r\n Sona-11 (32 mm) provides the largest sensor available for microscopy with an amazing 32 mm sensor diagonal! This has been made possible by unique technologies such as AntiglowTM to unlock the full sensor array. With the Sona-11 you can see much more in each image than any other competing camera. Capture more data. Boost productivity. The 95% QE back-illuminated sensor and large 11µm pixel size delivers optimal photon collection under light-starved applications like TIRF, confocal and SMLM.\r\n Sona-11 (22 mm) offers the sensor in a 22 mm format maximising field of view from the standard C-mount fitting.\r\nBoth the Sona-6 and Sona-11 are real-time super-resolution capable. Reveal the hidden details of the cell to 100 nm with a Sona camera and our exclusive SRRF-Stream+ technology!",
"features" : "",
"features_benefits" : "95% QE & lowest noise - Observe live cells over longer durations \/ measure more accurate physiology,4.2 Megapixel & 32 mm F-mount: Sona-11 (32mm) - Maximum field of view and sensitivity, capture maximum field of cells and large tissue samples. Easily adaptable to 60x and 40x objectives. Combine with inbuilt microscope magnification or optional Magnifying Coupler Unit (MCU) - preserve optical clarity over a range of sample types.,2.0 Megapixel and 22 mm C-mount: Sona 11 (22mm) - All the benefits of the Sona-11 (32 mm) but in a C-mount format for microscopes up to 22 mm field of view,4.2 Megapixel C-mount (Sona-6) - Ideal for applications that will benefit from the smaller 6.5 µm pixel size. Perfectly suited to 40x and 60x magnifications with a combination of sensitivity, speed and resolution. Low noise mode uses correlated multi-sampling to achieve a flat and clean image without affecting frame rate. HDR and High Speed modes enable dynamic events of the cell to be captured with ease.,Vacuum Cooled to -45 °C - The weakest signals require the lowest noise floor: Don’t be limited by camera thermal noise!,The ONLY vacuum back-illuminated sCMOS - Andor's exclusive vacuum technology is not found on any other back-illuminated camera. It protects the sensor from (a) QE degradation, and (b) moisture condensation. Backed up with a 5-year warranty on the sensor chamber.,Anti-Glow Technology (Sona 11) - Allows access to full 4.2 Megapixel array with long exposures often needed for weak signals– maximize field of view and sensitivity advantages.,High speed imaging - Image highly dynamic samples without signal smear - e.g. cell motility, membrane dynamics, ion flux, blood flow (Sona-11: 48 fps and Sona-6: 135 fps).,Extended Dynamic Range mode - Don’t lose part of your image data. 'One snap quantification' across the widest possible signal range (Sona-11: 53,000:1, Sona-6: 26,250:1) - measure challenging samples such as neurons with ease.,> 99.7% linearity - Market leading quantitative accuracy over the whole signal range – have confidence in data in concentration and rates measurements.,Unlock Super-resolution to ~100 nm - Convert your conventional microscope to super-resolution capabilities with our exclusive easy and flexible real-time super resolution (SRRF-Stream+).,User configurable ROI - Adapt to a range of microscope port sizes. Push frame rates and save data storage space.,Fan and Water cooling as standard - Water cooling for maximum sensitivity and highly vibration sensitive set-ups, e.g. super-resolution and electrophysiology,High Speed Interfaces - All Sona models have USB 3.0 (USB 3.1 Gen 1) for a convenient high-speed interface. To push the highest speeds, use coaXPress on the Sona-6 for the fastest possible data transfer rates.,Take control with Python - Integrated python SDK wrapper and documentation for self-build and custom system community",
"extended_tabs" : "\n \n \n \n Key Specifications\n Sona-11\n Sona-6\n \n \n Sensor Type\n GPixel GSENSE 400BSI back-illuminated\n GPixel GSENSE 2020BSI back-illuminated\n \n \n Active Pixels\n Sona-11 (32mm) 2048 x 2048Sona-11 (22mm) 1400 x 1400\n 2048 x 2048 \n \n \n Sensor Size\n Sona-11 (32 mm) 22.5 mm x 22.5 mm (32mm diagonal)Sona-11 (22mm) 15.5 mm x 15.5 mm (22 mm diagonal)\n 13.3 mm x 13.3 mm (18.8 mm diagonal) \n \n \n Pixel Size\n 11 μm\n 6.5 μm\n \n \n Read Noise (median)\n 1.6 e- (all modes) \n 1.0 e- (12-bit low noise mode)1.6 e-(16-bit HDR mode)1.8 e- (11-bit HS mode)\n \n \n Maximum Quantum Efficiency\n 95%\n \n \n Dark current (at min. cooling)\n 0.3e-\n 0.1e-\n \n \n Pixel well depth\n (12-bit mode)85,000 e-(16-bit mode) \n 1,100 e- (12-bit low noise mode)42,000 e-(16-bit HDR mode)1,800 e- (11-bit HS mode)\n \n \n Maximum dynamic range\n 53,000:1(16-bit mode)\n 26,250:1(16-bit HDR mode)\n \n \n Linearity\n Better than 99.7%\n \n \n Photon Response Non-Uniformity (PRNU)\n Better than 0.5%\n \tBetter than 0.3% (High Dynamic Range mode)\n \n \n Data range\n 12 bit (fastest frame rates) 16 bit (max dynamic range)\n 12 bit (low noise 2-CMS mode)16 bit (High Dynamic Range mode)11-bit (High Speed mode)\n \n \n Interface\n USB 3.0 \n USB 3.0CoaXPress (2 lane)\n \n \n \n,The Sona series has been designed to extract the very best from the latest back-illuminated sensors. Sona features a range of exclusive technologies so you get a camera that can detect more and capture the true dynamics of the cell in greater precision. Some of the key technologies are outlined below:\n\nPermanent Vacuum Technology \nSona is the only back-illuminated camera with a permanent hermetically sealed sensor enclosure. This exclusive vacuum technology provides the ultimate reliability and maintains the performance of the sensor year after year. Backed up by a 5-year chamber integrity warranty.\nDeep Cooling\nA further benefit of the vacuum technology is when combined with effective thermoelectric cooling is that precise, stable and flexible cooling is possible. Market leading cooling to -25°C with air cooling, and -45°C with liquid assisted cooling provides the lowest possible thermal noise and thus the lowest noise floor. This allows Sona to operate over a wider range of exposure ranges than other competing sCMOS cameras with less capable cooling. The excellent cooling capacity of Sona minimises dark current and other hot pixels. Sensor temperature can be held stable even when running high frames. The best image quality and detection of the weakest signals can be achieved.\n\n\n\nAnti-Glow: Accessing the Entire Sensor Array (Sona-11 32mm)\nThe GSense400 back-illuminated sensor from GPixel is widely recognised to suffer from glow at the edges of the sensor. This glow manifests as false signal and is exposure dependent. To date, the effect has forced camera manufacturers to either limit the usable region of the sensor to an array size notably smaller than the native 2048 x 2048 full resolution, or alternatively to impose a severe 30 millisecond restriction on the maximum exposure length that is permitted by the camera. Either way this fundamentally restricts performance and usefulness across a range of applications, either through field of view limitation or through sensitivity limitation.\nAndor characterised this sensor issue and developed a unique anti-glow technology to tackle this problem for the Sona-11 camera. The figure below shows a dark image of the GSense 400 back-illuminated sensor with and without Anti-glow technology – the difference it makes is stark. Andor can open up the full 2048 x2048 array, while also greatly extending the exposure time. With the full 32 mm field of view, you get the full benefits of this sensor.\nCamera based Super-resolution\nUnlock super-resolution from your microscope with Sona and SRRF-Stream+. Sona sCMOS cameras are compatible with our real-time super-resolution technology. Flexible and easy to use, and compatible with normal labelling, SRRF-Stream+ provides a cost-effective way to achieve ~100 nm resolution. Discover how super-resolution may add value to your research at SRRF-Steam | Super Resolution Software - Andor - Oxford Instruments (oxinst.com)\nExtended Dynamic Range\nThe innovative Dual Amplifier architecture of sCMOS sensors uniquely circumvents the need to choose between high or low gain amplifiers, in that signal can be sampled simultaneously by both high gain (low noise) and low gain (high capacity) amplifiers. As such, the lowest noise of the sensor can be harnessed alongside the maximum well depth, affording widest possible dynamic range. Uniquely for such a relatively small pixel design, this allows for dynamic range performance of 26,250:1 for the Sona-6, and an impressive 53,000:1 in Sona-11. Challenging samples like neurons can be imaged with biologically relevant information in the weaker distal regions and brighter central regions all in a single snap.\n\nQuantitative Accuracy\nThe primary aim of any detector is to respond accurately and precisely to the signal. The response must be accurate over a range of signal (linearity), and across all pixels over the full sensor (sensor uniformity). The on-camera intelligence of the Sona delivers a significant linearity advantage, providing unparalleled quantitative measurement accuracy of >99.7% across the full dynamic range. This provides confidence in any applications where signal intensity indicates local concentration, e.g. ion flux, FRET and expression analysis. Each camera is carefully configured and optimised to ensure edge-to-edge uniformity. Aside from quantitative measurements it is also relevant to stitched images where uniformity issues would otherwise reveal clear tiled effects.\nCorrelated Multi-Sampling (Sona-6)\n\n \n \n \n Sona-6 Mode\n Low-Noise Mode (2-CMS)\n HDR Mode\n High Speed Mode\n \n \n Bit Depth\n 12-bit\n 16-bit\n 11-bit\n \n \n Max Frame Rate\n 43 fps\n 74 fps\n 135 fps\n \n \n Normal Read Noise (median)\n 1.0 e-\n 1.6 e-\n 1.8 e-\n \n \n Well Depth\n 1,100 e-\n 42,000 e-\n 1,800 e-\n \n \n \n\nHigh-Speed Imaging\nAll Sona camera offer superb high speed imaging capabilities. Each camera is carefully configured so that the noise floor is kept to the minimum to avoid negatively impacting the signal to noise. High speed interfaces such as CoaXPress provide stable high-speed operation.\nSona-11 series offers up to 48 fps at full 32 mm field of view, and 70 fps in the 22 mm model.\nFor even greater speeds, Sona-6 offers exceptional performance. In full 16-bit dynamic range up to 74 fps is possible. A new High Speed mode Sona-6 pushes the fastest available speeds from the GS2020BSI sensor up to 135 fps! This stunning speed fully exploits the 2-lane CoaXPress connection of Sona. Need to go even faster? Faster speeds are available through Region of Interest (ROI) selection, scaling only with ROI height, i.e. a full width ROI provides the same frame rate as a reduced with ROI, as long as they share the same number of rows. This can be useful for imaging elongated samples at fast frame rates, such as measuring calcium flux in smooth muscle cells, or blood flow studies.\nHardware Timestamp\nThe Sona platform can generate a timestamp for each image that is accurate to 25 ns. Accurate timestamps can be important where precise knowledge of frame time impacts temporal dynamic analysis. This is especially important for fast events, where computer and interface latencies need to be considered. Areas include signalling cascades, vesicle trafficking, lipid dynamics, synaptic re-modelling, action potential studies using opto-genetics and opto-physiology. Timestamps can also be useful for FRAP Analysis, facilitating the estimation of diffusion rates.",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nContact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`682260`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"name":"Spectromag<\/b>PT",
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"content" : "12692",
"outline" : "A magneto-optical Cryofree® superconducting magnet system. ",
"outline_limited" : "A magneto-optical Cryofree® superconducting magnet system. ",
"highlights" : " 7 T magnetic field in a compact geometry<\/p>, Integrated variable temperature insert providing sample temperatures between 1.6 and 300 K<\/p>, Excellent optical access in the horizontal plane, both parallel and perpendicular to the magnetic field<\/p>",
"overview" : "SpectromagPT is a split pair, horizontal field magneto-optical Cryofree superconducting magnet system. It provides optical access to a sample in a variable magnetic field and low temperature environment.\r\n\r\n\r\n7 T magnetic field in a compact geometry\r\n\r\n\r\nThe sample can be changed while the system is cold. No need for a complicated load-lock mechanism\r\n\r\n\r\nSealed circulation loop reduces the risk of contamination and blockages, increasing the continuous running period of this system\r\n\r\n\r\nExcellent optical access in the horizontal plane (both parallel and perpendicular to the magnetic field)\r\n\r\n\r\nUses the highest specification magnet superconducting wire available on the market and advanced construction techniques to ensureultimate performance and reliability\r\n\r\n1 year standard warranty\r\n",
"features" : "Flexible: Wide range of experimental inserts to suit many applications\r\nFast experiment: Quick sample change via top-loading probe\r\nOptical excellence: Excellent optical access in the horizontal plane, both parallel and perpendicular to the magnetic field\r\nEasy to use: Enables full sample rotation for measurements",
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"extended_tabs" : "Temperature range: 1.6 K to 300 K\nStandard sample probe temperature stability: ± 0.1 K\nSystem cooldown: ~ 40 hours from room temperature to 4 K\nStandard sample probe cooldown: ~ 90 minutes from room temperature to < 5 K (probe loaded into cold variable temperature insert)\nContinuous system operation: Typically > 4 weeks\nMagnet ramp to full field: ≤ 60 minutes\nVaraible temperature insert sample space diameter: 30 mm nominal,A typical system comprises of:\n\nCryostat\nOptical Windows\nMagnet and Power Supply\nVariable Temperature Insert and Controller\nSample Probe\nCryocooler and Compressor\nAccessories and Manuals\n,\nMagneto circular dichroism\nRaman spectroscopy\nPhotoluminescence\nFaraday effect measurements\nOptical characterisation of nano-devices \/ quantum dots\n",
"options" : "Optical Windows\r\nVariable Temperature Inserts",
"accessories" : "MercuryiTC,MercuryiPS",
"tags" : "spectroscopy techniques,material characterisation,Magneto-transport Measurements,superconducting magnets,magneto-optical measurements",
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"image":"/assets/components/phpthumbof/cache/Newton-CCD-Camera.858546bb17fa655f3458499328961565.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nFront-Illuminated (FI) CCD camera\nA front-illuminated CCD is characterized by a broad range of possible applications and wavelengths, generally oriented toward budget-conscious or basic experimental setups.\nBack-Illuminated (BI) CCD camera\nWith a quantum efficiency of 95% or more, a back-illuminated CCD sets the industry standard for efficient Raman signal detection in the visible range. Compared to a front-illuminated CCD, they offer twice the quantum efficiency and are therefore suitable for precise and sensitive FAST RAMAN IMAGINGR at the highest lateral resolution. (UV-optimized versions are also available.)\nElectron-Multiplying (EM) CCD camera\nFor sophisticated and leading-edge Raman applications, an EM CCD provides the most advanced readout capabilities for low light-level detection or ULTRA-FAST RAMAN IMAGING. Readout-speed can be as low as 760 µs per spectrum (1300 spectra\/s) and dark currents as low as 0.0001 electrons\/pixel per second.\nOpen Electrode (OE) CCD camera\nThe open electrode (OE) CCD is a front-illuminated camera that enables the acquisition of almost the entire spectral bandwidth and is specifically well-suited to measurements in the UV. In order to achieve state-of-the-art signal-to-noise ratios it features a low dark current and a multi-purpose camera functionality for various applications.\nLow Dark-Current Deep Depletion CCD camera\nNear-infrared (NIR) spectroscopic measurements of Raman and photoluminescence (PL) require specialized CCD detectors to prevent the spectral data from being influenced by “etaloning”, an effect that occurs when the Si-CCD chip materials become increasingly transparent to light at longer wavelengths. With the low dark-current deep depletion technology provided by this detector, critical NIR and PL experiments can be performed without signal loss.\nInGaAs linear array detector\nFor scattering experiments above the Si-bandgap of approximately 1100 nm Oxford Instruments supplies state-of-the-art Indium-Gallium-Arsenide (InGaAs) linear array detectors allowing for spectral imaging in the IR (up to 1700 nm) with peak quantum efficiencies near 90%.\nLearn more\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`370585`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"name":"Suite SEVEN – Measurement Control and Data Analysis ",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` New Features DataTrace: Archives measurement and processing steps and features metadata viewer with time stamps and export parameters for reproducibility Enhanced Project Manager: Provides tool bar with search, hierarchical data structure and selective display of data objects Spectral Certification*: Uses the spectrum of a reference sample to verify system calibration with standardized data. Advanced Cosmic Ray Removal**: Facilitates the detection, selection and removal of cosmic rays. Key Features TrueOrigin: Portable coordinate system: Locates the same sample area in different measurements and even different microscopes Workflow Manager*: Streamlines your optimized and standardized measurement workflows State Manager: Defines and retrieves your standard microscope operation settings Multi-user Management*: Defines access rights associated with each user account\n* cost option ** Suite SEVEN+ feature !If? &subject=`` &operator=`notempty` &then=`` &else=``\nExplore the WITec Software Packages Suite SEVEN Instrument configuration and control High-speed data acquisition Data evaluation and processing \nFind out more Suite SEVEN+ All basic package features included Advanced tools for data processing TrueComponent Analysis \nFind out more Additional Software ParticleScout TrueMatch Multi-user Management\nExplore options !If? &subject=`` &operator=`notempty` &then=`` &else=``\nThe WITec Suite SEVEN basic software package\nThe Suite SEVEN basic software modules offer you powerful platforms for instrument control and sophisticated data analysis. Instrument Control One intuitive software package for all measurement modes Optimized user interface depending on the measurement mode User-customizable standard configurations for recurring measurements via the State Manager High-speed data acquisition and processing through intelligent computer resource management (>1300 Raman spectra per second) TrueScanTM for exact positioning even at the fastest scan rates All features of the Project SEVEN package included for on- and offline data evaluation and post processing TrueOrigin, Oxford Instruments' portable coordinate system for witec360 microscopes that maps a sample in relation to prominent features on the specimen itself or its holder. It expedites the correlation of data acquired by multiple techniques from the same position, even when the sample is moved between instruments. Imported images recorded with an external camera or a different microscope can be used for sample navigation. TrueOrigin is compatible with the Shuttle & Find system from ZEISS. Data Evaluation and Processing Accessing metadata of imaging settings and data analysis steps via DataTrace Guidance through all steps of data processing and image generation (Software Wizard) Graph Demixer: Subtraction or addition of spectra with adjustable weighting factors Multiple algorithms for background subtraction and cosmic ray removal Curve-fitting tool for single spectra, including: several pre-defined fit functions (such as Gaussian, Lorentzian and pseudo-Voigt functions), multiple peak fitting and programming of user-defined functions Spectral peak finder and labeling Import of external images for consistent project documentation Data export to various formats, including ASCII, JCamp-DX, SPC, MATLAB, Zeiss CZI and HDF5 Included demo versions of all features of Project SEVEN+ !If? &subject=`` &operator=`notempty` &then=`` &else=``\nThe Project SEVEN+ package: Advanced data analysis\nProject SEVEN+ is a software extension for advanced data evaluation and processing. A variety of intelligent algorithms and tools facilitate specialized, expert-level analysis and visualization. Project SEVEN+ is available as single user license. All SEVEN+ features are included as demo versions in Project SEVEN. Key features Advanced Cosmic Ray Removal tool Cluster analysis (automatic classification, average spectra generation and cluster visualization in images) TrueComponent Analysis for Raman imaging: Advanced algorithm that automatically establishes the number of sample components, differentiates their spectra and locates them in the image Principal component analysis (PCA) Advanced curve fitting tool for fitting of multi-spectral datasets Overlay of images recorded with different techniques Various filters (e.g. Fourier, anisotropic, edge, sharpen, user-customized filters and many more) Graph and image repair: data substitution algorithms such as interpolations or texture analysis for removing pixel failures Non-negative matrix factorization (NMF) !If? &subject=`` &operator=`notempty` &then=`` &else=``\nOptional software packages compatible with Suite SEVEN\tTrueMatch Raman spectral database management software\tTrueMatch Raman spectral database management softwareIdentify measured spectra with established Raman libraries or create your own database.\tFind out more\tParticleScout for Raman-based microparticle analysis\tParticleScout for Raman-based microparticle analysisFind, classify, identify and quantify particulate sample components.\tFind out more\tWorkflow Manager\tWorkflow ManagerAutomate experimental sequences.\tFind out more\tMulti-user Management\tMulti-user ManagementDefine functionalities and data access rights for individual user accounts.\tFind out more\tProgramming Interface\tProgramming InterfaceImplement user-defined measurement procedures\tFind out more\tNanomanipulation and Nanolithography\tNanomanipulation and NanolithographyInduce nanomanipulations with highest precision.\tFind out more\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Application Examples\nCorrelative Raman-AFM study of a polymer blend Raman image (left) showing the phase separation in a blend of PMMA (red) and PS (blue) and AFM topography image (right) of the same sample area. !If? &subject=`` &operator=`notempty` &then=`` Raman spectra of PMMA (red) and PS (blue). !If? &subject=`` &operator=`notempty` &then=`` Overlay of the AFM topography and Raman image, relating structural and chemical information. !If? &subject=`` &operator=`notempty` &then=`` High-resolution Raman imaging of a pharmaceutical tablet Large-area, high-resolution Raman image of a painkiller tablet. The Raman image (left) is color-coded according to the Raman spectra (right) of the individual components, which were differentiated automatically with TrueComponent Analysis and identified using the TrueMatch spectral database software. !If? &subject=`` &operator=`notempty` &then=`` RISE (Raman-SEM) imaging of a battery cathode RISE image (overlay of Raman and SEM images) of a lithium-ion battery (LIB) cathode. LIB particles of different compositions (blue, green) are embedded in the carbon matrix (red). !If? &subject=`` &operator=`notempty` &then=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`205500`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"content" : "Overview\nFeatures\nSoftware\nLibrary\nGallery\nVideo\nApplications !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"1\",\"tabTitle\": \"Overview\",\"content\": !jsonEncode? &input=`\nSymmetry S3 uses a customised CMOS sensor and fibre optics to unlock a unique and powerful combination of speed, sensitivity, and diffraction pattern detail. The S3, in combination with the AZtec software, delivers exceptional performance on all materials and for all measurements. The highest analysis speed of the Symmetry S3, in excess of 5700 pps, enables texture and grain size characterisation in a matter of seconds, yet this is achieved without requiring high beam currents or sacrificing pattern resolution. This means that these high speeds can be achieved even on challenging, real-world samples such as multiphase light metal alloys or deformed steels.\nIn addition, the Symmetry S3 can collect distortion-free, megapixel resolution EBSPs for detailed strain and phase analyses. This is a detector to suit all applications, enhanced by innovative features such as software controlled tilting (with dynamic calibration) and a unique proximity sensor.\nWhen an EBSD detector has no compromise, no application is beyond your reach. This was recently recognised, as the Symmetry was awarded the King's Award for Enterprise in Innovation. Learn about the award here.\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"2\",\"tabTitle\": \"Features\",\"content\": !jsonEncode? &input=` The Symmetry S3 detector has an outstanding performance coupled with ease of use, making it the ideal detector for all EBSD applications:\nGuaranteed indexing speeds > 5700 patterns per second (pps)\nFibre-optic lens delivering unrivalled sensitivity\nHighest sensitivity > 1000 pps \/ nA\n156 x 128 pixel resolution at maximum speed\nFull megapixel resolution (1244 x 1024) patterns – ideal for high angular resolution (HR)-EBSD strain analyses\nSub-pixel distortion, ensuring an angular precision below 0.05°\nSoftware controlled tilting interface coupled with autocalibration – perfect positioning and indexing for all sample sizes and geometries\nUnique proximity sensor – detects potential collisions before they happen and automatically moves the detector to a safe position\nFive integrated forescatter detectors (optional), providing full colour complementary channelling contrast and atomic number contrast images.\nBellows SEM interface, maintaining the microscope’s vacuum integrity\nSimple and intuitive detector settings, ensuring optimum results every time\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"3\",\"tabTitle\": \"Software\",\"content\": !jsonEncode? &input=` The performance of the Symmetry S3 detector is enabled by the powerful AZtecHKL acquisition platform, backed up by the fastest and most modern EBSD data processing software, AZtecCrystal. The comparison table below will help you to choose the best software package to deliver the flexibility and functionality that you require. Feature\nDescription\nAZtecHKL\nAZtecHKL\nAZtecHKL\nStandard\nAdvanced\nExpert\nAZtec EBSD Mapping \nPoint Analyses,LineScans and Maps\n✔\n✔\n✔\nReAnalysis\nReprocess datasets with stored patterns\n✔\n✔\n✔\nAZtec Synergy \nFully integrates Oxford Instruments EDS & EBSD systems with simultaneous EDS and EBSD maps \/linescans\n✔\n✔\n✔\nAZtec PhaseID \nCombines EDS & EBSD data to identify unknown phases\n✔\n✔\n✔\nAZtec Image Registration\nRegister and use an image for specimen navigation\n✔\n✔\n✔\nTKD Navigator\nDedicated workflow for transmission Kikuchi diffraction (TKD)\n✔\n✔\n✔\nAZtec Data Analysis\nData Clean, Grain Detection & Size Analysis, Map Editor\n✔\n✔\n✔\nAZtecCrystalStandard\nModern, standalone EBSD data processing software incl. maps, pole\/inverse pole figures, ODFs and grain analysis\n✔\n✔\n✔\nAZtec TruPhase \nReal time differentiation of similar crystal structures using EDS\nO\n✔\n✔\nAZtec Autolock \nPredictive and reactive specimen drift correction\nO\n✔\n✔\nColour FSD \nColour visualisation of orientation images using forescatter detectors\nO\n✔\n✔\nPseudoSymmetry\nSolves orientation measurements in materials where different orientations deliver similar EBSPs\nO\n✔\n✔\nAZtecHKL Steel \nReclassify phase tool for phase separation and dedicated steel phase database\nO\n✔\n✔\nAZtecCrystal Advanced\nComprehensive standalone data processing package, incl. materials properties, parent grain reconstruction and advanced dislocation analysis\nO\n✔\n✔\nAZtecCrystal MapSweeper\nDataset enhancement tools based on pattern simulation and pattern matching routines\nO\nO\n✔\nAZtec Large Area Mapping \nAcquire and stitch multiple fields to characterise large sample areas\nO\nO\n✔\nAZtec MapQueue \nSchedule acquisition of multiple experiments\nO\nO\n✔\nCIF Import\nImport Crystal Information Files for phase definition\nO\nO\n✔\nMagnetic Field Correction \nCorrect EBSD pattern distortion from immersion lens fields\nO\nO\nO\nAZtec 3D\nAutomated acquisition of 3D datasets on compatible FIB-SEMs\n✘\nO\nO\nO: Available as Option\n`},\"tab4\":{\"index\":\"4\",\"tabID\": \"4\",\"tabTitle\": \"Library\",\"content\": !jsonEncode? &input=` Symmetry S3 Brochure\n!If? &subject=`1` &operator=`eq` &operand=`1` &then=` !renderForm? &form=`19` &formTpl=`protected-form-wrapper` &unique_id=`4636`\n` Blog: EBSD: Taking the First Look at Your Sample Blog: EBSD – Experienced changes Blog: Characterisation of nano precipitates by STEM-EDS and Transmission Kikuchi Diffraction (TKD) EBSD.com: Fibre Optics and Sensitivity EBSD.com: Direct v Indirect Electron Backscatter Diffraction (EBSD) Detectors Application Notes using Symmetry !If? &subject=`` &operator=`notempty` &then=`` &else=`` Microstructure characterisation in metal powders by EBSD\nWe demonstrate how gas atomised copper powders can be effectively characterised using EBSD data collected with the latest high-speed Symmetry EBSD detector. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` NCM cathode material characterised using EBSD\nDiscover how EBSD can be used to obtain grain size and texture information from NCM (nickel, cobalt, manganese) cathode material. By characterising and comparing samples of different cathode materials at different stages of the battery’s lifetime, it's possible to link the performance with the microstructure and improve understanding of how the materials can be optimised. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Determining the metamorphic history of rocks using combined EBSD and EDS\nReconstructing the metamorphic evolution of rocks often depends on the identification of key minerals that are only stable at specific temperatures and pressures. Combined EBSD and EDS analyses enable more rigorous phase identification than conventional techniques, with the added benefit of providing insights into a rock’s deformation and chemical history. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload !If? &subject=`` &operator=`notempty` &then=`` &else=`` Direct Observations of Phase Transformations using High Temperature EBSD\nLearn about a new phosphor screen for the Oxford Instruments CMOS EBSD detector range that uses an optical interference filter to block out the infrared signal during high temperature EBSD experiments. This new technology enables faster and more sensitive analyses of microstructural changes measured in-situ at high temperatures. !If? &subject=`` &operator=`notempty` &then=` >`\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nDownload\n`},\"tab5\":{\"index\":\"5\",\"tabID\": \"5\",\"tabTitle\": \"Gallery\",\"content\": !jsonEncode? &input=` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Grain size map of a duplex steel sample, collected in 36s to international standards !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` KAM map of a deformed Ni grain collected using AZtec’s Refined Accuracy indexing !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Grain relative orientation deviation map of a deformed Ni sample, collected at 5763 pps !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Orientation contrast image of a Ni sample collecting using the S3’s forescatter detectors !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` The Symmetry S3 fibre-optically coupled CMOS EBSD detector !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Full resolution EBSP from a steel sample, ideal for HR-EBSD strain analyses !If? &subject=`` &operator=`notempty` &then=`` &else=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=``\n`},\"tab6\":{\"index\":\"6\",\"tabID\": \"6\",\"tabTitle\": \"Video\",\"content\": !jsonEncode? &input=` Symmetry S3 Demonstration \nWatch a demonstration of the previous generation, all-in-one EBSD detector Symmetry S3. \n \n!If? &subject=`` &operator=`notempty` &then=`` &else=`` EBSD without limits...\nRecorded live from our Spotlight session, at the virtual meeting M&M 2020. In this session, expert Dr. Pat Trimby introduces the previous generation Symmetry S2 fibre-optically coupled EBSD detector. \nViewing time: 30 minutes\n`}}` Customer Publications Powered by Bioz See more details on Bioz Applications\nThe Symmetry S3’s combination of extreme speed, sensitivity and versatility makes it the only EBSD detector that can cover all application areas. This includes: Routine analyses of standard metal and alloy samples In-depth examination of strain and deformation Effective characterisation of complex or beam sensitive samples Optimised measurement of large samples Transmission Kikuchi Diffraction (TKD) analysis of nanocrystalline materials Rapid quality control of materials properties\nSymmetry S3’s maximum analysis speed of >5700 pps enables the measurement of key sample properties in just seconds\nHere the grain size of a duplex stainless steel has been analysed to ASTM E2627 standard in less than 40 s, measuring > 2000 grains.\nSimilarly rapid characterisation of texture and phase fraction makes the Symmetry S3 ideal for quality control and high sample throughput applications\nHigh speed analyses can be completed on a wide range of materials, using only moderate beam currents (e.g. ~20 nA) High speed analysis of beam-sensitive samples The unique fibre-optic lens within the Symmetry S3 detector delivers unparalleled sensitivity, ensuring not only excellent data from beam-sensitive materials but performance benefits on all sample types Here a quartz (SiO2) rock sample has been effectively analysed in under 12 minutes at 1900 pps, using only a moderate beam current Symmetry S3’s sensitivity ensures you to utilise the detectors exceptional speeds in all applications, delivering significant throughput advantages Detailed analysis of strained samples In order to characterise strain effectively, a detector with megapixel resolution and minimal distortion is essential Symmetry S3 is the only detector that can satisfy these criteria – full 1244 x 1024 pixel diffraction patterns are ideal for high angular resolution (HR) EBSD, with every detector guaranteeing sub-pixel distortion This example shows how high quality EBSPs coupled with AZtec’s Refined Accuracy indexing mode can characterise dislocation cells within a strained Ni sample Analysis of any sample size Large samples are difficult to analyse using conventional EBSD detectors, since they need to be analysed at long working distances (WD) in the SEM, this compromising the standard EBSD geometry Symmetry S3, with its software-controlled tilting, can be positioned at the ideal geometry for every sample type, from TEM foils to cm-scale samples (such as in-situ testing samples or geological thin sections) The map shows EBSD data from a large mechanical test Ti64 alloy sample, with the grain orientation data used to calculate the Young’s Modulus in the loading direction",
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"highlights" : " Guaranteed indexing speeds in excess of 5700 pps at 156 x 128 pixel EBSD pattern resolution<\/p>, 1244 x 1024 pixel resolution – ideal for high angular resolution (HR) EBSD<\/p>, Unique fibre-optic coupling with sub-pixel distortion<\/p>, Extreme sensitivity, benefiting all types of analysis<\/p>, Software controlled detector tilting<\/p>",
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"name":"Time-Correlated Single Photon Counting",
"sorting_name":"tcspc",
"image":"/assets/components/phpthumbof/cache/WITec_StrobeLock_FLIM.7d1ad9559eeb8237d20bb9a08548532e.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nStrobeLock Benefits Precise time-resolved measurement of fluorescence and other luminescence decays Sample excitation via a pulsed laser for fluorescence or via a pulse generator for electrically stimulated luminescence Adjustable excitation pulse frequencies (up to 100 MHz) Instrument response function typically below 120 ps Compatibility with integrated Software Suite for data acquisition and evaluation User-friendly combination options with Raman and other imaging options\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Time-resolved Luminescence microscopy (TLM) With Time-resolved Luminescence Microscopy (TLM), the luminescence properties of light-emitting devices, such as LEDs, can be investigated and spatial differences can be revealed. Light emission is stimulated by an electrical pulse generator and its intensity is recorded in a time-resolved manner. Thus, relaxation times or response times can be calculated for each image pixel and visualized. TLM can be used for example for the quality control of LEDs.\nTime-resolved Luminescence Microscopy (TLM) on a blue light-emitting diode (LED).Left: Map of local relaxation times; scale bar 7 µm.Right: Contour plot of the temporal start of the luminescence emission; scale bar 10 µm.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nFluorescence Lifetime Imaging (FLIM) Fluorescence Lifetime Imaging Microscopy (FLIM) determines the average fluorescence lifetime for each image pixel from the time-resolved fluorescence decay after excitation by a pulsed laser. The resulting FLIM image is color-coded according to the lifetime, displaying its spatial distribution in a sample. In combination with other imaging techniques, such as Raman imaging or AFM, FLIM extends the amount of information gained from one sample.\nFluorescence Lifetime Imaging (FLIM) of N,N′‐bis(1‐ethylpropyl)‐3,4,9,10‐perylenebis(dicarboximide) (EPPTC) crystal needles. Left: Total fluorescence intensity; scale bar 5 µm. Right: FLIM; scale bar 5 µm.Images are a courtesy of Xinping Zhang, Institute of Information Photonics Technology and College of Applied Sciences, Beijing University of Technology.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`665135`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"name":"Teslatron<\/b>PT",
"sorting_name":"teslatronpt",
"image":"/assets/components/phpthumbof/cache/TeslatronPT.e8ba3068d2462a0c4a005a9bddc221ff.png",
"content" : "12626",
"outline" : "An integrated Cryofree® superconducting magnet system with variable temperature inserts.\r\n\r\nStandard magnetic fields up to 14 T in a compact geometry\r\n\r\nIntegrated variable temperature insert providing sample temperatures between 1.5 K and 300 K\r\n\r\n\r\nWide range of high performance sample rods with height adjustment and rotation options\r\n\r\n\r\nPATHWAYS is our new customer application resources, that will help in choosing the right solution, addressing some of the challenges faced by the researchers, dealing with complex material characterisation. Find out more. \r\nWatch the webinar on transport properties of low dimensional semiconductors here.\r\n ",
"outline_limited" : "An integrated Cryofree® superconducting magnet system with variable temperature inserts.\r...",
"highlights" : "",
"overview" : "Whatever your experimental need for variable magnetic field and temperature, the Teslatron™PT Cryofree integrated magnet system has the solution. The wide range of different experimental inserts enables you to configure your measurement platform for cutting-edge applications, such as 2D materials, nano-structures and superconducting devices.\r\n\r\nStandard magnetic fields up to 14 T in a compact geometry\r\nVector rotate magnet geometries available\r\nIntegrated variable temperature insert providing sampletemperatures between 1.5 K and 300 K\r\nWide range of high performance sample rods with height adjustment and rotation options\r\nLower base temperature can be obtained using our optional inserts < 300 mK with HelioxVT and < 25 mK with KelvinoxJT \r\n\r\n\r\nLow vibration - suitable for a wide range of sensitive measurements\r\nRequires only electric supply, no cryogens needed\r\nFast and easy sample change into our separate sealed chamber eliminating the risk of blocking the cooling loop\r\nUses the highest specification superconducting wire available on the market\r\nLow power consumption - operate from a single pulse tube refrigerator\r\nFast magnet ramp rates\r\nNo gas flow over sensitive samples - the system uses a static exchange gas around the sample, preventing flow induced movement of delicate samples or measurement probes\r\nQuick sample change via top-loading probe. The sample can be changed while the system is cold. No need for complicated load-lock mechanism to reload into the variable temperature insert\r\nDelivered with the MercuryiTC temperature controller and MercuryiPS magnet power supply\r\n1 year standard warranty\r\n",
"features" : "Flexible: a wide range of experimental inserts to suit many applicationsConfigurable: match the system capability to suit your needs and budgetPowerful: get millikelvin temperature in your standard systemUpgradeable: start with a simple system and add extra capability as your experiments evolve",
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"extended_tabs" : "Temperature range: < 1.5 K to 300 K\nStandard sample probe temperature stability: ± 0.05 K\nSystem cooldown: ~ 60 hours from room temperature to 4 K (varies with different magnet options)\nStandard sample probe cooldown: < 200 minutes from room temperature to < 5 K (probe loaded into cold varaible temperature insert)\nContinuous system operation: Typically > 4 weeks \nMagnetic field: 8, 9, 12 and 14 T\nMagnet ramp to full field: ≤ 60 minutes (varies with different magnet options)\nVaraible temperature insert sample space diameter: 50 mm nominal \n ,A typical system comprises of:\n\nCryostat\nMagnet and Power Supply\nVariable Temperature Insert and Controller\nSample Probe\nCryocooler and Compressor\nAccessories and Manuals\n,\nLow Dimensional Physics\nGraphene & 2D Materials\nLow Temperature Detectors\nSpintronics\nQuantum Dots\nElectrical Transport Measurements \n",
"options" : "Magnets\r\nVariable Temperture Inserts",
"accessories" : "MercuryiTC,MercuryiPS",
"tags" : "Electrical transport measurements,Superconductivity,material characterisation,Magneto-transport Measurements,superconducting magnets",
"businesses" : "nanoscience",
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"applications_frontend" : "Nanomaterial Growth and Characterisation, Battery Technology, Quantum Information Processing, Quantum Transport Measurement, Characterisation of Low Dimensional Structures",
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"name":"TrueMatch – Raman Spectral Database Management ",
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"image":"/assets/components/phpthumbof/cache/WITec_TrueMatch.18895662259f5ddb80b394afd454666a.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` Easy Access, Quick Search, Positive Identification\nMulti-spectral searches enable the user to identify several spectra simultaneously, using databases to return hit rates describing the probability of a match for each individual spectrum:\nSimultaneous multi-spectra search (1:1 match)\nMultiple component search: combine up to three database components to describe a measured composite spectrum\nAutomated and simultaneous demixing analysis of multiple components\nPrinciples of the various search options in TrueMatch: Simultaneous multi-spectra search (1:1 match); Multiple component search; Automated and simultaneous demixing analysis\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Rely on existing databases or create your own catalog of spectra\nTrueMatch allows users to utilize established libraries of Raman spectra or to create their own catalog of acquired spectra.\nCompatible versions of ST Japan’s wide range of databases are available and can be implemented quickly and conveniently.\nExtensive libraries of Raman spectra can be referenced while creating individual databases.\nDatabase management is controlled from within the Software Suite environment.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`208240`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"name":"TruePower – Absolute Laser Power Determination",
"sorting_name":"truepower",
"image":"/assets/components/phpthumbof/cache/WITec_TruePower.ed92a15e94c24e2f2bcbe81f8cd8ba87.jpg",
"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nBenefits TruePower allows automated and software-controlled absolute laser power determination in the optical fiber and adjustment with 0.1 mW resolution. TruePower is the only available laser power measurement system for Raman microscopes that provides such accuracy, ensuring optimal laser power for the preservation of delicate samples. TruePower maintains the diffraction-limited point light source optical features of the incoming laser beam independent of the adjusted laser power. TruePower values are recorded with the Raman data acquisition and can be retrieved later – important for internal documentation and accurate reproducibility in measurement conditions TruePower enables power series measurements, which allow the quantification of laser power-induced spectral changes. TruePower is retrofittable for most Oxford Instruments Raman imaging systems.\nWith TruePower each laser’s output power can be set to an absolute value.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`217830`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nThe TrueSurface Principle\n3D chemical characterization on rough, inclined or irregularly-shaped samples can be carried out precisely along or at a set distance from a surface without requiring sample preparation. In confocal microscopy, light from outside the focal plane is strongly reduced by the detection pinhole. With the TrueSurface module the sample's surface can be kept in focus during the entire measurement procedure, irrespective of its topography.\nThe optical sensor controls the distance between the objective and the sample surface with sub-micrometer precision. Thus, any variation occurring during measurements with long integration times is compensated for, resulting in perfectly sharp and detailed images. \n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Application Examples\nTopographic Raman microscopy image of a pharmaceutical tablet with corresponding spectra.\nTopographic Raman microscopy image of micro-structured silicon.\nTopographic Raman microscopy image of indented text on a glucose energy stick.\nTopographic Raman microscopy image of cellulose fibers of paper.\nTopographic confocal Raman microscopy of the surface of a tooth.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Award Winning Technology\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`576770`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"outline" : "Operate your MFP-3D in a turnkey glovebox for the most demanding environmental control under low oxygen and low water (sub-ppm) conditions. Our fully integrated glovebox solutions are engineered to deliver maximum usability and performance. Contact us for information regarding availability outside the United States and Europe (inquire about compatibility with specific AFM configurations).",
"outline_limited" : "Operate your MFP-3D in a turnkey glovebox for the most demanding environmental control under low oxygen and low water (sub-ppm) conditions. Our fully integrated glovebox solutions...",
"highlights" : "Superior AFM performance with no compromises,Gas purification system with variable speed blower is separated from the glovebox to minimize vibrational coupling,Sturdy, super stiff table support to minimize vibration isolation, Options range from basic, low-cost configurations to those with MBraun's most advanced options<\/p>",
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"outline" : "The Air Temperature Control (ATC) flows temperature-regulated, HEPA filtered air through the Cypher enclosure for ultra-low drift operation. Because of the Cypher's intrinsically low drift, this option is generally only necessary in laboratories with large ambient temperature swings.",
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"outline" : "The Vacuum Chuck for MFP-3D AFMs allows flat samples to be held without any mechanical contacts to the top surface and with no adhesives on the bottom surface. The Vacuum Chuck has three rings to which vacuum can be routed to accommodate 3” or 4” wafers, or sample sizes between 0.8” and 3”. Note: Some regions of the wafers are not accessible.",
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"outline" : "The Variable Field Module 4 (VFM4) is ideal for magnetic force microscopy and other applications where the sample has a dependence on the applied magnetic field. The VFM4 can apply adjustable in-plane magnetic fields up to 8000 G and out-of-plane magnetic fields up to 1200 G. Unlike competing designs, it uses permanent magnets to avoid heating and associated drift. (Compatible with Jupiter XR AFM and all MFP-3D AFMs except Origin.)",
"outline_limited" : "The Variable Field Module 4 (VFM4) is ideal for magnetic force microscopy and other applications where the sample has a dependence on the applied magnetic field. The VFM4 can apply...",
"highlights" : " Applies static in-plane magnetic fields up to ±8000 G<\/p>, Applies static out-of-plane magnetic fields up to ±1200 G<\/p>,High voltage option available for studies of ferroelectric and piezoelectric materials",
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"outline" : "The Variable Field Module 4 (VFM4) is ideal for magnetic force microscopy and other applications where the sample has a dependence on the applied magnetic field. The VFM4 can apply adjustable in-plane magnetic fields up to 8000 G and out-of-plane magnetic fields up to 1200 G. Unlike competing designs, it uses permanent magnets to avoid heating and associated drift. (Compatible with Jupiter XR AFM and all MFP-3D AFMs except Origin.)",
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"outline" : "Andor’s new laser engine delivers high-quality illumination for live or fixed cell imaging using confocal or widefield. VLE also delivers enough power for photostimulation applications using MicroPoint, and users can add up to 10 lasers from UV to NIR. Further, when higher laser power is needed, the VLE can be field upgraded to HLE.",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nFeatures Köhler-illuminated light microscopy for high-quality white-light images Automated focus stacking and image stitching Homogeneous sample-illumination and consistent focus throughout entire field of view Dark-field and differential interference contrast (DIC) modes for efficient visualization of even thin and highly transparent samples Polarization options compatible with transmission and\/or reflection mode Optional epifluorescence setup using a monochromatic camera for detection along with matching fluorescence emission filters for a large selection of compatible wavelength combinations\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` White-light Microscopy Options The witec360 imaging microscopes can integrate bright-field options in reflection or transmission mode, in addition to other techniques including differential interference contrast (DIC) and dark-field imaging.\nFocus Stacking and Image Stitching\nAll light microscopy techniques in witec360 systems feature software-controlled focus stacking and image stitching. With focus stacking, sharp images of samples of varying height can be quickly generated from a stack of individual images. Automated image stitching combines a series of individual measurements into a large-area image at the highest resolution.\nPolarized White-light Microscopy \nWhite-light microscopy in witec360 microscopes can optionally be upgraded with polarization modules, ideally suited for applications in geology, biology, chemistry and material science. The independent control of the polarizer (excitation path) and analyzer (detection path) facilitate different polarization illumination setups in parallel and perpendicular orientations. $image-comparison-slider?\t&unique_idx=`16`\t&layout_id=`5`\t&layout_column=`column2`\t&layout_idx=`0`\t&layout_title=``\t&imageCaption1=``\t&imageCaption2=``\t&sliderCaption=``\t&captionColour=`color-black`\t&image1=`\/assets\/uploads\/images\/raman\/products\/White-light-options\/PMMA-BrightField.png`\t&image2=`\/assets\/uploads\/images\/raman\/products\/White-light-options\/PMMA-DIC.png`\t&leftalt=`Polymer blend of PS and PMMA in white light microscopy`\t&rightalt=`Polymer blend of PS and PMMA in differential interference contrast (DIC) microscopy`\t¢reText=``\nBright-field (left) and DIC image (right) of a polymer blend of PS and PMMA. DIC Image acquired using an Epiplan-Neofluar DIC 100x\/0.9 NA objective.\n$image-comparison-slider?\t&unique_idx=`19`\t&layout_id=`5`\t&layout_column=`column2`\t&layout_idx=`0`\t&layout_title=``\t&imageCaption1=``\t&imageCaption2=``\t&sliderCaption=``\t&captionColour=``\t&image1=`\/assets\/uploads\/images\/raman\/products\/White-light-options\/Particle_before-web.png`\t&image2=`\/assets\/uploads\/images\/raman\/products\/White-light-options\/Particle_after-web.png`\t&leftalt=`Image stacking`\t&rightalt=``\t¢reText=``\nParticle imaged using dark-field microscopy without (left) and with focus stacking (right).\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Discover witec360's outstanding light microscopy performance\nThe white-light microscopy capabilities of the witec360 systems convince with their exceptional performance. In this example, small inclusions were easily found in a diamond, even though they were located 20 – 50 µm beneath the surface. Confocal Raman imaging at the same position then revealed the inclusions' composition.\nLeft: Transmission image (5x\/0.13 NA objective) of a diamond with inclusions. Middle: Magnification of a small inclusion in the diamond (100x\/0.9 NA objective). Right: Raman image of the inclusion in the outlined area. Red: Diamond; Blue: Gel; Green: Pyrope.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nFluorescence Microscopy\nCombine Raman microscopy and fluorescence imaging in one instrument. The optional fluorescence setup for witec360 microscopes uses laser excitation and features a highly sensitive monochromatic camera for detection. Matching emission filters are available for a large number of compatible wavelength combinations.\nCorrelative Raman and fluorescence imaging of cells. Left: Cellular nuclei stained with the fluorescence marker DAPI. Middle: Endoplasmic reticulum (green) and nucleoli (orange) identified with Raman. Right: Overlay image.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Application Examples\nAnalysis of biotite mineral thin-section with different polarization-resolved white-light illumination modes. Unpolarized reflection (A), transmission mode (B), parallel-polarized (C) and cross-polarized transmission image (D). $image-comparison-slider?\t&unique_idx=`56`\t&layout_id=`5`\t&layout_column=`column1`\t&layout_idx=`0`\t&layout_title=``\t&imageCaption1=``\t&imageCaption2=``\t&sliderCaption=``\t&captionColour=``\t&image1=`\/assets\/uploads\/images\/raman\/products\/White-light-options\/ParticleScout-BrightField-Stitching_web.png`\t&image2=`\/assets\/uploads\/images\/raman\/products\/White-light-options\/ParticleScout-DarkField-Stitching_web.png`\t&leftalt=`Image stitching`\t&rightalt=``\t¢reText=``\nStitched large-area bright-field (left) and dark-field (right) images of particles from a ParticleScout measurement.\nDetection of actinolite fibers in a feldspar matrix with transmission microscopy. Image courtesy of Didier Lahondère and Guillaume Wille, French Geological Survey, Orléans (BRGM).\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`631570`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"content" : "witec360 Raman Microscope\nThe Oxford Instruments witec360 is the new benchmark for Raman imaging and correlative microscopy systems, designed to meet the growing demands of academic and industrial researchers for comprehensive analysis at the nanoscale. Download Brochure\n!If? &subject=`` &operator=`eq` &operand=`1` &then=` !renderForm? &form=``&force_fb=`1`&formTpl=`protected-form-wrapper` &unique_id=`0`\n`\nRequest Pricing !renderForm? &form=`685`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`332225`&force_language_de=``&force_language_fr=`` !generateTabbedContent? &rows=`{\"tab1\":{\"index\":\"1\",\"tabID\": \"why\",\"tabTitle\": \"Why witec360\",\"content\": !jsonEncode? &input=` Take your research in any direction\nThe witec360, successor to the pioneering alpha300 series, sets new standards in performance and broadband capability. Its fundamentally modular design provides immediate and long-term value with easy onboarding for Raman newcomers and the versatility to keep pace with varied and quickly evolving applications.\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nBenefits !If? &subject=`` &operator=`!empty` &then=`` !If? &subject=`\/assets\/uploads\/assets\/uploads\/research_icon.png` &operator=`!empty` &then=`\n` Acquire research-grade results\nOptimised optics throughout the entire beam path deliver class-leading speed, sensitivity, and resolution for leading-edge research and development !If? &subject=`` &operator=`!empty` &then=`` !If? &subject=`\/assets\/uploads\/assets\/uploads\/throughput_icon.png` &operator=`!empty` &then=`\n` Experience unprecedented versatility\nBroadband capabilities provide the spectral flexibility needed for demanding research tasks and diverse applications in multi-user facilities !If? &subject=`` &operator=`!empty` &then=`` !If? &subject=`\/assets\/uploads\/assets\/uploads\/gain_insight_icon.png` &operator=`!empty` &then=`\n` Gain comprehensive insight\nSeamless integration of imaging techniques enables the correlation of chemical and structural properties for a more thorough understanding of samples !If? &subject=`` &operator=`!empty` &then=`` !If? &subject=`\/assets\/uploads\/assets\/uploads\/microscope_icon.png` &operator=`!empty` &then=`\n` Configure your microscope for current and evolving experiments\nModular design offers a wide range of capabilities and upgrade options to deliver tailored solutions and scalability to match your institution’s requirements and resources !If? &subject=`` &operator=`!empty` &then=`` !If? &subject=`\/assets\/uploads\/assets\/uploads\/intelligent_automation_icon.png` &operator=`!empty` &then=`\n` Enhance productivity with intelligent automation\nAdvanced hardware automation and intuitive software simplify data acquisition and analysis for operational efficiency and fast onboarding of users with different experience levels !If? &subject=`` &operator=`!empty` &then=`` !If? &subject=`\/assets\/uploads\/assets\/uploads\/checklist_icon_1.png` &operator=`!empty` &then=`\n` Ensure consistency and transparency\nMulti-user management, internal calibration, automated reporting, and streamlined analysis facilitate reproducibility and support institutional and regulatory compliance Advanced confocal Raman technology for every task:\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Point-by-point spectral acquisition for precise measurement at individual locations`&else=`Point-by-point spectral acquisition for precise measurement at individual locations` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`2D area scans for high-resolution imaging and fast overview mapping`&else=`2D area scans for high-resolution imaging and fast overview mapping` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`3D analyses that reveal internal structures layer by layer`&else=`3D analyses that reveal internal structures layer by layer` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Line scans for depth profiling along defined axes`&else=`Line scans for depth profiling along defined axes` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Time-resolved measurements for monitoring reactions and material changes`&else=`Time-resolved measurements for monitoring reactions and material changes`\nLearn more about the confocal Raman imaging technique\n3D Raman image of a cosmetic emulsion rendered in Imaris. Dimensions: 30 x 30 x 10 µm³. Image credits: Oxford Instruments\n`},\"tab2\":{\"index\":\"2\",\"tabID\": \"modularity\",\"tabTitle\": \"Modularity\",\"content\": !jsonEncode? &input=` A system designed to meet your needs\nFlexible – sustainable – future-proof\nThe witec360’s modular architecture empowers you to obtain the matching system for your specific experimental challenges. We provide solutions ranging from fixed configurations for single applications to specialised instruments for advanced academic research, as well as tools designed to meet industry standards and multi-user facility demands. Its flexible design ensures that the witec360 evolves and expands with your future requirements.\nContact our experts !renderForm? &form=`8`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`7712`&force_language_de=``&force_language_fr=``\n3D Raman image of a human epithelial cancer cell rendered in Imaris. Sample courtesy of Dr. Irina Estrela-Lopis and Tom Venus, Institute of Medical Physics and Biophysics, Leipzig University, Germany.\nExample configurations Inverted beam path Effortlessly access liquid and bulky samples from below - ideal for life science and geo science applications Full automation Simplify tasks, streamline workflows, and boost reproducibility with intuitive automation options, supporting both Raman newcomers and expert users Full-wafer access Enable large-area wafer access with strong focus stabilisation and extensive automation, optimised for the semiconductor industry. Explore the witec360 Semiconductor Edition.\nExplore your options within witec360\n2\nLasers\n!sendToEnd?&code=` Lasers\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Fiber-coupled lasers for highest flexibility and efficiency`&else=`Fiber-coupled lasers for highest flexibility and efficiency` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Extensive wavelength and power range options`&else=`Extensive wavelength and power range options` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Up to 6 wavelengths permanently coupled in one system`&else=`Up to 6 wavelengths permanently coupled in one system` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`High-precision fibre couplers for fast switching between lasers`&else=`High-precision fibre couplers for fast switching between lasers` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Absolute laser intensity control via patented TruePower™ technology`&else=`Absolute laser intensity control via patented TruePower™ technology` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Automatic shutter control`&else=`Automatic shutter control` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Polarisation-maintaining optics`&else=`Polarisation-maintaining optics`\nExplore Lasers\n`\n9\nSoftware\n!sendToEnd?&code=` Software\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Integrated Software Suite for data acquisition and evaluation`&else=`Integrated Software Suite for data acquisition and evaluation` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Modular architecture for adaptable software configurations`&else=`Modular architecture for adaptable software configurations` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Optimised user-interface for powerful instrument control `&else=`Optimised user-interface for powerful instrument control ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Seamless control of supported correlative techniques`&else=`Seamless control of supported correlative techniques` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Intelligent data analysis and visualisation`&else=`Intelligent data analysis and visualisation`\nAdvanced software packages\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`ParticleScout: Fast and easy Raman particle identification and classification`&else=`ParticleScout: Fast and easy Raman particle identification and classification` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`TrueMatch™: Raman spectral database management software for simplified compound identification `&else=`TrueMatch™: Raman spectral database management software for simplified compound identification ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Workflow Manager: Facilitating automated and reoccurring measurement workflows`&else=`Workflow Manager: Facilitating automated and reoccurring measurement workflows` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Multi-user Management: Control of data access and instrument functionalities for individual users and user groups`&else=`Multi-user Management: Control of data access and instrument functionalities for individual users and user groups` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Programming Interface: Custom-defined measurement procedures for individualised applications`&else=`Programming Interface: Custom-defined measurement procedures for individualised applications` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`DaVinci: Accurate nanomanipulation and nanolithography tool`&else=`DaVinci: Accurate nanomanipulation and nanolithography tool`\nExplore Software\n`\n6\nSample Positioning and Handling\n!sendToEnd?&code=` Sample Positioning\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Manual and motorised stages for precise scanning in x, y and z`&else=`Manual and motorised stages for precise scanning in x, y and z` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Piezo-actuated stages for applications that require highest spatial resolution and precision `&else=`Piezo-actuated stages for applications that require highest spatial resolution and precision ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Standard travel range options from 25 mm x 25 mm to 350 mm x 300 mm`&else=`Standard travel range options from 25 mm x 25 mm to 350 mm x 300 mm`\nExplore Sample Positioning\nSample Handling Accessories\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Stages for special experimental conditions `&else=`Stages for special experimental conditions ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Environmental control devices (heating and cooling stages, stage top incubators)`&else=`Environmental control devices (heating and cooling stages, stage top incubators)` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Sample holders for various devices and sample geometries`&else=`Sample holders for various devices and sample geometries`\n`\n8\nCompact Footprint\n!sendToEnd?&code=` Compact Footprint \n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Flexible layout of all components`&else=`Flexible layout of all components` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Reduced heat and vibrational interferences in the measurement`&else=`Reduced heat and vibrational interferences in the measurement` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Compatibility for operation within glove box or enclosure`&else=`Compatibility for operation within glove box or enclosure`\n`\n5\nObjective Turret\n!sendToEnd?&code=` Objective Turret\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Up to 6 objectives mounted simultaneously`&else=`Up to 6 objectives mounted simultaneously` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Compatibility with high-performance objectives from renowned suppliers`&else=`Compatibility with high-performance objectives from renowned suppliers` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Optional software-controlled turret rotation for efficient workflows`&else=`Optional software-controlled turret rotation for efficient workflows`\n`\n4\nWhite light \/ Widefield Microscopy\n!sendToEnd?&code=` White light \/ Widefield microscopy\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Class-leading Köhler illumination for uniform, high-contrast images across the entire field of view`&else=`Class-leading Köhler illumination for uniform, high-contrast images across the entire field of view` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`High-end white light microscopy images in various imaging modes (Brightfield, Darkfield, and DIC) `&else=`High-end white light microscopy images in various imaging modes (Brightfield, Darkfield, and DIC) ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Operates in reflection or transmission mode`&else=`Operates in reflection or transmission mode` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Optional polarisation setup `&else=`Optional polarisation setup ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Optional fluorescence microscopy integration for multi-modal imaging capabilities`&else=`Optional fluorescence microscopy integration for multi-modal imaging capabilities`\nExplore White Light Microscopy\n`\n7\nSpectrometers\n!sendToEnd?&code=` Spectrometers\nHexalight\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Mirror-free, lens-based design ensures the highest sensitivity and throughput`&else=`Mirror-free, lens-based design ensures the highest sensitivity and throughput` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Properietary Olaf-Hollricher-Design (OHD) lenses provide true broadband capability from 350 to 1100 nm`&else=`Properietary Olaf-Hollricher-Design (OHD) lenses provide true broadband capability from 350 to 1100 nm` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Integrated device for seamless switching between high-resolution and broadband acquisition of Raman and PL spectra`&else=`Integrated device for seamless switching between high-resolution and broadband acquisition of Raman and PL spectra` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Up to 6 installed gratings offers both the highest resolution and application flexibility, no manual manual interaction needed`&else=`Up to 6 installed gratings offers both the highest resolution and application flexibility, no manual manual interaction needed` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Innovative harmonic drive enables automated grating selection and precise positioning`&else=`Innovative harmonic drive enables automated grating selection and precise positioning` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`300 mm or 600 mm focal length options`&else=`300 mm or 600 mm focal length options`\nMonolight\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Single, fixed grating solution for specific applications`&else=`Single, fixed grating solution for specific applications` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Configuration options for lasers from UV (266 nm) to NIR (1064 nm) `&else=`Configuration options for lasers from UV (266 nm) to NIR (1064 nm) `\nExplore Spectrometers\nDetectors\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Ultra-sensitive Oxford Instruments Andor cameras optimized for advanced Raman imaging`&else=`Ultra-sensitive Oxford Instruments Andor cameras optimized for advanced Raman imaging` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Excellent quantum efficiencies`&else=`Excellent quantum efficiencies` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Ultra-fast acquisition times`&else=`Ultra-fast acquisition times` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Improved imaging quality by reduced artifacts`&else=`Improved imaging quality by reduced artifacts` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Ultra-low dark current `&else=`Ultra-low dark current ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Budget-conscious to high-end options (Front Illuminated, Back Illuminated, Electron Multiplying, Open Electrode)`&else=`Budget-conscious to high-end options (Front Illuminated, Back Illuminated, Electron Multiplying, Open Electrode)` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`InGaAs array detectors for extended possibilities in the NIR excitation range`&else=`InGaAs array detectors for extended possibilities in the NIR excitation range`\nExplore Cameras\n`\n1\nModular Input and Output Couplers\n!sendToEnd?&code=` Modular Input and Output Couplers\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Individual combination of imaging modes and correlative techniques`&else=`Individual combination of imaging modes and correlative techniques` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Optimal alignment for an ideal beam path and high throughput`&else=`Optimal alignment for an ideal beam path and high throughput` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Polarisation-maintaining optics`&else=`Polarisation-maintaining optics` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Manual or automated operation`&else=`Manual or automated operation`\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`RayShield coupler and RayLine filters for low-frequency signal detection`&else=`RayShield coupler and RayLine filters for low-frequency signal detection` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Polarisation module for freely rotating polarisation direction or generating circularly polarised light`&else=`Polarisation module for freely rotating polarisation direction or generating circularly polarised light`\n`\n3\nIllumination and Detection Setup\n!sendToEnd?&code=` Illumination and Detection Setup\nFlexible illumination and detection possibilities for various application fields and sample geometries\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Upright or inverted microscope body for top or bottom illumination `&else=`Upright or inverted microscope body for top or bottom illumination ` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Transmission and reflection mode`&else=`Transmission and reflection mode` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`BeamFlex option for ultimate flexibility in upright and inverted imaging in reflection and transmission mode`&else=`BeamFlex option for ultimate flexibility in upright and inverted imaging in reflection and transmission mode`\nupright\ninverted\nBeamFlex\n`\nThe path to your Raman microscope Choose your microscope basis (upright\/inverted)\nSelect your microscope components\nIncorporate advancedimaging and analysis options\nCustomise with accessories\nRelated Product options:\nwitec360 access: Entry-level Raman system, point-mapping Raman microscope, upgradable witec360 Focus Editions: preconfigured systems fitted to application-specific requirements special customer solutions: Developing a system for your customised requirements with our team\n`},\"tab3\":{\"index\":\"3\",\"tabID\": \"correlative\",\"tabTitle\": \"Correlative Microscopy\",\"content\": !jsonEncode? &input=` Comprehensive sample analysis with Raman and correlative techniques\nBy integrating correlative techniques, the witec360 expands its analytical capabilities and delivers complementary insights about chemical, topographic, mechanical, and structural properties at the same sample location. Its software ensures user-friendly control, effortless result correlation, and intuitive image overlay for streamlined analysis workflows.\nBoth witec360 systems and microscopes from the previous alpha300 series can be upgraded to include correlative imaging techniques.\nCorrelative imaging techniques\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/shg-thg` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-SHG.png` &operator=`!empty` &then=`` Second Harmonic Generation (SHG)\nSHG is sensitive to non-centrosymmetric structures and is ideal for analysing crystal properties in 2D materials and label-free insights in life sciences. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/shg-thg` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/shg-thg`&operator=`!empty`&then=``&else=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/raman-microscopes\/raman-sem-rise` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-SEM.png` &operator=`!empty` &then=`` Scanning electron microscopy (SEM)\nSEM techniques add nano-structural, crystallographic, and elemental information, especially valuable for material analysis, nanotechnology, and geosciences. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/raman.oxinst.com\/products\/raman-microscopes\/raman-sem-rise` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/raman-microscopes\/raman-sem-rise`&operator=`!empty`&then=``&else=``\n!If? &subject=`` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-PL.png` &operator=`!empty` &then=`` Photoluminescence (PL) imaging\nPL provides critical insights into optoelectronic properties, which makes it a widely used technique in material science and semiconductor characterisation. !If? &subject=`` &operator=`!empty` &andSubject=`` &andOperator=`empty` &then=``\n!If? &subject=``&operator=`!empty`&then=``&else=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/raman-afm` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-AFM.png` &operator=`!empty` &then=`` Atomic force microscopy (AFM)\nAFM reveals nanoscale surface properties, such as topography, adhesion, and stiffness, that are particularly important in materials science and nanotechnology. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/raman-afm` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/raman-afm`&operator=`!empty`&then=``&else=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/truesurface` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-TrueSurface.png` &operator=`!empty` &then=`` Topographic Raman imaging\nTrueSurface enables simultaneous topographic and Raman measurements of samples with irregular surfaces, such as rocks, tablets, or micro-structured materials. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/truesurface` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/truesurface`&operator=`!empty`&then=``&else=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/featured-light-microscopy` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-WhiteLight.png` &operator=`!empty` &then=`` White-light microscopy options\nTo efficiently locate and visualise regions of interest, witec360 microscopes feature Köhler illumination for class-leading white-light images in various modes. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/featured-light-microscopy` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/featured-light-microscopy`&operator=`!empty`&then=``&else=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/snom` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-SNOM.png` &operator=`!empty` &then=`` Scanning near-field microscopy (SNOM)\nSNOM achieves optical imaging beyond the diffraction limit, with resolutions down to ~ 60 nm, suited for analysing nanomaterials and complex samples. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/snom` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/snom`&operator=`!empty`&then=``&else=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/featured-light-microscopy` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-FL.png` &operator=`!empty` &then=`` Fluorescence microscopy\nFor specific applications in life sciences that rely on fluorescent labelling, Raman data can be complemented with fluorescence microscopy. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/featured-light-microscopy` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/featured-light-microscopy`&operator=`!empty`&then=``&else=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/tcspc` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-TCSPC.png` &operator=`!empty` &then=`` Time-correlated single photon counting\nTCSPC techniques such TLM and FLIM provide valuable insights in semiconductor and optoelectronics research, as well as life sciences. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/tcspc` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/raman.oxinst.com\/products\/imaging-options\/tcspc`&operator=`!empty`&then=``&else=``\n!If? &subject=`https:\/\/www.oxinst.com\/news\/photon-antibunching-identifies-single-photon-emitters` &operator=`!empty` &then=`` &else=`` !If? &subject=`\/assets\/uploads\/images\/raman\/products\/witec360\/CorrelativeImagingOption-antibunching.png` &operator=`!empty` &then=`` Antibunching measurements Correlative Raman, PL and antibunching enables efficient identification of single-photon emitters (SPEs) critical for quantum computing and cryptography. !If? &subject=`` &operator=`!empty` &andSubject=`https:\/\/www.oxinst.com\/news\/photon-antibunching-identifies-single-photon-emitters` &andOperator=`empty` &then=``\n!If? &subject=`https:\/\/www.oxinst.com\/news\/photon-antibunching-identifies-single-photon-emitters`&operator=`!empty`&then=``&else=``\n.horizontal-carousel .item {\ncolor: inherit\n}\n.horizontal-carousel .item img {\nheight: auto\n}\n!insertJS? &what=`\n$('.horizontal-carousel-techniques').owlCarousel({ loop: true, margin: 15, autoplay: true, autoplayTimeout: 4000, autoplayHoverPause: true, nav: true,\tnavText: ['',''], responsive: { 0:{ items:1 }, 600: { items:3 }, 1000:{ items:4 } }\n})\n`\n`},\"tab4\":{\"index\":\"4\",\"tabID\": \"performance\",\"tabTitle\": \"Performance\",\"content\": !jsonEncode? &input=` Class-leading performance\nThe witec360 sets the highest standards for performance in confocal Raman imaging. Every component is optimised for maximum transmission efficiency and consistency, enabling accurate results within seconds. This accelerates your imaging workflows and facilitates even the most challenging applications. !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Maximized signal intensity for the broadband range`&else=`Maximized signal intensity for the broadband range` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`350 - 1100 nm within the same core system`&else=`350 - 1100 nm within the same core system` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Extended options from UV (266 nm) to NIR (1064 nm)`&else=`Extended options from UV (266 nm) to NIR (1064 nm)` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Diffraction-limited spatial resolution`&else=`Diffraction-limited spatial resolution` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Lateral resolution <300 nm (dependent on excitation wavelength`&else=`Lateral resolution <300 nm (dependent on excitation wavelength` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Depth resolution <950 nm (dependent on excitation wavelength)`&else=`Depth resolution <950 nm (dependent on excitation wavelength)` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Exceptional spectral resolution`&else=`Exceptional spectral resolution` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Down to 0.1 cm⁻¹ relative wavenumbers (at 633 nm excitation)`&else=`Down to 0.1 cm⁻¹ relative wavenumbers (at 633 nm excitation)` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Ultra-fast Raman imaging`&else=`Ultra-fast Raman imaging` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Acquisition speeds below 1 ms per spectrum without compromising resolution`&else=`Acquisition speeds below 1 ms per spectrum without compromising resolution` Hexalight - the core of witec360’s performance\nEssential to the witec360 is the innovative Hexalight spectrometer, equipped with lens-based, mirror-free optics and 6 grating positions for optimal throughput and spectral flexibility across the broadest wavelength range.\nRead more about Hexalight here.\n`},\"tab5\":{\"index\":\"5\",\"tabID\": \"automation\",\"tabTitle\": \"Automation\",\"content\": !jsonEncode? &input=` Effortless precision with advanced automation\nMaximise efficiency and simplify your workflows with advanced automation options for witec360 microscopes that help ensure consistency and deliver high-quality results you can rely on.\nKey benefits:\n!If?&subject=`0`&operator=`eq`&operand=`1`&then=`Ease of Use Simplify complex tasks and enable advanced measurements for both beginners and Raman imaging experts`&else=`Ease of Use Simplify complex tasks and enable advanced measurements for both beginners and Raman imaging experts` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Streamlined Workflow Free up more time for your research with automated adjustment procedures`&else=`Streamlined Workflow Free up more time for your research with automated adjustment procedures` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Enhanced Reproducibility Ensure consistent, high-quality results with automated handling of repetitive tasks and hand-free optics positioning`&else=`Enhanced Reproducibility Ensure consistent, high-quality results with automated handling of repetitive tasks and hand-free optics positioning` !If?&subject=`0`&operator=`eq`&operand=`1`&then=`Remote Operation Perform measurements and control your microscope entirely remotely, as in enclosed environments such as glove boxes.`&else=`Remote Operation Perform measurements and control your microscope entirely remotely, as in enclosed environments such as glove boxes.`\n3D Raman image of a defect in a SiC wafer. Dimensions: 180 x 245 x 7 µm³. Image credits: Oxford Instruments.\nAutomation for every user Multi-User Labs: \nAccommodate varying experience levels and streamline workflows with easy-to-use shared equipment.\nIndustry Researchers: \nHandle recurring experimental tasks quickly and precisely to accelerate development.\nRaman Newcomers: \nSimplify advanced tasks and enable confident operation with intuitive onboarding.\nRaman Experts: \nPush the boundaries with advanced automation for complex experiments.\nwitec360 automation key features Instrument setup and imaging control Feature\nBenefit\nAutoBeam – One click precision alignment\nAutomatic laser beam path alignment using a certified reference sample, ensuring diffraction-limited resolution and stable performance. It features a memory function for multiple laser alignments and enables fully remote operation.\nIdeal for multi-user labs and enclosed setups, enabling hands-free, repeatable alignment for consistent, high-quality results.\nTrueCal – Calibration made easy\nAutomated pre-configured calibration routines, keeping your system spectrally aligned and experiment ready.\nPerfect for repetitive or regulated workflows requiring precision, compliance, and quantitatively accurate results. Raman imaging Feature\nBenefit\nTrueComfort – Simplify everyday operations\nEnhanced convenience and accelerated imaging through streamlining essential operations: Motorised Köhler illumination for optimal light settings Quick switching between bright-field and Raman modes Software-controlled objective revolver for one-click rotation\nBudget-conscious solution for increasing efficiency and ease-of use in routine imaging tasks.\nTrueSurface – Always in focus\nActively maintains perfect focus during the entire measurement for sharp and high-quality images.\nIdeal for large-area scans and samples with curved, tilted and structured surfaces.\nMotorised laser coupler – Expand your wavelength options\nSoftware-controlled switching between up to six laser wavelengths (UV to NIR).\nPerfect for multi-wavelength experiments and diverse samples requiring varied excitation conditions.\nTruePower™ – Absolute laser power control\nSets and controls absolute laser power within the measurement with an accuracy of <0.1 mW (down to 0.1 µW in extended configurations) for consistent, reproducible illumination.\nEssential for energy-dependent experiments and sensitive samples requiring strict laser power control.\nMotorised Polarisation Modules – Effortless and accurate\nAutomated adjustment of freely rotatable excitation polarisers and detection analysers, streamlining polarisation-sensitive and polarisation-resolved series measurements.\nIdeal for molecular orientation or anisotropic materials studies, with improved usability and time efficiency.\nMotorised and piezo-driven stages – Precision made easy\nAutomatic positioning of samples with motorised and piezo-driven scan stages.\nEssential for large area mapping, automatic zooming into regions of interest and revisiting of defined measurement positions. Data processing Our advanced software streamlines data processing and analysis, allowing you to quickly interpret results. Feature\nBenefit\nSoftware Suite Analysis Wizard\nSimplifies data analysis with guided, click-through workflows.\nReduced training time and accelerated data analysis for users of all experience levels.\nTrueComponent analysis\nAutomatically identifies and differentiates sample components in an image.\nFast and comprehensive analysis of complex samples, easy spectral unmixing.\nTrueMatch\nQuickly matches measured spectra to known molecules using renowned spectral databases.\nDirect peak assignment without the need of interpretation or mathematical evaluation.\n!insertJS? &what=`\n$(document).ready(function(){$(\".accordion a\").on(\"click\",function(){setTimeout(()=>{var o=$(this).attr(\"aria-controls\"),o=document.querySelectorAll(\"a[aria-controls=\"+o+\"]\");o[0].getBoundingClientRect().top Material Science From large-area composition mapping to 3D stress and defect analysis, the witec360 drives material science innovations across polymers, geological samples, nanomaterials, chemistry and beyond. Its versatility supports advanced in-situ studies and correlative techniques, enabling comprehensive insights from material research to production.\nRead more Semiconductors The witec360 advances semiconductor innovation by integrating high-resolution Raman and photoluminescence imaging for detailed metrology covering structural and electronic insights. This includes non-destructive profiling, stress field mapping, defect characterisation and bandgap analysis.\nRead more Life Science The witec360 empowers life science research with label-free and non-destructive Raman imaging in 2D and 3D for detailed analysis of cellular structures and processes. It provides insights into metabolism, drug uptake, lipid and protein organisation, enabling comprehensive studies of biological interactions and disease mechanisms.\nRead more Pharmaceutics For pharmaceutical R&D, the witec360 Raman microscopes offer high-resolution insights into drug formulation, stability, and bioavailability. From API mapping and polymorph distribution in various dosage forms to surface coatings and uptake mechanisms, the witec360 ensures fast, precise results to accelerate time-to-market.\nRead more\n!If? &subject=`` &operator=`!empty` &then=`View More`\nAll Applications Publications Powered by Bioz See more details on Bioz Contact us\nIf you have any questions, or would like to speak to an expert or request pricing, we will reply to your enquiry shortly.\nGet In Touch !renderForm? &form=`687`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`195108`&force_language_de=``&force_language_fr=``",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=``\nKey Features\naccess to high-performance Raman spectroscopy and spectral Raman mapping access to high-quality and ultra-precise optical microscopy components access to exceptional spectral quality provided by the Hexalight and Monolight Raman spectrometers access to class-leading capability within challenging budget environments access to Oxford Instruments' Raman and imaging know-how access to the future of Raman spectroscopy through upgradeability\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Application Examples\nLarge-area Raman map (A) of a pharmaceutical pain relief ointment (emulsion) and corresponding spectra of oil and water with the dissolved active ingredient (B). Raman analysis of a graphene flake: (C) White light video image indicating the positions of single micro-Raman spectra acquisitions as shown in (D) with corresponding colors. The Raman image in (E) reveals its layered structure based on the recorded Raman map.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Specifications\nHigh-quality, rock solid microscope base for highest stability and long-term drift elimination Research-grade optical microscope body with LED Köhler white-light illumination and video camera sample view Manual stage for highly accurate single-point spectrum acquisitions Motorized microscopy stage (optional) to allow for high-resolution confocal Raman mapping and large area investigations Multiple laser excitation sources adaptable (single or multi-laser coupling units) for a maximum of experimental flexibility Integrated Software Suite for data acquisition and evaluation High-end spectrometer for excellent sensitivity, resolution and spectral shape over a broad wavelength range Fluorescence microscopy and polarization dependent measurements easily accessible\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Stay flexible and keep pace with the evolving state of the art\nThe ideal access point to Oxford Instrument's Raman imaging know-how:\nFeaturing optimized optical components, the witec360 access provides uncompromising cutting-edge capabilities. It offers full upgradeability to confocal 3D Raman imaging and cutting-edge correlative Raman microscopy techniques, along with the modularity to keep pace with emerging and future challenges.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Customer Publications Powered by Bioz See more details on Bioz\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`586360`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` Benefits Full inspection of up to 300 mm (12 inch) wafers Non-destructive characterization of crystallinity, polymorphism, defects, strain and doping Analysis of wide-bandgap semiconductors and layered structures Surface analyses, depth scans and 3D imaging\n3D defect analysis\nRaman imaging is able to distinguish polymorphs and characterize crystal defects below the sample’s surface. This 3D Raman image reveals the origin of a defect in a 4H-SiC wafer and identifies it as the 3C-SiC polymorph. Read more in our application note: Correlative Raman Imaging of Compound Semiconductors 3D Raman representation of a defect in an epitaxially overgrown SiC wafer. Blue: defect, red: epitaxial layer, green: wafer substrate. Dimensions: 240 x 240 x 12 μm³ !If? &subject=`` &operator=`notempty` &then=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Key features Industry-leading confocal Raman and PL microscope for high speed, sensitivity and resolution – simultaneously Scientific-grade, wavelength-optimized spectrometer for high signal sensitivity and spectral resolution Large-area scanning (300 x 350 mm) for wafer inspection Active focus stabilization for large-area measurements (TrueSurface) Vibration damping Extensive automation for remote-control and recurring measurement workflows Integrated Software Suite for data acquisition and advanced post-processing witec360 Semiconductor Edition – Confocal Raman imaging microscope for wafer inspection !If? &subject=`` &operator=`notempty` &then=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Large-area wafer inspection Monitoring the quality of wafers is critically important for the semiconductor industry. In order to establish the homogeneity of the material and reveal areas of strain or inhomogeneous doping, the entire area of a wafer must be investigated.\nIn this example, the complete surface of a 150 mm (6 inch) silicon carbide (SiC) wafer was imaged with Raman microscopy using a 532 nm laser for excitation. The analysis showed that the doping concentration was not homogeneous over the full area. The microscope‘s highly sensitive spectrometer was able to detect peak shifts below 0.01 cm-1 and could thus reveal stress fields within the wafer.\nTo obtain a sharp Raman image of the entire wafer, actively keeping the surface in focus was crucial. TrueSurface recorded the wafer’s topography simultaneously with the Raman data and compensated for height variations.\nRead more in our application note: Correlative Raman Imaging of Compound Semiconductors\nSample courtesy of the Fraunhofer Institute for Integrated Systems and Device Technology IISB, Erlangen, Germany. Confocal Raman image of a 150 mm SiC wafer. TrueComponent Analysis identified two spectra, which mainly differed in the doping-sensitive A1 peak (ca. 990 cm-1). The image reveals an oval region (blue) with a different doping concentration than the bulk wafer area (red). !If? &subject=`` &operator=`notempty` &then=`` Raman spectra of the two components identified in the 150 mm SiC wafer by TrueComponent Analysis. !If? &subject=`` &operator=`notempty` &then=`` Confocal Raman image of a 150 mm SiC wafer, color coded for the position of the stress-sensitive E2 peak (776 cm-1). The image reveals a small, presumably stress-induced peak shift from the wafer’s center toward its edge. !If? &subject=`` &operator=`notempty` &then=`` Topography of a 150 mm SiC wafer with height variations of up to 40 µm. !If? &subject=`` &operator=`notempty` &then=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Specifications Research-grade witec360 Raman microscope White-light illumination for sample overview 300 x 350 mm scanning stage Wafer chuck, optionally with vacuum pump TrueSurface for active focus stabilization and topographic Raman imaging Vibration damping Fully automated microscope control Various laser wavelengths available Highly sensitive, on-axis, lens-based, excitation wavelength-optimized spectrometer featuring thermoelectrically-cooled, scientific-grade spectroscopic CCD camera Integrated Software Suite for data acquisition and post-processing Workflow manager for streamlining recurring experimental tasks DCOM interface for design and control of individual measurement procedures with LabVIEW, Python, C# and others programming tools\nConfigurations\nIn order to meet your individual requirements, we offer a set of microscope configuration packages for the witec360 Semiconductor Edition. Whether you investigate compound semiconductors, layered structures, wide-bandgap semiconductors or 2D materials, you can choose the configuration package that best suits your research. Our specialists will be happy to discuss the right instrument for you. \nContact us !renderForm? &form=`685`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`481555`&force_language_de=``&force_language_fr=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Photoluminescence (PL) imaging\nWith the witec360 Semiconductor Edition, you can perform PL measurements to complement your Raman analyses. This is particularly interesting for investigating wide-bandgap semiconductors such as SiC or gallium nitride (GaN). The PL emission wavelength serves as an indicator for the material’s electronic properties, including its bandgap.\nThis PL image of a SiC wafer shows differences in PL properties, revealing defects. Read more in our application note: Correlative Raman Imaging of Compound Semiconductors PL image of defects in a 4H-SiC wafer. PL spectra show characteristics of 4H-SiC (red), 4H-SiC with stacking faults (blue, green) and 3C-SiC (yellow, cyan). !If? &subject=`` &operator=`notempty` &then=``\nTopographic Raman imaging Topographic Raman image of micro-structured silicon (blue) with fluorescent impurities (pink). Chemical and profilometric information were recorded simultaneously by TrueSurface technology and overlaid. The maximum height variation was 9 µm. !If? &subject=`` &operator=`notempty` &then=`` Layer characterization\nRaman imaging provides insight into the sub-surface properties of layered semiconducting materials. This depth scan through an epitaxially overgrown SiC wafer visualizes the distribution of its different layers. Raman depth scan of an epitaxially overgrown SiC wafer, showing a thin interface layer (blue) between the wafer substrate (green) and epitaxial layer (red). !If? &subject=`Sample courtesy of the Fraunhofer Institute for Integrated Systems and Device Technology IISB, Erlangen, Germany.` &operator=`notempty` &then=`Sample courtesy of the Fraunhofer Institute for Integrated Systems and Device Technology IISB, Erlangen, Germany.`\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` 2D materials analysis\nNovel 2D materials are of increasing interest for their unusual structural, electronic and optical properties. Correlative Raman imaging enables thorough characterization of these few- to single-layered materials, including graphene and perovskite, as well as molybdenum disulfide (MoS2), tungsten diselenide (WSe2) and other transition metal dichalcogenides (TMDs).\nLearn more in our Application Notes: Correlative high-resolution imaging of TMDs Correlative Confocal Raman Microscopy for 2D Materials Investigation\nCharacterization of a WSe2 flake. A: bright-field image. B: high-resolution Raman image (102,400 spectra acquired in about 17 minutes), distinguishing single-layer (red), bi-layer (green), and multi-layer (blue) areas. C: photoluminescence image with visible grain boundary (white arrow). Representative Raman spectrum of CVD-grown mono-layer MoS2 on a Si\/SiO2 substrate. !If? &subject=`` &operator=`notempty` &then=`` Raman image of mono-layer MoS2 color coded for shifts of the Raman E2g band, visualizing areas of strain and doping. !If? &subject=`` &operator=`notempty` &then=`` Customer Publications Powered by Bioz See more details on Bioz Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`388395`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"content" : "!If? &subject=`` &operator=`notempty` &then=`` &else=`` Specifications Streamlining of application-optimized and standardized workflows Easy-to-use selection tool to define multiple measurement areas of one experiment Compatible with all measurement options including image scans, large-area scans, line scans and single-spectra acquisition Access to hardware control in automated systems to enable changes in predefined states (i.e. laser and grating selection) within the experiment Management of TrueSurface and polarization module settings in systems so equipped Analysis of multiple samples with fixed patterns via relative positioning Automated saving of data and opening of new projects\n!If? &subject=`` &operator=`notempty` &then=`` &else=``\nThe workflow manager user interface\nIntuitive selections in the overview image. Click-and-select options to easily define areas and spots for Raman measurements such as area scans, single-spectra measurements and line scans.\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`685`&formTpl=`standard-form-wrapper` &unique_id=`315100`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"content" : "Explore the brand new Suite SEVEN: \nOne integrated environment empowers scientists from setup through data acquisition and post-processing. How it works: !If? &subject=`` &operator=`notempty` &then=`` &else=`` Connect with our experts. They will help you to get the best individual package for you. !If? &subject=`1: Fill out the form` &operator=`notempty` &then=`1: Fill out the form` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Included in the Year-end Software Special: 2 years of Suite SEVEN updates – Windows 11 compatibility is assured !If? &subject=`2: Get your personal quote and connect with our experts` &operator=`notempty` &then=`2: Get your personal quote and connect with our experts` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=`` !If? &subject=`` &operator=`notempty` &then=`` &else=`` Access the new WITec Suite SEVEN Software Solution and experience the new features !If? &subject=`3: Receive detailed software usage` &operator=`notempty` &then=`3: Receive detailed software usage` &else=`` !If? &subject=`` &operator=`notempty` &then=` ` !If? &subject=`` &operator=`notempty` &then=`` &else=``\nPlease fill out the form\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`1003`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`838508`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=`` About the new WITec Suite SEVEN Software New Features DataTrace: Archives measurement steps and metadata viewer with time stamps and export parameters for reproducibility Enhanced Project Manager: Provides tool bar with search, hierarchical data structure and selective display of data objects Spectral Certification: Uses the spectrum of a reference sample to verify system calibration with standardized data. Advanced Cosmic Ray Removal: Facilitates the detection, selection and removal of cosmic rays. Key Features TrueOrigin portable coordinate system: Locates the same sample area in different measurements and even different microscopes Workflow Manager: Streamlines your optimized and standardized measurement workflows State Manager: Defines and retrieves your standard microscope operation settings Multi-user Management: Defines access rights associated with each user account !If? &subject=`` &operator=`notempty` &then=`` &else=``\nExplore the WITec Software Packages Suite SEVEN Instrument configuration and control high-speed data acquisition Data evaluation and processing \nFind out more Suite SEVEN+ All basic package features included Advanced tools for data processing TrueComponent Analysis \nFind out more Additional Software ParticleScout TrueMatch Multi-user management\nExplore options !If? &subject=`` &operator=`notempty` &then=`` &else=``\nThe WITec Suite SEVEN basic software package\nThe Suite SEVEN basic software modules offer you powerful platforms for instrument control and sophisticated data analysis. Instrument Control One intuitive software package for all measurement modes Optimized user interface depending on the measurement mode User-customizable standard configurations for recurring measurements via the State Manager High-speed data acquisition and processing through intelligent computer resource management (>1300 Raman spectra per second) TrueScanTM for exact positioning even at the fastest scan rates All features of the Project SEVEN package included for on- and offline data evaluation and post processing TrueOrigin is WITec’s portable coordinate system that maps a sample in relation to prominent features on the specimen itself or its holder. This expedites the correlation of data acquired by multiple techniques from the same position, even when the sample is moved between instruments. Imported images recorded with an external camera or a different microscope can be used for sample navigation. TrueOrigin is compatible with the Shuttle & Find system from ZEISS. Data Evaluation and Processing Accessing metadata of imaging settings and data analysis steps via DataTrace Guidance through all steps of data processing and image generation (Software Wizard) Graph Demixer: Subtraction or addition of spectra with adjustable weighting factors Multiple algorithms for background subtraction and cosmic ray removal Curve-fitting tool for single spectra, including: several pre-defined fit functions (such as Gaussian, Lorentzian and pseudo-Voigt functions), multiple peak fitting and programming of user-defined functions Spectral peak finder and labeling Import of external images for consistent project documentation Data export to various formats, including ASCII, JCamp-DX, SPC, MATLAB, Zeiss CZI and HDF5 Included demo versions of all features of Project SEVEN+ !If? &subject=`` &operator=`notempty` &then=`` &else=``\nThe Project SEVEN+ package: Advanced data analysis\nProject SEVEN+ is a software extension for advanced data evaluation and processing. A variety of intelligent algorithms and tools facilitate specialized, expert-level analysis and visualization. Project SEVEN+ is available as single user license. All SEVEN+ features are included as demo versions in Project SEVEN. Key features Advanced Cosmic Ray Removal tool Cluster analysis (automatic classification, average spectra generation and cluster visualization in images) TrueComponent Analysis for Raman imaging: Advanced algorithm that automatically establishes the number of sample components, differentiates their spectra and locates them in the image Principal component analysis (PCA) Advanced curve fitting tool for fitting of multi-spectral datasets Overlay of images recorded with different techniques Various filters (e.g. Fourier, anisotropic, edge, sharpen, user-customized filters and many more) Graph and image repair: data substitution algorithms such as interpolations or texture analysis for removing pixel failures Non-negative matrix factorization (NMF) !If? &subject=`` &operator=`notempty` &then=`` &else=``\nOptional software packages compatible with Suite SEVEN\tTrueMatch Raman spectral database management software\tTrueMatch Raman spectral database management softwareIdentify measured spectra with established Raman libraries or create your own database.\tFind out more\tParticleScout for Raman-based microparticle analysis\tParticleScout for Raman-based microparticle analysisFind, classify, identify and quantify particulate sample components.\tFind out more\tWorkflow manager user interface\tWorkflow managerAutomate experimental sequences.\tFind out more\tMulti-user Management\tMulti-user ManagementDefine functionalities and data access rights for individual user accounts.\tFind out more\tProgramming Interface\tProgramming InterfaceImplement user-defined measurement procedures\tFind out more\tNanomanipulation and Nanolithography\tNanomanipulation and NanolithographyInduce nanomanipulations with highest precision.\tFind out more !If? &subject=`` &operator=`notempty` &then=`` &else=``\nApplication Examples\nCorrelative Raman-AFM study of a polymer blend Raman image (left) showing the phase separation in a blend of PMMA (red) and PS (blue) and AFM topography image (right) of the same sample area. !If? &subject=`` &operator=`notempty` &then=`` Raman spectra of PMMA (red) and PS (blue). !If? &subject=`` &operator=`notempty` &then=`` Overlay of the AFM topography and Raman image, relating structural and chemical information. !If? &subject=`` &operator=`notempty` &then=`` High-resolution Raman imaging of a pharmaceutical tablet Large-area, high-resolution Raman image of a painkiller tablet. The Raman image (left) is color-coded according to the Raman spectra (right) of the individual components, which were differentiated automatically with TrueComponent Analysis and identified using the TrueMatch spectral database software. !If? &subject=`` &operator=`notempty` &then=`` RISE (Raman-SEM) imaging of a battery cathode RISE image (overlay of Raman and SEM images) of a lithium-ion battery (LIB) cathode. LIB particles of different compositions (blue, green) are embedded in the carbon matrix (red). !If? &subject=`` &operator=`notempty` &then=``\n!If? &subject=`` &operator=`notempty` &then=`` &else=`` Contact\nPlease fill in all data fields to ensure we can process your inquiry as quickly as possible.\n!If? &subject=`` &operator=`notempty` &then=``\n!renderForm? &form=`1003`&force_fb=`1`&formTpl=`standard-form-wrapper` &unique_id=`236708`&force_language_de=``&force_language_fr=``&forcesubmitnewrow=``\n!If? &subject=`` &operator=`notempty` &then=``",
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"outline" : "ZL41 Cell is the next generation in the highly successful Zyla sCMOS series! We have carefully refined and perfected the design. Truly exceptional imaging flexibility, value and compatibility. Specifically for life science imaging.",
"outline_limited" : "ZL41 Cell is the next generation in the highly successful Zyla sCMOS series! We have carefully refined and perfected the design. Truly exceptional imaging flexibility, value and...",
"highlights" : " Sharp:<\/strong> ~<\/sup>100 nm resolution<\/p>, Fast:<\/strong> up to 100 fps<\/p>, Sensitive:<\/strong> up to 82% QE<\/p>, Accurate:<\/strong> >99.8% linearity<\/p>, Flexible:<\/strong> 4.2 and 5.5 Megapixels<\/p>, Productive:<\/strong> up to 22 mm field of view<\/p>",
"overview" : "The ZL41 Cell takes all the strengths of the highly popular Zyla series into a new edition specifically for life science researchers! An all-new sensor chamber design provides even greater robustness and longevity (5-year chamber integrity warranty).\r\n\r\n ZL41 Cell 4.2 supercedes the Zyla 4.2 PLUS. Delivering up to 82% QEmax, coupled with sub-electron read noise. The broad QE profile provides excellent coverage of the visible\/NIR wavelength range, highly optimized to a wide range of common fluorophores. The high sensitivity permits use of shorter exposure times, faster frame rates and reduced phototoxicity.\r\n ZL41 Cell 5.5 replaces the Zyla 5.5 and remains the ideal cost-effective upgrade solution for a microscope. It offers a 22 mm format sensor with 64 % QE. Uniquely, it offers a Global Shutter mode that is ideal for snapshot imaging of fast-moving objects without temporal distortion.\r\n\r\nThe ZL41 Cell 4.2 is ideal for applications that benefit from optimal sensitivity and speed, such as calcium imaging, light sheet microscopy and super-resolution microscopy. Packed with features such as:\r\n\r\n SRRF-Stream+: (ZL41 Cell 4.2). Make your standard fluorescence microscope capable of Super-Resolution. Our cost-effective and easy to use real time super-resolution is available on ZL41 Cell 4.2 models. Use normal labelling and find out how your imaging can be taken to the next level.\r\n LightScan PLUS: (ZL41 Cell 4.2) features FlexiScan & CycleMax functionality, permitting simple and flexible adaption of the Rolling Shutter scan mode to applications such as Scanning LightSheet Microscopy and Line Scan Confocal.\r\n FCS Mode: Obtain the fastest speeds from minimal height ROIs configured for Fluorescence Correlation Spectroscopy experiments. ZL41 Cell 4.2 outputs a sustained 26,041 fps (2048 (w) x 8 (h) ROI) for exceptional temporal resolution.\r\n GPU Express Simplify and optimize data transfer from the camera – ideal for today’s data intensive imaging experiments. Leverage CUDA-enabled NVidia GPU processing to accelerate the data acquisition pipeline with GPU Express.\r\n\r\nSuperior data transfer efficiency and 12-bit high speed mode combine to deliver an incredible 53 fps through the super-convenient USB 3.0 interface, with industry fastest Region of Interest (ROI) frame rates. With this capability, speed is on tap to allow users to follow faster dynamic processes with improved temporal resolution. Opt for the Camera Link version to access up to a blistering 100 fps (full resolution).\r\n\r\n ZL41 Cell also offers industry-leading linearity (99.8%) for unparalleled quantitative accuracy of measurement across the full dynamic range.\r\n An all new sensor chamber design provides even greater robustness and longevity (5-year chamber integrity warranty).\r\n ZL41 Cell models share software compatibility with the previous editions of Zyla 4.2P and 5.5 models",
"features" : "",
"features_benefits" : "Up to 82% QE - Highest and broadest available sCMOS QE. Optimized to a wide range of common fluorophores. Enables shorter exposures, faster frame rates and reduced photobleaching.,0.9 e- read noise - Lowest read noise sCMOS. Significantly lower than any CCD.,Industry Fastest Frame Rates - Follow faster processes. Industry-fastest USB 3.0 frame rates, 53 fps (full frame). 100 fps (full frame) sustained via Camera Link.,4.2 and 5.5 megapixel sensor formats and 6.5 µm pixels - Delivers extremely sharp resolution for modern microscopes with C-mount ports.,SRRF-Stream+ - Super Resolution made cost effective, flexible and easy. New ZL41 Cell 4.2 compatible with our real-time Super-resolution Technology.,LightScan PLUS - Reduce background and improve contrast and resolution in scattering samples. Designed to allow users to optimise signal strength and confocality concurrently in applications such as Scanned Light Sheet Microscopy and Line Scanning Confocal Microscopy.,FCS Mode - Obtain the fastest speeds from minimal height ROIs configured for Fluorescence Correlation Spectroscopy experiments,GPU Express - Simplify and optimize data transfers from camera to a CUDA-enabled NVidia Graphical Processing Unit (GPU) card to facilitate accelerated GPU processing as part of the acquisition pipeline,Compatible - Maintains compatibility with previous Zyla series with no changes at EEPROM level.,Robust - New mechanical design for greater longevity and sensor protection. 5-year warranty on sensor chamber integrity.,Ultra - Low Fan Vibration - Designed with vibration sensitive experiments in mind, such as super-resolution microscopy. ,Dual-Gain Amplifiers - Maximum well depth and lowest noise simultaneously, affording extended dynamic range of 33,000:1,12-bit and 16-bit modes - 12-bit for absolute fastest frame rates through USB 3.0; 16-bit for full dynamic range.,Extensive FPGA on-head data processing - Essential to ensure best image quality and quantitative fidelity from sCMOS technology.,Hardware Timestamp - FPGA generated timestamp with 25ns accuracy.,Dynamic Baseline Clamp - Essential to ensure quantitative accuracy across the image area and between successive images of a kinetic series.,Python Ready - Take control with our new python integrated SDK. Ideal for custom system integrations. ,Water Cooled Option - Option for vibration sensitive applications. Available under request",
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"product_family" : "scmos-camera-series",
"product_family_frontend" : "sCMOS Camera Series",
"sorting_product_family" : "100",
"idx": 230,
"page_id": 23530,
"page_link" : "https://andor.oxinst.com/products/scmos-camera-series/zl41-cell-scmos",
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{
"name":"ZL41 Wave sCMOS",
"sorting_name":"zl41 wave scmos",
"image":"/assets/components/phpthumbof/cache/zl-41-wave-product.3341ae8bbf8643ae67a2fb420bbc6c6b.png",
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"outline" : "ZL41 Wave is the next generation in the highly successful Zyla sCMOS series, specifically for physical science and astronomy researchers. Superb imaging and spectroscopic flexibility, compactness for tight optical spaces, extensive software compatibility and exceptional price\/performance value. ",
"outline_limited" : "ZL41 Wave is the next generation in the highly successful Zyla sCMOS series, specifically for physical science and astronomy researchers. Superb imaging and spectroscopic...",
"highlights" : "Up to 82% QE,< 1 e- read noise,Up to 100 fps,32-bit binning mode,Spectroscopy modes,Operate down to -20°C ambient",
"overview" : "Andor’s ZL41 Wave physical sciences sCMOS camera platform delivers sheer excellence in speed, sensitivity, dynamic range and resolution, with comprehensive imaging and spectroscopy functionalities. Building upon the strengths of the original Zyla sCMOS series, the cost-effective, compact, thermoelectrically cooled design of ZL41 Wave benefits from a reengineered and enhanced sensor chamber and is supported within a wide range of physical science software environments, integrating perfectly into any optical laboratory or observatory setting.\r\nZL41 Wave 4.2 provides exceptional sensitivity\r\n from a combination of 82% QE and very low 0.9 e- read noise from a 4.2 Megapixel sensor. Ideal for pushing frame rates in light starved\r\n applications within astronomy, quantum imaging, quantum computing, spectroscopy and 3D-tomography fields. \r\nZL41 Wave 5.5 is an ideal workhorse camera, a highly cost-effective and flexible solution that delivers a superior field of view from a 5.5 Megapixel sensor. Furthermore, this camera offers 2-in-1 rolling and true global shutter functionality. Global shutter is key to techniques such as particle imaging velocimetry (PIV) and astronomical object tracking.",
"features" : "",
"features_benefits" : "NEW 32-bit binning mode - Access huge dynamic range through extensive pixel binning. User-selectable data bit-depth up to 32-bit, transmitted upstream over the camera interface. ,Spectroscopy mode - On-head asymmetric pixel binning and multitrack. Spectroscopist-friendly spectra and multi-track data, prior to transfer through 10-tap or USB interface. Upstream data size reduction and easier user data processing.,Fast Spectroscopy: Up to 27,000 spectra\/sec - Study of transient spectral phenomena with sub-millisecond time resolution,PIV capability (ZL41 Wave 5.5) - Perfect for fluid dynamics, Global Shutter mode of ZL41 Wave 5.5 facilitating image pair acqusition with an inter-frame gap of down to 100 ns.,NEW Operate down to -20°C ambient temp - Ideal for use at higher elevation observatories under cold conditions.,ZERO etaloning in the NIR - Front-illuminated sensor architecture, no unwanted signal modulation in the NIR compared to back-illuminated devices,Linux, Windows, Labview and Matlab ready - Full and flexible SDK options for a wide variety of physical science laboratory and observatory uses. , NEW Python ready - Python wrapper integration and full supporting documentation in latest camera SDK helps integration and full control of custom-build systems.,NEW ASCOM, EPICS and Tango ready - Supported in open source software platforms. ASCOM astronomy instrument control standard; EPICS and Tango Lima are used for hardware control at a number of particle accelerators and large scientific instruments facilities worldwide.,NEW Enhanced image quality - Updated QC processes ensure every ZL41 Wave delivers optimal image quality. Ultra-low Photon Response Non-Uniformity (PRNU) for clear, uniform images.,NEW Enhanced sensor chamber - A robust next generation sensor chamber provides even greater long-term protection from condensation in high humidity environments (5-year chamber warranty).,5.5 and 4.2 megapixel formats - Sharp resolution over a large field of view. Ideal for astronomy, area scanning applications or multi-track spectroscopy.,QEmax up to 82% - Highest available photon capture efficiency across visible\/NIR.,~ 1 e- Read Noise - Noise floor down to 0.9e-. Lower detection limit than any CCD.,100 fps (Camera Link) - ZL41 offers ‘10-tap’ Camera Link for maximum sustained frame rates.",
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"product_family" : "scmos-camera-series",
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"page_link" : "https://andor.oxinst.com/products/scmos-camera-series/zl41-wave-scmos",
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"name":"Zyla-HF sCMOS\r",
"sorting_name":"zyla-hf scmos\r",
"image":"/assets/components/phpthumbof/cache/zyla-hf-xray.d404f4a1870ea6afe29a191c5598b8db.png",
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"outline" : "Andor’s Zyla 5.5 HF outstanding design delivers the highest transmission and spatial resolution performance associated with state-of-the-art single fiber optic plate bonding, while also taking advantage of the very fast frame rate, ultra-low noise performance and exceptional field of view of the Zyla 5.5.",
"outline_limited" : "Andor’s Zyla 5.5 HF outstanding design delivers the highest transmission and spatial resolution performance associated with state-of-the-art single fiber optic plate bonding,...",
"highlights" : "100 fps full frame sustained,Fiber optic plate coupling,5.5 megapixel sensor format with high resolution and 6.5 μm pixels,1.2 e- read noise,Rolling and Global shutter",
"overview" : "Andor’s Zyla 5.5 HF outstanding design delivers the highest transmission and spatial resolution performance associated with state-of-the-art single fiber optic plate bonding, while also taking advantage of the very fast frame rate, ultra-low noise performance and exceptional field of view of the Zyla 5.5.\r\nIts compact format, multiple mounting points and modular input configuration for scintillators or Beryllium filter integration allow ease of integration into laboratory setup or integrator (OEM) systems.",
"features" : "",
"features_benefits" : "Rapid frame rates - 100 fps full frame sustained,Fiber optic plate coupling - Direct bonding on sCMOS sensor for maximum throughput. EMA statistical structure for lowest channel crosstalk,5.5 megapixel sensor format with high resolution and 6.5 μm pixels - Large 16.6 x 14 mm field of view,1.2 e- read noise - Lower detection limit than any CCD,Compact and light - Ideal for integration into space restrictive set-ups,Rolling and Global shutter - Maximum flexibility across all application,Dual-Gain amplifiers - Extensive dynamic range of 25,000:1 @ 30 fps,ROI and pixel binning - User-defined ROI (1 pixel granularity) and hardware binning,Dynamic baseline clamp - Ensures quantitative stability,Hardware time stamp - FPGA generated time stamp with 25 ns accuracy",
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"accessories" : "SCT-FLT_HLD-CC025ZYL - Ø56 mm filter and Ø25.4 x3 mm scintillator holder for Zyla-HF ,ACC-OPT-07875 - Beryllium filter, Ø56 mm, 200 µm thick ,SCT-FLT_HLD-H050ZYL - Ø56 mm filter and 50 x 50 x 3 mm scintillator holder for Zyla-HF ,ACC-ASE-02992 - 5 m Camera Link connector cable. Order x2 if using with Zyla Camera Link 10-tap models ,ACC-ASE-06962 - 10 m active Camera Link connector cable, including power supply. For use with Zyla 10-tap Camera Link models. ,ACC-ZYLFOX-10TAP-30M - 30 m fibre-optic extender solution for use with Zyla Camera Link 10-tap models. ,ACC-ZYLFOX-10TAP-100 - 100 m fibre-optic extender solution for use with Zyla Camera Link 10-tap models ,ACC-ASE-06887 - 15 m active USB 3.0 connector cable (power supply not required). For use with Zyla USB 3.0 models. ,ACC-ASE-08762 - 50 m fibre optic USB 3.0 extender solution including power supply. For use with Zyla USB 3.0 models. ,ACC-ASE-07860 - 100 m fibre optic USB 3.0 extender solution including power supply. For use with Zyla USB 3.0 models. ",
"tags" : "",
"businesses" : "andor",
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"applications" : [ "automotive-engines","battery-technology","material-composition-and-structure","structural-materials-and-components","x-ray-fluoroscopy-tomography-and-micro-ct" ],
"applications_frontend" : "Automotive Engines, Battery Technology, Material Composition and Structure, Structural Materials and Components, X-ray Fluoroscopy, Radiography and CT",
"product_family" : "high-energy-detection",
"product_family_frontend" : "High Energy Detection",
"sorting_product_family" : "100",
"idx": 232,
"page_id": 200,
"page_link" : "https://andor.oxinst.com/products/high-energy-detection/zyla-scmos-hf",
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